{"id":"https://openalex.org/W4379115643","doi":"https://doi.org/10.1109/vts56346.2023.10140039","title":"Test Generation for Defect-Based Faults of Scan Flip-Flops","display_name":"Test Generation for Defect-Based Faults of Scan Flip-Flops","publication_year":2023,"publication_date":"2023-04-24","ids":{"openalex":"https://openalex.org/W4379115643","doi":"https://doi.org/10.1109/vts56346.2023.10140039"},"language":"en","primary_location":{"id":"doi:10.1109/vts56346.2023.10140039","is_oa":false,"landing_page_url":"https://doi.org/10.1109/vts56346.2023.10140039","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2023 IEEE 41st VLSI Test Symposium (VTS)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5057582360","display_name":"Yu-Teng Nien","orcid":"https://orcid.org/0000-0002-6549-1918"},"institutions":[{"id":"https://openalex.org/I148366613","display_name":"National Yang Ming Chiao Tung University","ror":"https://ror.org/00se2k293","country_code":"TW","type":"education","lineage":["https://openalex.org/I148366613"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Yu-Teng Nien","raw_affiliation_strings":["Institute of Electronics, National Yang Ming Chiao Tung University,Hsinchu,Taiwan","Institute of Electronics, National Yang Ming Chiao Tung University, Hsinchu, Taiwan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Institute of Electronics, National Yang Ming Chiao Tung University,Hsinchu,Taiwan","institution_ids":["https://openalex.org/I148366613"]},{"raw_affiliation_string":"Institute of Electronics, National Yang Ming Chiao Tung University, Hsinchu, Taiwan","institution_ids":["https://openalex.org/I148366613"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5029887661","display_name":"Chenhong Li","orcid":"https://orcid.org/0000-0003-3075-1756"},"institutions":[{"id":"https://openalex.org/I148366613","display_name":"National Yang Ming Chiao Tung University","ror":"https://ror.org/00se2k293","country_code":"TW","type":"education","lineage":["https://openalex.org/I148366613"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Chen-Hong Li","raw_affiliation_strings":["Institute of Electronics, National Yang Ming Chiao Tung University,Hsinchu,Taiwan","Institute of Electronics, National Yang Ming Chiao Tung University, Hsinchu, Taiwan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Institute of Electronics, National Yang Ming Chiao Tung University,Hsinchu,Taiwan","institution_ids":["https://openalex.org/I148366613"]},{"raw_affiliation_string":"Institute of Electronics, National Yang Ming Chiao Tung University, Hsinchu, Taiwan","institution_ids":["https://openalex.org/I148366613"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5108840677","display_name":"P.J. Wu","orcid":null},"institutions":[{"id":"https://openalex.org/I148366613","display_name":"National Yang Ming Chiao Tung University","ror":"https://ror.org/00se2k293","country_code":"TW","type":"education","lineage":["https://openalex.org/I148366613"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Pei-Yin Wu","raw_affiliation_strings":["Institute of Electronics, National Yang Ming Chiao Tung University,Hsinchu,Taiwan","Institute of Electronics, National Yang Ming Chiao Tung University, Hsinchu, Taiwan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Institute of Electronics, National Yang Ming Chiao Tung University,Hsinchu,Taiwan","institution_ids":["https://openalex.org/I148366613"]},{"raw_affiliation_string":"Institute of Electronics, National Yang Ming Chiao Tung University, Hsinchu, Taiwan","institution_ids":["https://openalex.org/I148366613"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5109610731","display_name":"Y.-C. Wang","orcid":null},"institutions":[{"id":"https://openalex.org/I148366613","display_name":"National Yang Ming Chiao Tung University","ror":"https://ror.org/00se2k293","country_code":"TW","type":"education","lineage":["https://openalex.org/I148366613"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Yung-Jheng Wang","raw_affiliation_strings":["Institute of Electronics, National Yang Ming Chiao Tung University,Hsinchu,Taiwan","Institute of Electronics, National Yang Ming Chiao Tung University, Hsinchu, Taiwan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Institute of Electronics, National Yang Ming Chiao Tung University,Hsinchu,Taiwan","institution_ids":["https://openalex.org/I148366613"]},{"raw_affiliation_string":"Institute of Electronics, National Yang Ming Chiao Tung University, Hsinchu, Taiwan","institution_ids":["https://openalex.org/I148366613"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5109999808","display_name":"Kai\u2013Chiang