{"id":"https://openalex.org/W2806711156","doi":"https://doi.org/10.1109/vts.2018.8368652","title":"On-line monitoring and error correction in sensor interface circuits using digital calibration techniques","display_name":"On-line monitoring and error correction in sensor interface circuits using digital calibration techniques","publication_year":2018,"publication_date":"2018-04-01","ids":{"openalex":"https://openalex.org/W2806711156","doi":"https://doi.org/10.1109/vts.2018.8368652","mag":"2806711156"},"language":"en","primary_location":{"id":"doi:10.1109/vts.2018.8368652","is_oa":false,"landing_page_url":"https://doi.org/10.1109/vts.2018.8368652","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2018 IEEE 36th VLSI Test Symposium (VTS)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5078863721","display_name":"Sascha Heinssen","orcid":null},"institutions":[{"id":"https://openalex.org/I180437899","display_name":"University of Bremen","ror":"https://ror.org/04ers2y35","country_code":"DE","type":"education","lineage":["https://openalex.org/I180437899"]}],"countries":["DE"],"is_corresponding":true,"raw_author_name":"Sascha Heinssen","raw_affiliation_strings":["Institute of Electrodynamics and Microelectronics (ITEM.me), University of Bremen, Bremen, Germany"],"affiliations":[{"raw_affiliation_string":"Institute of Electrodynamics and Microelectronics (ITEM.me), University of Bremen, Bremen, Germany","institution_ids":["https://openalex.org/I180437899"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5054389827","display_name":"Theodor Hillebrand","orcid":"https://orcid.org/0000-0003-0234-6884"},"institutions":[{"id":"https://openalex.org/I180437899","display_name":"University of Bremen","ror":"https://ror.org/04ers2y35","country_code":"DE","type":"education","lineage":["https://openalex.org/I180437899"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Theodor Hillebrand","raw_affiliation_strings":["Institute of Electrodynamics and Microelectronics (ITEM.me), University of Bremen, Bremen, Germany"],"affiliations":[{"raw_affiliation_string":"Institute of Electrodynamics and Microelectronics (ITEM.me), University of Bremen, Bremen, Germany","institution_ids":["https://openalex.org/I180437899"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5008083213","display_name":"Maike Taddiken","orcid":null},"institutions":[{"id":"https://openalex.org/I180437899","display_name":"University of Bremen","ror":"https://ror.org/04ers2y35","country_code":"DE","type":"education","lineage":["https://openalex.org/I180437899"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Maike Taddiken","raw_affiliation_strings":["Institute of Electrodynamics and Microelectronics (ITEM.me), University of Bremen, Bremen, Germany"],"affiliations":[{"raw_affiliation_string":"Institute of Electrodynamics and Microelectronics (ITEM.me), University of Bremen, Bremen, Germany","institution_ids":["https://openalex.org/I180437899"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101959993","display_name":"Steffen Paul","orcid":"https://orcid.org/0000-0003-3392-0471"},"institutions":[{"id":"https://openalex.org/I180437899","display_name":"University of Bremen","ror":"https://ror.org/04ers2y35","country_code":"DE","type":"education","lineage":["https://openalex.org/I180437899"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Steffen Paul","raw_affiliation_strings":["Institute of Electrodynamics and Microelectronics (ITEM.me), University of Bremen, Bremen, Germany"],"affiliations":[{"raw_affiliation_string":"Institute of Electrodynamics and Microelectronics (ITEM.me), University of Bremen, Bremen, Germany","institution_ids":["https://openalex.org/I180437899"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5017232274","display_name":"Dagmar Peters-Drolshagen","orcid":null},"institutions":[{"id":"https://openalex.org/I180437899","display_name":"University of Bremen","ror":"https://ror.org/04ers2y35","country_code":"DE","type":"education","lineage":["https://openalex.org/I180437899"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Dagmar Peters-Drolshagen","raw_affiliation_strings":["Institute of Electrodynamics and Microelectronics (ITEM.me), University of Bremen, Bremen, Germany"],"affiliations":[{"raw_affiliation_string":"Institute of Electrodynamics and Microelectronics (ITEM.me), University of Bremen, Bremen, Germany","institution_ids":["https://openalex.org/I180437899"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5078863721"],"corresponding_institution_ids":["https://openalex.org/I180437899"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.05095467,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"6"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10369","display_name":"Advanced MEMS and NEMS Technologies","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10369","display_name":"Advanced MEMS and NEMS Technologies","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12564","display_name":"Sensor Technology and Measurement Systems","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/interface","display_name":"Interface (matter)","score":0.7145752906799316},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.680284857749939},{"id":"https://openalex.org/keywords/offset","display_name":"Offset (computer science)","score":0.6773766875267029},{"id":"https://openalex.org/keywords/calibration","display_name":"Calibration","score":0.5978724956512451},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.5831683278083801},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.5776445269584656},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.5525755286216736},{"id":"https://openalex.org/keywords/signal","display_name":"SIGNAL (programming language)","score":0.46810078620910645},{"id":"https://openalex.org/keywords/mixed-signal-integrated-circuit","display_name":"Mixed-signal integrated circuit","score":0.4558784067630768},{"id":"https://openalex.org/keywords/digital-electronics","display_name":"Digital