{"id":"https://openalex.org/W2403801176","doi":"https://doi.org/10.1109/vts.2016.7477315","title":"Lifetime reliability modeling and estimation in multi-core systems","display_name":"Lifetime reliability modeling and estimation in multi-core systems","publication_year":2016,"publication_date":"2016-04-01","ids":{"openalex":"https://openalex.org/W2403801176","doi":"https://doi.org/10.1109/vts.2016.7477315","mag":"2403801176"},"language":"en","primary_location":{"id":"doi:10.1109/vts.2016.7477315","is_oa":false,"landing_page_url":"https://doi.org/10.1109/vts.2016.7477315","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2016 IEEE 34th VLSI Test Symposium (VTS)","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5031451381","display_name":"Antonio Miele","orcid":"https://orcid.org/0000-0003-3197-0723"},"institutions":[{"id":"https://openalex.org/I93860229","display_name":"Politecnico di Milano","ror":"https://ror.org/01nffqt88","country_code":"IT","type":"education","lineage":["https://openalex.org/I93860229"]}],"countries":["IT"],"is_corresponding":true,"raw_author_name":"Antonio Miele","raw_affiliation_strings":["Dip. Elettronica, Informazione e Bioingegneria, Politecnico di Milano, Italy"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Dip. Elettronica, Informazione e Bioingegneria, Politecnico di Milano, Italy","institution_ids":["https://openalex.org/I93860229"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":["https://openalex.org/A5031451381"],"corresponding_institution_ids":["https://openalex.org/I93860229"],"apc_list":null,"apc_paid":null,"fwci":null,"has_fulltext":false,"cited_by_count":4,"citation_normalized_percentile":null,"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"1"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10780","display_name":"Reliability and Maintenance Optimization","score":0.9965999722480774,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10780","display_name":"Reliability and Maintenance Optimization","score":0.9965999722480774,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12423","display_name":"Software Reliability and Analysis Research","score":0.9962999820709229,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10876","display_name":"Fault Detection and Control Systems","score":0.9914000034332275,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/estimation","display_name":"Estimation","score":0.6546880006790161},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.6540268659591675},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6178042888641357},{"id":"https://openalex.org/keywords/core","display_name":"Core (optical fiber)","score":0.586905300617218},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.576309323310852},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.14585930109024048},{"id":"https://openalex.org/keywords/systems-engineering","display_name":"Systems engineering","score":0.11768585443496704},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.08556091785430908}],"concepts":[{"id":"https://openalex.org/C96250715","wikidata":"https://www.wikidata.org/wiki/Q965330","display_name":"Estimation","level":2,"score":0.6546880006790161},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.6540268659591675},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6178042888641357},{"id":"https://openalex.org/C2164484","wikidata":"https://www.wikidata.org/wiki/Q5170150","display_name":"Core (optical fiber)","level":2,"score":0.586905300617218},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.576309323310852},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.14585930109024048},{"id":"https://openalex.org/C201995342","wikidata":"https://www.wikidata.org/wiki/Q682496","display_name":"Systems engineering","level":1,"score":0.11768585443496704},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.08556091785430908},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/vts.2016.7477315","is_oa":false,"landing_page_url":"https://doi.org/10.1109/vts.2016.7477315","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2016 IEEE 34th VLSI Test Symposium (VTS)","raw_type":"proceedings-article"},{"id":"pmh:oai:re.public.polimi.it:11311/999673","is_oa":false,"landing_page_url":"http://ieeexplore.ieee.org/document/7477315/","pdf_url":null,"source":{"id":"https://openalex.org/S4306400312","display_name":"Virtual Community of Pathological Anatomy (University of Castilla La Mancha)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I79189158","host_organization_name":"University of Castilla-La Mancha","host_organization_lineage":["https://openalex.org/I79189158"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"","raw_type":"info:eu-repo/semantics/conferenceObject"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7","score":0.75}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":2,"referenced_works":["https://openalex.org/W1977655174","https://openalex.org/W2080300564"],"related_works":["https://openalex.org/W2033512842","https://openalex.org/W4322734194","https://openalex.org/W3005535424","https://openalex.org/W4233600955","https://openalex.org/W2913665393","https://openalex.org/W2369695847","https://openalex.org/W2994319598","https://openalex.org/W2047067935","https://openalex.org/W1607054433","https://openalex.org/W2110842462"],"abstract_inverted_index":{"In":[0],"the":[1,14,20,24,36,82],"past":[2],"decade,":[3],"aggressive":[4],"CMOS":[5],"scaling":[6],"has":[7],"led":[8],"to":[9,56,63,72],"a":[10,57,78],"considerable":[11],"increase":[12,34],"in":[13,19,29,42],"power":[15],"densities,":[16],"and":[17,45,70],"consequently,":[18],"operating":[21],"temperature":[22,33],"within":[23],"device.":[25],"As":[26],"ITRS":[27],"reported":[28],"2011":[30],"[1],":[31],"such":[32,66],"is":[35,76],"primary":[37],"cause":[38],"of":[39,60,81,84],"an":[40],"acceleration":[41],"device":[43],"aging":[44],"wear-out":[46],"phenomena":[47],"(e.g.":[48],"electromigration":[49],"or":[50],"thermal":[51],"cycling),":[52],"that":[53],"are":[54],"leading":[55],"higher":[58],"susceptibility":[59],"digital":[61,85],"systems":[62],"degradation":[64],"effects,":[65],"as":[67],"timing":[68],"errors,":[69],"eventually":[71],"breakdowns.":[73],"The":[74],"result,":[75],"therefore":[77],"dramatic":[79],"decrease":[80],"lifetime":[83],"systems.":[86]},"counts_by_year":[{"year":2022,"cited_by_count":1},{"year":2017,"cited_by_count":2},{"year":2016,"cited_by_count":1}],"updated_date":"2026-07-14T23:27:15.235271","created_date":"2025-10-10T00:00:00"}