{"id":"https://openalex.org/W7110002949","doi":"https://doi.org/10.1109/wf-iot64238.2025.11270507","title":"Intermittent Fault Detection and Temporal Localization Method for Analog Circuits Based on Semantic Segmentation","display_name":"Intermittent Fault Detection and Temporal Localization Method for Analog Circuits Based on Semantic Segmentation","publication_year":2025,"publication_date":"2025-10-27","ids":{"openalex":"https://openalex.org/W7110002949","doi":"https://doi.org/10.1109/wf-iot64238.2025.11270507"},"language":null,"primary_location":{"id":"doi:10.1109/wf-iot64238.2025.11270507","is_oa":false,"landing_page_url":"https://doi.org/10.1109/wf-iot64238.2025.11270507","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2025 IEEE 11th World Forum on Internet of Things (WF-IoT)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":null,"display_name":"Tianyu Gao","orcid":null},"institutions":[{"id":"https://openalex.org/I204983213","display_name":"Harbin Institute of Technology","ror":"https://ror.org/01yqg2h08","country_code":"CN","type":"education","lineage":["https://openalex.org/I204983213"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Tianyu Gao","raw_affiliation_strings":["Harbin Institute of Technology,School of Electronics and Information Engineering,Harbin,China"],"affiliations":[{"raw_affiliation_string":"Harbin Institute of Technology,School of Electronics and Information Engineering,Harbin,China","institution_ids":["https://openalex.org/I204983213"]}]},{"author_position":"middle","author":{"id":null,"display_name":"Yongjiang Li","orcid":null},"institutions":[{"id":"https://openalex.org/I204983213","display_name":"Harbin Institute of Technology","ror":"https://ror.org/01yqg2h08","country_code":"CN","type":"education","lineage":["https://openalex.org/I204983213"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yongjiang Li","raw_affiliation_strings":["Harbin Institute of Technology,School of Electronics and Information Engineering,Harbin,China"],"affiliations":[{"raw_affiliation_string":"Harbin Institute of Technology,School of Electronics and Information Engineering,Harbin,China","institution_ids":["https://openalex.org/I204983213"]}]},{"author_position":"middle","author":{"id":null,"display_name":"Jingli Yang","orcid":null},"institutions":[{"id":"https://openalex.org/I204983213","display_name":"Harbin Institute of Technology","ror":"https://ror.org/01yqg2h08","country_code":"CN","type":"education","lineage":["https://openalex.org/I204983213"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jingli Yang","raw_affiliation_strings":["Harbin Institute of Technology,School of Electronics and Information Engineering,Harbin,China"],"affiliations":[{"raw_affiliation_string":"Harbin Institute of Technology,School of Electronics and Information Engineering,Harbin,China","institution_ids":["https://openalex.org/I204983213"]}]},{"author_position":"last","author":{"id":null,"display_name":"Xiaopeng Fan","orcid":null},"institutions":[{"id":"https://openalex.org/I204983213","display_name":"Harbin Institute of Technology","ror":"https://ror.org/01yqg2h08","country_code":"CN","type":"education","lineage":["https://openalex.org/I204983213"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xiaopeng Fan","raw_affiliation_strings":["Harbin Institute of Technology,School of Computer Science,Harbin,China"],"affiliations":[{"raw_affiliation_string":"Harbin Institute of Technology,School of Computer Science,Harbin,China","institution_ids":["https://openalex.org/I204983213"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I204983213"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.6375502,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"6"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.8511999845504761,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.8511999845504761,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.02250000089406967,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12122","display_name":"Physical