{"id":"https://openalex.org/W2806603087","doi":"https://doi.org/10.1109/vts.2018.8368655","title":"IC layout weak point effectiveness evaluation based on statistical methods","display_name":"IC layout weak point effectiveness evaluation based on statistical methods","publication_year":2018,"publication_date":"2018-04-01","ids":{"openalex":"https://openalex.org/W2806603087","doi":"https://doi.org/10.1109/vts.2018.8368655","mag":"2806603087"},"language":"en","primary_location":{"id":"doi:10.1109/vts.2018.8368655","is_oa":false,"landing_page_url":"https://doi.org/10.1109/vts.2018.8368655","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2018 IEEE 36th VLSI Test Symposium (VTS)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5060262327","display_name":"Fang Lin","orcid":"https://orcid.org/0000-0002-5855-540X"},"institutions":[{"id":"https://openalex.org/I26538001","display_name":"San Diego State University","ror":"https://ror.org/0264fdx42","country_code":"US","type":"education","lineage":["https://openalex.org/I26538001"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Fang Lin","raw_affiliation_strings":["Department of Electrical and Computer Engineering, San Diego State University, San Diego"],"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, San Diego State University, San Diego","institution_ids":["https://openalex.org/I26538001"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5070659794","display_name":"Ali Ahmadi","orcid":null},"institutions":[{"id":"https://openalex.org/I2799405328","display_name":"Heritage Malta","ror":"https://ror.org/0570tbq97","country_code":"MT","type":"archive","lineage":["https://openalex.org/I2799405328"]}],"countries":["MT"],"is_corresponding":false,"raw_author_name":"Ali Ahmadi","raw_affiliation_strings":["GLOBALFOUNDRIES Inc., Malta"],"affiliations":[{"raw_affiliation_string":"GLOBALFOUNDRIES Inc., Malta","institution_ids":["https://openalex.org/I2799405328"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5036497948","display_name":"Kannan Sekar","orcid":null},"institutions":[{"id":"https://openalex.org/I2799405328","display_name":"Heritage Malta","ror":"https://ror.org/0570tbq97","country_code":"MT","type":"archive","lineage":["https://openalex.org/I2799405328"]}],"countries":["MT"],"is_corresponding":false,"raw_author_name":"Kannan Sekar","raw_affiliation_strings":["GLOBALFOUNDRIES Inc., Malta"],"affiliations":[{"raw_affiliation_string":"GLOBALFOUNDRIES Inc., Malta","institution_ids":["https://openalex.org/I2799405328"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5091437311","display_name":"Yan Pan","orcid":"https://orcid.org/0000-0002-4546-2351"},"institutions":[{"id":"https://openalex.org/I2799405328","display_name":"Heritage Malta","ror":"https://ror.org/0570tbq97","country_code":"MT","type":"archive","lineage":["https://openalex.org/I2799405328"]}],"countries":["MT"],"is_corresponding":false,"raw_author_name":"Yan Pan","raw_affiliation_strings":["GLOBALFOUNDRIES Inc., Malta"],"affiliations":[{"raw_affiliation_string":"GLOBALFOUNDRIES Inc., Malta","institution_ids":["https://openalex.org/I2799405328"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5101967980","display_name":"Ke Huang","orcid":"https://orcid.org/0000-0002-1587-9877"},"institutions":[{"id":"https://openalex.org/I26538001","display_name":"San Diego State University","ror":"https://ror.org/0264fdx42","country_code":"US","type":"education","lineage":["https://openalex.org/I26538001"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Ke Huang","raw_affiliation_strings":["Department of Electrical and Computer Engineering, San Diego State University, San Diego"],"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, San Diego State University, San Diego","institution_ids":["https://openalex.org/I26538001"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5060262327"],"corresponding_institution_ids":["https://openalex.org/I26538001"],"apc_list":null,"apc_paid":null,"fwci":0.5049,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":{"value":0.60193107,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":94,"max":96},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"6"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11338","display_name":"Advancements