{"id":"https://openalex.org/W4282968565","doi":"https://doi.org/10.1109/vts52500.2021.9794197","title":"A Highly Reliable and Low Power RHBD Flip-Flop Cell for Aerospace Applications","display_name":"A Highly Reliable and Low Power RHBD Flip-Flop Cell for Aerospace Applications","publication_year":2022,"publication_date":"2022-04-25","ids":{"openalex":"https://openalex.org/W4282968565","doi":"https://doi.org/10.1109/vts52500.2021.9794197"},"language":"en","primary_location":{"id":"doi:10.1109/vts52500.2021.9794197","is_oa":false,"landing_page_url":"https://doi.org/10.1109/vts52500.2021.9794197","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2022 IEEE 40th VLSI Test Symposium (VTS)","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"green","oa_url":"https://hal-lirmm.ccsd.cnrs.fr/lirmm-03770473","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5072439444","display_name":"Aibin Yan","orcid":"https://orcid.org/0000-0003-0024-987X"},"institutions":[{"id":"https://openalex.org/I143868143","display_name":"Anhui University","ror":"https://ror.org/05th6yx34","country_code":"CN","type":"education","lineage":["https://openalex.org/I143868143"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Aibin Yan","raw_affiliation_strings":["Anhui University,School of Computer Science and Technology,Hefei,China","School of Computer Science and Technology, Anhui University, Hefei, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Anhui University,School of Computer Science and Technology,Hefei,China","institution_ids":["https://openalex.org/I143868143"]},{"raw_affiliation_string":"School of Computer Science and Technology, Anhui University, Hefei, China","institution_ids":["https://openalex.org/I143868143"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5026442083","display_name":"Kuikui Qian","orcid":null},"institutions":[{"id":"https://openalex.org/I143868143","display_name":"Anhui University","ror":"https://ror.org/05th6yx34","country_code":"CN","type":"education","lineage":["https://openalex.org/I143868143"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Kuikui Qian","raw_affiliation_strings":["Anhui University,School of Computer Science and Technology,Hefei,China","School of Computer Science and Technology, Anhui University, Hefei, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Anhui University,School of Computer Science and Technology,Hefei,China","institution_ids":["https://openalex.org/I143868143"]},{"raw_affiliation_string":"School of Computer Science and Technology, Anhui University, Hefei, China","institution_ids":["https://openalex.org/I143868143"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5081525426","display_name":"Jie Cui","orcid":"https://orcid.org/0000-0001-7258-3418"},"institutions":[{"id":"https://openalex.org/I143868143","display_name":"Anhui University","ror":"https://ror.org/05th6yx34","country_code":"CN","type":"education","lineage":["https://openalex.org/I143868143"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jie Cui","raw_affiliation_strings":["Anhui University,School of Computer Science and Technology,Hefei,China","School of Computer Science and Technology, Anhui University, Hefei, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Anhui University,School of Computer Science and Technology,Hefei,China","institution_ids":["https://openalex.org/I143868143"]},{"raw_affiliation_string":"School of Computer Science and Technology, Anhui University, Hefei, China","institution_ids":["https://openalex.org/I143868143"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5071688309","display_name":"Ningning Cui","orcid":"https://orcid.org/0000-0002-1940-625X"},"institutions":[{"id":"https://openalex.org/I143868143","display_name":"Anhui University","ror":"https://ror.org/05th6yx34","country_code":"CN","type":"education","lineage":["https://openalex.org/I143868143"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Ningning Cui","raw_affiliation_strings":["Anhui University,School of Computer Science and Technology,Hefei,China","School of Computer Science and Technology, Anhui University, Hefei, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Anhui University,School of Computer Science and Technology,Hefei,China","institution_ids":["https://openalex.org/I143868143"]},{"raw_affiliation_string":"School of Computer Science and Technology, Anhui University, Hefei, China","institution_ids":["https://openalex.org/I143868143"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5073810494","display_name":"Zhengfeng Huang","orcid":"https://orcid.org/0000-0001-8695-4478"},"institutions":[{"id":"https://openalex.org/I16365422","display_name":"Hefei University of Technology","ror":"https://ror.org/02czkny70","country_code":"CN","type":"education","lineage":["https://openalex.org/I16365422"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Zhengfeng Huang","raw_affiliation_strings":["Hefei University of Technology,School of Microelectronic,Hefei,China","School of Microelectronic, Hefei University