{"id":"https://openalex.org/W7165111396","doi":"https://doi.org/10.1109/vts69484.2026.11563358","title":"RTL-Forge: CNF-Anchored, LLM-Assisted Verilog Generation","display_name":"RTL-Forge: CNF-Anchored, LLM-Assisted Verilog Generation","publication_year":2026,"publication_date":"2026-04-27","ids":{"openalex":"https://openalex.org/W7165111396","doi":"https://doi.org/10.1109/vts69484.2026.11563358"},"language":null,"primary_location":{"id":"doi:10.1109/vts69484.2026.11563358","is_oa":false,"landing_page_url":"https://doi.org/10.1109/vts69484.2026.11563358","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2026 IEEE 44th VLSI Test Symposium (VTS)","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5138861363","display_name":"Prithwish Basu Roy","orcid":null},"institutions":[{"id":"https://openalex.org/I3129563930","display_name":"Eckernforde Tanga University","ror":"https://ror.org/05mh02w22","country_code":"TZ","type":"education","lineage":["https://openalex.org/I3129563930"]}],"countries":["TZ"],"is_corresponding":false,"raw_author_name":"Prithwish Basu Roy","raw_affiliation_strings":["NYU Tandon School of Engineering,ECE Dept,New York,US"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"NYU Tandon School of Engineering,ECE Dept,New York,US","institution_ids":["https://openalex.org/I3129563930"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5083907788","display_name":"Akashdeep Saha","orcid":"https://orcid.org/0000-0003-2060-2773"},"institutions":[{"id":"https://openalex.org/I120250893","display_name":"New York University Abu Dhabi","ror":"https://ror.org/00e5k0821","country_code":"AE","type":"education","lineage":["https://openalex.org/I120250893","https://openalex.org/I57206974"]}],"countries":["AE"],"is_corresponding":false,"raw_author_name":"Akashdeep Saha","raw_affiliation_strings":["CCS, NYU Abu Dhabi,Abu Dhabi,UAE"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"CCS, NYU Abu Dhabi,Abu Dhabi,UAE","institution_ids":["https://openalex.org/I120250893"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5053280523","display_name":"Manaar Alam","orcid":"https://orcid.org/0000-0002-3338-2944"},"institutions":[{"id":"https://openalex.org/I120250893","display_name":"New York University Abu Dhabi","ror":"https://ror.org/00e5k0821","country_code":"AE","type":"education","lineage":["https://openalex.org/I120250893","https://openalex.org/I57206974"]}],"countries":["AE"],"is_corresponding":false,"raw_author_name":"Manaar Alam","raw_affiliation_strings":["CCS, NYU Abu Dhabi,Abu Dhabi,UAE"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"CCS, NYU Abu Dhabi,Abu Dhabi,UAE","institution_ids":["https://openalex.org/I120250893"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5052751303","display_name":"Johann Knechtel","orcid":"https://orcid.org/0000-0001-5093-2939"},"institutions":[{"id":"https://openalex.org/I120250893","display_name":"New York University Abu Dhabi","ror":"https://ror.org/00e5k0821","country_code":"AE","type":"education","lineage":["https://openalex.org/I120250893","https://openalex.org/I57206974"]}],"countries":["AE"],"is_corresponding":false,"raw_author_name":"Johann Knechtel","raw_affiliation_strings":["CCS, NYU Abu Dhabi,Abu Dhabi,UAE"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"CCS, NYU Abu Dhabi,Abu Dhabi,UAE","institution_ids":["https://openalex.org/I120250893"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5138950616","display_name":"Michail Maniatakos","orcid":null},"institutions":[{"id":"https://openalex.org/I120250893","display_name":"New York University Abu Dhabi","ror":"https://ror.org/00e5k0821","country_code":"AE","type":"education","lineage":["https://openalex.org/I120250893","https://openalex.org/I57206974"]}],"countries":["AE"],"is_corresponding":false,"raw_author_name":"Michail Maniatakos","raw_affiliation_strings":["CCS, NYU Abu Dhabi,Abu Dhabi,UAE"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"CCS, NYU Abu Dhabi,Abu Dhabi,UAE","institution_ids":["https://openalex.org/I120250893"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5059987567","display_name":"Ozgur Sinanoglu","orcid":"https://orcid.org/0000-0003-0782-0397"},"institutions":[{"id":"https://openalex.org/I120250893","display_name":"New York University Abu Dhabi","ror":"https://ror.org/00e5k0821","country_code":"AE","type":"education","lineage":["https://openalex.org/I120250893","https://openalex.org/I57206974"]}],"countries":["AE"],"is_corresponding":false,"raw_author_name":"Ozgur