{"id":"https://openalex.org/W4399120068","doi":"https://doi.org/10.1109/vts60656.2024.10538743","title":"Customizing ATPG User-Defined Stresses and Tests To Target Cell-Neighborhood-Bridging Defects","display_name":"Customizing ATPG User-Defined Stresses and Tests To Target Cell-Neighborhood-Bridging Defects","publication_year":2024,"publication_date":"2024-04-22","ids":{"openalex":"https://openalex.org/W4399120068","doi":"https://doi.org/10.1109/vts60656.2024.10538743"},"language":"en","primary_location":{"id":"doi:10.1109/vts60656.2024.10538743","is_oa":false,"landing_page_url":"https://doi.org/10.1109/vts60656.2024.10538743","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2024 IEEE 42nd VLSI Test Symposium (VTS)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5098922956","display_name":"Stephen Traynor","orcid":null},"institutions":[{"id":"https://openalex.org/I74760111","display_name":"Texas Instruments (United States)","ror":"https://ror.org/03vsmv677","country_code":"US","type":"company","lineage":["https://openalex.org/I74760111"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Stephen Traynor","raw_affiliation_strings":["NXP Semiconductors, 6501 W. William Cannon Drive,Austin,TX,78735"],"affiliations":[{"raw_affiliation_string":"NXP Semiconductors, 6501 W. William Cannon Drive,Austin,TX,78735","institution_ids":["https://openalex.org/I74760111"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5104195160","display_name":"Saidapet Ramesh","orcid":null},"institutions":[{"id":"https://openalex.org/I74760111","display_name":"Texas Instruments (United States)","ror":"https://ror.org/03vsmv677","country_code":"US","type":"company","lineage":["https://openalex.org/I74760111"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Saidapet Ramesh","raw_affiliation_strings":["NXP Semiconductors, 6501 W. William Cannon Drive,Austin,TX,78735"],"affiliations":[{"raw_affiliation_string":"NXP Semiconductors, 6501 W. William Cannon Drive,Austin,TX,78735","institution_ids":["https://openalex.org/I74760111"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5098922957","display_name":"Maryfe Hernandez","orcid":null},"institutions":[{"id":"https://openalex.org/I74760111","display_name":"Texas Instruments (United States)","ror":"https://ror.org/03vsmv677","country_code":"US","type":"company","lineage":["https://openalex.org/I74760111"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Maryfe Hernandez","raw_affiliation_strings":["NXP Semiconductors, 6501 W. William Cannon Drive,Austin,TX,78735"],"affiliations":[{"raw_affiliation_string":"NXP Semiconductors, 6501 W. William Cannon Drive,Austin,TX,78735","institution_ids":["https://openalex.org/I74760111"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5098922958","display_name":"Lawrence Herr","orcid":null},"institutions":[{"id":"https://openalex.org/I74760111","display_name":"Texas Instruments (United States)","ror":"https://ror.org/03vsmv677","country_code":"US","type":"company","lineage":["https://openalex.org/I74760111"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Lawrence Herr","raw_affiliation_strings":["NXP Semiconductors, 6501 W. William Cannon Drive,Austin,TX,78735"],"affiliations":[{"raw_affiliation_string":"NXP Semiconductors, 6501 W. William Cannon Drive,Austin,TX,78735","institution_ids":["https://openalex.org/I74760111"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5113232096","display_name":"Scott Chen","orcid":null},"institutions":[{"id":"https://openalex.org/I74760111","display_name":"Texas Instruments (United States)","ror":"https://ror.org/03vsmv677","country_code":"US","type":"company","lineage":["https://openalex.org/I74760111"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Scott Chen","raw_affiliation_strings":["NXP Semiconductors, 6501 W. William Cannon Drive,Austin,TX,78735"],"affiliations":[{"raw_affiliation_string":"NXP Semiconductors, 6501 W. William Cannon Drive,Austin,TX,78735","institution_ids":["https://openalex.org/I74760111"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5098922956"],"corresponding_institution_ids":["https://openalex.org/I74760111"],"apc_list":null,"apc_paid":null,"fwci":0.2225,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.49152018,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":91,"max":95},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"5"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12495","display_name":"Electrostatic Discharge in Electronics","score":0.9987999796867371,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/bridging","display_name":"Bridging (networking)","score":0.8599892854690552},{"id":"https://openalex.org/keywords/resistive-touchscreen","display_name":"Resistive touchscreen","score":0.6671410799026489},{"id":"https://openalex.org/keywords/wafer","display_name":"Wafer","score":0.6409705877304077},{"id":"https://openalex.org/keywords/limiting","display_name":"Limiting","score":0.6037388443946838},{"id":"https://openalex.org/keywords/automatic-test-pattern-generation","display_name":"Automatic test pattern generation","score":0.5686221718788147},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.5383995175361633},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.49884676933288574},{"id":"https://openalex.org/keywords/logic-gate","display_name":"Logic gate","score":0.45876947045326233},{"id":"https://openalex.org/keywords/fault-coverage","display_name":"Fault coverage","score":0.44590768218040466},{"id":"https://openalex.org/keywords/automotive-industry","display_name":"Automotive industry","score":0.4295057952404022},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.384167343378067},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.3840734660625458},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.32820767164230347},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.32501593232154846},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.26465263962745667},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.24205759167671204},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.17627519369125366},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.15955576300621033},{"id":"https://openalex.org/keywords/mechanical-engineering","display_name":"Mechanical