{"id":"https://openalex.org/W2065061510","doi":"https://doi.org/10.1109/wisnet.2014.6825501","title":"Fast in-situ diode detector characterization for Six-Port interferometer receivers","display_name":"Fast in-situ diode detector characterization for Six-Port interferometer receivers","publication_year":2014,"publication_date":"2014-01-01","ids":{"openalex":"https://openalex.org/W2065061510","doi":"https://doi.org/10.1109/wisnet.2014.6825501","mag":"2065061510"},"language":"en","primary_location":{"id":"doi:10.1109/wisnet.2014.6825501","is_oa":false,"landing_page_url":"https://doi.org/10.1109/wisnet.2014.6825501","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2014 IEEE Topical Conference on Wireless Sensors and Sensor Networks (WiSNet)","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5030606335","display_name":"Francesco Barbon","orcid":"https://orcid.org/0000-0002-5436-7831"},"institutions":[{"id":"https://openalex.org/I181369854","display_name":"Friedrich-Alexander-Universit\u00e4t Erlangen-N\u00fcrnberg","ror":"https://ror.org/00f7hpc57","country_code":"DE","type":"education","lineage":["https://openalex.org/I181369854"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Francesco Barbon","raw_affiliation_strings":["Institute for Electronics Engineering, FAU, Erlangen, Germany","Institute for Electronics Engineering, FAU, Cauerstr. 9, 91058 Erlangen, Germany"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Institute for Electronics Engineering, FAU, Erlangen, Germany","institution_ids":[]},{"raw_affiliation_string":"Institute for Electronics Engineering, FAU, Cauerstr. 9, 91058 Erlangen, Germany","institution_ids":["https://openalex.org/I181369854"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5013397069","display_name":"Stefan Lindner","orcid":"https://orcid.org/0000-0001-6910-6573"},"institutions":[{"id":"https://openalex.org/I181369854","display_name":"Friedrich-Alexander-Universit\u00e4t Erlangen-N\u00fcrnberg","ror":"https://ror.org/00f7hpc57","country_code":"DE","type":"education","lineage":["https://openalex.org/I181369854"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Stefan Lindner","raw_affiliation_strings":["Institute for Electronics Engineering, FAU, Erlangen, Germany","Institute for Electronics Engineering, FAU, Cauerstr. 9, 91058 Erlangen, Germany"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Institute for Electronics Engineering, FAU, Erlangen, Germany","institution_ids":[]},{"raw_affiliation_string":"Institute for Electronics Engineering, FAU, Cauerstr. 9, 91058 Erlangen, Germany","institution_ids":["https://openalex.org/I181369854"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5044482211","display_name":"Sebastian Mann","orcid":"https://orcid.org/0000-0003-3774-2852"},"institutions":[{"id":"https://openalex.org/I181369854","display_name":"Friedrich-Alexander-Universit\u00e4t Erlangen-N\u00fcrnberg","ror":"https://ror.org/00f7hpc57","country_code":"DE","type":"education","lineage":["https://openalex.org/I181369854"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Sebastian Mann","raw_affiliation_strings":["Institute for Electronics Engineering, FAU, Erlangen, Germany","Institute for Electronics Engineering, FAU, Cauerstr. 9, 91058 Erlangen, Germany"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Institute for Electronics Engineering, FAU, Erlangen, Germany","institution_ids":[]},{"raw_affiliation_string":"Institute for Electronics Engineering, FAU, Cauerstr. 9, 91058 Erlangen, Germany","institution_ids":["https://openalex.org/I181369854"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5051931591","display_name":"Sarah Linz","orcid":"https://orcid.org/0000-0003-1832-7477"},"institutions":[{"id":"https://openalex.org/I181369854","display_name":"Friedrich-Alexander-Universit\u00e4t Erlangen-N\u00fcrnberg","ror":"https://ror.org/00f7hpc57","country_code":"DE","type":"education","lineage":["https://openalex.org/I181369854"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Sarah Linz","raw_affiliation_strings":["Institute for Electronics Engineering, FAU, Erlangen, Germany","Institute for Electronics Engineering, FAU, Cauerstr. 9, 91058 Erlangen, Germany"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Institute for Electronics Engineering, FAU, Erlangen, Germany","institution_ids":[]},{"raw_affiliation_string":"Institute for Electronics Engineering, FAU, Cauerstr. 