{"id":"https://openalex.org/W3033261812","doi":"https://doi.org/10.1109/vts48691.2020.9107638","title":"Reliability Evaluation of Turbo Decoders Implemented on SRAM-FPGAs","display_name":"Reliability Evaluation of Turbo Decoders Implemented on SRAM-FPGAs","publication_year":2020,"publication_date":"2020-04-01","ids":{"openalex":"https://openalex.org/W3033261812","doi":"https://doi.org/10.1109/vts48691.2020.9107638","mag":"3033261812"},"language":"en","primary_location":{"id":"doi:10.1109/vts48691.2020.9107638","is_oa":false,"landing_page_url":"https://doi.org/10.1109/vts48691.2020.9107638","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2020 IEEE 38th VLSI Test Symposium (VTS)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5054396881","display_name":"Zhen Gao","orcid":"https://orcid.org/0000-0002-2709-0216"},"institutions":[{"id":"https://openalex.org/I162868743","display_name":"Tianjin University","ror":"https://ror.org/012tb2g32","country_code":"CN","type":"education","lineage":["https://openalex.org/I162868743"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Zhen Gao","raw_affiliation_strings":["School of Electrical and Information Engineering, Tianjin University, Tianjin, China"],"affiliations":[{"raw_affiliation_string":"School of Electrical and Information Engineering, Tianjin University, Tianjin, China","institution_ids":["https://openalex.org/I162868743"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100384157","display_name":"Lingling Zhang","orcid":"https://orcid.org/0000-0002-9834-7410"},"institutions":[{"id":"https://openalex.org/I162868743","display_name":"Tianjin University","ror":"https://ror.org/012tb2g32","country_code":"CN","type":"education","lineage":["https://openalex.org/I162868743"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Lingling Zhang","raw_affiliation_strings":["School of Electrical and Information Engineering, Tianjin University, Tianjin, China"],"affiliations":[{"raw_affiliation_string":"School of Electrical and Information Engineering, Tianjin University, Tianjin, China","institution_ids":["https://openalex.org/I162868743"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5032975404","display_name":"Ruishi Han","orcid":null},"institutions":[{"id":"https://openalex.org/I162868743","display_name":"Tianjin University","ror":"https://ror.org/012tb2g32","country_code":"CN","type":"education","lineage":["https://openalex.org/I162868743"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Ruishi Han","raw_affiliation_strings":["School of Electrical and Information Engineering, Tianjin University, Tianjin, China"],"affiliations":[{"raw_affiliation_string":"School of Electrical and Information Engineering, Tianjin University, Tianjin, China","institution_ids":["https://openalex.org/I162868743"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5080322790","display_name":"Pedro Reviriego","orcid":"https://orcid.org/0000-0003-2540-5234"},"institutions":[{"id":"https://openalex.org/I50357001","display_name":"Universidad Carlos III de Madrid","ror":"https://ror.org/03ths8210","country_code":"ES","type":"education","lineage":["https://openalex.org/I50357001"]}],"countries":["ES"],"is_corresponding":false,"raw_author_name":"Pedro Reviriego","raw_affiliation_strings":["Departamento de Ingenier\u00eda Telem\u00e1tica, Universidad Carlos III de Madrid, Madrid, Spain"],"affiliations":[{"raw_affiliation_string":"Departamento de Ingenier\u00eda Telem\u00e1tica, Universidad Carlos III de Madrid, Madrid, Spain","institution_ids":["https://openalex.org/I50357001"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5100679817","display_name":"Zhiqiang Li","orcid":"https://orcid.org/0000-0002-9548-935X"},"institutions":[{"id":"https://openalex.org/I72565114","display_name":"Luoyang Institute of Science and Technology","ror":"https://ror.org/04nraex26","country_code":"CN","type":"education","lineage":["https://openalex.org/I72565114"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Zhiqiang Li","raw_affiliation_strings":["Luoyang Newvid Technology Co., Ltd, Luoyang, China"],"affiliations":[{"raw_affiliation_string":"Luoyang Newvid Technology