{"id":"https://openalex.org/W4282970482","doi":"https://doi.org/10.1109/vts52500.2021.9794170","title":"Machine Learning-Based Overkill Reduction through Inter-Test Correlation","display_name":"Machine Learning-Based Overkill Reduction through Inter-Test Correlation","publication_year":2022,"publication_date":"2022-04-25","ids":{"openalex":"https://openalex.org/W4282970482","doi":"https://doi.org/10.1109/vts52500.2021.9794170"},"language":"en","primary_location":{"id":"doi:10.1109/vts52500.2021.9794170","is_oa":false,"landing_page_url":"https://doi.org/10.1109/vts52500.2021.9794170","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2022 IEEE 40th VLSI Test Symposium (VTS)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5029881698","display_name":"D. Neethirajan","orcid":null},"institutions":[{"id":"https://openalex.org/I162577319","display_name":"The University of Texas at Dallas","ror":"https://ror.org/049emcs32","country_code":"US","type":"education","lineage":["https://openalex.org/I162577319"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"D. Neethirajan","raw_affiliation_strings":["The University of Texas at Dallas,Department of Electrical and Computer Engineering,Richardson,TX,USA, 75080","Department of Electrical and Computer Engineering, The University of Texas at Dallas, Richardson, TX, USA, 75080"],"affiliations":[{"raw_affiliation_string":"The University of Texas at Dallas,Department of Electrical and Computer Engineering,Richardson,TX,USA, 75080","institution_ids":["https://openalex.org/I162577319"]},{"raw_affiliation_string":"Department of Electrical and Computer Engineering, The University of Texas at Dallas, Richardson, TX, USA, 75080","institution_ids":["https://openalex.org/I162577319"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5103129664","display_name":"V. A. Niranjan","orcid":null},"institutions":[{"id":"https://openalex.org/I162577319","display_name":"The University of Texas at Dallas","ror":"https://ror.org/049emcs32","country_code":"US","type":"education","lineage":["https://openalex.org/I162577319"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"V. A. Niranjan","raw_affiliation_strings":["The University of Texas at Dallas,Department of Electrical and Computer Engineering,Richardson,TX,USA, 75080","Department of Electrical and Computer Engineering, The University of Texas at Dallas, Richardson, TX, USA, 75080"],"affiliations":[{"raw_affiliation_string":"The University of Texas at Dallas,Department of Electrical and Computer Engineering,Richardson,TX,USA, 75080","institution_ids":["https://openalex.org/I162577319"]},{"raw_affiliation_string":"Department of Electrical and Computer Engineering, The University of Texas at Dallas, Richardson, TX, USA, 75080","institution_ids":["https://openalex.org/I162577319"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5050689080","display_name":"Richard L. Willis","orcid":null},"institutions":[{"id":"https://openalex.org/I162577319","display_name":"The University of Texas at Dallas","ror":"https://ror.org/049emcs32","country_code":"US","type":"education","lineage":["https://openalex.org/I162577319"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"R. Willis","raw_affiliation_strings":["The University of Texas at Dallas,Department of Electrical and Computer Engineering,Richardson,TX,USA, 75080","Department of Electrical and Computer Engineering, The University of Texas at Dallas, Richardson, TX, USA, 75080"],"affiliations":[{"raw_affiliation_string":"The University of Texas at Dallas,Department of Electrical and Computer Engineering,Richardson,TX,USA, 75080","institution_ids":["https://openalex.org/I162577319"]},{"raw_affiliation_string":"Department of Electrical and Computer Engineering, The University of Texas at Dallas, Richardson, TX, USA, 75080","institution_ids":["https://openalex.org/I162577319"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5111905813","display_name":"Amit Nahar","orcid":null},"institutions":[{"id":"https://openalex.org/I74760111","display_name":"Texas Instruments (United States)","ror":"https://ror.org/03vsmv677","country_code":"US","type":"company","lineage":["https://openalex.org/I74760111"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"A. Nahar","raw_affiliation_strings":["Texas Instruments