{"id":"https://openalex.org/W4282980265","doi":"https://doi.org/10.1109/vts52500.2021.9794251","title":"On-Die Noise Measurement During Automatic Test Equipment (ATE) Testing and In-System-Test (IST)","display_name":"On-Die Noise Measurement During Automatic Test Equipment (ATE) Testing and In-System-Test (IST)","publication_year":2022,"publication_date":"2022-04-25","ids":{"openalex":"https://openalex.org/W4282980265","doi":"https://doi.org/10.1109/vts52500.2021.9794251"},"language":"en","primary_location":{"id":"doi:10.1109/vts52500.2021.9794251","is_oa":false,"landing_page_url":"https://doi.org/10.1109/vts52500.2021.9794251","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2022 IEEE 40th VLSI Test Symposium (VTS)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5015570819","display_name":"Seyed Nima Mozaffari","orcid":"https://orcid.org/0000-0003-1719-6815"},"institutions":[{"id":"https://openalex.org/I4210127875","display_name":"Nvidia (United States)","ror":"https://ror.org/03jdj4y14","country_code":"US","type":"company","lineage":["https://openalex.org/I4210127875"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Seyed Nima Mozaffari","raw_affiliation_strings":["NVIDIA Corporation,Santa Clara,USA","NVIDIA Corporation, Santa Clara, USA"],"affiliations":[{"raw_affiliation_string":"NVIDIA Corporation,Santa Clara,USA","institution_ids":["https://openalex.org/I4210127875"]},{"raw_affiliation_string":"NVIDIA Corporation, Santa Clara, USA","institution_ids":["https://openalex.org/I4210127875"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5085906985","display_name":"Bonita Bhaskaran","orcid":null},"institutions":[{"id":"https://openalex.org/I4210127875","display_name":"Nvidia (United States)","ror":"https://ror.org/03jdj4y14","country_code":"US","type":"company","lineage":["https://openalex.org/I4210127875"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Bonita Bhaskaran","raw_affiliation_strings":["NVIDIA Corporation,Santa Clara,USA","NVIDIA Corporation, Santa Clara, USA"],"affiliations":[{"raw_affiliation_string":"NVIDIA Corporation,Santa Clara,USA","institution_ids":["https://openalex.org/I4210127875"]},{"raw_affiliation_string":"NVIDIA Corporation, Santa Clara, USA","institution_ids":["https://openalex.org/I4210127875"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5009749203","display_name":"Shantanu Sarangi","orcid":null},"institutions":[{"id":"https://openalex.org/I4210127875","display_name":"Nvidia (United States)","ror":"https://ror.org/03jdj4y14","country_code":"US","type":"company","lineage":["https://openalex.org/I4210127875"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Shantanu Sarangi","raw_affiliation_strings":["NVIDIA Corporation,Santa Clara,USA","NVIDIA Corporation, Santa Clara, USA"],"affiliations":[{"raw_affiliation_string":"NVIDIA Corporation,Santa Clara,USA","institution_ids":["https://openalex.org/I4210127875"]},{"raw_affiliation_string":"NVIDIA Corporation, Santa Clara, USA","institution_ids":["https://openalex.org/I4210127875"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5049098590","display_name":"Suhas M. Satheesh","orcid":null},"institutions":[{"id":"https://openalex.org/I4210127875","display_name":"Nvidia (United States)","ror":"https://ror.org/03jdj4y14","country_code":"US","type":"company","lineage":["https://openalex.org/I4210127875"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Suhas Satheesh","raw_affiliation_strings":["NVIDIA Corporation,Santa Clara,USA","NVIDIA Corporation, Santa Clara, USA"],"affiliations":[{"raw_affiliation_string":"NVIDIA Corporation,Santa Clara,USA","institution_ids":["https://openalex.org/I4210127875"]},{"raw_affiliation_string":"NVIDIA Corporation, Santa Clara, USA","institution_ids":["https://openalex.org/I4210127875"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5006801440","display_name":"Kuo Lin Fu","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Kuo Lin Fu","raw_affiliation_strings":["NVIDIA Corporation,Taipei City,Taiwan","NVIDIA Corporation, Taipei City, Taiwan"],"affiliations":[{"raw_affiliation_string":"NVIDIA Corporation,Taipei City,Taiwan","institution_ids":[]},{"raw_affiliation_string":"NVIDIA Corporation, Taipei City, Taiwan","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5060268491","display_name":"Nithin Valentine","orcid":null},"institutions":[{"id":"https://openalex.org/I4210127875","display_name":"Nvidia (United States)","ror":"https://ror.org/03jdj4y14","country_code":"US","type":"company","lineage":["https://openalex.org/I4210127875"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Nithin