Co., Ltd, Luoyang, China","institution_ids":["https://openalex.org/I72565114"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5054396881"],"corresponding_institution_ids":["https://openalex.org/I162868743"],"apc_list":null,"apc_paid":null,"fwci":0.7192,"has_fulltext":false,"cited_by_count":8,"citation_normalized_percentile":{"value":0.6990398,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":97},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"6"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11321","display_name":"Error Correcting Code Techniques","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10125","display_name":"Advanced Wireless Communication Techniques","score":0.9976000189781189,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/turbo-code","display_name":"Turbo code","score":0.7530893087387085},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7392559051513672},{"id":"https://openalex.org/keywords/field-programmable-gate-array","display_name":"Field-programmable gate array","score":0.6627064943313599},{"id":"https://openalex.org/keywords/static-random-access-memory","display_name":"Static random-access memory","score":0.6375900506973267},{"id":"https://openalex.org/keywords/turbo","display_name":"Turbo","score":0.5822029709815979},{"id":"https://openalex.org/keywords/fault-injection","display_name":"Fault injection","score":0.536893904209137},{"id":"https://openalex.org/keywords/interleaving","display_name":"Interleaving","score":0.5063139200210571},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.49698832631111145},{"id":"https://openalex.org/keywords/turbo-equalizer","display_name":"Turbo equalizer","score":0.4759654402732849},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.4748252332210541},{"id":"https://openalex.org/keywords/decoding-methods","display_name":"Decoding methods","score":0.4139552712440491},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.3988248109817505},{"id":"https://openalex.org/keywords/concatenated-error-correction-code","display_name":"Concatenated error correction code","score":0.19051286578178406},{"id":"https://openalex.org/keywords/block-code","display_name":"Block code","score":0.14133509993553162},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.13581889867782593},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.1055644154548645},{"id":"https://openalex.org/keywords/operating-system","display_name":"Operating system","score":0.08956757187843323}],"concepts":[{"id":"https://openalex.org/C114504821","wikidata":"https://www.wikidata.org/wiki/Q2164281","display_name":"Turbo code","level":3,"score":0.7530893087387085},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7392559051513672},{"id":"https://openalex.org/C42935608","wikidata":"https://www.wikidata.org/wiki/Q190411","display_name":"Field-programmable gate array","level":2,"score":0.6627064943313599},{"id":"https://openalex.org/C68043766","wikidata":"https://www.wikidata.org/wiki/Q267416","display_name":"Static random-access memory","level":2,"score":0.6375900506973267},{"id":"https://openalex.org/C2776240298","wikidata":"https://www.wikidata.org/wiki/Q1138513","display_name":"Turbo","level":2,"score":0.5822029709815979},{"id":"https://openalex.org/C2775928411","wikidata":"https://www.wikidata.org/wiki/Q2041312","display_name":"Fault injection","level":3,"score":0.536893904209137},{"id":"https://openalex.org/C28034677","wikidata":"https://www.wikidata.org/wiki/Q17092530","display_name":"Interleaving","level":2,"score":0.5063139200210571},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.49698832631111145},{"id":"https://openalex.org/C12232224","wikidata":"https://www.wikidata.org/wiki/Q7853840","display_name":"Turbo equalizer","level":5,"score":0.4759654402732849},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.4748252332210541},{"id":"https://openalex.org/C57273362","wikidata":"https://www.wikidata.org/wiki/Q576722","display_name":"Decoding methods","level":2,"score":0.4139552712440491},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.3988248109817505},{"id":"https://openalex.org/C78944582","wikidata":"https://www.wikidata.org/wiki/Q5158264","display_name":"Concatenated error correction code","level":4,"score":0.19051286578178406},{"id":"https://openalex.org/C157125643","wikidata":"https://www.wikidata.org/wiki/Q884707","display_name":"Block