{"id":"https://openalex.org/W2806992466","doi":"https://doi.org/10.1109/vts.2018.8368625","title":"ATPG-based cost-effective, secure logic locking","display_name":"ATPG-based cost-effective, secure logic locking","publication_year":2018,"publication_date":"2018-04-01","ids":{"openalex":"https://openalex.org/W2806992466","doi":"https://doi.org/10.1109/vts.2018.8368625","mag":"2806992466"},"language":"en","primary_location":{"id":"doi:10.1109/vts.2018.8368625","is_oa":false,"landing_page_url":"https://doi.org/10.1109/vts.2018.8368625","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2018 IEEE 36th VLSI Test Symposium (VTS)","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5101970784","display_name":"Abhrajit Sengupta","orcid":"https://orcid.org/0000-0002-5491-6714"},"institutions":[{"id":"https://openalex.org/I57206974","display_name":"New York University","ror":"https://ror.org/0190ak572","country_code":"US","type":"education","lineage":["https://openalex.org/I57206974"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Abhrajit Sengupta","raw_affiliation_strings":["Tandon School of Engineering, New York University, New York, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Tandon School of Engineering, New York University, New York, USA","institution_ids":["https://openalex.org/I57206974"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5110703612","display_name":"Mohammed Nabeel","orcid":null},"institutions":[{"id":"https://openalex.org/I120250893","display_name":"New York University Abu Dhabi","ror":"https://ror.org/00e5k0821","country_code":"AE","type":"education","lineage":["https://openalex.org/I120250893","https://openalex.org/I57206974"]}],"countries":["AE"],"is_corresponding":false,"raw_author_name":"Mohammed Nabeel","raw_affiliation_strings":["New York University Abu Dhabi, Abu Dhabi, United Arab Emirates"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"New York University Abu Dhabi, Abu Dhabi, United Arab Emirates","institution_ids":["https://openalex.org/I120250893"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5034926702","display_name":"Muhammad Yasin","orcid":"https://orcid.org/0000-0001-9475-2796"},"institutions":[{"id":"https://openalex.org/I57206974","display_name":"New York University","ror":"https://ror.org/0190ak572","country_code":"US","type":"education","lineage":["https://openalex.org/I57206974"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Muhammad Yasin","raw_affiliation_strings":["Tandon School of Engineering, New York University, New York, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Tandon School of Engineering, New York University, New York, USA","institution_ids":["https://openalex.org/I57206974"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5059987567","display_name":"Ozgur Sinanoglu","orcid":"https://orcid.org/0000-0003-0782-0397"},"institutions":[{"id":"https://openalex.org/I120250893","display_name":"New York University Abu Dhabi","ror":"https://ror.org/00e5k0821","country_code":"AE","type":"education","lineage":["https://openalex.org/I120250893","https://openalex.org/I57206974"]}],"countries":["AE"],"is_corresponding":false,"raw_author_name":"Ozgur Sinanoglu","raw_affiliation_strings":["New York University Abu Dhabi, Abu Dhabi, United Arab Emirates"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"New York University Abu Dhabi, Abu Dhabi, United Arab Emirates","institution_ids":["https://openalex.org/I120250893"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":null,"has_fulltext":false,"cited_by_count":62,"citation_normalized_percentile":null,"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"6"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12122","display_name":"Physical Unclonable Functions (PUFs) and Hardware Security","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12122","display_name":"Physical Unclonable Functions (PUFs) and Hardware Security","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9940999746322632,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11601","display_name":"Neuroscience and Neural Engineering","score":0.9898999929428101,"subfield":{"id":"https://openalex.org/subfields/2804","display_name":"Cellular and Molecular Neuroscience"},"field":{"id":"https://openalex.org/fields/28","display_name":"Neuroscience"},"domain":{"id":"https://openalex.org/domains/1","display_name":"Life Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.718153715133667},{"id":"https://openalex.org/keywords/automatic-test-pattern-generation","display_name":"Automatic test pattern generation","score":0.5640623569488525},{"id":"https://openalex.org/keywords/logic-gate","display_name":"Logic