{"id":"https://openalex.org/W2806020122","doi":"https://doi.org/10.1109/vts.2018.8368662","title":"Online information utility assessment for per-device adaptive test flow","display_name":"Online information utility assessment for per-device adaptive test flow","publication_year":2018,"publication_date":"2018-04-01","ids":{"openalex":"https://openalex.org/W2806020122","doi":"https://doi.org/10.1109/vts.2018.8368662","mag":"2806020122"},"language":"en","primary_location":{"id":"doi:10.1109/vts.2018.8368662","is_oa":false,"landing_page_url":"https://doi.org/10.1109/vts.2018.8368662","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2018 IEEE 36th VLSI Test Symposium (VTS)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5100382136","display_name":"Yanjun Li","orcid":"https://orcid.org/0000-0003-3971-9795"},"institutions":[{"id":"https://openalex.org/I150229711","display_name":"University of Electronic Science and Technology of China","ror":"https://ror.org/04qr3zq92","country_code":"CN","type":"education","lineage":["https://openalex.org/I150229711"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Yanjun Li","raw_affiliation_strings":["Center for Information Geoscience/School of Automation Engineering, UESTC, Chengdu, China"],"affiliations":[{"raw_affiliation_string":"Center for Information Geoscience/School of Automation Engineering, UESTC, Chengdu, China","institution_ids":["https://openalex.org/I150229711"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5108524932","display_name":"Ender Y\u0131lmaz","orcid":"https://orcid.org/0009-0004-0254-5845"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Ender Yilmaz","raw_affiliation_strings":["NXP Semiconductors, Austin, USA"],"affiliations":[{"raw_affiliation_string":"NXP Semiconductors, Austin, USA","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5006256979","display_name":"Peter Sarson","orcid":"https://orcid.org/0000-0002-7150-2281"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Peter Sarson","raw_affiliation_strings":["AMSAG Premstaetten, Austria"],"affiliations":[{"raw_affiliation_string":"AMSAG Premstaetten, Austria","institution_ids":[]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5058946013","display_name":"Sule Ozev","orcid":"https://orcid.org/0000-0002-3636-715X"},"institutions":[{"id":"https://openalex.org/I55732556","display_name":"Arizona State University","ror":"https://ror.org/03efmqc40","country_code":"US","type":"education","lineage":["https://openalex.org/I55732556"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Sule Ozev","raw_affiliation_strings":["School of Electrical Computer, and Energy Engineering, Arizona State University, Tempe, USA"],"affiliations":[{"raw_affiliation_string":"School of Electrical Computer, and Energy Engineering, Arizona State University, Tempe, USA","institution_ids":["https://openalex.org/I55732556"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5100382136"],"corresponding_institution_ids":["https://openalex.org/I150229711"],"apc_list":null,"apc_paid":null,"fwci":0.5049,"has_fulltext":false,"cited_by_count":4,"citation_normalized_percentile":{"value":0.60070887,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":95},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"6"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9977999925613403,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9977999925613403,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13293","display_name":"Engineering and Test Systems","score":0.9854000210762024,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11749","display_name":"Iterative Learning Control Systems","score":0.984000027179718,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computerized-adaptive-testing","display_name":"Computerized adaptive testing","score":0.6676764488220215},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6481897830963135},{"id":"https://openalex.org/keywords/test","display_name":"Test (biology)","score":0.5753708481788635},{"id":"https://openalex.org/keywords/information-flow","display_name":"Information flow","score":0.5368315577507019},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.35063111782073975},{"id":"https://openalex.org/keywords/statistics","display_name":"Statistics","score":0.2037944495677948},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.13373175263404846},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.1058153510093689}],"concepts":[{"id":"https://openalex.org/C144352353","wikidata":"https://www.wikidata.org/wiki/Q2920411","display_name":"Computerized adaptive