Wu","orcid":null},"institutions":[{"id":"https://openalex.org/I148366613","display_name":"National Yang Ming Chiao Tung University","ror":"https://ror.org/00se2k293","country_code":"TW","type":"education","lineage":["https://openalex.org/I148366613"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Kai-Chiang Wu","raw_affiliation_strings":["National Yang Ming Chiao Tung University,Department of Computer Science,Hsinchu,Taiwan","Department of Computer Science, National Yang Ming Chiao Tung University, Hsinchu, Taiwan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"National Yang Ming Chiao Tung University,Department of Computer Science,Hsinchu,Taiwan","institution_ids":["https://openalex.org/I148366613"]},{"raw_affiliation_string":"Department of Computer Science, National Yang Ming Chiao Tung University, Hsinchu, Taiwan","institution_ids":["https://openalex.org/I148366613"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5045156360","display_name":"Mango C.-T. Chao","orcid":"https://orcid.org/0000-0002-7299-9015"},"institutions":[{"id":"https://openalex.org/I148366613","display_name":"National Yang Ming Chiao Tung University","ror":"https://ror.org/00se2k293","country_code":"TW","type":"education","lineage":["https://openalex.org/I148366613"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Mango C.-T. Chao","raw_affiliation_strings":["Institute of Electronics, National Yang Ming Chiao Tung University,Hsinchu,Taiwan","Institute of Electronics, National Yang Ming Chiao Tung University, Hsinchu, Taiwan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Institute of Electronics, National Yang Ming Chiao Tung University,Hsinchu,Taiwan","institution_ids":["https://openalex.org/I148366613"]},{"raw_affiliation_string":"Institute of Electronics, National Yang Ming Chiao Tung University, Hsinchu, Taiwan","institution_ids":["https://openalex.org/I148366613"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":6,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.2454,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":{"value":0.51287958,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":95},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"7"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9979000091552734,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/scan-chain","display_name":"Scan chain","score":0.8137480020523071},{"id":"https://openalex.org/keywords/automatic-test-pattern-generation","display_name":"Automatic test pattern generation","score":0.7834734916687012},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6632865071296692},{"id":"https://openalex.org/keywords/flops","display_name":"FLOPS","score":0.6402592062950134},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.5347496867179871},{"id":"https://openalex.org/keywords/flip","display_name":"Flip","score":0.48923802375793457},{"id":"https://openalex.org/keywords/fault-coverage","display_name":"Fault coverage","score":0.4836062490940094},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.451994925737381},{"id":"https://openalex.org/keywords/real-time-computing","display_name":"Real-time computing","score":0.3769545555114746},{"id":"https://openalex.org/keywords/parallel-computing","display_name":"Parallel computing","score":0.30072614550590515},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.2074204981327057},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.15209481120109558},{"id":"https://openalex.org/keywords/integrated-circuit","display_name":"Integrated circuit","score":0.13575857877731323},{"id":"https://openalex.org/keywords/chemistry","display_name":"Chemistry","score":0.12301686406135559},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.07984945178031921}],"concepts":[{"id":"https://openalex.org/C150012182","wikidata":"https://www.wikidata.org/wiki/Q225990","display_name":"Scan chain","level":3,"score":0.8137480020523071},{"id":"https://openalex.org/C17626397","wikidata":"https://www.wikidata.org/wiki/Q837455","display_name":"Automatic test pattern generation","level":3,"score":0.7834734916687012},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6632865071296692},{"id":"https://openalex.org/C3826847","wikidata":"https://www.wikidata.org/wiki/Q188768","display_name":"FLOPS","level":2,"score":0.6402592062950134},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.5347496867179871},{"id":"https://openalex.org/C2776591724","wikidata":"https://www.wikidata.org/wiki/Q5459651","display_name":"Flip","level":3,"score":0.48923802375793457},{"id":"https://openalex.org/C126953365","wikidata":"https://www.wikidata.org/wiki/Q5438152","display_name":"Fault