{"id":"https://openalex.org/W7165165349","doi":"https://doi.org/10.1109/vts69484.2026.11563200","title":"LEAD: Link Exploitability Analysis for Die-to-Die Interconnects in Heterogeneous Integration <sup>*</sup>","display_name":"LEAD: Link Exploitability Analysis for Die-to-Die Interconnects in Heterogeneous Integration <sup>*</sup>","publication_year":2026,"publication_date":"2026-04-27","ids":{"openalex":"https://openalex.org/W7165165349","doi":"https://doi.org/10.1109/vts69484.2026.11563200"},"language":null,"primary_location":{"id":"doi:10.1109/vts69484.2026.11563200","is_oa":false,"landing_page_url":"https://doi.org/10.1109/vts69484.2026.11563200","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2026 IEEE 44th VLSI Test Symposium (VTS)","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5120235746","display_name":"Arjun Hati","orcid":null},"institutions":[{"id":"https://openalex.org/I55732556","display_name":"Arizona State University","ror":"https://ror.org/03efmqc40","country_code":"US","type":"education","lineage":["https://openalex.org/I55732556"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Arjun Hati","raw_affiliation_strings":["Arizona State University,School of Electrical, Computer and Energy Engineering,Tempe,AZ"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Arizona State University,School of Electrical, Computer and Energy Engineering,Tempe,AZ","institution_ids":["https://openalex.org/I55732556"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5103146563","display_name":"Eduardo Ortega","orcid":"https://orcid.org/0009-0003-2570-4901"},"institutions":[{"id":"https://openalex.org/I55732556","display_name":"Arizona State University","ror":"https://ror.org/03efmqc40","country_code":"US","type":"education","lineage":["https://openalex.org/I55732556"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Eduardo Ortega","raw_affiliation_strings":["Arizona State University,School of Electrical, Computer and Energy Engineering,Tempe,AZ"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Arizona State University,School of Electrical, Computer and Energy Engineering,Tempe,AZ","institution_ids":["https://openalex.org/I55732556"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5017274857","display_name":"Jonti Talukdar","orcid":"https://orcid.org/0000-0001-7079-5281"},"institutions":[{"id":"https://openalex.org/I55732556","display_name":"Arizona State University","ror":"https://ror.org/03efmqc40","country_code":"US","type":"education","lineage":["https://openalex.org/I55732556"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Jonti Talukdar","raw_affiliation_strings":["Arizona State University,School of Electrical, Computer and Energy Engineering,Tempe,AZ"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Arizona State University,School of Electrical, Computer and Energy Engineering,Tempe,AZ","institution_ids":["https://openalex.org/I55732556"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5029774084","display_name":"Jim Plusquellic","orcid":"https://orcid.org/0000-0002-1876-117X"},"institutions":[{"id":"https://openalex.org/I169521973","display_name":"University of New Mexico","ror":"https://ror.org/05fs6jp91","country_code":"US","type":"education","lineage":["https://openalex.org/I169521973"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Jim Plusquellic","raw_affiliation_strings":["University of New Mexico,Electrical and Computer Engineering Department,Albuquerque,NM"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"University of New Mexico,Electrical and Computer Engineering Department,Albuquerque,NM","institution_ids":["https://openalex.org/I169521973"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5138943088","display_name":"Krishnendu Chakrabarty","orcid":null},"institutions":[{"id":"https://openalex.org/I55732556","display_name":"Arizona State University","ror":"https://ror.org/03efmqc40","country_code":"US","type":"education","lineage":["https://openalex.org/I55732556"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Krishnendu Chakrabarty","raw_affiliation_strings":["Arizona State University,School of Electrical, Computer and Energy Engineering,Tempe,AZ"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Arizona State University,School of Electrical, Computer and Energy Engineering,Tempe,AZ","institution_ids":["https://openalex.org/I55732556"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.77510596,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"7"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11527","display_name":"3D