Inc.,Dallas,TX,USA, 75243","Texas Instruments Inc., Dallas, TX, USA, 75243"],"affiliations":[{"raw_affiliation_string":"Texas Instruments Inc.,Dallas,TX,USA, 75243","institution_ids":["https://openalex.org/I74760111"]},{"raw_affiliation_string":"Texas Instruments Inc., Dallas, TX, USA, 75243","institution_ids":["https://openalex.org/I74760111"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5056193640","display_name":"Dallas Webster","orcid":null},"institutions":[{"id":"https://openalex.org/I74760111","display_name":"Texas Instruments (United States)","ror":"https://ror.org/03vsmv677","country_code":"US","type":"company","lineage":["https://openalex.org/I74760111"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"D. Webster","raw_affiliation_strings":["Texas Instruments Inc.,Dallas,TX,USA, 75243","Texas Instruments Inc., Dallas, TX, USA, 75243"],"affiliations":[{"raw_affiliation_string":"Texas Instruments Inc.,Dallas,TX,USA, 75243","institution_ids":["https://openalex.org/I74760111"]},{"raw_affiliation_string":"Texas Instruments Inc., Dallas, TX, USA, 75243","institution_ids":["https://openalex.org/I74760111"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5078818440","display_name":"Yiorgos Makris","orcid":"https://orcid.org/0000-0002-4322-0068"},"institutions":[{"id":"https://openalex.org/I162577319","display_name":"The University of Texas at Dallas","ror":"https://ror.org/049emcs32","country_code":"US","type":"education","lineage":["https://openalex.org/I162577319"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Y. Makris","raw_affiliation_strings":["The University of Texas at Dallas,Department of Electrical and Computer Engineering,Richardson,TX,USA, 75080","Department of Electrical and Computer Engineering, The University of Texas at Dallas, Richardson, TX, USA, 75080"],"affiliations":[{"raw_affiliation_string":"The University of Texas at Dallas,Department of Electrical and Computer Engineering,Richardson,TX,USA, 75080","institution_ids":["https://openalex.org/I162577319"]},{"raw_affiliation_string":"Department of Electrical and Computer Engineering, The University of Texas at Dallas, Richardson, TX, USA, 75080","institution_ids":["https://openalex.org/I162577319"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":6,"corresponding_author_ids":["https://openalex.org/A5029881698"],"corresponding_institution_ids":["https://openalex.org/I162577319"],"apc_list":null,"apc_paid":null,"fwci":0.6812,"has_fulltext":false,"cited_by_count":3,"citation_normalized_percentile":{"value":0.65129254,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":96},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"7"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11338","display_name":"Advancements in Photolithography Techniques","score":0.9962000250816345,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/imperfect","display_name":"Imperfect","score":0.6419775485992432},{"id":"https://openalex.org/keywords/quality","display_name":"Quality (philosophy)","score":0.613379716873169},{"id":"https://openalex.org/keywords/exploit","display_name":"Exploit","score":0.6111374497413635},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.576035737991333},{"id":"https://openalex.org/keywords/semiconductor-industry","display_name":"Semiconductor industry","score":0.569121241569519},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5545192360877991},{"id":"https://openalex.org/keywords/yield","display_name":"Yield (engineering)","score":0.5110338926315308},{"id":"https://openalex.org/keywords/test","display_name":"Test (biology)","score":0.4955333471298218},{"id":"https://openalex.org/keywords/machine-learning","display_name":"Machine learning","score":0.4952222406864166},{"id":"https://openalex.org/keywords/product","display_name":"Product (mathematics)","score":0.4947769045829773},{"id":"https://openalex.org/keywords/reduction","display_name":"Reduction (mathematics)","score":0.49401432275772095},{"id":"https://openalex.org/keywords/integrated-circuit","display_name":"Integrated circuit","score":0.47586745023727417},{"id":"https://openalex.org/keywords/time-to-market","display_name":"Time to market","score":0.45758169889450073},{"id":"https://openalex.org/keywords/industrial-engineering","display_name":"Industrial