{"id":"https://openalex.org/W4379115638","doi":"https://doi.org/10.1109/vts56346.2023.10140005","title":"Machine Learning-Based Adaptive Outlier Detection for Underkill Reduction in Analog/RF IC Testing","display_name":"Machine Learning-Based Adaptive Outlier Detection for Underkill Reduction in Analog/RF IC Testing","publication_year":2023,"publication_date":"2023-04-24","ids":{"openalex":"https://openalex.org/W4379115638","doi":"https://doi.org/10.1109/vts56346.2023.10140005"},"language":"en","primary_location":{"id":"doi:10.1109/vts56346.2023.10140005","is_oa":false,"landing_page_url":"https://doi.org/10.1109/vts56346.2023.10140005","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2023 IEEE 41st VLSI Test Symposium (VTS)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5103129664","display_name":"V. A. Niranjan","orcid":null},"institutions":[{"id":"https://openalex.org/I162577319","display_name":"The University of Texas at Dallas","ror":"https://ror.org/049emcs32","country_code":"US","type":"education","lineage":["https://openalex.org/I162577319"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"V.A Niranjan","raw_affiliation_strings":["The University of Texas at Dallas,Department of Electrical and Computer Engineering,Richardson,TX,USA,75080"],"affiliations":[{"raw_affiliation_string":"The University of Texas at Dallas,Department of Electrical and Computer Engineering,Richardson,TX,USA,75080","institution_ids":["https://openalex.org/I162577319"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5029881698","display_name":"D. Neethirajan","orcid":null},"institutions":[{"id":"https://openalex.org/I162577319","display_name":"The University of Texas at Dallas","ror":"https://ror.org/049emcs32","country_code":"US","type":"education","lineage":["https://openalex.org/I162577319"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"D. Neethirajan","raw_affiliation_strings":["The University of Texas at Dallas,Department of Electrical and Computer Engineering,Richardson,TX,USA,75080"],"affiliations":[{"raw_affiliation_string":"The University of Texas at Dallas,Department of Electrical and Computer Engineering,Richardson,TX,USA,75080","institution_ids":["https://openalex.org/I162577319"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5073120036","display_name":"Constantinos Xanthopoulos","orcid":null},"institutions":[{"id":"https://openalex.org/I162577319","display_name":"The University of Texas at Dallas","ror":"https://ror.org/049emcs32","country_code":"US","type":"education","lineage":["https://openalex.org/I162577319"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"C. Xanthopoulos","raw_affiliation_strings":["The University of Texas at Dallas,Department of Electrical and Computer Engineering,Richardson,TX,USA,75080"],"affiliations":[{"raw_affiliation_string":"The University of Texas at Dallas,Department of Electrical and Computer Engineering,Richardson,TX,USA,75080","institution_ids":["https://openalex.org/I162577319"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5056193640","display_name":"Dallas Webster","orcid":null},"institutions":[{"id":"https://openalex.org/I74760111","display_name":"Texas Instruments (United States)","ror":"https://ror.org/03vsmv677","country_code":"US","type":"company","lineage":["https://openalex.org/I74760111"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"D. Webster","raw_affiliation_strings":["Texas Instruments Inc.,Dallas,TX,75243"],"affiliations":[{"raw_affiliation_string":"Texas Instruments Inc.,Dallas,TX,75243","institution_ids":["https://openalex.org/I74760111"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5111905813","display_name":"Amit Nahar","orcid":null},"institutions":[{"id":"https://openalex.org/I74760111","display_name":"Texas Instruments (United States)","ror":"https://ror.org/03vsmv677","country_code":"US","type":"company","lineage":["https://openalex.org/I74760111"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"A. Nahar","raw_affiliation_strings":["Texas Instruments Inc.,Dallas,TX,75243"],"affiliations":[{"raw_affiliation_string":"Texas Instruments Inc.,Dallas,TX,75243","institution_ids":["https://openalex.org/I74760111"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5078818440","display_name":"Yiorgos Makris","orcid":"https://orcid.org/0000-0002-4322-0068"},"institutions":[{"id":"https://openalex.org/I162577319","display_name":"The University of Texas at Dallas","ror":"https://ror.org/049emcs32","country_code":"US","type":"education","lineage":["https://openalex.org/I162577319"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Y. Makris","raw_affiliation_strings":["The University of Texas at Dallas,Department of Electrical and Computer Engineering,Richardson,TX,USA,75080"],"affiliations":[{"raw_affiliation_string":"The University of Texas at Dallas,Department of Electrical and Computer Engineering,Richardson,TX,USA,75080","institution_ids":["https://openalex.org/I162577319"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":6,"corresponding_author_ids":["https://openalex.org/A5103129664"],"corresponding_institution_ids":["https://openalex.org/I162577319"],"apc_list":null,"apc_paid":null,"fwci":0.2681,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":{"value":0.52099393,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":95,"max":96},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"7"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9976000189781189,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9959999918937683,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/anomaly-detection","display_name":"Anomaly