in Photolithography Techniques","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6448032855987549},{"id":"https://openalex.org/keywords/point","display_name":"Point (geometry)","score":0.5789915323257446},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.14337757229804993}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6448032855987549},{"id":"https://openalex.org/C28719098","wikidata":"https://www.wikidata.org/wiki/Q44946","display_name":"Point (geometry)","level":2,"score":0.5789915323257446},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.14337757229804993},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/vts.2018.8368655","is_oa":false,"landing_page_url":"https://doi.org/10.1109/vts.2018.8368655","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2018 IEEE 36th VLSI Test Symposium (VTS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":10,"referenced_works":["https://openalex.org/W1995601995","https://openalex.org/W2008176598","https://openalex.org/W2012064824","https://openalex.org/W2037552354","https://openalex.org/W2054835352","https://openalex.org/W2089642960","https://openalex.org/W2147068791","https://openalex.org/W2152489029","https://openalex.org/W2397554756","https://openalex.org/W3149713340"],"related_works":["https://openalex.org/W4391375266","https://openalex.org/W2748952813","https://openalex.org/W2390279801","https://openalex.org/W2358668433","https://openalex.org/W4396701345","https://openalex.org/W2376932109","https://openalex.org/W2001405890","https://openalex.org/W4396696052","https://openalex.org/W4402327032","https://openalex.org/W2382290278"],"abstract_inverted_index":{"Design":[0],"hotspots,":[1],"a.k.a.":[2],"layout":[3,7,28,45,76,161],"weak":[4,29,39,77,105,143,162,174,187,213,225],"points":[5,40,78,106,163,214],"are":[6,10,79],"patterns":[8],"that":[9,121,204],"susceptible":[11],"to":[12,73,103,178,209],"systematic":[13],"failure":[14,166],"and":[15,64,98,134,218],"yield":[16,25,36,81],"loss":[17,82],"in":[18,114,193],"high-volume":[19],"manufacturing":[20,65,86],"(HVM).":[21],"Therefore,":[22],"understanding":[23],"the":[24,60,101,118,142,158,181,220],"impact":[26,159],"of":[27,160,196,223],"point":[30,144,175,188,226],"is":[31,67,117,123,130,189,207],"a":[32,84,152,172,185,190,194],"crucial":[33],"step":[34],"for":[35,83,107,155,215],"learning.":[37],"Layout":[38],"can":[41,89,138],"be":[42,90,139],"identified":[43],"by":[44,92],"analysis":[46],"based":[47],"on":[48,164,183],"simulation":[49],"or":[50],"silicon":[51],"learning":[52],"from":[53],"past":[54],"failures.":[55],"In":[56,147],"advanced":[57],"technology":[58],"nodes,":[59],"interaction":[61],"between":[62],"design":[63],"process":[66,116],"increasingly":[68],"significant,":[69],"making":[70],"it":[71],"paramount":[72],"quantify":[74],"which":[75],"causing":[80],"specific":[85,186],"process.":[87],"This":[88],"achieved":[91],"collecting":[93],"volume":[94,197],"scan":[95,127,198],"diagnosis":[96,128,199],"results":[97,202],"then":[99],"map":[100],"call-outs":[102],"suspected":[104],"defect":[108],"root-cause":[109,217],"analysis.":[110],"One":[111],"major":[112],"challenge":[113],"this":[115,148],"often-false":[119],"assumptions":[120],"correlation":[122,136],"causation,":[124],"especially":[125],"as":[126,141],"resolution":[129],"typically":[131],"not":[132],"ideal":[133],"random":[135],"hits":[137],"common":[140],"count":[145,212],"grows.":[146],"work,":[149],"we":[150],"propose":[151],"novel":[153],"approach":[154,206],"quantitatively":[156],"assessing":[157],"IC":[165],"using":[167],"statistical":[168],"methods.":[169],"We":[170],"develop":[171],"new":[173],"effectiveness":[176],"metric":[177],"help":[179],"guide":[180],"decision":[182],"whether":[184],"root":[191],"cause":[192],"population":[195],"results.":[200],"Experimental":[201],"show":[203],"our":[205],"able":[208],"interpret":[210],"high":[211],"\u201cmeaningful\u201d":[216],"rank":[219],"relative":[221],"contribution":[222],"different":[224],"sets.":[227]},"counts_by_year":[{"year":2020,"cited_by_count":2}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}