{"id":"https://openalex.org/W3033429261","doi":"https://doi.org/10.1109/vts48691.2020.9107616","title":"Quantile \u2013 Quantile Fitting Approach to Detect Site to Site Variations in Massive Multi-site Testing","display_name":"Quantile \u2013 Quantile Fitting Approach to Detect Site to Site Variations in Massive Multi-site Testing","publication_year":2020,"publication_date":"2020-04-01","ids":{"openalex":"https://openalex.org/W3033429261","doi":"https://doi.org/10.1109/vts48691.2020.9107616","mag":"3033429261"},"language":"en","primary_location":{"id":"doi:10.1109/vts48691.2020.9107616","is_oa":false,"landing_page_url":"https://doi.org/10.1109/vts48691.2020.9107616","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2020 IEEE 38th VLSI Test Symposium (VTS)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5084435377","display_name":"Praise O. Farayola","orcid":"https://orcid.org/0000-0002-2853-4763"},"institutions":[{"id":"https://openalex.org/I173911158","display_name":"Iowa State University","ror":"https://ror.org/04rswrd78","country_code":"US","type":"education","lineage":["https://openalex.org/I173911158"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Praise O. Farayola","raw_affiliation_strings":["Electrical and Computer Engineering Department, Iowa State University, Ames, IA, USA"],"affiliations":[{"raw_affiliation_string":"Electrical and Computer Engineering Department, Iowa State University, Ames, IA, USA","institution_ids":["https://openalex.org/I173911158"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5023673688","display_name":"Shravan K. Chaganti","orcid":"https://orcid.org/0000-0001-5930-5894"},"institutions":[{"id":"https://openalex.org/I173911158","display_name":"Iowa State University","ror":"https://ror.org/04rswrd78","country_code":"US","type":"education","lineage":["https://openalex.org/I173911158"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Shravan K. Chaganti","raw_affiliation_strings":["Electrical and Computer Engineering Department, Iowa State University, Ames, IA, USA"],"affiliations":[{"raw_affiliation_string":"Electrical and Computer Engineering Department, Iowa State University, Ames, IA, USA","institution_ids":["https://openalex.org/I173911158"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5072580224","display_name":"Abdullah O. Obaidi","orcid":null},"institutions":[{"id":"https://openalex.org/I173911158","display_name":"Iowa State University","ror":"https://ror.org/04rswrd78","country_code":"US","type":"education","lineage":["https://openalex.org/I173911158"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Abdullah O. Obaidi","raw_affiliation_strings":["Electrical and Computer Engineering Department, Iowa State University, Ames, IA, USA"],"affiliations":[{"raw_affiliation_string":"Electrical and Computer Engineering Department, Iowa State University, Ames, IA, USA","institution_ids":["https://openalex.org/I173911158"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5081596132","display_name":"Abalhassan Sheikh","orcid":"https://orcid.org/0000-0001-8106-4732"},"institutions":[{"id":"https://openalex.org/I74760111","display_name":"Texas Instruments (United States)","ror":"https://ror.org/03vsmv677","country_code":"US","type":"company","lineage":["https://openalex.org/I74760111"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Abalhassan Sheikh","raw_affiliation_strings":["Product Engineer, Texas Instruments Inc, Sugar Land, TX, USA"],"affiliations":[{"raw_affiliation_string":"Product Engineer, Texas Instruments Inc, Sugar Land, TX, USA","institution_ids":["https://openalex.org/I74760111"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101754185","display_name":"Srivaths Ravi","orcid":"https://orcid.org/0000-0002-1306-2361"},"institutions":[{"id":"https://openalex.org/I74760111","display_name":"Texas Instruments (United States)","ror":"https://ror.org/03vsmv677","country_code":"US","type":"company","lineage":["https://openalex.org/I74760111"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Srivaths Ravi","raw_affiliation_strings":["TI Test Engineering, Texas Instrument Inc, Sugar Land, TX, USA"],"affiliations":[{"raw_affiliation_string":"TI Test Engineering, Texas Instrument Inc, Sugar