detection","score":0.6914617419242859},{"id":"https://openalex.org/keywords/outlier","display_name":"Outlier","score":0.6771167516708374},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.582624614238739},{"id":"https://openalex.org/keywords/reduction","display_name":"Reduction (mathematics)","score":0.5391557216644287},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.44595080614089966},{"id":"https://openalex.org/keywords/integrated-circuit","display_name":"Integrated circuit","score":0.4250290095806122},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.3403301537036896},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.30013585090637207},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.27320367097854614},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.10697418451309204}],"concepts":[{"id":"https://openalex.org/C739882","wikidata":"https://www.wikidata.org/wiki/Q3560506","display_name":"Anomaly detection","level":2,"score":0.6914617419242859},{"id":"https://openalex.org/C79337645","wikidata":"https://www.wikidata.org/wiki/Q779824","display_name":"Outlier","level":2,"score":0.6771167516708374},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.582624614238739},{"id":"https://openalex.org/C111335779","wikidata":"https://www.wikidata.org/wiki/Q3454686","display_name":"Reduction (mathematics)","level":2,"score":0.5391557216644287},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.44595080614089966},{"id":"https://openalex.org/C530198007","wikidata":"https://www.wikidata.org/wiki/Q80831","display_name":"Integrated circuit","level":2,"score":0.4250290095806122},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.3403301537036896},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.30013585090637207},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.27320367097854614},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.10697418451309204},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/vts56346.2023.10140005","is_oa":false,"landing_page_url":"https://doi.org/10.1109/vts56346.2023.10140005","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2023 IEEE 41st VLSI Test Symposium (VTS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.44999998807907104,"display_name":"Industry, innovation and infrastructure","id":"https://metadata.un.org/sdg/9"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":17,"referenced_works":["https://openalex.org/W1527363716","https://openalex.org/W1967683336","https://openalex.org/W2019014808","https://openalex.org/W2045725984","https://openalex.org/W2053259742","https://openalex.org/W2089468765","https://openalex.org/W2101406500","https://openalex.org/W2102201073","https://openalex.org/W2137559939","https://openalex.org/W2141146355","https://openalex.org/W2156227942","https://openalex.org/W2763432333","https://openalex.org/W2773014657","https://openalex.org/W2781490043","https://openalex.org/W3039718103","https://openalex.org/W3039827217","https://openalex.org/W3121941635"],"related_works":["https://openalex.org/W3006513224","https://openalex.org/W2046456988","https://openalex.org/W2357409937","https://openalex.org/W2978674666","https://openalex.org/W2074430941","https://openalex.org/W2499612753","https://openalex.org/W3111802945","https://openalex.org/W2946096271","https://openalex.org/W2295423552","https://openalex.org/W3107369729"],"abstract_inverted_index":{"We":[0],"present":[1],"a":[2],"solution":[3,48,64],"for":[4],"reducing":[5,131],"the":[6,42,45,51,94,103,135],"number":[7],"of":[8,44,71,97,127],"defective":[9,123],"analog/RF":[10],"integrated":[11],"circuits":[12],"(ICs)":[13],"that":[14,65,119],"escape":[15],"detection":[16,63,83],"during":[17],"manufacturing":[18],"testing.":[19],"Also":[20],"known":[21],"as":[22,79],"underkill,":[23],"these":[24],"ICs":[25,67,110],"may":[26],"fail":[27],"when":[28,108],"deployed":[29],"in":[30,130],"their":[31],"target":[32],"application":[33],"and":[34,49,75,102,115],"eventually":[35],"become":[36],"customer":[37,73],"returns,":[38],"casting":[39],"doubt":[40],"on":[41,93,99],"effectiveness":[43,126],"employed":[46],"test":[47],"affecting":[50],"bottom":[52],"line.":[53],"To":[54],"ameliorate":[55],"this":[56],"problem,":[57],"we":[58],"introduce":[59],"an":[60,142],"adaptive":[61],"outlier":[62,82],"identifies":[66],"which":[68],"are":[69,111,121],"suspect":[70],"becoming":[72],"returns":[74],"proactively":[76],"bins":[77],"them":[78],"failing.":[80],"The":[81,125],"boundary":[84],"used":[85],"by":[86],"our":[87,128],"method":[88,129],"is":[89,106,139],"dynamically":[90],"computed":[91],"based":[92],"performance":[95],"distribution":[96],"devices":[98],"each":[100],"wafer":[101],"underlying":[104],"model":[105],"updated":[107],"new":[109],"returned":[112],"from":[113,145],"customers":[114],"failure":[116],"analysis":[117],"confirms":[118],"they":[120],"indeed":[122],"devices.":[124],"underkill":[132],"while":[133],"minimizing":[134],"incurred":[136],"yield":[137],"loss":[138],"evaluated":[140],"using":[141],"industrial":[143],"dataset":[144],"Texas":[146],"Instruments.":[147]},"counts_by_year":[{"year":2025,"cited_by_count":2}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}