testing","level":3,"score":0.6676764488220215},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6481897830963135},{"id":"https://openalex.org/C2777267654","wikidata":"https://www.wikidata.org/wiki/Q3519023","display_name":"Test (biology)","level":2,"score":0.5753708481788635},{"id":"https://openalex.org/C2779136372","wikidata":"https://www.wikidata.org/wiki/Q10283002","display_name":"Information flow","level":2,"score":0.5368315577507019},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.35063111782073975},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.2037944495677948},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.13373175263404846},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.1058153510093689},{"id":"https://openalex.org/C138885662","wikidata":"https://www.wikidata.org/wiki/Q5891","display_name":"Philosophy","level":0,"score":0.0},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0},{"id":"https://openalex.org/C41895202","wikidata":"https://www.wikidata.org/wiki/Q8162","display_name":"Linguistics","level":1,"score":0.0},{"id":"https://openalex.org/C151730666","wikidata":"https://www.wikidata.org/wiki/Q7205","display_name":"Paleontology","level":1,"score":0.0},{"id":"https://openalex.org/C171606756","wikidata":"https://www.wikidata.org/wiki/Q506132","display_name":"Psychometrics","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/vts.2018.8368662","is_oa":false,"landing_page_url":"https://doi.org/10.1109/vts.2018.8368662","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2018 IEEE 36th VLSI Test Symposium (VTS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.550000011920929,"id":"https://metadata.un.org/sdg/9","display_name":"Industry, innovation and infrastructure"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":23,"referenced_works":["https://openalex.org/W1588276442","https://openalex.org/W2024465941","https://openalex.org/W2035764712","https://openalex.org/W2074014702","https://openalex.org/W2103543101","https://openalex.org/W2104486691","https://openalex.org/W2136007135","https://openalex.org/W2139497890","https://openalex.org/W2147916294","https://openalex.org/W2147930497","https://openalex.org/W2156227942","https://openalex.org/W2161332022","https://openalex.org/W2161832017","https://openalex.org/W2162433349","https://openalex.org/W2329154899","https://openalex.org/W2396110057","https://openalex.org/W2492791075","https://openalex.org/W2614720667","https://openalex.org/W2900234561","https://openalex.org/W3145589026","https://openalex.org/W6635141994","https://openalex.org/W6712168606","https://openalex.org/W6738660793"],"related_works":["https://openalex.org/W2748952813","https://openalex.org/W1967937306","https://openalex.org/W226604446","https://openalex.org/W4242162185","https://openalex.org/W3021300720","https://openalex.org/W1883834147","https://openalex.org/W2170357422","https://openalex.org/W2076585022","https://openalex.org/W4243083202","https://openalex.org/W1540608021"],"abstract_inverted_index":{"Per-device":[0],"adaptive":[1,59,114],"test":[2,12,15,36,39,51,54,115,148,153],"is":[3,75],"a":[4,24,57,100],"promising":[5],"direction":[6],"with":[7,151],"the":[8,30,34,38,48,68,94,123,137,143],"best":[9],"trade-off":[10,49],"between":[11,50],"quality":[13,52],"and":[14,53,86,132],"time":[16,55,154],"so":[17],"far.":[18],"In":[19],"this":[20],"work,":[21],"we":[22],"propose":[23],"method":[25,107],"for":[26],"online":[27],"assessment":[28,42],"of":[29,33,56,63,72,99,103],"information":[31,70,97],"content":[32,71],"next":[35],"in":[37,122],"queue.":[40],"This":[41],"can":[43,108,140],"be":[44,109],"used":[45],"to":[46,77,92],"tune":[47,142],"per-device":[58],"test.":[60],"Since":[61],"majority":[62],"specification":[64,84],"parameters":[65,85],"are":[66],"correlated,":[67],"overall":[69,96],"multiple":[73],"tests":[74],"difficult":[76],"extract.":[78],"We":[79],"model":[80],"multi-variate":[81],"correlations":[82,89],"among":[83],"take":[87],"these":[88],"into":[90],"account":[91],"estimate":[93],"multivariate":[95],"utility":[98],"given":[101],"set":[102],"tests.":[104],"The":[105],"proposed":[106,138],"integrated":[110],"within":[111],"an":[112],"existing":[113],"flow":[116],"(per-device":[117],"or":[118],"per-wafer)":[119],"that":[120,136],"runs":[121],"background.":[124],"Experimental":[125],"results":[126],"using":[127],"3":[128],"distinct":[129],"industry":[130],"circuits":[131],"sizable":[133],"data":[134],"show":[135],"technique":[139],"finely":[141],"trade-off,":[144],"even":[145],"achieve":[146],"zero":[147],"escape":[149],"rates":[150],"appreciable":[152],"savings.":[155]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2022,"cited_by_count":1},{"year":2021,"cited_by_count":2}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}