Land, TX, USA","institution_ids":["https://openalex.org/I74760111"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5101873076","display_name":"Degang Chen","orcid":"https://orcid.org/0000-0002-5938-6329"},"institutions":[{"id":"https://openalex.org/I173911158","display_name":"Iowa State University","ror":"https://ror.org/04rswrd78","country_code":"US","type":"education","lineage":["https://openalex.org/I173911158"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Degang Chen","raw_affiliation_strings":["Electrical and Computer Engineering Department, Iowa State University, Ames, IA, USA"],"affiliations":[{"raw_affiliation_string":"Electrical and Computer Engineering Department, Iowa State University, Ames, IA, USA","institution_ids":["https://openalex.org/I173911158"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":6,"corresponding_author_ids":["https://openalex.org/A5084435377"],"corresponding_institution_ids":["https://openalex.org/I173911158"],"apc_list":null,"apc_paid":null,"fwci":3.9276,"has_fulltext":false,"cited_by_count":18,"citation_normalized_percentile":{"value":0.94221835,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":90,"max":99},"biblio":{"volume":"44","issue":null,"first_page":"1","last_page":"6"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9980999827384949,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9980999827384949,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11798","display_name":"Optimal Experimental Design Methods","score":0.9932000041007996,"subfield":{"id":"https://openalex.org/subfields/1803","display_name":"Management Science and Operations Research"},"field":{"id":"https://openalex.org/fields/18","display_name":"Decision Sciences"},"domain":{"id":"https://openalex.org/domains/2","display_name":"Social Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9879999756813049,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/quantile","display_name":"Quantile","score":0.7903551459312439},{"id":"https://openalex.org/keywords/quantile-regression","display_name":"Quantile regression","score":0.5594014525413513},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5115123987197876},{"id":"https://openalex.org/keywords/skewness","display_name":"Skewness","score":0.5072605013847351},{"id":"https://openalex.org/keywords/plot","display_name":"Plot (graphics)","score":0.5021963119506836},{"id":"https://openalex.org/keywords/test-site","display_name":"Test site","score":0.4919995963573456},{"id":"https://openalex.org/keywords/statistics","display_name":"Statistics","score":0.4819764494895935},{"id":"https://openalex.org/keywords/statistical-hypothesis-testing","display_name":"Statistical hypothesis testing","score":0.46453171968460083},{"id":"https://openalex.org/keywords/data-mining","display_name":"Data mining","score":0.3874146342277527},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.3329789638519287},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.23837891221046448},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2052454650402069}],"concepts":[{"id":"https://openalex.org/C118671147","wikidata":"https://www.wikidata.org/wiki/Q578714","display_name":"Quantile","level":2,"score":0.7903551459312439},{"id":"https://openalex.org/C63817138","wikidata":"https://www.wikidata.org/wiki/Q3455889","display_name":"Quantile regression","level":2,"score":0.5594014525413513},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5115123987197876},{"id":"https://openalex.org/C122342681","wikidata":"https://www.wikidata.org/wiki/Q330828","display_name":"Skewness","level":2,"score":0.5072605013847351},{"id":"https://openalex.org/C167651023","wikidata":"https://www.wikidata.org/wiki/Q1474611","display_name":"Plot (graphics)","level":2,"score":0.5021963119506836},{"id":"https://openalex.org/C2983696493","wikidata":"https://www.wikidata.org/wiki/Q7705730","display_name":"Test site","level":2,"score":0.4919995963573456},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.4819764494895935},{"id":"https://openalex.org/C87007009","wikidata":"https://www.wikidata.org/wiki/Q210832","display_name":"Statistical hypothesis testing","level":2,"score":0.46453171968460083},{"id":"https://openalex.org/C124101348","wikidata":"https://www.wikidata.org/wiki/Q172491","display_name":"Data