{"id":"https://openalex.org/W2956496679","doi":"https://doi.org/10.1109/vts.2019.8758662","title":"Special Session: Delay Fault Testing - Present and Future","display_name":"Special Session: Delay Fault Testing - Present and Future","publication_year":2019,"publication_date":"2019-04-01","ids":{"openalex":"https://openalex.org/W2956496679","doi":"https://doi.org/10.1109/vts.2019.8758662","mag":"2956496679"},"language":"en","primary_location":{"id":"doi:10.1109/vts.2019.8758662","is_oa":false,"landing_page_url":"https://doi.org/10.1109/vts.2019.8758662","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2019 IEEE 37th VLSI Test Symposium (VTS)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5084680936","display_name":"Jubayer Mahmod","orcid":"https://orcid.org/0000-0001-6535-182X"},"institutions":[{"id":"https://openalex.org/I82497590","display_name":"Auburn University","ror":"https://ror.org/02v80fc35","country_code":"US","type":"education","lineage":["https://openalex.org/I82497590"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Jubayer Mahmod","raw_affiliation_strings":["Department of Electrical and Computer Engineering, Auburn University, AL"],"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, Auburn University, AL","institution_ids":["https://openalex.org/I82497590"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5083602913","display_name":"Spencer K. Millican","orcid":"https://orcid.org/0000-0003-3682-4610"},"institutions":[{"id":"https://openalex.org/I82497590","display_name":"Auburn University","ror":"https://ror.org/02v80fc35","country_code":"US","type":"education","lineage":["https://openalex.org/I82497590"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Spencer Millican","raw_affiliation_strings":["Department of Electrical and Computer Engineering, Auburn University, AL"],"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, Auburn University, AL","institution_ids":["https://openalex.org/I82497590"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5079601863","display_name":"Ujjwal Guin","orcid":"https://orcid.org/0000-0002-4819-8728"},"institutions":[{"id":"https://openalex.org/I82497590","display_name":"Auburn University","ror":"https://ror.org/02v80fc35","country_code":"US","type":"education","lineage":["https://openalex.org/I82497590"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Ujjwal Guin","raw_affiliation_strings":["Department of Electrical and Computer Engineering, Auburn University, AL"],"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, Auburn University, AL","institution_ids":["https://openalex.org/I82497590"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5084081268","display_name":"Vishwani D. Agrawal","orcid":"https://orcid.org/0000-0002-7121-5979"},"institutions":[{"id":"https://openalex.org/I82497590","display_name":"Auburn University","ror":"https://ror.org/02v80fc35","country_code":"US","type":"education","lineage":["https://openalex.org/I82497590"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Vishwani Agrawal","raw_affiliation_strings":["Department of Electrical and Computer Engineering, Auburn University, AL"],"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, Auburn University, AL","institution_ids":["https://openalex.org/I82497590"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5084680936"],"corresponding_institution_ids":["https://openalex.org/I82497590"],"apc_list":null,"apc_paid":null,"fwci":0.8346,"has_fulltext":false,"cited_by_count":14,"citation_normalized_percentile":{"value":0.73821554,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":97},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"10"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12122","display_name":"Physical Unclonable Functions (PUFs) and Hardware Security","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7034838199615479},{"id":"https://openalex.org/keywords/session","display_name":"Session (web analytics)","score":0.6967284083366394},{"id":"https://openalex.org/keywords/automatic-test-pattern-generation","display_name":"Automatic test pattern generation","score":0.6332603096961975},{"id":"https://openalex.org/keywords/asynchronous-communication","display_name":"Asynchronous