Sinanoglu","raw_affiliation_strings":["CCS, NYU Abu Dhabi,Abu Dhabi,UAE"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"CCS, NYU Abu Dhabi,Abu Dhabi,UAE","institution_ids":["https://openalex.org/I120250893"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5059648257","display_name":"Ramesh Karri","orcid":"https://orcid.org/0000-0001-7989-5617"},"institutions":[{"id":"https://openalex.org/I3129563930","display_name":"Eckernforde Tanga University","ror":"https://ror.org/05mh02w22","country_code":"TZ","type":"education","lineage":["https://openalex.org/I3129563930"]}],"countries":["TZ"],"is_corresponding":false,"raw_author_name":"Ramesh Karri","raw_affiliation_strings":["NYU Tandon School of Engineering,ECE Dept,New York,US"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"NYU Tandon School of Engineering,ECE Dept,New York,US","institution_ids":["https://openalex.org/I3129563930"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":null,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":null,"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"7"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11206","display_name":"Model Reduction and Neural Networks","score":0.06199999898672104,"subfield":{"id":"https://openalex.org/subfields/3109","display_name":"Statistical and Nonlinear Physics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11206","display_name":"Model Reduction and Neural Networks","score":0.06199999898672104,"subfield":{"id":"https://openalex.org/subfields/3109","display_name":"Statistical and Nonlinear Physics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12808","display_name":"Ferroelectric and Negative Capacitance Devices","score":0.030300000682473183,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10054","display_name":"Parallel Computing and Optimization Techniques","score":0.02319999970495701,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.26570001244544983},{"id":"https://openalex.org/keywords/verilog","display_name":"Verilog","score":0.2313999980688095},{"id":"https://openalex.org/keywords/software","display_name":"Software","score":0.22679999470710754},{"id":"https://openalex.org/keywords/power-consumption","display_name":"Power consumption","score":0.20589999854564667},{"id":"https://openalex.org/keywords/pipeline","display_name":"Pipeline (software)","score":0.20559999346733093}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6241999864578247},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.26570001244544983},{"id":"https://openalex.org/C2779030575","wikidata":"https://www.wikidata.org/wiki/Q827773","display_name":"Verilog","level":3,"score":0.2313999980688095},{"id":"https://openalex.org/C2777904410","wikidata":"https://www.wikidata.org/wiki/Q7397","display_name":"Software","level":2,"score":0.22679999470710754},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.21639999747276306},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.21150000393390656},{"id":"https://openalex.org/C2984118289","wikidata":"https://www.wikidata.org/wiki/Q29954","display_name":"Power consumption","level":3,"score":0.20589999854564667},{"id":"https://openalex.org/C43521106","wikidata":"https://www.wikidata.org/wiki/Q2165493","display_name":"Pipeline (software)","level":2,"score":0.20559999346733093},{"id":"https://openalex.org/C116834253","wikidata":"https://www.wikidata.org/wiki/Q2039217","display_name":"Identification (biology)","level":2,"score":0.20229999721050262},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2004999965429306}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/vts69484.2026.11563358","is_oa":false,"landing_page_url":"https://doi.org/10.1109/vts69484.2026.11563358","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2026 IEEE 44th VLSI Test Symposium (VTS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":14,"referenced_works":["https://openalex.org/W2106950603","https://openalex.org/W2133527541","https://openalex.org/W3082750925","https://openalex.org/W3151473321","https://openalex.org/W4238706614","https://openalex.org/W4243399171","https://openalex.org/W4251228600","https://openalex.org/W4388040405","https://openalex.org/W4391681217","https://openalex.org/W4393305455","https://openalex.org/W4402835956","https://openalex.org/W4403023622","https://openalex.org/W4403024085","https://openalex.org/W4404134046"],"related_works":[],"abstract_inverted_index":null,"counts_by_year":[],"updated_date":"2026-07-14T23:27:15.235271","created_date":"2026-06-19T00:00:00"}