of Technology, Hefei, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Hefei University of Technology,School of Microelectronic,Hefei,China","institution_ids":["https://openalex.org/I16365422"]},{"raw_affiliation_string":"School of Microelectronic, Hefei University of Technology, Hefei, China","institution_ids":["https://openalex.org/I16365422"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5084697545","display_name":"Xiaoqing Wen","orcid":"https://orcid.org/0000-0001-8305-604X"},"institutions":[{"id":"https://openalex.org/I207014233","display_name":"Kyushu Institute of Technology","ror":"https://ror.org/02278tr80","country_code":"JP","type":"education","lineage":["https://openalex.org/I207014233"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Xiaoqing Wen","raw_affiliation_strings":["Kyushu Institute of Technology,Graduate School of Computer Science and Systems Engineering,Fukuoka,Japan","Graduate School of Computer Science and Systems Engineering, Kyushu Institute of Technology, Fukuoka, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Kyushu Institute of Technology,Graduate School of Computer Science and Systems Engineering,Fukuoka,Japan","institution_ids":["https://openalex.org/I207014233"]},{"raw_affiliation_string":"Graduate School of Computer Science and Systems Engineering, Kyushu Institute of Technology, Fukuoka, Japan","institution_ids":["https://openalex.org/I207014233"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5005116115","display_name":"Patrick Girard","orcid":"https://orcid.org/0000-0003-0722-8772"},"institutions":[{"id":"https://openalex.org/I1294671590","display_name":"Centre National de la Recherche Scientifique","ror":"https://ror.org/02feahw73","country_code":"FR","type":"government","lineage":["https://openalex.org/I1294671590"]},{"id":"https://openalex.org/I19894307","display_name":"Universit\u00e9 de Montpellier","ror":"https://ror.org/051escj72","country_code":"FR","type":"education","lineage":["https://openalex.org/I19894307"]},{"id":"https://openalex.org/I4210101743","display_name":"Laboratoire d'Informatique, de Robotique et de Micro\u00e9lectronique de Montpellier","ror":"https://ror.org/013yean28","country_code":"FR","type":"facility","lineage":["https://openalex.org/I1294671590","https://openalex.org/I1294671590","https://openalex.org/I1326498283","https://openalex.org/I151295451","https://openalex.org/I19894307","https://openalex.org/I4210101743","https://openalex.org/I4210159245","https://openalex.org/I4405261681"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"Patrick Girard","raw_affiliation_strings":["University of Montpellier / CNRS,LIRMM,Montpellier,France","LIRMM, University of Montpellier / CNRS, Montpellier, France"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"University of Montpellier / CNRS,LIRMM,Montpellier,France","institution_ids":["https://openalex.org/I1294671590","https://openalex.org/I19894307","https://openalex.org/I4210101743"]},{"raw_affiliation_string":"LIRMM, University of Montpellier / CNRS, Montpellier, France","institution_ids":["https://openalex.org/I1294671590","https://openalex.org/I19894307","https://openalex.org/I4210101743"]}]}],"institutions":[],"countries_distinct_count":3,"institutions_distinct_count":6,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":null,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":null,"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":null,"last_page":null},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9980000257492065,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9926999807357788,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/flip-flop","display_name":"Flip-flop","score":0.7389524579048157},{"id":"https://openalex.org/keywords/node","display_name":"Node (physics)","score":0.5734502673149109},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.4978475570678711},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.4318998157978058},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.3841925859451294},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.35167258977890015},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.3501448631286621},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.3469744324684143},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.3175017237663269},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.1211654543876648}],"concepts":[{"id":"https://openalex.org/C2781007278","wikidata":"https://www.wikidata.org/wiki/Q183406","display_name":"Flip-flop","level":3,"score":0.7389524579048157},{"id":"https://openalex.org/C62611344","wikidata":"https://www.wikidata.org/wiki/Q1062658","display_name":"Node (physics)","level":2,"score":0.5734502673149109},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.4978475570678711},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4318998157978058},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.3841925859451294},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.35167258977890015},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.3501448631286621},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.3469744324684143},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.3175017237663269},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.1211654543876648},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/vts52500.2021.9794197","is_oa":false,"landing_page_url":"https://doi.org/10.1109/vts52500.2021.9794197","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2022 IEEE 40th VLSI Test Symposium (VTS)","raw_type":"proceedings-article"},{"id":"pmh:oai:HAL:lirmm-03770473v1","is_oa":true,"landing_page_url":"https://hal-lirmm.ccsd.cnrs.fr/lirmm-03770473","pdf_url":null,"source":{"id":"https://openalex.org/S4306402512","display_name":"HAL (Le Centre pour la Communication Scientifique Directe)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I1294671590","host_organization_name":"Centre National de la Recherche Scientifique","host_organization_lineage":["https://openalex.org/I1294671590"],"host_organization_lineage_names":[],"type":"repository"},"license":"other-oa","license_id":"https://openalex.org/licenses/other-oa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"VTS 2022 - IEEE 40th VLSI Test Symposium, Apr 2022, San Diego, CA, United States. pp.1-6, ⟨10.1109/VTS52500.2021.9794197⟩","raw_type":"info:eu-repo/semantics/conferenceObject"}],"best_oa_location":{"id":"pmh:oai:HAL:lirmm-03770473v1","is_oa":true,"landing_page_url":"https://hal-lirmm.ccsd.cnrs.fr/lirmm-03770473","pdf_url":null,"source":{"id":"https://openalex.org/S4306402512","display_name":"HAL (Le Centre pour la Communication Scientifique Directe)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I1294671590","host_organization_name":"Centre National de la Recherche Scientifique","host_organization_lineage":["https://openalex.org/I1294671590"],"host_organization_lineage_names":[],"type":"repository"},"license":"other-oa","license_id":"https://openalex.org/licenses/other-oa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"VTS 2022 - IEEE 40th VLSI Test Symposium, Apr 2022, San Diego, CA, United States. pp.1-6, ⟨10.1109/VTS52500.2021.9794197⟩","raw_type":"info:eu-repo/semantics/conferenceObject"},"sustainable_development_goals":[{"score":0.8999999761581421,"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":15,"referenced_works":["https://openalex.org/W1968121555","https://openalex.org/W2017426388","https://openalex.org/W2023659251","https://openalex.org/W2048751700","https://openalex.org/W2148327955","https://openalex.org/W2153751624","https://openalex.org/W2161033118","https://openalex.org/W2558274594","https://openalex.org/W2580567750","https://openalex.org/W2613938152","https://openalex.org/W2894057114","https://openalex.org/W2945902746","https://openalex.org/W3000209635","https://openalex.org/W3081672332","https://openalex.org/W3199363867"],"related_works":["https://openalex.org/W2748952813","https://openalex.org/W2899084033","https://openalex.org/W1235669242","https://openalex.org/W2902546961","https://openalex.org/W2981473605","https://openalex.org/W2058676402","https://openalex.org/W2399397734","https://openalex.org/W4313017699","https://openalex.org/W4287866222","https://openalex.org/W2004284024"],"abstract_inverted_index":{"In":[0,27],"space,":[1],"the":[2,15,76,84,92,101,106,118],"impact":[3],"of":[4,18,25],"radiative":[5],"particles,":[6],"such":[7],"as":[8],"neutrons":[9],"and":[10,33,69],"heavy":[11],"ions,":[12],"can":[13,109],"change":[14],"node":[16],"states":[17],"a":[19,30,55],"flip-flop,":[20],"thus":[21],"resulting":[22],"in":[23],"loss":[24],"data.":[26],"this":[28],"paper,":[29],"Highly":[31],"reliable":[32],"Low":[34],"power":[35,111],"Radiation-hardened-by-design":[36],"(RHBD)":[37],"Flip-Flop":[38],"cell,":[39],"namely":[40],"HLRFF,":[41],"completely":[42,96,124],"hardened":[43],"against":[44],"double-node-upsets":[45],"(DNUs),":[46],"is":[47,54,61,95,121],"proposed":[48,93,107,119],"for":[49],"aerospace":[50],"applications.":[51],"The":[52,58,87],"HLRFF":[53,94,108,120],"master-slave":[56],"structure.":[57],"master":[59],"latch":[60,78],"mainly":[62],"constructed":[63],"from":[64],"two":[65],"2-input":[66,71],"C-elements":[67],"(CEs)":[68],"one":[70],"clock-gating":[72],"based":[73],"CE,":[74],"while":[75],"slave":[77],"has":[79],"an":[80],"additional":[81],"keeper":[82],"at":[83],"output":[85],"stage.":[86],"verification":[88],"results":[89],"demonstrate":[90],"that":[91],"DNU-tolerant.":[97],"Furthermore,":[98],"compared":[99],"to":[100,129],"state-of-the-art":[102],"radiation-hardened":[103],"FF":[104],"cells,":[105],"reduce":[110],"consumption":[112],"by":[113],"approximately":[114],"69%.":[115],"However,":[116],"only":[117,123],"not":[122],"DNU-tolerant":[125],"but":[126],"also":[127],"insensitive":[128],"high-impedance-state.":[130]},"counts_by_year":[{"year":2023,"cited_by_count":1},{"year":2022,"cited_by_count":1}],"updated_date":"2026-07-22T07:51:19.307946","created_date":"2025-10-10T00:00:00"}