{"id":"https://openalex.org/W7165176439","doi":"https://doi.org/10.1109/vts69484.2026.11563393","title":"Soft Error Reliability Analysis & Hardening of NVDLA MAC Units","display_name":"Soft Error Reliability Analysis & Hardening of NVDLA MAC Units","publication_year":2026,"publication_date":"2026-04-27","ids":{"openalex":"https://openalex.org/W7165176439","doi":"https://doi.org/10.1109/vts69484.2026.11563393"},"language":null,"primary_location":{"id":"doi:10.1109/vts69484.2026.11563393","is_oa":false,"landing_page_url":"https://doi.org/10.1109/vts69484.2026.11563393","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2026 IEEE 44th VLSI Test Symposium (VTS)","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5057971669","display_name":"Nikolaos Chatzivangelis","orcid":"https://orcid.org/0009-0008-1050-046X"},"institutions":[{"id":"https://openalex.org/I145722265","display_name":"University of Thessaly","ror":"https://ror.org/04v4g9h31","country_code":"GR","type":"education","lineage":["https://openalex.org/I145722265"]}],"countries":["GR"],"is_corresponding":false,"raw_author_name":"Nikolaos Chatzivangelis","raw_affiliation_strings":["University Of Thessaly,Volos,Greece"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"University Of Thessaly,Volos,Greece","institution_ids":["https://openalex.org/I145722265"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5138906299","display_name":"Nikolaos Betsos","orcid":null},"institutions":[{"id":"https://openalex.org/I145722265","display_name":"University of Thessaly","ror":"https://ror.org/04v4g9h31","country_code":"GR","type":"education","lineage":["https://openalex.org/I145722265"]}],"countries":["GR"],"is_corresponding":false,"raw_author_name":"Nikolaos Betsos","raw_affiliation_strings":["University Of Thessaly,Volos,Greece"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"University Of Thessaly,Volos,Greece","institution_ids":["https://openalex.org/I145722265"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5009316258","display_name":"Georgios-Ioannis Paliaroutis","orcid":"https://orcid.org/0000-0002-4897-0634"},"institutions":[{"id":"https://openalex.org/I145722265","display_name":"University of Thessaly","ror":"https://ror.org/04v4g9h31","country_code":"GR","type":"education","lineage":["https://openalex.org/I145722265"]}],"countries":["GR"],"is_corresponding":false,"raw_author_name":"Georgios-Ioannis Paliaroutis","raw_affiliation_strings":["University Of Thessaly,Volos,Greece"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"University Of Thessaly,Volos,Greece","institution_ids":["https://openalex.org/I145722265"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5116186667","display_name":"Nikolaos Zazatis","orcid":null},"institutions":[{"id":"https://openalex.org/I145722265","display_name":"University of Thessaly","ror":"https://ror.org/04v4g9h31","country_code":"GR","type":"education","lineage":["https://openalex.org/I145722265"]}],"countries":["GR"],"is_corresponding":false,"raw_author_name":"Nikolaos Zazatis","raw_affiliation_strings":["University Of Thessaly,Volos,Greece"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"University Of Thessaly,Volos,Greece","institution_ids":["https://openalex.org/I145722265"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5039792365","display_name":"Pelopidas Tsoumanis","orcid":null},"institutions":[{"id":"https://openalex.org/I145722265","display_name":"University of Thessaly","ror":"https://ror.org/04v4g9h31","country_code":"GR","type":"education","lineage":["https://openalex.org/I145722265"]}],"countries":["GR"],"is_corresponding":false,"raw_author_name":"Pelopidas Tsoumanis","raw_affiliation_strings":["University Of Thessaly,Volos,Greece"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"University Of Thessaly,Volos,Greece","institution_ids":["https://openalex.org/I145722265"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5032628049","display_name":"F. Wrobel","orcid":"https://orcid.org/0000-0002-2437-1223"},"institutions":[{"id":"https://openalex.org/I1294671590","display_name":"Centre National de la Recherche Scientifique","ror":"https://ror.org/02feahw73","country_code":"FR","type":"government","lineage":["https://openalex.org/I1294671590"]},{"id":"https://openalex.org/I19894307","display_name":"Universit\u00e9 de Montpellier","ror":"https://ror.org/051escj72","country_code":"FR","type":"education","lineage":["https://openalex.org/I19894307"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"Frederic Wrobel","raw_affiliation_strings":["University of Montpellier, CNRS,IES,Montpellier,France"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"University of Montpellier, CNRS,IES,Montpellier,France","institution_ids":["https://openalex.org/I1294671590","https://openalex.org/I19894307"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5136474877","display_name":"Marko Andjelkovic","orcid":null},"institutions":[{"id":"https://openalex.org/I92894754","display_name":"Leibniz Institute for High Performance Microelectronics","ror":"https://ror.org/0489gab80","country_code":"DE","type":"facility","lineage":["https://openalex.org/I315704651","https://openalex.org/I92894754"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Marko Andjelkovic","raw_affiliation_strings":["IHP – Leibniz Institute for High Performance Microelectronics, Frankfurt Oder,Germany"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"IHP – Leibniz Institute for High Performance Microelectronics, Frankfurt Oder,Germany","institution_ids":["https://openalex.org/I92894754"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5135670721","display_name":"Christos Sotiriou","orcid":null},"institutions":[{"id":"https://openalex.org/I145722265","display_name":"University of Thessaly","ror":"https://ror.org/04v4g9h31","country_code":"GR","type":"education","lineage":["https://openalex.org/I145722265"]}],"countries":["GR"],"is_corresponding":false,"raw_author_name":"Christos Sotiriou","raw_affiliation_strings":["University Of Thessaly,Volos,Greece"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"University Of Thessaly,Volos,Greece","institution_ids":["https://openalex.org/I145722265"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5138859097","display_name":"Luigi Dilillo","orcid":null},"institutions":[{"id":"https://openalex.org/I1294671590","display_name":"Centre National de la Recherche Scientifique","ror":"https://ror.org/02feahw73","country_code":"FR","type":"government","lineage":["https://openalex.org/I1294671590"]},{"id":"https://openalex.org/I19894307","display_name":"Universit\u00e9 de Montpellier","ror":"https://ror.org/051escj72","country_code":"FR","type":"education","lineage":["https://openalex.org/I19894307"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"Luigi Dilillo","raw_affiliation_strings":["University of Montpellier, CNRS,IES,Montpellier,France"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"University of Montpellier, CNRS,IES,Montpellier,France","institution_ids":["https://openalex.org/I1294671590","https://openalex.org/I19894307"]}]}],"institutions":[],"countries_distinct_count":3,"institutions_distinct_count":4,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":null,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":null,"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"5"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.19169999659061432,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.19169999659061432,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.14350000023841858,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.10740000009536743,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.5194000005722046},{"id":"https://openalex.org/keywords/hardening","display_name":"Hardening (computing)","score":0.4945000112056732},{"id":"https://openalex.org/keywords/observational-error","display_name":"Observational error","score":0.26339998841285706},{"id":"https://openalex.org/keywords/error-analysis","display_name":"Error analysis","score":0.2363000065088272}],"concepts":[{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.5194000005722046},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.49540001153945923},{"id":"https://openalex.org/C44255700","wikidata":"https://www.wikidata.org/wiki/Q978423","display_name":"Hardening (computing)","level":3,"score":0.4945000112056732},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4832000136375427},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.29280000925064087},{"id":"https://openalex.org/C66938386","wikidata":"https://www.wikidata.org/wiki/Q633538","display_name":"Structural engineering","level":1,"score":0.2678999900817871},{"id":"https://openalex.org/C19619285","wikidata":"https://www.wikidata.org/wiki/Q196372","display_name":"Observational error","level":2,"score":0.26339998841285706},{"id":"https://openalex.org/C3018824978","wikidata":"https://www.wikidata.org/wiki/Q2894891","display_name":"Error analysis","level":2,"score":0.2363000065088272},{"id":"https://openalex.org/C77595967","wikidata":"https://www.wikidata.org/wiki/Q3151013","display_name":"Forensic engineering","level":1,"score":0.23319999873638153},{"id":"https://openalex.org/C154474529","wikidata":"https://www.wikidata.org/wiki/Q1658917","display_name":"Soft error","level":2,"score":0.22630000114440918}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/vts69484.2026.11563393","is_oa":false,"landing_page_url":"https://doi.org/10.1109/vts69484.2026.11563393","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2026 IEEE 44th VLSI Test Symposium (VTS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[{"id":"https://openalex.org/F4320334322","display_name":"HORIZON EUROPE Framework Programme","ror":null}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":17,"referenced_works":["https://openalex.org/W1971009705","https://openalex.org/W2099569658","https://openalex.org/W2166532333","https://openalex.org/W2946332877","https://openalex.org/W3028112146","https://openalex.org/W3040935927","https://openalex.org/W3105084904","https://openalex.org/W3166958299","https://openalex.org/W4361862709","https://openalex.org/W4388667102","https://openalex.org/W4396955725","https://openalex.org/W4400034223","https://openalex.org/W4404955136","https://openalex.org/W4416725252","https://openalex.org/W7102407775","https://openalex.org/W7128781051","https://openalex.org/W7129079269"],"related_works":[],"abstract_inverted_index":null,"counts_by_year":[],"updated_date":"2026-07-22T07:51:19.307946","created_date":"2026-06-19T00:00:00"}