electronics","score":0.43302029371261597},{"id":"https://openalex.org/keywords/error-detection-and-correction","display_name":"Error detection and correction","score":0.42148903012275696},{"id":"https://openalex.org/keywords/analogue-electronics","display_name":"Analogue electronics","score":0.418438583612442},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.2655688226222992},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.20545339584350586},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.10072532296180725}],"concepts":[{"id":"https://openalex.org/C113843644","wikidata":"https://www.wikidata.org/wiki/Q901882","display_name":"Interface (matter)","level":4,"score":0.7145752906799316},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.680284857749939},{"id":"https://openalex.org/C175291020","wikidata":"https://www.wikidata.org/wiki/Q1156822","display_name":"Offset (computer science)","level":2,"score":0.6773766875267029},{"id":"https://openalex.org/C165838908","wikidata":"https://www.wikidata.org/wiki/Q736777","display_name":"Calibration","level":2,"score":0.5978724956512451},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.5831683278083801},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.5776445269584656},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.5525755286216736},{"id":"https://openalex.org/C2779843651","wikidata":"https://www.wikidata.org/wiki/Q7390335","display_name":"SIGNAL (programming language)","level":2,"score":0.46810078620910645},{"id":"https://openalex.org/C62907940","wikidata":"https://www.wikidata.org/wiki/Q1541329","display_name":"Mixed-signal integrated circuit","level":3,"score":0.4558784067630768},{"id":"https://openalex.org/C81843906","wikidata":"https://www.wikidata.org/wiki/Q173156","display_name":"Digital electronics","level":3,"score":0.43302029371261597},{"id":"https://openalex.org/C103088060","wikidata":"https://www.wikidata.org/wiki/Q1062839","display_name":"Error detection and correction","level":2,"score":0.42148903012275696},{"id":"https://openalex.org/C29074008","wikidata":"https://www.wikidata.org/wiki/Q174925","display_name":"Analogue electronics","level":3,"score":0.418438583612442},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.2655688226222992},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.20545339584350586},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.10072532296180725},{"id":"https://openalex.org/C157915830","wikidata":"https://www.wikidata.org/wiki/Q2928001","display_name":"Bubble","level":2,"score":0.0},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.0},{"id":"https://openalex.org/C129307140","wikidata":"https://www.wikidata.org/wiki/Q6795880","display_name":"Maximum bubble pressure method","level":3,"score":0.0},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C173608175","wikidata":"https://www.wikidata.org/wiki/Q232661","display_name":"Parallel computing","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/vts.2018.8368652","is_oa":false,"landing_page_url":"https://doi.org/10.1109/vts.2018.8368652","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2018 IEEE 36th VLSI Test Symposium (VTS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":16,"referenced_works":["https://openalex.org/W1998133217","https://openalex.org/W1999542175","https://openalex.org/W2023940016","https://openalex.org/W2029872673","https://openalex.org/W2080251928","https://openalex.org/W2089663857","https://openalex.org/W2101905862","https://openalex.org/W2101983452","https://openalex.org/W2103198996","https://openalex.org/W2104267440","https://openalex.org/W2112693984","https://openalex.org/W2249064704","https://openalex.org/W2498179618","https://openalex.org/W2533861368","https://openalex.org/W4231501498","https://openalex.org/W4239309307"],"related_works":["https://openalex.org/W4242258007","https://openalex.org/W2155285526","https://openalex.org/W2007222089","https://openalex.org/W2394022884","https://openalex.org/W2185815555","https://openalex.org/W2071235072","https://openalex.org/W1603142061","https://openalex.org/W1917800633","https://openalex.org/W2357284929","https://openalex.org/W1862020018"],"abstract_inverted_index":{"The":[0,146],"functionality":[1],"of":[2,16,124],"modern":[3],"integrated":[4],"circuits":[5],"is":[6,22,37,40,57,66,102,149],"affected":[7],"by":[8,28,94,151],"numerous":[9],"non-ideal":[10],"effects.":[11],"Especially":[12],"during":[13],"the":[14,60,64,91,106,121,125,143],"design":[15,122],"analog":[17,126,144],"circuit":[18,127],"components,":[19],"much":[20],"effort":[21],"invested":[23],"in":[24,48,75,90,142,157],"compensating":[25],"these":[26,84],"effects":[27],"various":[29],"methods.":[30],"In":[31],"this":[32,76],"work,":[33],"an":[34,98],"alternative":[35],"approach":[36,148],"presented,":[38],"which":[39,104],"based":[41],"on":[42],"digital":[43,92],"calibration":[44],"techniques":[45],"and":[46,70,88,115,155],"used":[47],"a":[49,158],"sensor":[50,61,81,107,162],"interface":[51,65,108],"circuit.":[52],"A":[53],"suitable":[54],"test":[55],"signal":[56],"interleaved":[58],"with":[59],"signal,":[62],"whereby":[63],"permanently":[67],"monitored.":[68],"Static":[69],"dynamic":[71],"errors":[72,85,136],"are":[73,86],"detected":[74],"way":[77],"without":[78],"interrupting":[79],"normal":[80],"activities.":[82],"Afterwards,":[83],"determined":[87],"corrected":[89],"domain":[93],"adaptive":[95],"filters.":[96],"Hereby,":[97],"on-line":[99],"error":[100],"correction":[101],"realized,":[103],"allows":[105],"to":[109,111,138],"react":[110],"changing":[112],"ambient":[113],"conditions":[114],"makes":[116],"it":[117],"more":[118],"robust.":[119],"Furthermore,":[120],"requirements":[123],"components":[128],"can":[129],"be":[130,139],"drastically":[131],"reduced":[132],"since":[133],"not":[134],"all":[135],"need":[137],"fully":[140],"compensated":[141],"domain.":[145],"introduced":[147],"demonstrated":[150],"correcting":[152],"different":[153],"gain-":[154],"offset-errors":[156],"65":[159],"nm":[160],"CMOS":[161],"interface.":[163]},"counts_by_year":[],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}