communication","score":0.5686684846878052},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.5117106437683105},{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.494841992855072},{"id":"https://openalex.org/keywords/digital-electronics","display_name":"Digital electronics","score":0.4912838339805603},{"id":"https://openalex.org/keywords/field","display_name":"Field (mathematics)","score":0.4636828303337097},{"id":"https://openalex.org/keywords/fault-simulator","display_name":"Fault Simulator","score":0.45808401703834534},{"id":"https://openalex.org/keywords/counterfeit","display_name":"Counterfeit","score":0.45378443598747253},{"id":"https://openalex.org/keywords/path","display_name":"Path (computing)","score":0.42368996143341064},{"id":"https://openalex.org/keywords/fault-coverage","display_name":"Fault coverage","score":0.41580134630203247},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.4141237139701843},{"id":"https://openalex.org/keywords/computer-engineering","display_name":"Computer engineering","score":0.3484015464782715},{"id":"https://openalex.org/keywords/computer-architecture","display_name":"Computer architecture","score":0.32016873359680176},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.2970077693462372},{"id":"https://openalex.org/keywords/fault-detection-and-isolation","display_name":"Fault detection and isolation","score":0.2870951294898987},{"id":"https://openalex.org/keywords/stuck-at-fault","display_name":"Stuck-at fault","score":0.2822599709033966},{"id":"https://openalex.org/keywords/computer-network","display_name":"Computer network","score":0.2334120273590088},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.1964661180973053},{"id":"https://openalex.org/keywords/operating-system","display_name":"Operating system","score":0.1478683054447174},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.12465164065361023},{"id":"https://openalex.org/keywords/world-wide-web","display_name":"World Wide Web","score":0.08226755261421204}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7034838199615479},{"id":"https://openalex.org/C2779182362","wikidata":"https://www.wikidata.org/wiki/Q17126187","display_name":"Session (web analytics)","level":2,"score":0.6967284083366394},{"id":"https://openalex.org/C17626397","wikidata":"https://www.wikidata.org/wiki/Q837455","display_name":"Automatic test pattern generation","level":3,"score":0.6332603096961975},{"id":"https://openalex.org/C151319957","wikidata":"https://www.wikidata.org/wiki/Q752739","display_name":"Asynchronous communication","level":2,"score":0.5686684846878052},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.5117106437683105},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.494841992855072},{"id":"https://openalex.org/C81843906","wikidata":"https://www.wikidata.org/wiki/Q173156","display_name":"Digital electronics","level":3,"score":0.4912838339805603},{"id":"https://openalex.org/C9652623","wikidata":"https://www.wikidata.org/wiki/Q190109","display_name":"Field (mathematics)","level":2,"score":0.4636828303337097},{"id":"https://openalex.org/C2776365744","wikidata":"https://www.wikidata.org/wiki/Q5438149","display_name":"Fault Simulator","level":5,"score":0.45808401703834534},{"id":"https://openalex.org/C2779356469","wikidata":"https://www.wikidata.org/wiki/Q502918","display_name":"Counterfeit","level":2,"score":0.45378443598747253},{"id":"https://openalex.org/C2777735758","wikidata":"https://www.wikidata.org/wiki/Q817765","display_name":"Path (computing)","level":2,"score":0.42368996143341064},{"id":"https://openalex.org/C126953365","wikidata":"https://www.wikidata.org/wiki/Q5438152","display_name":"Fault coverage","level":3,"score":0.41580134630203247},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.4141237139701843},{"id":"https://openalex.org/C113775141","wikidata":"https://www.wikidata.org/wiki/Q428691","display_name":"Computer engineering","level":1,"score":0.3484015464782715},{"id":"https://openalex.org/C118524514","wikidata":"https://www.wikidata.org/wiki/Q173212","display_name":"Computer architecture","level":1,"score":0.32016873359680176},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.2970077693462372},{"id":"https://openalex.org/C152745839","wikidata":"https://www.wikidata.org/wiki/Q5438153","display_name":"Fault