{"id":"https://openalex.org/W7165129018","doi":"https://doi.org/10.1109/vts69484.2026.11563304","title":"HAT-FI: Hardware-Aware Training for Fault-Tolerant LLM Inference on RRAM-Based Compute-in-Memory","display_name":"HAT-FI: Hardware-Aware Training for Fault-Tolerant LLM Inference on RRAM-Based Compute-in-Memory","publication_year":2026,"publication_date":"2026-04-27","ids":{"openalex":"https://openalex.org/W7165129018","doi":"https://doi.org/10.1109/vts69484.2026.11563304"},"language":null,"primary_location":{"id":"doi:10.1109/vts69484.2026.11563304","is_oa":false,"landing_page_url":"https://doi.org/10.1109/vts69484.2026.11563304","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2026 IEEE 44th VLSI Test Symposium (VTS)","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5121525502","display_name":"Pragya Sharma","orcid":null},"institutions":[{"id":"https://openalex.org/I55732556","display_name":"Arizona State University","ror":"https://ror.org/03efmqc40","country_code":"US","type":"education","lineage":["https://openalex.org/I55732556"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Pragya Sharma","raw_affiliation_strings":["Arizona State University,School of Electrical, Computer and Energy Engineering,Tempe,AZ,USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Arizona State University,School of Electrical, Computer and Energy Engineering,Tempe,AZ,USA","institution_ids":["https://openalex.org/I55732556"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5030858550","display_name":"Soyed Tuhin Ahmed","orcid":"https://orcid.org/0000-0001-5179-2392"},"institutions":[{"id":"https://openalex.org/I55732556","display_name":"Arizona State University","ror":"https://ror.org/03efmqc40","country_code":"US","type":"education","lineage":["https://openalex.org/I55732556"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Soyed Tuhin Ahmed","raw_affiliation_strings":["Arizona State University,School of Electrical, Computer and Energy Engineering,Tempe,AZ,USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Arizona State University,School of Electrical, Computer and Energy Engineering,Tempe,AZ,USA","institution_ids":["https://openalex.org/I55732556"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5018615087","display_name":"Farshad Firouzi","orcid":"https://orcid.org/0000-0002-8359-4304"},"institutions":[{"id":"https://openalex.org/I55732556","display_name":"Arizona State University","ror":"https://ror.org/03efmqc40","country_code":"US","type":"education","lineage":["https://openalex.org/I55732556"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Farshad Firouzi","raw_affiliation_strings":["Arizona State University,School of Electrical, Computer and Energy Engineering,Tempe,AZ,USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Arizona State University,School of Electrical, Computer and Energy Engineering,Tempe,AZ,USA","institution_ids":["https://openalex.org/I55732556"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5138943088","display_name":"Krishnendu Chakrabarty","orcid":null},"institutions":[{"id":"https://openalex.org/I55732556","display_name":"Arizona State University","ror":"https://ror.org/03efmqc40","country_code":"US","type":"education","lineage":["https://openalex.org/I55732556"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Krishnendu Chakrabarty","raw_affiliation_strings":["Arizona State University,School of Electrical, Computer and Energy Engineering,Tempe,AZ,USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Arizona State University,School of Electrical, Computer and Energy Engineering,Tempe,AZ,USA","institution_ids":["https://openalex.org/I55732556"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I55732556"],"apc_list":null,"apc_paid":null,"fwci":null,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":null,"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"5"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10772","display_name":"Distributed systems and fault tolerance","score":0.3091000020503998,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10772","display_name":"Distributed systems and fault tolerance","score":0.3091000020503998,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.28630000352859497,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12127","display_name":"Software System Performance and Reliability","score":0.1023000031709671,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/training","display_name":"Training (meteorology)","score":0.5479000210762024},{"id":"https://openalex.org/keywords/inference","display_name":"Inference","score":0.39169999957084656},{"id":"https://openalex.org/keywords/training-set","display_name":"Training set","score":0.30399999022483826},{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.26420000195503235},{"id":"https://openalex.org/keywords/feature","display_name":"Feature (linguistics)","score":0.24040000140666962}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5809000134468079},{"id":"https://openalex.org/C2777211547","wikidata":"https://www.wikidata.org/wiki/Q17141490","display_name":"Training (meteorology)","level":2,"score":0.5479000210762024},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.5401999950408936},{"id":"https://openalex.org/C2776214188","wikidata":"https://www.wikidata.org/wiki/Q408386","display_name":"Inference","level":2,"score":0.39169999957084656},{"id":"https://openalex.org/C119857082","wikidata":"https://www.wikidata.org/wiki/Q2539","display_name":"Machine learning","level":1,"score":0.3206999897956848},{"id":"https://openalex.org/C51632099","wikidata":"https://www.wikidata.org/wiki/Q3985153","display_name":"Training set","level":2,"score":0.30399999022483826},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.26420000195503235},{"id":"https://openalex.org/C2776401178","wikidata":"https://www.wikidata.org/wiki/Q12050496","display_name":"Feature (linguistics)","level":2,"score":0.24040000140666962},{"id":"https://openalex.org/C527412718","wikidata":"https://www.wikidata.org/wiki/Q855395","display_name":"Interpretation (philosophy)","level":2,"score":0.23399999737739563},{"id":"https://openalex.org/C9652623","wikidata":"https://www.wikidata.org/wiki/Q190109","display_name":"Field (mathematics)","level":2,"score":0.2281000018119812}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/vts69484.2026.11563304","is_oa":false,"landing_page_url":"https://doi.org/10.1109/vts69484.2026.11563304","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2026 IEEE 44th VLSI Test Symposium (VTS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.4752865433692932,"id":"https://metadata.un.org/sdg/10","display_name":"Reduced inequalities"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":24,"referenced_works":["https://openalex.org/W1999085092","https://openalex.org/W2518281301","https://openalex.org/W2604319603","https://openalex.org/W2768104155","https://openalex.org/W2803163155","https://openalex.org/W2805362231","https://openalex.org/W2946522000","https://openalex.org/W2948661249","https://openalex.org/W2983278064","https://openalex.org/W3006150812","https://openalex.org/W4307748377","https://openalex.org/W4311415873","https://openalex.org/W4316661092","https://openalex.org/W4376606693","https://openalex.org/W4384009484","https://openalex.org/W4399120232","https://openalex.org/W4401568230","https://openalex.org/W4404848529","https://openalex.org/W4409282575","https://openalex.org/W4410583939","https://openalex.org/W7117561630","https://openalex.org/W7124988612","https://openalex.org/W7133211372","https://openalex.org/W7134813260"],"related_works":[],"abstract_inverted_index":null,"counts_by_year":[],"updated_date":"2026-07-14T23:27:15.235271","created_date":"2026-06-19T00:00:00"}