9, 91058 Erlangen, Germany","institution_ids":["https://openalex.org/I181369854"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5070760948","display_name":"Robert Weigel","orcid":"https://orcid.org/0000-0002-3131-1800"},"institutions":[{"id":"https://openalex.org/I181369854","display_name":"Friedrich-Alexander-Universit\u00e4t Erlangen-N\u00fcrnberg","ror":"https://ror.org/00f7hpc57","country_code":"DE","type":"education","lineage":["https://openalex.org/I181369854"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Robert Weigel","raw_affiliation_strings":["Institute for Electronics Engineering, FAU, Erlangen, Germany","Institute for Electronics Engineering, FAU, Cauerstr. 9, 91058 Erlangen, Germany"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Institute for Electronics Engineering, FAU, Erlangen, Germany","institution_ids":[]},{"raw_affiliation_string":"Institute for Electronics Engineering, FAU, Cauerstr. 9, 91058 Erlangen, Germany","institution_ids":["https://openalex.org/I181369854"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5019989632","display_name":"Alexander Koelpin","orcid":"https://orcid.org/0000-0002-9071-5661"},"institutions":[{"id":"https://openalex.org/I181369854","display_name":"Friedrich-Alexander-Universit\u00e4t Erlangen-N\u00fcrnberg","ror":"https://ror.org/00f7hpc57","country_code":"DE","type":"education","lineage":["https://openalex.org/I181369854"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Alexander Koelpin","raw_affiliation_strings":["Institute for Electronics Engineering, FAU, Erlangen, Germany","Institute for Electronics Engineering, FAU, Cauerstr. 9, 91058 Erlangen, Germany"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Institute for Electronics Engineering, FAU, Erlangen, Germany","institution_ids":[]},{"raw_affiliation_string":"Institute for Electronics Engineering, FAU, Cauerstr. 9, 91058 Erlangen, Germany","institution_ids":["https://openalex.org/I181369854"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I181369854"],"apc_list":null,"apc_paid":null,"fwci":1.2237,"has_fulltext":false,"cited_by_count":3,"citation_normalized_percentile":{"value":0.76607011,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":94},"biblio":{"volume":null,"issue":null,"first_page":"13","last_page":"15"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11607","display_name":"Microwave and Dielectric Measurement Techniques","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11607","display_name":"Microwave and Dielectric Measurement Techniques","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12564","display_name":"Sensor Technology and Measurement Systems","score":0.9959999918937683,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11249","display_name":"Wireless Power Transfer Systems","score":0.9940999746322632,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/detector","display_name":"Detector","score":0.8535747528076172},{"id":"https://openalex.org/keywords/port","display_name":"Port (circuit theory)","score":0.6802195310592651},{"id":"https://openalex.org/keywords/diode","display_name":"Diode","score":0.607099175453186},{"id":"https://openalex.org/keywords/microcontroller","display_name":"Microcontroller","score":0.5615395903587341},{"id":"https://openalex.org/keywords/interferometry","display_name":"Interferometry","score":0.48798197507858276},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.4846239984035492},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.45783260464668274},{"id":"https://openalex.org/keywords/pin-diode","display_name":"PIN diode","score":0.44208788871765137},{"id":"https://openalex.org/keywords/fabrication","display_name":"Fabrication","score":0.4356403052806854},{"id":"https://openalex.org/keywords/sensitivity","display_name":"Sensitivity (control systems)","score":0.420158326625824},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.40769216418266296},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.35357749462127686},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.3399391174316406},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.31048935651779175},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.2883567214012146},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2342049479484558},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.19693762063980103}],"concepts":[{"id":"https://openalex.org/C94915269","wikidata":"https://www.wikidata.org/wiki/Q1834857","display_name":"Detector","level":2,"score":0.8535747528076172},{"id":"https://openalex.org/C32802771","wikidata":"https://www.wikidata.org/wiki/Q2443617","display_name":"Port (circuit