mining","level":1,"score":0.3874146342277527},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.3329789638519287},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.23837891221046448},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2052454650402069},{"id":"https://openalex.org/C16674752","wikidata":"https://www.wikidata.org/wiki/Q1370637","display_name":"Mining engineering","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/vts48691.2020.9107616","is_oa":false,"landing_page_url":"https://doi.org/10.1109/vts48691.2020.9107616","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2020 IEEE 38th VLSI Test Symposium (VTS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":26,"referenced_works":["https://openalex.org/W1998943402","https://openalex.org/W2001881266","https://openalex.org/W2019716132","https://openalex.org/W2031211406","https://openalex.org/W2040695849","https://openalex.org/W2050085107","https://openalex.org/W2053084211","https://openalex.org/W2086066321","https://openalex.org/W2099992850","https://openalex.org/W2111265284","https://openalex.org/W2115170364","https://openalex.org/W2116428497","https://openalex.org/W2118131183","https://openalex.org/W2118932352","https://openalex.org/W2123818150","https://openalex.org/W2149337256","https://openalex.org/W2159449186","https://openalex.org/W2162342991","https://openalex.org/W2162433349","https://openalex.org/W2169894359","https://openalex.org/W2329024626","https://openalex.org/W2498233082","https://openalex.org/W4210462867","https://openalex.org/W4238503129","https://openalex.org/W6658183893","https://openalex.org/W6724361376"],"related_works":["https://openalex.org/W4206511378","https://openalex.org/W4206618949","https://openalex.org/W2526321210","https://openalex.org/W3205863630","https://openalex.org/W4318833145","https://openalex.org/W2364275385","https://openalex.org/W4388704167","https://openalex.org/W2007977664","https://openalex.org/W4376874882","https://openalex.org/W2224749288"],"abstract_inverted_index":{"Multi-site":[0],"testing":[1],"saves":[2],"test":[3,21,34,83,94,131,163,173,183],"time":[4,35],"and":[5,36,71,85,117,159,188],"tests":[6],"cost":[7],"by":[8],"screening":[9],"multiple":[10],"chips":[11],"at":[12,190],"once.":[13],"However,":[14],"it":[15],"comes":[16],"with":[17,74,137],"its":[18],"issues.":[19],"As":[20],"engineers":[22],"increase":[23],"the":[24,57,93,109,143,156,162,172],"number":[25],"of":[26,111,145,161],"sites":[27,73,136],"on":[28,101,181],"each":[29,112],"tester":[30],"to":[31,47,53,65,68,77,80,86,107,114,123,126,171],"further":[32],"save":[33],"cost,":[37],"variations":[38,70,128],"are":[39],"now":[40],"being":[41],"observed":[42],"in":[43,56,130,150],"measurements":[44],"from":[45,92],"site":[46,48,67,69,113,125,127],"which":[49],"do":[50],"not":[51],"correspond":[52],"actual":[54],"problems":[55,90],"devices":[58],"under":[59],"test.":[60],"Thus,":[61],"a":[62,102,115,151],"cost-effective":[63],"way":[64],"investigate":[66],"identify":[72],"issues":[75],"needs":[76],"be":[78],"developed":[79],"ensure":[81],"high":[82],"quality":[84],"rule":[87],"out":[88],"possible":[89],"arising":[91],"hardware.":[95],"In":[96],"this":[97],"paper,":[98],"regression":[99],"fitting":[100],"quantile-quantile":[103,140],"curve":[104],"is":[105,121,189],"used":[106],"compare":[108],"distribution":[110,186],"theoretical":[116],"expected":[118],"distribution.":[119],"This":[120,166],"shown":[122],"pronounce":[124],"inherent":[129],"data,":[132],"hence":[133],"identifying":[134],"issue-ridden":[135],"ease.":[138],"The":[139],"plot":[141],"compares":[142],"integrals":[144],"two":[146],"probability":[147],"density":[148],"functions":[149],"single":[152,182],"plot,":[153],"thus":[154],"capturing":[155],"location,":[157],"scale,":[158],"skewness":[160],"data":[164],"set.":[165],"method":[167],"provides":[168],"more":[169],"information":[170],"engineer":[174],"than":[175],"classical":[176],"statistical":[177],"methods":[178],"that":[179],"rely":[180],"statistics":[184],"for":[185],"comparison":[187],"no":[191],"extra":[192],"cost.":[193]},"counts_by_year":[{"year":2024,"cited_by_count":1},{"year":2023,"cited_by_count":4},{"year":2022,"cited_by_count":7},{"year":2021,"cited_by_count":6}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}