code","level":3,"score":0.14133509993553162},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.13581889867782593},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.1055644154548645},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.08956757187843323},{"id":"https://openalex.org/C2777904410","wikidata":"https://www.wikidata.org/wiki/Q7397","display_name":"Software","level":2,"score":0.0},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C171146098","wikidata":"https://www.wikidata.org/wiki/Q124192","display_name":"Automotive engineering","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/vts48691.2020.9107638","is_oa":false,"landing_page_url":"https://doi.org/10.1109/vts48691.2020.9107638","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2020 IEEE 38th VLSI Test Symposium (VTS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.6700000166893005,"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":23,"referenced_works":["https://openalex.org/W58580312","https://openalex.org/W582070731","https://openalex.org/W1512085033","https://openalex.org/W1607327922","https://openalex.org/W2000459267","https://openalex.org/W2001118700","https://openalex.org/W2008526643","https://openalex.org/W2054149682","https://openalex.org/W2067709077","https://openalex.org/W2076317413","https://openalex.org/W2107084876","https://openalex.org/W2113783551","https://openalex.org/W2119571645","https://openalex.org/W2139541918","https://openalex.org/W2143105503","https://openalex.org/W2169335080","https://openalex.org/W2475646144","https://openalex.org/W2541133130","https://openalex.org/W2794358169","https://openalex.org/W4234572373","https://openalex.org/W4300835888","https://openalex.org/W6652700295","https://openalex.org/W6844949599"],"related_works":["https://openalex.org/W2161351338","https://openalex.org/W4287740435","https://openalex.org/W2103764150","https://openalex.org/W2116478666","https://openalex.org/W2147600706","https://openalex.org/W4298153665","https://openalex.org/W2593195270","https://openalex.org/W2497042610","https://openalex.org/W2535923291","https://openalex.org/W2010424581"],"abstract_inverted_index":{"Turbo":[0,10,45,53,86,163],"codes":[1],"are":[2,67],"widely":[3],"used":[4],"in":[5,21],"satellite":[6],"communications.":[7,38],"When":[8],"a":[9,15,22,134,166],"decoder":[11,54,164],"is":[12,50,58,99,107,151,175],"implemented":[13,47,59],"on":[14,48,60,75,80,124,129,138],"Field":[16],"Programmable":[17],"Gate":[18],"Array":[19],"(FPGA)":[20],"space":[23],"platform,":[24],"it":[25],"will":[26],"suffer":[27],"Single":[28],"Event":[29],"Upsets":[30],"(SEUs)":[31],"that":[32],"can":[33],"cause":[34],"failures":[35],"and":[36,79,102,115,128,155,171],"disrupt":[37],"In":[39,121,160],"this":[40],"paper,":[41],"the":[42,71,76,81,85,95,103,110,125,130,144,147,162,172,179],"reliability":[43,168],"of":[44,73,84,105],"decoders":[46],"FPGAs":[49],"evaluated.":[51],"The":[52],"with":[55],"Log-MAP":[56],"algorithm":[57],"an":[61],"SRAM-FPGA.":[62],"Then,":[63],"fault":[64],"injection":[65],"experiments":[66],"conducted":[68],"to":[69,109,117],"simulate":[70],"effects":[72],"SEU":[74,96,106,148],"user":[77,93,173],"memory":[78,83,174],"configuration":[82,145,180],"decoder.":[87],"Experimental":[88],"results":[89],"show":[90],"that,":[91],"for":[92],"memory,":[94,146],"tolerance":[97,149],"rate":[98,150],"over":[100],"95%,":[101],"effect":[104],"related":[108],"iteration":[111],"period,":[112],"bit":[113],"position":[114],"Signal":[116],"Noise":[118],"Ratio":[119],"(SNR).":[120],"particular,":[122],"SEUs":[123],"control/address":[126],"registers":[127,140],"interleaving":[131],"table":[132],"have":[133],"larger":[135],"impact":[136],"than":[137,153,178],"other":[139],"or":[141],"memories.":[142],"For":[143],"higher":[152],"86%,":[154],"decreases":[156],"as":[157],"SNR":[158],"increases.":[159],"general,":[161],"exhibits":[165],"high":[167],"against":[169],"SEUs,":[170],"more":[176],"reliable":[177],"memory.":[181]},"counts_by_year":[{"year":2024,"cited_by_count":1},{"year":2023,"cited_by_count":2},{"year":2022,"cited_by_count":3},{"year":2020,"cited_by_count":2}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}