{"id":"https://openalex.org/W2806724998","doi":"https://doi.org/10.1109/vts.2018.8368631","title":"High efficient low cost EEPROM screening method in combination with an area optimized byte replacement strategy which enables high reliability EEPROMs","display_name":"High efficient low cost EEPROM screening method in combination with an area optimized byte replacement strategy which enables high reliability EEPROMs","publication_year":2018,"publication_date":"2018-04-01","ids":{"openalex":"https://openalex.org/W2806724998","doi":"https://doi.org/10.1109/vts.2018.8368631","mag":"2806724998"},"language":"en","primary_location":{"id":"doi:10.1109/vts.2018.8368631","is_oa":false,"landing_page_url":"https://doi.org/10.1109/vts.2018.8368631","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2018 IEEE 36th VLSI Test Symposium (VTS)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5041976550","display_name":"Gregor Schatzberger","orcid":null},"institutions":[{"id":"https://openalex.org/I154481106","display_name":"AMS (Austria)","ror":"https://ror.org/03vz6gs79","country_code":"AT","type":"company","lineage":["https://openalex.org/I154481106"]}],"countries":["AT"],"is_corresponding":true,"raw_author_name":"Gregor Schatzberger","raw_affiliation_strings":["AMS AG, Premstaetten, Austria"],"affiliations":[{"raw_affiliation_string":"AMS AG, Premstaetten, Austria","institution_ids":["https://openalex.org/I154481106"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5002804696","display_name":"F.P. Leisenberger","orcid":null},"institutions":[{"id":"https://openalex.org/I154481106","display_name":"AMS (Austria)","ror":"https://ror.org/03vz6gs79","country_code":"AT","type":"company","lineage":["https://openalex.org/I154481106"]}],"countries":["AT"],"is_corresponding":false,"raw_author_name":"Friedrich Peter Leisenberger","raw_affiliation_strings":["ams AG, Premstaetten, Austria"],"affiliations":[{"raw_affiliation_string":"ams AG, Premstaetten, Austria","institution_ids":["https://openalex.org/I154481106"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5006256979","display_name":"Peter Sarson","orcid":"https://orcid.org/0000-0002-7150-2281"},"institutions":[{"id":"https://openalex.org/I154481106","display_name":"AMS (Austria)","ror":"https://ror.org/03vz6gs79","country_code":"AT","type":"company","lineage":["https://openalex.org/I154481106"]}],"countries":["AT"],"is_corresponding":false,"raw_author_name":"Peter Sarson","raw_affiliation_strings":["AMS AG, Premstaetten, Austria"],"affiliations":[{"raw_affiliation_string":"AMS AG, Premstaetten, Austria","institution_ids":["https://openalex.org/I154481106"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5115604653","display_name":"Andreas Wiesner","orcid":"https://orcid.org/0000-0002-4548-9351"},"institutions":[{"id":"https://openalex.org/I154481106","display_name":"AMS (Austria)","ror":"https://ror.org/03vz6gs79","country_code":"AT","type":"company","lineage":["https://openalex.org/I154481106"]}],"countries":["AT"],"is_corresponding":false,"raw_author_name":"Andreas Wiesner","raw_affiliation_strings":["AMS AG, Premstaetten, Austria"],"affiliations":[{"raw_affiliation_string":"AMS AG, Premstaetten, Austria","institution_ids":["https://openalex.org/I154481106"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5041976550"],"corresponding_institution_ids":["https://openalex.org/I154481106"],"apc_list":null,"apc_paid":null,"fwci":0.2575,"has_fulltext":false,"cited_by_count":5,"citation_normalized_percentile":{"value":0.55837493,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":96},"biblio":{"volume":"4","issue":null,"first_page":"1","last_page":"6"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11181","display_name":"Advanced Data Storage Technologies","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9994000196456909,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/eeprom","display_name":"EEPROM","score":0.9939562082290649},{"id":"https://openalex.org/keywords/eprom","display_name":"EPROM","score":0.788814902305603},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.6981436014175415},{"id":"https://openalex.org/keywords/byte","display_name":"Byte","score":0.6708256006240845},{"id":"https://openalex.org/keywords/non-volatile-memory","display_name":"Non-volatile