{"id":"https://openalex.org/W4411173267","doi":"https://doi.org/10.1109/vts65138.2025.11022902","title":"Test, Debug, and Repair for Chiplet-Based Designs","display_name":"Test, Debug, and Repair for Chiplet-Based Designs","publication_year":2025,"publication_date":"2025-04-28","ids":{"openalex":"https://openalex.org/W4411173267","doi":"https://doi.org/10.1109/vts65138.2025.11022902"},"language":"en","primary_location":{"id":"doi:10.1109/vts65138.2025.11022902","is_oa":false,"landing_page_url":"https://doi.org/10.1109/vts65138.2025.11022902","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2025 IEEE 43rd VLSI Test Symposium (VTS)","raw_type":"proceedings-article"},"type":"conference-abstract","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5041100073","display_name":"Anshuman Chandra","orcid":"https://orcid.org/0000-0002-2686-3918"},"institutions":[{"id":"https://openalex.org/I1325886976","display_name":"Siemens (Germany)","ror":"https://ror.org/059mq0909","country_code":"DE","type":"company","lineage":["https://openalex.org/I1325886976"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Anshuman Chandra","raw_affiliation_strings":["Siemens"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Siemens","institution_ids":["https://openalex.org/I1325886976"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5079323613","display_name":"Esteban Garita-Rodriguez","orcid":null},"institutions":[{"id":"https://openalex.org/I4210158342","display_name":"Intel (United Kingdom)","ror":"https://ror.org/058cxws58","country_code":"GB","type":"company","lineage":["https://openalex.org/I1343180700","https://openalex.org/I4210158342"]}],"countries":["GB"],"is_corresponding":false,"raw_author_name":"Esteban Garita-Rodriguez","raw_affiliation_strings":["Intel"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Intel","institution_ids":["https://openalex.org/I4210158342"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5102712249","display_name":"P. Ghosh","orcid":"https://orcid.org/0000-0002-6446-9612"},"institutions":[{"id":"https://openalex.org/I4210164937","display_name":"Microsoft Research (United Kingdom)","ror":"https://ror.org/05k87vq12","country_code":"GB","type":"company","lineage":["https://openalex.org/I1290206253","https://openalex.org/I4210164937"]}],"countries":["GB"],"is_corresponding":false,"raw_author_name":"Pradipta Ghosh","raw_affiliation_strings":["Microsoft"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Microsoft","institution_ids":["https://openalex.org/I4210164937"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":3,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":null,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":null,"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"1"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12971","display_name":"Material Properties and Processing","score":0.4668000042438507,"subfield":{"id":"https://openalex.org/subfields/2211","display_name":"Mechanics of Materials"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12971","display_name":"Material Properties and Processing","score":0.4668000042438507,"subfield":{"id":"https://openalex.org/subfields/2211","display_name":"Mechanics of Materials"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/debugging","display_name":"Debugging","score":0.7295803427696228},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6168147921562195},{"id":"https://openalex.org/keywords/test","display_name":"Test (biology)","score":0.6024661660194397},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.455244243144989},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.4412321150302887},{"id":"https://openalex.org/keywords/programming-language","display_name":"Programming language","score":0.3245689868927002},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.20314860343933105},{"id":"https://openalex.org/keywords/geology","display_name":"Geology","score":0.06872028112411499}],"concepts":[{"id":"https://openalex.org/C168065819","wikidata":"https://www.wikidata.org/wiki/Q845566","display_name":"Debugging","level":2,"score":0.7295803427696228},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6168147921562195},{"id":"https://openalex.org/C2777267654","wikidata":"https://www.wikidata.org/wiki/Q3519023","display_name":"Test (biology)","level":2,"score":0.6024661660194397},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.455244243144989},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.4412321150302887},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.3245689868927002},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.20314860343933105},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.06872028112411499},{"id":"https://openalex.org/C151730666","wikidata":"https://www.wikidata.org/wiki/Q7205","display_name":"Paleontology","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/vts65138.2025.11022902","is_oa":false,"landing_page_url":"https://doi.org/10.1109/vts65138.2025.11022902","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2025 IEEE 43rd VLSI Test Symposium (VTS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":0,"referenced_works":[],"related_works":["https://openalex.org/W4321442002","https://openalex.org/W2015265939","https://openalex.org/W2284072287","https://openalex.org/W2611067230","https://openalex.org/W2061417947","https://openalex.org/W2978026406","https://openalex.org/W1999657508","https://openalex.org/W2399091034","https://openalex.org/W2351581202","https://openalex.org/W2366922255"],"abstract_inverted_index":{"Chiplet-based":[0],"systems":[1,28],"introduce":[2],"new":[3],"challenges":[4,129],"in":[5,154],"test,":[6,76],"debug,":[7],"and":[8,12,47,78,81,115,120,130,137,156],"repair.":[9],"The":[10,68,123],"complexity":[11],"number":[13],"of":[14,19,70,83,102,118,140,151],"interconnects":[15,119],"increase":[16],"the":[17,39,75,106,113,138,144,149],"likelihood":[18],"defects,":[20],"necessitating":[21],"repair":[22,121],"strategies":[23],"to":[24,30,59,73,111,133,159],"prevent":[25],"discarding":[26],"expensive":[27],"due":[29],"a":[31,109],"few":[32],"faulty":[33],"interconnects.":[34],"To":[35],"address":[36,148],"these":[37,103],"challenges,":[38,104],"IEEE":[40,56,64],"P3405":[41,71],"\"Standard":[42],"for":[43,89,108],"Chiplet":[44],"Interconnect":[45],"Test":[46],"Repair\"":[48],"is":[49,72],"under":[50],"development.":[51],"This":[52,94],"standard,":[53],"originating":[54],"from":[55],"1838-2019,":[57],"aims":[58],"be":[60],"universally":[61],"applicable":[62],"beyond":[63],"1838-based":[65],"multi-die":[66],"designs.":[67],"goal":[69],"standardize":[74],"repair,":[77],"potentially":[79],"debug":[80],"diagnosis":[82],"interconnect":[84,135],"hardware":[85],"between":[86],"chiplets,":[87],"particularly":[88],"heterogeneous,":[90],"multi-vendor":[91],"integration":[92],"flows.":[93],"session":[95],"will":[96,126,147],"present":[97],"talks":[98],"covering":[99],"various":[100],"aspects":[101],"including":[105],"need":[107],"language":[110],"communicate":[112],"structural":[114],"functional":[116],"details":[117],"options.":[122],"second":[124],"presentation":[125],"focus":[127],"on":[128],"solutions":[131],"related":[132],"clock":[134],"testing":[136,150],"impact":[139],"high-speed":[141,161],"clocking.":[142],"Finally,":[143],"last":[145],"talk":[146],"analog":[152],"circuitry":[153],"chiplets":[155],"its":[157],"application":[158],"enable":[160],"communication.":[162]},"counts_by_year":[{"year":2025,"cited_by_count":1}],"updated_date":"2026-07-14T23:27:15.235271","created_date":"2025-10-10T00:00:00"}