gate","score":0.4475270211696625},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.23941758275032043},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.11234250664710999},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.10638031363487244},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.10272815823554993}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.718153715133667},{"id":"https://openalex.org/C17626397","wikidata":"https://www.wikidata.org/wiki/Q837455","display_name":"Automatic test pattern generation","level":3,"score":0.5640623569488525},{"id":"https://openalex.org/C131017901","wikidata":"https://www.wikidata.org/wiki/Q170451","display_name":"Logic gate","level":2,"score":0.4475270211696625},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.23941758275032043},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.11234250664710999},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.10638031363487244},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.10272815823554993}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/vts.2018.8368625","is_oa":false,"landing_page_url":"https://doi.org/10.1109/vts.2018.8368625","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2018 IEEE 36th VLSI Test Symposium (VTS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/17","score":0.41999998688697815,"display_name":"Partnerships for the goals"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":24,"referenced_works":["https://openalex.org/W1515903565","https://openalex.org/W1524250393","https://openalex.org/W1952517978","https://openalex.org/W1963105592","https://openalex.org/W1986199670","https://openalex.org/W2008819052","https://openalex.org/W2064541558","https://openalex.org/W2095410905","https://openalex.org/W2106409910","https://openalex.org/W2169212403","https://openalex.org/W2343475170","https://openalex.org/W2419784917","https://openalex.org/W2499445168","https://openalex.org/W2616325639","https://openalex.org/W2708742051","https://openalex.org/W2741711485","https://openalex.org/W2747980214","https://openalex.org/W2766393343","https://openalex.org/W6640822877","https://openalex.org/W6641116602","https://openalex.org/W6675797392","https://openalex.org/W6724703443","https://openalex.org/W6742287765","https://openalex.org/W6743403458"],"related_works":["https://openalex.org/W4391375266","https://openalex.org/W2899084033","https://openalex.org/W2748952813","https://openalex.org/W4254560580","https://openalex.org/W2127167802","https://openalex.org/W2131559056","https://openalex.org/W2080984854","https://openalex.org/W2323083271","https://openalex.org/W2019500818","https://openalex.org/W2390279801"],"abstract_inverted_index":{"The":[0,44],"globalization":[1],"of":[2,10,71,138],"IC":[3],"supply":[4],"chain":[5],"lead":[6],"to":[7,28,102,121,128,150],"the":[8,25,35,57,64,68,136,144],"emergence":[9],"hardware":[11,22],"security":[12,55,130],"threats":[13],"such":[14],"as":[15,77],"IP":[16],"piracy,":[17],"reverse":[18],"engineering,":[19],"overbuilding,":[20],"and":[21,39,53,63,97,108,126],"Trojans.":[23],"Among":[24],"techniques":[26],"developed":[27],"mitigate":[29],"these":[30],"threats,":[31],"logic":[32],"locking":[33,47],"offers":[34],"most":[36,45],"versatile":[37],"protection":[38],"is":[40],"being":[41],"actively":[42],"researched.":[43],"recent":[46],"technique":[48],"SFLL":[49,72,107,151],"thwarts":[50],"with":[51],"provable":[52],"quantifiable":[54],"all":[56],"state-of-the-art":[58],"attacks":[59],"including":[60],"SAT,":[61],"AppSAT,":[62],"removal":[65],"attack.":[66],"However,":[67],"implementation":[69,86,145],"cost":[70,146],"can":[73,99,142],"sometimes":[74],"be":[75,100],"prohibitive,":[76],"it":[78],"lacks":[79],"an":[80],"automated":[81],"framework":[82],"that":[83,115],"explores":[84],"cost-effective":[85],"options.":[87],"In":[88],"this":[89],"paper,":[90],"we":[91],"show":[92],"how":[93],"VLSI":[94],"testing":[95],"principles":[96],"tools":[98],"adopted":[101],"automate":[103],"critical":[104],"steps":[105],"in":[106],"minimize":[109],"its":[110],"cost.":[111],"We":[112],"propose":[113],"\u201cSFLL-fault\u201d":[114],"utilizes":[116],"fault":[117],"injection":[118],"driven":[119],"synthesis":[120],"efficiently":[122],"explore":[123],"design":[124],"options":[125],"ATPG":[127],"assess":[129],"levels.":[131],"Our":[132],"experimental":[133],"results":[134],"confirm":[135],"efficacy":[137],"our":[139],"strategy;":[140],"SFLL-fault":[141],"reduce":[143],"by":[147],"35%":[148],"compared":[149],"without":[152],"compromising":[153],"security.":[154]},"counts_by_year":[{"year":2026,"cited_by_count":3},{"year":2025,"cited_by_count":1},{"year":2024,"cited_by_count":2},{"year":2023,"cited_by_count":5},{"year":2022,"cited_by_count":11},{"year":2021,"cited_by_count":9},{"year":2020,"cited_by_count":13},{"year":2019,"cited_by_count":16},{"year":2018,"cited_by_count":2}],"updated_date":"2026-07-14T23:27:15.235271","created_date":"2025-10-10T00:00:00"}