{"id":"https://openalex.org/W4411172841","doi":"https://doi.org/10.1109/vts65138.2025.11022775","title":"Security Verification and Secure Testing Solutions","display_name":"Security Verification and Secure Testing Solutions","publication_year":2025,"publication_date":"2025-04-28","ids":{"openalex":"https://openalex.org/W4411172841","doi":"https://doi.org/10.1109/vts65138.2025.11022775"},"language":"en","primary_location":{"id":"doi:10.1109/vts65138.2025.11022775","is_oa":false,"landing_page_url":"https://doi.org/10.1109/vts65138.2025.11022775","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2025 IEEE 43rd VLSI Test Symposium (VTS)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5008154852","display_name":"Sohrab Aftabjahani","orcid":"https://orcid.org/0000-0001-8906-2934"},"institutions":[{"id":"https://openalex.org/I4210158342","display_name":"Intel (United Kingdom)","ror":"https://ror.org/058cxws58","country_code":"GB","type":"company","lineage":["https://openalex.org/I1343180700","https://openalex.org/I4210158342"]}],"countries":["GB"],"is_corresponding":false,"raw_author_name":"Sohrab Aftabjahani","raw_affiliation_strings":["Intel"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Intel","institution_ids":["https://openalex.org/I4210158342"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5055355246","display_name":"Wilson Pradeep","orcid":null},"institutions":[{"id":"https://openalex.org/I1291425158","display_name":"Google (United States)","ror":"https://ror.org/00njsd438","country_code":"US","type":"company","lineage":["https://openalex.org/I1291425158","https://openalex.org/I4210128969"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Wilson Pradeep","raw_affiliation_strings":["Google"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Google","institution_ids":["https://openalex.org/I1291425158"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.11511651,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"1"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10743","display_name":"Software Testing and Debugging Techniques","score":0.8499000072479248,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10743","display_name":"Software Testing and Debugging Techniques","score":0.8499000072479248,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11241","display_name":"Advanced Malware Detection Techniques","score":0.7462999820709229,"subfield":{"id":"https://openalex.org/subfields/1711","display_name":"Signal Processing"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12127","display_name":"Software System Performance and Reliability","score":0.6969000101089478,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7175995707511902},{"id":"https://openalex.org/keywords/computer-security","display_name":"Computer security","score":0.3487512469291687}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7175995707511902},{"id":"https://openalex.org/C38652104","wikidata":"https://www.wikidata.org/wiki/Q3510521","display_name":"Computer security","level":1,"score":0.3487512469291687}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/vts65138.2025.11022775","is_oa":false,"landing_page_url":"https://doi.org/10.1109/vts65138.2025.11022775","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2025 IEEE 43rd VLSI Test Symposium (VTS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":0,"referenced_works":[],"related_works":["https://openalex.org/W4391375266","https://openalex.org/W2899084033","https://openalex.org/W2748952813","https://openalex.org/W2390279801","https://openalex.org/W4391913857","https://openalex.org/W2358668433","https://openalex.org/W4396701345","https://openalex.org/W2376932109","https://openalex.org/W2001405890","https://openalex.org/W4396696052"],"abstract_inverted_index":{"Hardware":[0],"security":[1,19,33,59,72],"is":[2,11,20],"no":[3,42],"longer":[4],"a":[5],"\"nice":[6],"to":[7],"have\"":[8],"capability;":[9],"it":[10],"required":[12],"for":[13,61,67],"many":[14],"types":[15],"of":[16,24],"designs.":[17],"Ensuring":[18],"mandatory":[21],"as":[22],"part":[23],"the":[25,46],"chip":[26],"development":[27],"process.":[28],"Chip":[29],"designers":[30],"must":[31,39],"take":[32],"into":[34],"account":[35],"and":[36,64,70],"verification":[37,65,73],"engineers":[38],"check":[40],"that":[41,75],"vulnerabilities":[43],"exist":[44],"in":[45,53],"RTL":[47],"design.":[48],"Synopsys":[49,76],"provides":[50],"unparalleled":[51],"functionality":[52],"this":[54],"domain.":[55],"This":[56],"talk":[57],"covers":[58],"overview":[60],"hardware,":[62],"design":[63],"needs":[66],"secure":[68],"semiconductors":[69],"briefs":[71],"solutions":[74],"offers.":[77]},"counts_by_year":[],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}