IC and TSV technologies","score":0.31929999589920044,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11527","display_name":"3D IC and TSV technologies","score":0.31929999589920044,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11661","display_name":"Copper Interconnects and Reliability","score":0.15889999270439148,"subfield":{"id":"https://openalex.org/subfields/2504","display_name":"Electronic, Optical and Magnetic Materials"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.11729999631643295,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/component","display_name":"Component (thermodynamics)","score":0.2775000035762787},{"id":"https://openalex.org/keywords/link","display_name":"Link (geometry)","score":0.2759000062942505},{"id":"https://openalex.org/keywords/field","display_name":"Field (mathematics)","score":0.27390000224113464},{"id":"https://openalex.org/keywords/interconnection","display_name":"Interconnection","score":0.2709999978542328},{"id":"https://openalex.org/keywords/focus","display_name":"Focus (optics)","score":0.2671000063419342}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5874999761581421},{"id":"https://openalex.org/C168167062","wikidata":"https://www.wikidata.org/wiki/Q1117970","display_name":"Component (thermodynamics)","level":2,"score":0.2775000035762787},{"id":"https://openalex.org/C2778753846","wikidata":"https://www.wikidata.org/wiki/Q6554239","display_name":"Link (geometry)","level":2,"score":0.2759000062942505},{"id":"https://openalex.org/C9652623","wikidata":"https://www.wikidata.org/wiki/Q190109","display_name":"Field (mathematics)","level":2,"score":0.27390000224113464},{"id":"https://openalex.org/C123745756","wikidata":"https://www.wikidata.org/wiki/Q1665949","display_name":"Interconnection","level":2,"score":0.2709999978542328},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.2687000036239624},{"id":"https://openalex.org/C192209626","wikidata":"https://www.wikidata.org/wiki/Q190909","display_name":"Focus (optics)","level":2,"score":0.2671000063419342},{"id":"https://openalex.org/C26517878","wikidata":"https://www.wikidata.org/wiki/Q228039","display_name":"Key (lock)","level":2,"score":0.257099986076355},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.2551000118255615},{"id":"https://openalex.org/C2780009758","wikidata":"https://www.wikidata.org/wiki/Q6804172","display_name":"Measure (data warehouse)","level":2,"score":0.2485000044107437}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/vts69484.2026.11563200","is_oa":false,"landing_page_url":"https://doi.org/10.1109/vts69484.2026.11563200","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2026 IEEE 44th VLSI Test Symposium (VTS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[{"id":"https://openalex.org/F4320306087","display_name":"Semiconductor Research Corporation","ror":"https://ror.org/047z4n946"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":38,"referenced_works":["https://openalex.org/W2404942596","https://openalex.org/W2536483783","https://openalex.org/W2581875705","https://openalex.org/W2625666888","https://openalex.org/W2756703387","https://openalex.org/W2798312912","https://openalex.org/W2965759193","https://openalex.org/W2968622019","https://openalex.org/W3011296795","https://openalex.org/W3014360742","https://openalex.org/W3015247687","https://openalex.org/W3015587302","https://openalex.org/W3032908353","https://openalex.org/W3043252457","https://openalex.org/W3082788022","https://openalex.org/W3093933627","https://openalex.org/W3217372878","https://openalex.org/W4234937017","https://openalex.org/W4283702885","https://openalex.org/W4293023438","https://openalex.org/W4313142873","https://openalex.org/W4321608213","https://openalex.org/W4378195105","https://openalex.org/W4385392711","https://openalex.org/W4390415044","https://openalex.org/W4392084458","https://openalex.org/W4392502441","https://openalex.org/W4392746141","https://openalex.org/W4393145479","https://openalex.org/W4401881165","https://openalex.org/W4402303041","https://openalex.org/W4404739475","https://openalex.org/W4405440639","https://openalex.org/W4406793857","https://openalex.org/W4406894966","https://openalex.org/W4411713566","https://openalex.org/W4412082658","https://openalex.org/W4414648391"],"related_works":[],"abstract_inverted_index":null,"counts_by_year":[],"updated_date":"2026-07-29T14:22:42.915294","created_date":"2026-06-19T00:00:00"}