theory)","level":2,"score":0.6802195310592651},{"id":"https://openalex.org/C78434282","wikidata":"https://www.wikidata.org/wiki/Q11656","display_name":"Diode","level":2,"score":0.607099175453186},{"id":"https://openalex.org/C173018170","wikidata":"https://www.wikidata.org/wiki/Q165678","display_name":"Microcontroller","level":2,"score":0.5615395903587341},{"id":"https://openalex.org/C166689943","wikidata":"https://www.wikidata.org/wiki/Q850283","display_name":"Interferometry","level":2,"score":0.48798197507858276},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.4846239984035492},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.45783260464668274},{"id":"https://openalex.org/C52236655","wikidata":"https://www.wikidata.org/wiki/Q2628074","display_name":"PIN diode","level":3,"score":0.44208788871765137},{"id":"https://openalex.org/C136525101","wikidata":"https://www.wikidata.org/wiki/Q5428139","display_name":"Fabrication","level":3,"score":0.4356403052806854},{"id":"https://openalex.org/C21200559","wikidata":"https://www.wikidata.org/wiki/Q7451068","display_name":"Sensitivity (control systems)","level":2,"score":0.420158326625824},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.40769216418266296},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.35357749462127686},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.3399391174316406},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.31048935651779175},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.2883567214012146},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2342049479484558},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.19693762063980103},{"id":"https://openalex.org/C142724271","wikidata":"https://www.wikidata.org/wiki/Q7208","display_name":"Pathology","level":1,"score":0.0},{"id":"https://openalex.org/C204787440","wikidata":"https://www.wikidata.org/wiki/Q188504","display_name":"Alternative medicine","level":2,"score":0.0},{"id":"https://openalex.org/C71924100","wikidata":"https://www.wikidata.org/wiki/Q11190","display_name":"Medicine","level":0,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/wisnet.2014.6825501","is_oa":false,"landing_page_url":"https://doi.org/10.1109/wisnet.2014.6825501","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2014 IEEE Topical Conference on Wireless Sensors and Sensor Networks (WiSNet)","raw_type":"proceedings-article"},{"id":"pmh:oai:tore.tuhh.de:11420/6661","is_oa":false,"landing_page_url":"http://hdl.handle.net/11420/6661","pdf_url":null,"source":{"id":"https://openalex.org/S4306401751","display_name":"tub.dok (Hamburg University of Technology)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I884043246","host_organization_name":"Hamburg University of Technology","host_organization_lineage":["https://openalex.org/I884043246"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"","raw_type":"Conference Paper"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy","score":0.8899999856948853}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":8,"referenced_works":["https://openalex.org/W1593494329","https://openalex.org/W1985694466","https://openalex.org/W2009917349","https://openalex.org/W2041847640","https://openalex.org/W2120995054","https://openalex.org/W2126381841","https://openalex.org/W2152934743","https://openalex.org/W4252371378"],"related_works":["https://openalex.org/W2384022614","https://openalex.org/W1998697323","https://openalex.org/W2380216448","https://openalex.org/W1810291627","https://openalex.org/W2014695549","https://openalex.org/W4400641221","https://openalex.org/W2262887174","https://openalex.org/W4386494903","https://openalex.org/W2060557719","https://openalex.org/W2067654879"],"abstract_inverted_index":{"Six-Port":[0,60],"receivers":[1],"require":[2],"a":[3,43,74],"precise":[4],"power":[5,62],"measurement":[6,31],"of":[7],"all":[8],"their":[9],"four":[10],"output":[11],"channels.":[12],"However,":[13],"due":[14],"to":[15],"temperature":[16],"drift,":[17],"fabrication":[18],"and":[19,45,68],"component":[20],"tolerances":[21],"detectors'":[22],"performance":[23],"may":[24],"have":[25],"some":[26],"degradation,":[27],"which":[28,56],"limits":[29],"the":[30,50],"accuracy.":[32],"Thus,":[33],"an":[34],"in-situ":[35],"detector":[36],"characterization":[37],"is":[38,54,57,66],"necessary.":[39],"In":[40],"this":[41],"paper,":[42],"fast":[44,67],"simple":[46],"solution":[47],"for":[48,59],"estimating":[49],"diode":[51,61],"detector's":[52],"characteristics":[53],"presented,":[55],"ideal":[58],"detectors.":[63],"This":[64],"method":[65],"can":[69],"be":[70],"easily":[71],"implemented":[72],"on":[73],"microcontroller.":[75]},"counts_by_year":[{"year":2017,"cited_by_count":1},{"year":2016,"cited_by_count":1},{"year":2014,"cited_by_count":1}],"updated_date":"2026-07-29T14:22:42.915294","created_date":"2025-10-10T00:00:00"}