Unclonable Functions (PUFs) and Hardware Security","score":0.020600000396370888,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.6388999819755554},{"id":"https://openalex.org/keywords/fault-detection-and-isolation","display_name":"Fault detection and isolation","score":0.625},{"id":"https://openalex.org/keywords/segmentation","display_name":"Segmentation","score":0.6194999814033508},{"id":"https://openalex.org/keywords/analogue-electronics","display_name":"Analogue electronics","score":0.44679999351501465},{"id":"https://openalex.org/keywords/stuck-at-fault","display_name":"Stuck-at fault","score":0.42329999804496765},{"id":"https://openalex.org/keywords/pattern-recognition","display_name":"Pattern recognition (psychology)","score":0.41819998621940613},{"id":"https://openalex.org/keywords/sampling","display_name":"Sampling (signal processing)","score":0.3919000029563904},{"id":"https://openalex.org/keywords/transient","display_name":"Transient (computer programming)","score":0.37130001187324524}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6456999778747559},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.6388999819755554},{"id":"https://openalex.org/C152745839","wikidata":"https://www.wikidata.org/wiki/Q5438153","display_name":"Fault detection and isolation","level":3,"score":0.625},{"id":"https://openalex.org/C89600930","wikidata":"https://www.wikidata.org/wiki/Q1423946","display_name":"Segmentation","level":2,"score":0.6194999814033508},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.4562000036239624},{"id":"https://openalex.org/C29074008","wikidata":"https://www.wikidata.org/wiki/Q174925","display_name":"Analogue electronics","level":3,"score":0.44679999351501465},{"id":"https://openalex.org/C13625343","wikidata":"https://www.wikidata.org/wiki/Q7627418","display_name":"Stuck-at fault","level":4,"score":0.42329999804496765},{"id":"https://openalex.org/C153180895","wikidata":"https://www.wikidata.org/wiki/Q7148389","display_name":"Pattern recognition (psychology)","level":2,"score":0.41819998621940613},{"id":"https://openalex.org/C140779682","wikidata":"https://www.wikidata.org/wiki/Q210868","display_name":"Sampling (signal processing)","level":3,"score":0.3919000029563904},{"id":"https://openalex.org/C2780799671","wikidata":"https://www.wikidata.org/wiki/Q17087362","display_name":"Transient (computer programming)","level":2,"score":0.37130001187324524},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.36910000443458557},{"id":"https://openalex.org/C28719098","wikidata":"https://www.wikidata.org/wiki/Q44946","display_name":"Point (geometry)","level":2,"score":0.3610000014305115},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.33719998598098755},{"id":"https://openalex.org/C179254644","wikidata":"https://www.wikidata.org/wiki/Q13222844","display_name":"Moment (physics)","level":2,"score":0.3314000070095062},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.3160000145435333},{"id":"https://openalex.org/C127162648","wikidata":"https://www.wikidata.org/wiki/Q16858953","display_name":"Channel (broadcasting)","level":2,"score":0.31220000982284546},{"id":"https://openalex.org/C21267803","wikidata":"https://www.wikidata.org/wiki/Q5438159","display_name":"Fault indicator","level":4,"score":0.28690001368522644},{"id":"https://openalex.org/C79403827","wikidata":"https://www.wikidata.org/wiki/Q3988","display_name":"Real-time computing","level":1,"score":0.28540000319480896},{"id":"https://openalex.org/C530198007","wikidata":"https://www.wikidata.org/wiki/Q80831","display_name":"Integrated circuit","level":2,"score":0.2815000116825104},{"id":"https://openalex.org/C2779843651","wikidata":"https://www.wikidata.org/wiki/Q7390335","display_name":"SIGNAL (programming language)","level":2,"score":0.26669999957084656},{"id":"https://openalex.org/C26517878","wikidata":"https://www.wikidata.org/wiki/Q228039","display_name":"Key (lock)","level":2,"score":0.25380000472068787},{"id":"https://openalex.org/C104267543","wikidata":"https://www.wikidata.org/wiki/Q208163","display_name":"Signal processing","level":3,"score":0.251800000667572},{"id":"https://openalex.org/C2776365744","wikidata":"https://www.wikidata.org/wiki/Q5438149","display_name":"Fault Simulator","level":5,"score":0.251800000667572},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.250900000333786}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/wf-iot64238.2025.11270507","is_oa":false,"landing_page_url":"https://doi.org/10.1109/wf-iot64238.2025.11270507","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2025 IEEE 11th World Forum on Internet of Things (WF-IoT)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":18,"referenced_works":["https://openalex.org/W2395611524","https://openalex.org/W2468457481","https://openalex.org/W2761148314","https://openalex.org/W2904409077","https://openalex.org/W2963554131","https://openalex.org/W3096237054","https://openalex.org/W4225503344","https://openalex.org/W4225602460","https://openalex.org/W4285286599","https://openalex.org/W4317754108","https://openalex.org/W4378966361","https://openalex.org/W4388208118","https://openalex.org/W4389104667","https://openalex.org/W4389659240","https://openalex.org/W4392014753","https://openalex.org/W4399915717","https://openalex.org/W4403909911","https://openalex.org/W4406323848"],"related_works":[],"abstract_inverted_index":{"Intermittent":[0],"faults":[1,140],"(IFs),":[2],"which":[3],"are":[4],"common":[5],"in":[6,22,54,130,209],"electronic":[7],"systems,":[8],"represent":[9],"a":[10,27,98],"crucial":[11],"early":[12,134,202],"manifestation":[13],"of":[14,114,121,128,138,152,163,184,207],"permanent":[15],"circuit":[16,23,55,68,131,143],"failures.":[17],"Determining":[18],"its":[19,176],"temporal":[20,205],"location":[21],"signals":[24,56,71],"is":[25,91,198],"becoming":[26],"challenging":[28],"problem.":[29],"Therefore,":[30],"this":[31],"paper":[32],"proposes":[33],"an":[34],"intermittent":[35,94],"fault":[36,78,81,85,95,185],"detection":[37,161,178,203],"method":[38,65,158,197],"based":[39],"on":[40],"semantic":[41,75],"segmentation":[42],"combined":[43],"with":[44,102,149],"channel-spatial":[45],"attention.":[46],"In":[47],"analog":[48,210],"circuits,":[49,173],"IFs":[50,129,208],"cause":[51],"transient":[52],"changes":[53],"concerning":[57],"amplitude,":[58],"frequency,":[59],"and":[60,84,104,126,136,165,171,204],"waveform.":[61],"Consequently,":[62],"the":[63,67,115,119,123,139,142,150,168,181,195,201],"proposed":[64,157,196],"utilizes":[66],"output":[69],"voltage":[70],"to":[72],"extract":[73],"diverse":[74],"features":[76],"representing":[77],"initiation":[79],"(FI),":[80],"disappearance":[82],"(FD),":[83],"sustained":[86],"(FS).":[87],"First,":[88],"sampled":[89],"data":[90],"labeled":[92],"into":[93,112],"windows.":[96],"Then,":[97],"1D":[99],"U-Net":[100],"integrated":[101],"spatial":[103],"channel":[105],"attention":[106],"models":[107],"classifies":[108],"each":[109],"sampling":[110],"point":[111],"one":[113],"aforementioned":[116],"categories,":[117],"enabling":[118],"determination":[120],"both":[122],"onset":[124],"time":[125],"duration":[127],"components.":[132],"The":[133,156],"severity":[135],"progression":[137],"within":[141],"under":[144],"test":[145],"can":[146],"be":[147],"assessed":[148],"benefit":[151],"these":[153],"effective":[154,199],"features.":[155],"attains":[159],"IF":[160],"accuracies":[162],"97.2%":[164],"97.0%":[166],"for":[167,200],"quad":[169],"op-amp":[170],"SK":[172],"respectively.":[174],"Notably,":[175],"trigger":[177],"rates":[179],"at":[180],"precise":[182],"moment":[183],"occurrence":[186],"significantly":[187],"outperform":[188],"competing":[189],"methods.":[190],"Experimental":[191],"results":[192],"demonstrate":[193],"that":[194],"localization":[206],"circuits.":[211]},"counts_by_year":[],"updated_date":"2025-12-10T02:45:41.426853","created_date":"2025-12-08T00:00:00"}