engineering","score":0.1558031141757965},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.09352746605873108},{"id":"https://openalex.org/keywords/computer-vision","display_name":"Computer vision","score":0.09148508310317993}],"concepts":[{"id":"https://openalex.org/C174348530","wikidata":"https://www.wikidata.org/wiki/Q188635","display_name":"Bridging (networking)","level":2,"score":0.8599892854690552},{"id":"https://openalex.org/C6899612","wikidata":"https://www.wikidata.org/wiki/Q852911","display_name":"Resistive touchscreen","level":2,"score":0.6671410799026489},{"id":"https://openalex.org/C160671074","wikidata":"https://www.wikidata.org/wiki/Q267131","display_name":"Wafer","level":2,"score":0.6409705877304077},{"id":"https://openalex.org/C188198153","wikidata":"https://www.wikidata.org/wiki/Q1613840","display_name":"Limiting","level":2,"score":0.6037388443946838},{"id":"https://openalex.org/C17626397","wikidata":"https://www.wikidata.org/wiki/Q837455","display_name":"Automatic test pattern generation","level":3,"score":0.5686221718788147},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.5383995175361633},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.49884676933288574},{"id":"https://openalex.org/C131017901","wikidata":"https://www.wikidata.org/wiki/Q170451","display_name":"Logic gate","level":2,"score":0.45876947045326233},{"id":"https://openalex.org/C126953365","wikidata":"https://www.wikidata.org/wiki/Q5438152","display_name":"Fault coverage","level":3,"score":0.44590768218040466},{"id":"https://openalex.org/C526921623","wikidata":"https://www.wikidata.org/wiki/Q190117","display_name":"Automotive industry","level":2,"score":0.4295057952404022},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.384167343378067},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.3840734660625458},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.32820767164230347},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.32501593232154846},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.26465263962745667},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.24205759167671204},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.17627519369125366},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.15955576300621033},{"id":"https://openalex.org/C78519656","wikidata":"https://www.wikidata.org/wiki/Q101333","display_name":"Mechanical engineering","level":1,"score":0.1558031141757965},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.09352746605873108},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.09148508310317993},{"id":"https://openalex.org/C146978453","wikidata":"https://www.wikidata.org/wiki/Q3798668","display_name":"Aerospace engineering","level":1,"score":0.0},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C31258907","wikidata":"https://www.wikidata.org/wiki/Q1301371","display_name":"Computer network","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/vts60656.2024.10538743","is_oa":false,"landing_page_url":"https://doi.org/10.1109/vts60656.2024.10538743","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2024 IEEE 42nd VLSI Test Symposium (VTS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":11,"referenced_works":["https://openalex.org/W2542038790","https://openalex.org/W2735572146","https://openalex.org/W2911433171","https://openalex.org/W3038765653","https://openalex.org/W3124406777","https://openalex.org/W4200256850","https://openalex.org/W4312253616","https://openalex.org/W4312261428","https://openalex.org/W4312536027","https://openalex.org/W4312671979","https://openalex.org/W4379115662"],"related_works":["https://openalex.org/W2091833418","https://openalex.org/W2913077774","https://openalex.org/W4256030018","https://openalex.org/W2145089576","https://openalex.org/W2021253405","https://openalex.org/W1986228509","https://openalex.org/W2147400189","https://openalex.org/W1600468096","https://openalex.org/W2340957901","https://openalex.org/W1991935474"],"abstract_inverted_index":{"Cell-neighbor-bridging":[0],"defects":[1],"between":[2],"logic":[3],"and":[4,32,37,48,63,85,99,104,127,136,142],"filler":[5],"cells":[6],"were":[7,43],"detected":[8],"on":[9,73],"an":[10,22],"automotive":[11],"design":[12],"after":[13],"a":[14,80,133],"highly":[15,69],"resistive":[16,70],"short":[17],"defect":[18,148],"was":[19],"activated":[20],"during":[21,149],"internal":[23],"reliability":[24],"assessment,":[25],"having":[26],"previously":[27],"passed":[28],"all":[29,87],"wafer":[30,54],"probe":[31,55],"package":[33],"Final":[34],"Test":[35],"stresses":[36],"screens.":[38],"The":[39,77],"impacted":[40],"cell\u2019s":[41],"nodes":[42],"confirmed":[44],"to":[45,61,113,139],"be":[46],"stressed":[47],"tested":[49],"as":[50],"intended":[51],"at":[52],"the":[53,65,68,74,90,95,116,121,124,146],"insertion,":[56],"but":[57],"not":[58],"sufficiently":[59],"enough":[60],"activate":[62],"observe":[64],"effect":[66],"of":[67,89,97,101,123,145],"defect\u2019s":[71],"impact":[72],"circuit":[75],"behavior.":[76],"paper":[78],"discusses":[79],"new":[81,102],"methodology":[82],"that":[83],"identified":[84],"located":[86],"instantiations":[88],"affected":[91,117],"cell":[92,118],"combinations":[93],"in":[94,129],"sea":[96],"gates,":[98],"development":[100],"stress":[103,126],"test":[105,128,151],"stimuli":[106],"using":[107],"User":[108],"Define":[109],"Fault":[110],"Models":[111],"(UDFM)":[112],"target":[114],"only":[115],"combinations.":[119],"Limiting":[120],"reach":[122],"enhanced":[125],"this":[130],"way":[131],"enabled":[132],"cost":[134],"effective":[135],"high-quality":[137],"solution":[138],"accelerate":[140],"activation":[141],"improve":[143],"detectability":[144],"latent":[147],"silicon":[150],"flows.":[152]},"counts_by_year":[{"year":2025,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}