engineering","score":0.4347502589225769},{"id":"https://openalex.org/keywords/table","display_name":"Table (database)","score":0.4206191301345825},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.3752133846282959},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.29437363147735596},{"id":"https://openalex.org/keywords/manufacturing-engineering","display_name":"Manufacturing engineering","score":0.25418663024902344},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.2152913212776184},{"id":"https://openalex.org/keywords/data-mining","display_name":"Data mining","score":0.21125757694244385}],"concepts":[{"id":"https://openalex.org/C2780310539","wikidata":"https://www.wikidata.org/wiki/Q12547192","display_name":"Imperfect","level":2,"score":0.6419775485992432},{"id":"https://openalex.org/C2779530757","wikidata":"https://www.wikidata.org/wiki/Q1207505","display_name":"Quality (philosophy)","level":2,"score":0.613379716873169},{"id":"https://openalex.org/C165696696","wikidata":"https://www.wikidata.org/wiki/Q11287","display_name":"Exploit","level":2,"score":0.6111374497413635},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.576035737991333},{"id":"https://openalex.org/C2987888538","wikidata":"https://www.wikidata.org/wiki/Q2986369","display_name":"Semiconductor industry","level":2,"score":0.569121241569519},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5545192360877991},{"id":"https://openalex.org/C134121241","wikidata":"https://www.wikidata.org/wiki/Q899301","display_name":"Yield (engineering)","level":2,"score":0.5110338926315308},{"id":"https://openalex.org/C2777267654","wikidata":"https://www.wikidata.org/wiki/Q3519023","display_name":"Test (biology)","level":2,"score":0.4955333471298218},{"id":"https://openalex.org/C119857082","wikidata":"https://www.wikidata.org/wiki/Q2539","display_name":"Machine learning","level":1,"score":0.4952222406864166},{"id":"https://openalex.org/C90673727","wikidata":"https://www.wikidata.org/wiki/Q901718","display_name":"Product (mathematics)","level":2,"score":0.4947769045829773},{"id":"https://openalex.org/C111335779","wikidata":"https://www.wikidata.org/wiki/Q3454686","display_name":"Reduction (mathematics)","level":2,"score":0.49401432275772095},{"id":"https://openalex.org/C530198007","wikidata":"https://www.wikidata.org/wiki/Q80831","display_name":"Integrated circuit","level":2,"score":0.47586745023727417},{"id":"https://openalex.org/C2779229675","wikidata":"https://www.wikidata.org/wiki/Q445235","display_name":"Time to market","level":2,"score":0.45758169889450073},{"id":"https://openalex.org/C13736549","wikidata":"https://www.wikidata.org/wiki/Q4489420","display_name":"Industrial engineering","level":1,"score":0.4347502589225769},{"id":"https://openalex.org/C45235069","wikidata":"https://www.wikidata.org/wiki/Q278425","display_name":"Table (database)","level":2,"score":0.4206191301345825},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.3752133846282959},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.29437363147735596},{"id":"https://openalex.org/C117671659","wikidata":"https://www.wikidata.org/wiki/Q11049265","display_name":"Manufacturing engineering","level":1,"score":0.25418663024902344},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.2152913212776184},{"id":"https://openalex.org/C124101348","wikidata":"https://www.wikidata.org/wiki/Q172491","display_name":"Data mining","level":1,"score":0.21125757694244385},{"id":"https://openalex.org/C151730666","wikidata":"https://www.wikidata.org/wiki/Q7205","display_name":"Paleontology","level":1,"score":0.0},{"id":"https://openalex.org/C38652104","wikidata":"https://www.wikidata.org/wiki/Q3510521","display_name":"Computer security","level":1,"score":0.0},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.0},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0},{"id":"https://openalex.org/C111472728","wikidata":"https://www.wikidata.org/wiki/Q9471","display_name":"Epistemology","level":1,"score":0.0},{"id":"https://openalex.org/C41895202","wikidata":"https://www.wikidata.org/wiki/Q8162","display_name":"Linguistics","level":1,"score":0.0},{"id":"https://openalex.org/C138885662","wikidata":"https://www.wikidata.org/wiki/Q5891","display_name":"Philosophy","level":0,"score":0.0},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C191897082","wikidata":"https://www.wikidata.org/wiki/Q11467","display_name":"Metallurgy","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/vts52500.2021.9794170","is_oa":false,"landing_page_url":"https://doi.org/10.1109/vts52500.2021.9794170","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2022 