coverage","level":3,"score":0.4836062490940094},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.451994925737381},{"id":"https://openalex.org/C79403827","wikidata":"https://www.wikidata.org/wiki/Q3988","display_name":"Real-time computing","level":1,"score":0.3769545555114746},{"id":"https://openalex.org/C173608175","wikidata":"https://www.wikidata.org/wiki/Q232661","display_name":"Parallel computing","level":1,"score":0.30072614550590515},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.2074204981327057},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.15209481120109558},{"id":"https://openalex.org/C530198007","wikidata":"https://www.wikidata.org/wiki/Q80831","display_name":"Integrated circuit","level":2,"score":0.13575857877731323},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.12301686406135559},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.07984945178031921},{"id":"https://openalex.org/C55493867","wikidata":"https://www.wikidata.org/wiki/Q7094","display_name":"Biochemistry","level":1,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C190283241","wikidata":"https://www.wikidata.org/wiki/Q14599311","display_name":"Apoptosis","level":2,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/vts56346.2023.10140039","is_oa":false,"landing_page_url":"https://doi.org/10.1109/vts56346.2023.10140039","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2023 IEEE 41st VLSI Test Symposium (VTS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":17,"referenced_works":["https://openalex.org/W1987736596","https://openalex.org/W2008990681","https://openalex.org/W2086926157","https://openalex.org/W2108361034","https://openalex.org/W2112559786","https://openalex.org/W2127984980","https://openalex.org/W2142308491","https://openalex.org/W2142934491","https://openalex.org/W2151096779","https://openalex.org/W2167236639","https://openalex.org/W2168662307","https://openalex.org/W2170907629","https://openalex.org/W2550020175","https://openalex.org/W2890356968","https://openalex.org/W2926843349","https://openalex.org/W3147443654","https://openalex.org/W6685529102"],"related_works":["https://openalex.org/W2364150359","https://openalex.org/W2075356617","https://openalex.org/W2118952760","https://openalex.org/W2157726388","https://openalex.org/W2408214455","https://openalex.org/W2390529848","https://openalex.org/W2073042086","https://openalex.org/W2789883751","https://openalex.org/W2019719714","https://openalex.org/W2129591317"],"abstract_inverted_index":{"When":[0],"testing":[1],"scan":[2,15,31,40,70],"flip-flops":[3],"(SFFs),":[4],"chain":[5,48,87,93],"test":[6,49,174],"is":[7],"first":[8],"applied":[9],"to":[10,18,64,176],"ensure":[11],"the":[12,20,67,83,90,100],"functionality":[13],"of":[14,22,133],"chains":[16],"and":[17,25,53,77,114,167,170],"detect":[19],"majority":[21],"stuck-at":[23],"(SA)":[24],"transition":[26],"delay":[27],"(TD)":[28],"faults":[29,81,98,118,132,159],"along":[30],"paths.":[32],"However,":[33],"there":[34],"still":[35],"exist":[36],"some":[37],"defects":[38,68,84,91,101],"inside":[39,69],"cells":[41],"that":[42,156],"cannot":[43,160],"be":[44,161],"effectively":[45],"detected":[46],"by":[47,86,164],"or":[50],"conventional":[51,165],"SA":[52,166],"TD":[54,168],"patterns.":[55],"This":[56],"paper":[57],"presents":[58],"five":[59],"cell-aware":[60],"(CA)":[61],"fault":[62],"models":[63],"explicitly":[65],"target":[66,99,119],"flip-flops.":[71],"The":[72,129],"proposed":[73,158],"static":[74,95,111],"shift":[75,79],"(SS)":[76],"dynamic":[78,115],"(DS)":[80],"identify":[82],"detectable":[85,102,121],"test.":[88],"For":[89],"escaping":[92],"test,":[94],"single-capture":[96],"(SSC)":[97],"when":[103,122],"SFFs":[104,123,134],"are":[105,124,135],"in":[106,125,137],"one-cycle":[107],"capture":[108,127],"mode,":[109],"while":[110],"double-capture":[112,116],"(SDC)":[113],"(DDC)":[117],"those":[120],"two-cycle":[126],"mode.":[128],"identified":[130],"CA":[131],"output":[136],"a":[138,142],"format":[139],"compatible":[140],"with":[141],"commercial":[143],"ATPG":[144],"tool":[145],"for":[146],"pattern":[147],"generation.":[148],"Experimental":[149],"results":[150],"on":[151],"large":[152],"IWLS05":[153],"benchmarks":[154],"demonstrate":[155],"our":[157],"fully":[162],"covered":[163],"patterns":[169,175],"hence":[171],"require":[172],"dedicated":[173],"detect.":[177]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2024,"cited_by_count":1}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}