Valentine","raw_affiliation_strings":["NVIDIA Corporation,Santa Clara,USA","NVIDIA Corporation, Santa Clara, USA"],"affiliations":[{"raw_affiliation_string":"NVIDIA Corporation,Santa Clara,USA","institution_ids":["https://openalex.org/I4210127875"]},{"raw_affiliation_string":"NVIDIA Corporation, Santa Clara, USA","institution_ids":["https://openalex.org/I4210127875"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5020577612","display_name":"P Manikandan","orcid":null},"institutions":[{"id":"https://openalex.org/I1304085615","display_name":"Nvidia (United Kingdom)","ror":"https://ror.org/02kr42612","country_code":"GB","type":"company","lineage":["https://openalex.org/I1304085615","https://openalex.org/I4210127875"]},{"id":"https://openalex.org/I4210127875","display_name":"Nvidia (United States)","ror":"https://ror.org/03jdj4y14","country_code":"US","type":"company","lineage":["https://openalex.org/I4210127875"]}],"countries":["GB","US"],"is_corresponding":false,"raw_author_name":"P Manikandan","raw_affiliation_strings":["NVIDIA Corporation,Bengaluru,India","NVIDIA Corporation, Bengaluru, India"],"affiliations":[{"raw_affiliation_string":"NVIDIA Corporation,Bengaluru,India","institution_ids":["https://openalex.org/I1304085615","https://openalex.org/I4210127875"]},{"raw_affiliation_string":"NVIDIA Corporation, Bengaluru, India","institution_ids":[]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5043179142","display_name":"Mahmut Yilmaz","orcid":"https://orcid.org/0000-0002-4522-7028"},"institutions":[{"id":"https://openalex.org/I4210127875","display_name":"Nvidia (United States)","ror":"https://ror.org/03jdj4y14","country_code":"US","type":"company","lineage":["https://openalex.org/I4210127875"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Mahmut Yilmaz","raw_affiliation_strings":["NVIDIA Corporation,Santa Clara,USA","NVIDIA Corporation, Santa Clara, USA"],"affiliations":[{"raw_affiliation_string":"NVIDIA Corporation,Santa Clara,USA","institution_ids":["https://openalex.org/I4210127875"]},{"raw_affiliation_string":"NVIDIA Corporation, Santa Clara, USA","institution_ids":["https://openalex.org/I4210127875"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":8,"corresponding_author_ids":["https://openalex.org/A5015570819"],"corresponding_institution_ids":["https://openalex.org/I4210127875"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.03803719,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"6"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11444","display_name":"Electromagnetic Compatibility and Noise Suppression","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11444","display_name":"Electromagnetic Compatibility and Noise Suppression","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12495","display_name":"Electrostatic Discharge in Electronics","score":0.9993000030517578,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9991999864578247,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/die","display_name":"Die (integrated circuit)","score":0.7091692090034485},{"id":"https://openalex.org/keywords/automatic-test-equipment","display_name":"Automatic test equipment","score":0.6312413811683655},{"id":"https://openalex.org/keywords/test","display_name":"Test (biology)","score":0.5745924711227417},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.4605632424354553},{"id":"https://openalex.org/keywords/noise","display_name":"Noise (video)","score":0.45740392804145813},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.4144865870475769},{"id":"https://openalex.org/keywords/test-equipment","display_name":"Test equipment","score":0.4144393801689148},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.3080459237098694},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.1514562964439392},{"id":"https://openalex.org/keywords/operating-system","display_name":"Operating system","score":0.07403859496116638},{"id":"https://openalex.org/keywords/geology","display_name":"Geology","score":0.06036368012428284}],"concepts":[{"id":"https://openalex.org/C111106434","wikidata":"https://www.wikidata.org/wiki/Q1072430","display_name":"Die (integrated circuit)","level":2,"score":0.7091692090034485},{"id":"https://openalex.org/C141842801","wikidata":"https://www.wikidata.org/wiki/Q363815","display_name":"Automatic test equipment","level":3,"score":0.6312413811683655},{"id":"https://openalex.org/C2777267654","wikidata":"https://www.wikidata.org/wiki/Q3519023","display_name":"Test (biology)","level":2,"score":0.5745924711227417},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4605632424354553},{"id":"https://openalex.org/C99498987","wikidata":"https://www.wikidata.org/wiki/Q2210247","display_name":"Noise (video)","level":3,"score":0.45740392804145813},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.4144865870475769},{"id":"https://openalex.org/C2983725658","wikidata":"https://www.wikidata.org/wiki/Q7705768","display_name":"Test equipment","level":2,"score":0.4144393801689148},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.3080459237098694},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.1514562964439392},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.07403859496116638},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.06036368012428284},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.0},{"id":"https://openalex.org/C151730666","wikidata":"https://www.wikidata.org/wiki/Q7205","display_name":"Paleontology","level":1,"score":0.0},{"id":"https://openalex.org/C51234621","wikidata":"https://www.wikidata.org/wiki/Q2149495","display_name":"Testability","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/vts52500.2021.9794251","is_oa":false,"landing_page_url":"https://doi.org/10.1109/vts52500.2021.9794251","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2022 IEEE 40th VLSI Test Symposium (VTS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.6899999976158142,"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":7,"referenced_works":["https://openalex.org/W2081406871","https://openalex.org/W2113907764","https://openalex.org/W2122488218","https://openalex.org/W2154781197","https://openalex.org/W2399450485","https://openalex.org/W2402469790","https://openalex.org/W6682599810"],"related_works":["https://openalex.org/W2143294572","https://openalex.org/W4250651147","https://openalex.org/W4231859554","https://openalex.org/W1570780063","https://openalex.org/W2374190127","https://openalex.org/W2145792104","https://openalex.org/W1539818450","https://openalex.org/W2886943583","https://openalex.org/W2113341322","https://openalex.org/W1995271078"],"abstract_inverted_index":{"It":[0],"is":[1,12],"realized":[2],"that":[3,7,98,154,190],"having":[4],"a":[5,149,180,186],"method/apparatus":[6],"accurately":[8],"measures":[9],"voltage":[10,119,168,199],"noise":[11,55,60,83,120,142,169,200],"imperative":[13],"for":[14,37,62,192],"ATE":[15,40,131],"and":[16,42,57,81,92,103,132,176,185],"SLT":[17,47,133],"testing":[18,41],"to":[19,110,117,158,165],"1)":[20],"reliably":[21],"sign-off":[22],"on":[23,46],"production":[24],"patterns;":[25],"2)":[26],"effectively":[27],"optimize":[28],"low":[29],"power":[30],"settings":[31],"of":[32,124,170,196],"scan":[33],"architecture;":[34],"3)":[35],"screen":[36],"defects":[38,94],"during":[39,85,121,160,173],"apply":[43],"structural":[44,125],"patterns":[45],"at":[48],"desired":[49],"Voltage/Frequency":[50],"points;":[51],"This":[52,105],"requires":[53],"optimized":[54],"profiles":[56],"hence":[58],"localized":[59],"monitors":[61],"appropriate":[63],"tuning.":[64],"In":[65],"addition,":[66],"with":[67],"NVIDIA\u2019s":[68],"chips":[69],"foraying":[70],"into":[71],"the":[72,82,96,111,122,140,167,171,197],"automotive":[73],"space,":[74],"functional":[75,156],"safety":[76],"has":[77],"gained":[78],"utmost":[79],"priority,":[80],"profile":[84],"In-System":[86],"Test":[87],"(IST)":[88],"helps":[89],"catch":[90],"reliability":[91],"aging-related":[93],"in":[95,130,139],"field":[97],"show":[99],"up":[100],"after":[101],"stress":[102],"degradation.":[104],"paper":[106],"proposes":[107],"an":[108],"enhancement":[109],"in-system":[112],"Noise":[113],"Measurement":[114],"macro":[115],"(NMEAS)":[116],"record":[118],"application":[123],"DFT":[126],"patterns,":[127],"such":[128],"as":[129],"testing,":[134],"which":[135,162],"was":[136],"not":[137],"possible":[138],"conventional":[141],"measurement":[143],"methods.":[144],"The":[145],"introduced":[146,189],"technique":[147],"utilizes":[148],"continuous":[150],"free-running":[151],"fast":[152],"clock":[153],"feeds":[155],"frequency":[157],"NMEAS":[159],"test":[161],"allows":[163],"it":[164],"measure":[166],"chip":[172],"both":[174],"shift":[175],"capture":[177],"phases.":[178],"Also,":[179],"novel":[181],"enable":[182],"generation":[183],"logic":[184],"counter":[187],"are":[188],"allow":[191],"more":[193],"precise":[194],"characterization":[195],"measured":[198],"data.":[201]},"counts_by_year":[],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}