detection and isolation","level":3,"score":0.2870951294898987},{"id":"https://openalex.org/C13625343","wikidata":"https://www.wikidata.org/wiki/Q7627418","display_name":"Stuck-at fault","level":4,"score":0.2822599709033966},{"id":"https://openalex.org/C31258907","wikidata":"https://www.wikidata.org/wiki/Q1301371","display_name":"Computer network","level":1,"score":0.2334120273590088},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.1964661180973053},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.1478683054447174},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.12465164065361023},{"id":"https://openalex.org/C136764020","wikidata":"https://www.wikidata.org/wiki/Q466","display_name":"World Wide Web","level":1,"score":0.08226755261421204},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.0},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.0},{"id":"https://openalex.org/C17744445","wikidata":"https://www.wikidata.org/wiki/Q36442","display_name":"Political science","level":0,"score":0.0},{"id":"https://openalex.org/C202444582","wikidata":"https://www.wikidata.org/wiki/Q837863","display_name":"Pure mathematics","level":1,"score":0.0},{"id":"https://openalex.org/C172707124","wikidata":"https://www.wikidata.org/wiki/Q423488","display_name":"Actuator","level":2,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C199539241","wikidata":"https://www.wikidata.org/wiki/Q7748","display_name":"Law","level":1,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/vts.2019.8758662","is_oa":false,"landing_page_url":"https://doi.org/10.1109/vts.2019.8758662","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2019 IEEE 37th VLSI Test Symposium (VTS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":148,"referenced_works":["https://openalex.org/W13277579","https://openalex.org/W148640284","https://openalex.org/W346138648","https://openalex.org/W1482498073","https://openalex.org/W1502946027","https://openalex.org/W1511398680","https://openalex.org/W1514439880","https://openalex.org/W1543521752","https://openalex.org/W1555154650","https://openalex.org/W1576951655","https://openalex.org/W1582800210","https://openalex.org/W1583304273","https://openalex.org/W1595368737","https://openalex.org/W1603444000","https://openalex.org/W1610717462","https://openalex.org/W1941043554","https://openalex.org/W1974885092","https://openalex.org/W1980985044","https://openalex.org/W1982628661","https://openalex.org/W1984588379","https://openalex.org/W1986228509","https://openalex.org/W1992413325","https://openalex.org/W1994241124","https://openalex.org/W1995505545","https://openalex.org/W1996048930","https://openalex.org/W1996613319","https://openalex.org/W1998560100","https://openalex.org/W2003149744","https://openalex.org/W2022980973","https://openalex.org/W2033908843","https://openalex.org/W2035008154","https://openalex.org/W2035720669","https://openalex.org/W2040171223","https://openalex.org/W2041424982","https://openalex.org/W2042435629","https://openalex.org/W2046705287","https://openalex.org/W2059016802","https://openalex.org/W2061946964","https://openalex.org/W2067701383","https://openalex.org/W2074078071","https://openalex.org/W2078037485","https://openalex.org/W2087336363","https://openalex.org/W2093439000","https://openalex.org/W2095754347","https://openalex.org/W2095971709","https://openalex.org/W2096146619","https://openalex.org/W2096441057","https://openalex.org/W2099101940","https://openalex.org/W2100925694","https://openalex.org/W2103935412","https://openalex.org/W2106257389","https://openalex.org/W2106884550","https://openalex.org/W2108812492","https://openalex.org/W2109986557","https://openalex.org/W2110134350","https://openalex.org/W2110164501","https://openalex.org/W2110542678","https://openalex.org/W2110693000","https://openalex.org/W2111154686","https://openalex.org/W2112062619","https://openalex.org/W2113201323","https://openalex.org/W2113853304","https://openalex.org/W2114204923","https://openalex.org/W2114313734","https://openalex.org/W2119826888","https://openalex.org/W2121657613","https://openalex.org/W2123827167","https://openalex.org/W2124025609","https://openalex.org/W2124196450","https://openalex.org/W2