{"id":"https://openalex.org/W4379115681","doi":"https://doi.org/10.1109/vts56346.2023.10140103","title":"IP Session on Chiplet: Design, Assembly, and Test","display_name":"IP Session on Chiplet: Design, Assembly, and Test","publication_year":2023,"publication_date":"2023-04-24","ids":{"openalex":"https://openalex.org/W4379115681","doi":"https://doi.org/10.1109/vts56346.2023.10140103"},"language":"en","primary_location":{"id":"doi:10.1109/vts56346.2023.10140103","is_oa":false,"landing_page_url":"http://dx.doi.org/10.1109/vts56346.2023.10140103","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2023 IEEE 41st VLSI Test Symposium (VTS)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5057754531","display_name":"B. Vinnakota","orcid":null},"institutions":[{"id":"https://openalex.org/I148283060","display_name":"Lawrence Berkeley National Laboratory","ror":"https://ror.org/02jbv0t02","country_code":"US","type":"facility","lineage":["https://openalex.org/I1330989302","https://openalex.org/I148283060","https://openalex.org/I39565521"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Bapi Vinnakota","raw_affiliation_strings":["Lawrence Berkely Labs,Berkeley,CA,USA","Lawrence Berkely Labs, Berkeley, CA, USA"],"affiliations":[{"raw_affiliation_string":"Lawrence Berkely Labs,Berkeley,CA,USA","institution_ids":["https://openalex.org/I148283060"]},{"raw_affiliation_string":"Lawrence Berkely Labs, Berkeley, CA, USA","institution_ids":["https://openalex.org/I148283060"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5001763918","display_name":"Jaber Derakhshandeh","orcid":"https://orcid.org/0000-0003-2448-9165"},"institutions":[{"id":"https://openalex.org/I4210114974","display_name":"IMEC","ror":"https://ror.org/02kcbn207","country_code":"BE","type":"nonprofit","lineage":["https://openalex.org/I4210114974"]}],"countries":["BE"],"is_corresponding":false,"raw_author_name":"Jaber Derakhshandeh","raw_affiliation_strings":["IMEC,Leuven,Belgium,3001"],"affiliations":[{"raw_affiliation_string":"IMEC,Leuven,Belgium,3001","institution_ids":["https://openalex.org/I4210114974"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5051712390","display_name":"Eric Beyne","orcid":"https://orcid.org/0000-0002-3096-050X"},"institutions":[{"id":"https://openalex.org/I4210114974","display_name":"IMEC","ror":"https://ror.org/02kcbn207","country_code":"BE","type":"nonprofit","lineage":["https://openalex.org/I4210114974"]}],"countries":["BE"],"is_corresponding":false,"raw_author_name":"Eric Beyne","raw_affiliation_strings":["IMEC,Leuven,Belgium,3001"],"affiliations":[{"raw_affiliation_string":"IMEC,Leuven,Belgium,3001","institution_ids":["https://openalex.org/I4210114974"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5044629739","display_name":"Erik Jan Marinissen","orcid":"https://orcid.org/0000-0002-5058-8303"},"institutions":[{"id":"https://openalex.org/I4210114974","display_name":"IMEC","ror":"https://ror.org/02kcbn207","country_code":"BE","type":"nonprofit","lineage":["https://openalex.org/I4210114974"]}],"countries":["BE"],"is_corresponding":false,"raw_author_name":"Erik Jan Marinissen","raw_affiliation_strings":["IMEC,Leuven,Belgium,3001"],"affiliations":[{"raw_affiliation_string":"IMEC,Leuven,Belgium,3001","institution_ids":["https://openalex.org/I4210114974"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5102184443","display_name":"Sreejit Chakravarty","orcid":null},"institutions":[{"id":"https://openalex.org/I51504820","display_name":"San Jose State University","ror":"https://ror.org/04qyvz380","country_code":"US","type":"education","lineage":["https://openalex.org/I51504820"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Sreejit Chakravarty","raw_affiliation_strings":["San Jose,CA,USA","San Jose, CA, USA"],"affiliations":[{"raw_affiliation_string":"San Jose,CA,USA","institution_ids":["https://openalex.org/I51504820"]},{"raw_affiliation_string":"San Jose, CA, USA","institution_ids":[]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5057754531"],"corresponding_institution_ids":["https://openalex.org/I148283060"],"apc_list":null,"apc_paid":null,"fwci":0.1339,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.41362923,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":91,"max":95},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"1"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9994000196456909,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9994000196456909,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9980000257492065,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11527","display_name":"3D IC and TSV technologies","score":0.9962000250816345,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/session","display_name":"Session (web analytics)","score":0.9087671041488647},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6947754621505737},{"id":"https://openalex.org/keywords/test","display_name":"Test (biology)","score":0.5822560787200928},{"id":"https://openalex.org/keywords/presentation","display_name":"Presentation (obstetrics)","score":0.49121469259262085},{"id":"https://openalex.org/keywords/world-wide-web","display_name":"World Wide Web","score":0.13046717643737793},{"id":"https://openalex.org/keywords/medicine","display_name":"Medicine","score":0.05951094627380371},{"id":"https://openalex.org/keywords/geology","display_name":"Geology","score":0.053311049938201904}],"concepts":[{"id":"https://openalex.org/C2779182362","wikidata":"https://www.wikidata.org/wiki/Q17126187","display_name":"Session (web analytics)","level":2,"score":0.9087671041488647},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6947754621505737},{"id":"https://openalex.org/C2777267654","wikidata":"https://www.wikidata.org/wiki/Q3519023","display_name":"Test (biology)","level":2,"score":0.5822560787200928},{"id":"https://openalex.org/C2777601897","wikidata":"https://www.wikidata.org/wiki/Q3409113","display_name":"Presentation (obstetrics)","level":2,"score":0.49121469259262085},{"id":"https://openalex.org/C136764020","wikidata":"https://www.wikidata.org/wiki/Q466","display_name":"World Wide Web","level":1,"score":0.13046717643737793},{"id":"https://openalex.org/C71924100","wikidata":"https://www.wikidata.org/wiki/Q11190","display_name":"Medicine","level":0,"score":0.05951094627380371},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.053311049938201904},{"id":"https://openalex.org/C126838900","wikidata":"https://www.wikidata.org/wiki/Q77604","display_name":"Radiology","level":1,"score":0.0},{"id":"https://openalex.org/C151730666","wikidata":"https://www.wikidata.org/wiki/Q7205","display_name":"Paleontology","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/vts56346.2023.10140103","is_oa":false,"landing_page_url":"http://dx.doi.org/10.1109/vts56346.2023.10140103","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2023 IEEE 41st VLSI Test Symposium (VTS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":1,"referenced_works":["https://openalex.org/W3137731892"],"related_works":["https://openalex.org/W2748952813","https://openalex.org/W4296749040","https://openalex.org/W4230197055","https://openalex.org/W621808327","https://openalex.org/W644007644","https://openalex.org/W3012257603","https://openalex.org/W3177475962","https://openalex.org/W1586784764","https://openalex.org/W4292264782","https://openalex.org/W1994177189"],"abstract_inverted_index":{"This":[0],"IP":[1],"session":[2],"will":[3],"consist":[4],"of":[5,10],"three":[6],"presentations.":[7],"A":[8],"summary":[9],"each":[11],"presentation":[12],"is":[13],"given":[14],"below.":[15]},"counts_by_year":[{"year":2025,"cited_by_count":1}],"updated_date":"2025-12-23T23:11:35.936235","created_date":"2025-10-10T00:00:00"}