IEEE 40th VLSI Test Symposium (VTS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/9","score":0.6299999952316284,"display_name":"Industry, innovation and infrastructure"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":20,"referenced_works":["https://openalex.org/W1603355502","https://openalex.org/W1906764766","https://openalex.org/W2001881266","https://openalex.org/W2007480051","https://openalex.org/W2032698581","https://openalex.org/W2071783517","https://openalex.org/W2100758165","https://openalex.org/W2102201073","https://openalex.org/W2133241273","https://openalex.org/W2139497890","https://openalex.org/W2396110057","https://openalex.org/W2538809824","https://openalex.org/W2588066684","https://openalex.org/W2805255701","https://openalex.org/W3004652078","https://openalex.org/W3025962852","https://openalex.org/W3033429261","https://openalex.org/W3094136958","https://openalex.org/W3169220694","https://openalex.org/W4245420982"],"related_works":["https://openalex.org/W2374250903","https://openalex.org/W1546413948","https://openalex.org/W42072456","https://openalex.org/W1968696916","https://openalex.org/W2101780788","https://openalex.org/W4244619933","https://openalex.org/W2286729419","https://openalex.org/W1911718669","https://openalex.org/W3094591202","https://openalex.org/W2503934310"],"abstract_inverted_index":{"As":[0],"quality":[1,85],"expectations":[2],"of":[3,34,47,98,122,133,146,185,195],"integrated":[4],"circuits":[5],"(ICs)":[6],"continue":[7],"to":[8,19,52,64,95,117,176],"rise,":[9],"contemporary":[10],"semiconductor":[11],"manufacturing":[12],"and":[13,88,113,141,171,183],"test":[14,106],"solutions":[15],"experience":[16],"increased":[17],"pressure":[18],"prevent":[20],"any":[21],"defective":[22],"parts":[23],"from":[24],"being":[25],"shipped,":[26],"even":[27],"if":[28],"this":[29,40,139],"comes":[30],"at":[31],"the":[32,45,65,96,105,120,147,153,166,181,186],"cost":[33],"sacrificing":[35],"yield.":[36],"Known":[37],"as":[38,59,61],"\u201coverkill\u201d,":[39],"lost":[41],"yield":[42,148],"is":[43,150,198],"essentially":[44],"result":[46],"overly":[48],"conservative":[49],"decisions":[50,76],"made":[51],"compensate":[53],"for":[54,188],"imperfect":[55,57],"silicon,":[56],"test,":[58],"well":[60],"uncertainties":[62],"related":[63,94],"application":[66],"wherein":[67],"a":[68,99,127,144,160],"fabricated":[69],"IC":[70],"will":[71],"be":[72],"eventually":[73],"deployed.":[74],"Such":[75],"are":[77,91,191],"often":[78,125],"driven":[79],"by":[80,205],"auxiliary":[81,172],"production":[82],"characterization":[83],"or":[84],"control":[86],"tests":[87,112,170,173],"processes,":[89],"which":[90,164,189],"not":[92,130],"directly":[93],"specifications":[97],"product":[100],"but,":[101],"rather,":[102],"mainly":[103],"reflect":[104],"environment.":[107],"Nevertheless,":[108],"based":[109,162],"on":[110,119,152],"these":[111],"in":[114,174,180],"an":[115,201],"effort":[116],"err":[118],"side":[121],"caution,":[123],"industry":[124],"scraps":[126],"small":[128],"yet":[129],"insignificant":[131],"percentage":[132],"perfectly":[134],"good":[135],"devices.":[136],"To":[137],"address":[138],"problem":[140],"judiciously":[142],"recover":[143],"portion":[145],"that":[149],"left":[151],"table":[154],"without":[155],"increasing":[156],"risk,":[157],"we":[158],"introduce":[159],"machine-learning":[161],"solution":[163],"exploits":[165],"correlation":[167],"between":[168],"specification":[169],"order":[175],"independently":[177],"assess":[178],"confidence":[179],"validity":[182],"significance":[184],"latter,":[187],"limits":[190],"empirically":[192],"defined.":[193],"Effectiveness":[194],"our":[196],"method":[197],"evaluated":[199],"using":[200],"industrial":[202],"dataset":[203],"provided":[204],"Texas":[206],"Instruments.":[207]},"counts_by_year":[{"year":2025,"cited_by_count":2},{"year":2024,"cited_by_count":1}],"updated_date":"2026-02-26T06:29:33.603293","created_date":"2025-10-10T00:00:00"}