126199987","https://openalex.org/W2126564504","https://openalex.org/W2129183345","https://openalex.org/W2130530249","https://openalex.org/W2131694824","https://openalex.org/W2132934175","https://openalex.org/W2133513515","https://openalex.org/W2134827617","https://openalex.org/W2137012712","https://openalex.org/W2137279507","https://openalex.org/W2138086100","https://openalex.org/W2139098916","https://openalex.org/W2139397375","https://openalex.org/W2142426075","https://openalex.org/W2144375411","https://openalex.org/W2144573344","https://openalex.org/W2148598008","https://openalex.org/W2148873009","https://openalex.org/W2150928734","https://openalex.org/W2151275401","https://openalex.org/W2154363431","https://openalex.org/W2154695555","https://openalex.org/W2154708714","https://openalex.org/W2155694033","https://openalex.org/W2158902938","https://openalex.org/W2160010735","https://openalex.org/W2160444875","https://openalex.org/W2160826613","https://openalex.org/W2161054100","https://openalex.org/W2164754947","https://openalex.org/W2164858249","https://openalex.org/W2168642835","https://openalex.org/W2168647360","https://openalex.org/W2169061104","https://openalex.org/W2172075479","https://openalex.org/W2172249174","https://openalex.org/W2277653173","https://openalex.org/W2293704744","https://openalex.org/W2300806133","https://openalex.org/W2307493678","https://openalex.org/W2405841984","https://openalex.org/W2493822152","https://openalex.org/W2511040012","https://openalex.org/W2569628481","https://openalex.org/W2606045730","https://openalex.org/W2770140956","https://openalex.org/W2772639423","https://openalex.org/W2774375633","https://openalex.org/W2781990833","https://openalex.org/W2782512394","https://openalex.org/W2791363815","https://openalex.org/W2794709452","https://openalex.org/W2798417669","https://openalex.org/W2805199763","https://openalex.org/W2806223883","https://openalex.org/W2945899287","https://openalex.org/W3021874516","https://openalex.org/W3145117939","https://openalex.org/W3146045665","https://openalex.org/W3166753884","https://openalex.org/W4231973520","https://openalex.org/W4242308193","https://openalex.org/W4243195860","https://openalex.org/W4244741468","https://openalex.org/W4246316905","https://openalex.org/W4246568307","https://openalex.org/W4247494086","https://openalex.org/W4251123074","https://openalex.org/W4251819110","https://openalex.org/W6600530048","https://openalex.org/W6632457035","https://openalex.org/W6669715640","https://openalex.org/W6675222231","https://openalex.org/W6677086579","https://openalex.org/W6678664461","https://openalex.org/W6682184091","https://openalex.org/W6685194180","https://openalex.org/W6731620700","https://openalex.org/W6986729484"],"related_works":["https://openalex.org/W1574947316","https://openalex.org/W2031110496","https://openalex.org/W2138394502","https://openalex.org/W2157154381","https://openalex.org/W4253743993","https://openalex.org/W2913077774","https://openalex.org/W1923485359","https://openalex.org/W2158172759","https://openalex.org/W2288548055","https://openalex.org/W2015972826"],"abstract_inverted_index":{"This":[0,50],"article":[1],"presents":[2],"a":[3],"brief":[4],"survey":[5],"of":[6],"digital":[7],"delay":[8],"fault":[9,16],"testing,":[10],"which":[11],"lists":[12],"100+":[13],"references":[14],"on":[15],"models,":[17],"simulators,":[18],"ATPG,":[19],"DFT,":[20],"and":[21,47,61],"tools.":[22],"Continuing":[23],"studies":[24],"are":[25],"needed":[26],"in":[27],"this":[28],"maturing":[29],"field":[30],"for":[31],"new":[32],"technologies,":[33],"signal":[34],"integrity,":[35],"process":[36],"variations,":[37],"faster":[38],"than":[39],"critical":[40],"path":[41],"operation,":[42],"asynchronous":[43],"circuits,":[44],"counterfeit":[45],"ICs,":[46],"hardware":[48],"Trojans.":[49],"information":[51],"is":[52],"compiled":[53],"to":[54,57],"provide":[55],"direction":[56],"students,":[58],"practicing":[59],"engineers,":[60],"researchers":[62],"alike.":[63]},"counts_by_year":[{"year":2025,"cited_by_count":3},{"year":2024,"cited_by_count":2},{"year":2023,"cited_by_count":2},{"year":2021,"cited_by_count":2},{"year":2020,"cited_by_count":4},{"year":2019,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}