{"id":"https://openalex.org/W4282979059","doi":"https://doi.org/10.1109/vts52500.2021.9794204","title":"Innovation Practices Track: Silicon Telemetry for Dependability","display_name":"Innovation Practices Track: Silicon Telemetry for Dependability","publication_year":2022,"publication_date":"2022-04-25","ids":{"openalex":"https://openalex.org/W4282979059","doi":"https://doi.org/10.1109/vts52500.2021.9794204"},"language":"en","primary_location":{"id":"doi:10.1109/vts52500.2021.9794204","is_oa":false,"landing_page_url":"https://doi.org/10.1109/vts52500.2021.9794204","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2022 IEEE 40th VLSI Test Symposium (VTS)","raw_type":"proceedings-article"},"type":"conference-abstract","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5036373418","display_name":"Fei Su","orcid":"https://orcid.org/0000-0002-2585-6564"},"institutions":[{"id":"https://openalex.org/I1343180700","display_name":"Intel (United States)","ror":"https://ror.org/01ek73717","country_code":"US","type":"company","lineage":["https://openalex.org/I1343180700"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Fei Su","raw_affiliation_strings":["Intel Corporation,U.S","Intel Corporation, U.S"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Intel Corporation,U.S","institution_ids":["https://openalex.org/I1343180700"]},{"raw_affiliation_string":"Intel Corporation, U.S","institution_ids":["https://openalex.org/I1343180700"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5041815112","display_name":"Stephen Crosher","orcid":null},"institutions":[{"id":"https://openalex.org/I1335490905","display_name":"Synopsys (Switzerland)","ror":"https://ror.org/03mb54f81","country_code":"CH","type":"company","lineage":["https://openalex.org/I1335490905","https://openalex.org/I4210088951"]},{"id":"https://openalex.org/I4210088951","display_name":"Synopsys (United States)","ror":"https://ror.org/013by2m91","country_code":"US","type":"company","lineage":["https://openalex.org/I4210088951"]}],"countries":["CH","US"],"is_corresponding":false,"raw_author_name":"Stephen Crosher","raw_affiliation_strings":["Synposys,U.K","Synposys, U.K"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Synposys,U.K","institution_ids":["https://openalex.org/I1335490905","https://openalex.org/I4210088951"]},{"raw_affiliation_string":"Synposys, U.K","institution_ids":["https://openalex.org/I1335490905","https://openalex.org/I4210088951"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5043278800","display_name":"Andrea Matteucci","orcid":"https://orcid.org/0000-0002-8831-6178"},"institutions":[{"id":"https://openalex.org/I1335490905","display_name":"Synopsys (Switzerland)","ror":"https://ror.org/03mb54f81","country_code":"CH","type":"company","lineage":["https://openalex.org/I1335490905","https://openalex.org/I4210088951"]},{"id":"https://openalex.org/I4210088951","display_name":"Synopsys (United States)","ror":"https://ror.org/013by2m91","country_code":"US","type":"company","lineage":["https://openalex.org/I4210088951"]}],"countries":["CH","US"],"is_corresponding":false,"raw_author_name":"Andrea Matteucci","raw_affiliation_strings":["Synposys,U.K","Synposys, U.K"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Synposys,U.K","institution_ids":["https://openalex.org/I1335490905","https://openalex.org/I4210088951"]},{"raw_affiliation_string":"Synposys, U.K","institution_ids":["https://openalex.org/I1335490905","https://openalex.org/I4210088951"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5027473285","display_name":"Yuwen Zou","orcid":null},"institutions":[{"id":"https://openalex.org/I1343180700","display_name":"Intel (United States)","ror":"https://ror.org/01ek73717","country_code":"US","type":"company","lineage":["https://openalex.org/I1343180700"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Yuwen Zou","raw_affiliation_strings":["Intel Corporation,U.S","Intel Corporation, U.S"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Intel Corporation,U.S","institution_ids":["https://openalex.org/I1343180700"]},{"raw_affiliation_string":"Intel Corporation, U.S","institution_ids":["https://openalex.org/I1343180700"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":3,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":null,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":null,"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"1"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12127","display_name":"Software System Performance and Reliability","score":0.9225000143051147,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12127","display_name":"Software System Performance and Reliability","score":0.9225000143051147,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/dependability","display_name":"Dependability","score":0.915223240852356},{"id":"https://openalex.org/keywords/maintainability","display_name":"Maintainability","score":0.7593011856079102},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.6461150646209717},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.6232391595840454},{"id":"https://openalex.org/keywords/telemetry","display_name":"Telemetry","score":0.5900956392288208},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5284718871116638},{"id":"https://openalex.org/keywords/silicon","display_name":"Silicon","score":0.5045171976089478},{"id":"https://openalex.org/keywords/key","display_name":"Key (lock)","score":0.5025532245635986},{"id":"https://openalex.org/keywords/service","display_name":"Service (business)","score":0.45648193359375},{"id":"https://openalex.org/keywords/software-deployment","display_name":"Software deployment","score":0.4471995234489441},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.40047687292099},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.278075248003006},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.19703826308250427},{"id":"https://openalex.org/keywords/computer-security","display_name":"Computer security","score":0.14297151565551758},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.1125355064868927},{"id":"https://openalex.org/keywords/operating-system","display_name":"Operating system","score":0.10933816432952881},{"id":"https://openalex.org/keywords/business","display_name":"Business","score":0.0926152765750885}],"concepts":[{"id":"https://openalex.org/C77019957","wikidata":"https://www.wikidata.org/wiki/Q2689057","display_name":"Dependability","level":2,"score":0.915223240852356},{"id":"https://openalex.org/C160713754","wikidata":"https://www.wikidata.org/wiki/Q1389965","display_name":"Maintainability","level":2,"score":0.7593011856079102},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.6461150646209717},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.6232391595840454},{"id":"https://openalex.org/C183121708","wikidata":"https://www.wikidata.org/wiki/Q209867","display_name":"Telemetry","level":2,"score":0.5900956392288208},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5284718871116638},{"id":"https://openalex.org/C544956773","wikidata":"https://www.wikidata.org/wiki/Q670","display_name":"Silicon","level":2,"score":0.5045171976089478},{"id":"https://openalex.org/C26517878","wikidata":"https://www.wikidata.org/wiki/Q228039","display_name":"Key (lock)","level":2,"score":0.5025532245635986},{"id":"https://openalex.org/C2780378061","wikidata":"https://www.wikidata.org/wiki/Q25351891","display_name":"Service (business)","level":2,"score":0.45648193359375},{"id":"https://openalex.org/C105339364","wikidata":"https://www.wikidata.org/wiki/Q2297740","display_name":"Software deployment","level":2,"score":0.4471995234489441},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.40047687292099},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.278075248003006},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.19703826308250427},{"id":"https://openalex.org/C38652104","wikidata":"https://www.wikidata.org/wiki/Q3510521","display_name":"Computer security","level":1,"score":0.14297151565551758},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.1125355064868927},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.10933816432952881},{"id":"https://openalex.org/C144133560","wikidata":"https://www.wikidata.org/wiki/Q4830453","display_name":"Business","level":0,"score":0.0926152765750885},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C162853370","wikidata":"https://www.wikidata.org/wiki/Q39809","display_name":"Marketing","level":1,"score":0.0},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C191897082","wikidata":"https://www.wikidata.org/wiki/Q11467","display_name":"Metallurgy","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/vts52500.2021.9794204","is_oa":false,"landing_page_url":"https://doi.org/10.1109/vts52500.2021.9794204","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2022 IEEE 40th VLSI Test Symposium (VTS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Responsible consumption and production","score":0.5299999713897705,"id":"https://metadata.un.org/sdg/12"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":0,"referenced_works":[],"related_works":["https://openalex.org/W4252527915","https://openalex.org/W2409287660","https://openalex.org/W2233357156","https://openalex.org/W1976489385","https://openalex.org/W4256317220","https://openalex.org/W1506225852","https://openalex.org/W2141414364","https://openalex.org/W2376514150","https://openalex.org/W1523265213","https://openalex.org/W2104842527"],"abstract_inverted_index":{"Throughout":[0],"the":[1,32,35],"life":[2],"cycle":[3],"of":[4,24,51,53,69],"silicon-based":[5],"system":[6,26,36,72],"deployment,":[7],"there":[8],"may":[9],"be":[10],"a":[11,25,28,48,63,78,81],"service":[12,40],"failure":[13,41],"induced":[14],"by":[15],"external":[16],"or":[17],"internal":[18],"effects":[19],"(e.g.,":[20],"silicon":[21,70],"failure).":[22],"Dependability":[23],"is":[27,47,62],"term":[29],"to":[30,66,80],"define":[31],"ability":[33],"that":[34],"can":[37],"avoid":[38],"such":[39],"beyond":[42],"an":[43],"acceptance":[44],"level.":[45],"There":[46],"broad":[49],"spectrum":[50],"attributes":[52],"dependability,":[54],"including":[55],"reliability,":[56],"maintainability":[57],"and":[58,71,75],"safety.":[59],"Silicon":[60],"telemetry":[61],"key":[64],"technique":[65],"gain":[67],"insights":[68],"in":[73],"field,":[74],"it":[76],"opens":[77],"door":[79],"promising":[82],"solution":[83],"space":[84],"for":[85],"dependability":[86],"improvement.":[87]},"counts_by_year":[{"year":2026,"cited_by_count":1}],"updated_date":"2026-07-14T23:27:15.235271","created_date":"2025-10-10T00:00:00"}