memory","score":0.6278005838394165},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6128243207931519},{"id":"https://openalex.org/keywords/data-retention","display_name":"Data retention","score":0.5298827886581421},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.4442139267921448},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.4056554436683655}],"concepts":[{"id":"https://openalex.org/C27699510","wikidata":"https://www.wikidata.org/wiki/Q205908","display_name":"EEPROM","level":2,"score":0.9939562082290649},{"id":"https://openalex.org/C163980746","wikidata":"https://www.wikidata.org/wiki/Q378210","display_name":"EPROM","level":2,"score":0.788814902305603},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.6981436014175415},{"id":"https://openalex.org/C43364308","wikidata":"https://www.wikidata.org/wiki/Q8799","display_name":"Byte","level":2,"score":0.6708256006240845},{"id":"https://openalex.org/C177950962","wikidata":"https://www.wikidata.org/wiki/Q10997658","display_name":"Non-volatile memory","level":2,"score":0.6278005838394165},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6128243207931519},{"id":"https://openalex.org/C2780866740","wikidata":"https://www.wikidata.org/wiki/Q5227345","display_name":"Data retention","level":2,"score":0.5298827886581421},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.4442139267921448},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.4056554436683655},{"id":"https://openalex.org/C38652104","wikidata":"https://www.wikidata.org/wiki/Q3510521","display_name":"Computer security","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/vts.2018.8368631","is_oa":false,"landing_page_url":"https://doi.org/10.1109/vts.2018.8368631","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2018 IEEE 36th VLSI Test Symposium (VTS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy","score":0.5699999928474426}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":5,"referenced_works":["https://openalex.org/W2031767704","https://openalex.org/W2058715873","https://openalex.org/W2125662822","https://openalex.org/W2399695735","https://openalex.org/W2562125644"],"related_works":["https://openalex.org/W2147541863","https://openalex.org/W2083975737","https://openalex.org/W1815691694","https://openalex.org/W2160590338","https://openalex.org/W2053931924","https://openalex.org/W1853632475","https://openalex.org/W2142133575","https://openalex.org/W2028906339","https://openalex.org/W2539568976","https://openalex.org/W2036350002"],"abstract_inverted_index":{"Modern":[0],"high":[1],"reliability":[2],"EEPROM":[3,62,69,124],"technologies":[4],"use":[5],"advanced":[6,90],"screening":[7,70,91],"methods":[8,23],"to":[9,28],"screen":[10],"out":[11],"weak":[12],"bit":[13],"cells.":[14],"In":[15],"combination":[16,94],"with":[17,95],"standard":[18,68],"ECC":[19],"(Error":[20],"Correction":[21],"Code)":[22],"EEPROMs":[24],"can":[25],"be":[26,78],"produced":[27],"withstand":[29],"more":[30],"than":[31],"50k":[32],"endurance":[33,51,110],"cycles":[34,52,111],"at":[35,45],"150\u00b0C":[36],"and":[37,53],"have":[38],"a":[39,88,113],"data":[40,55],"retention":[41,56],"of":[42,50,60,109,115,122],"10":[43],"years":[44],"150\u00b0C.":[46],"Both":[47],"the":[48,54,58,67,81,107,118,123],"number":[49,108],"define":[57],"lifetime":[59],"an":[61,96,104],"memory.":[63],"After":[64],"successfully":[65],"passing":[66],"tests":[71],"only":[72,128],"randomly":[73],"distributed":[74],"intrinsic":[75],"failures":[76],"will":[77,86],"activated":[79],"during":[80],"EEPROM's":[82],"lifetime.":[83],"This":[84],"work":[85],"present":[87],"highly":[89],"procedure":[92],"in":[93,106,120],"area":[97,121],"efficient":[98],"byte":[99],"replacement":[100],"strategy":[101],"that":[102],"enables":[103],"increase":[105,119],"by":[112],"factor":[114],"2.5":[116],"while":[117],"memory":[125],"plane":[126],"is":[127],"5%.":[129]},"counts_by_year":[{"year":2023,"cited_by_count":2},{"year":2022,"cited_by_count":1},{"year":2020,"cited_by_count":1},{"year":2019,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}