{"id":"https://openalex.org/W2408365229","doi":"https://doi.org/10.1109/vts.2016.7477311","title":"Special panel session IIB: \"System validation and silicon debug \u2014 Is standardization possible?\"","display_name":"Special panel session IIB: \"System validation and silicon debug \u2014 Is standardization possible?\"","publication_year":2016,"publication_date":"2016-04-01","ids":{"openalex":"https://openalex.org/W2408365229","doi":"https://doi.org/10.1109/vts.2016.7477311","mag":"2408365229"},"language":"en","primary_location":{"id":"doi:10.1109/vts.2016.7477311","is_oa":false,"landing_page_url":"https://doi.org/10.1109/vts.2016.7477311","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2016 IEEE 34th VLSI Test Symposium (VTS)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5042908608","display_name":"Mike Ricchetti","orcid":null},"institutions":[{"id":"https://openalex.org/I4210088951","display_name":"Synopsys (United States)","ror":"https://ror.org/013by2m91","country_code":"US","type":"company","lineage":["https://openalex.org/I4210088951"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Mike Ricchetti","raw_affiliation_strings":["Synopsys, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Synopsys, USA","institution_ids":["https://openalex.org/I4210088951"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5055197793","display_name":"Eric Rentschler","orcid":null},"institutions":[{"id":"https://openalex.org/I4210156212","display_name":"Mentor Technologies","ror":"https://ror.org/05vewsj04","country_code":"US","type":"other","lineage":["https://openalex.org/I4210156212"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Eric Rentschler","raw_affiliation_strings":["Mentor Graphics, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Mentor Graphics, USA","institution_ids":["https://openalex.org/I4210156212"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5084369824","display_name":"Amit Majumdar","orcid":null},"institutions":[{"id":"https://openalex.org/I32923980","display_name":"Xilinx (United States)","ror":"https://ror.org/01rb7bk56","country_code":"US","type":"company","lineage":["https://openalex.org/I32923980"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Amit Majumdar","raw_affiliation_strings":["Xilinx, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Xilinx, USA","institution_ids":["https://openalex.org/I32923980"]}]},{"author_position":"middle","author":{"id":null,"display_name":"Mike Lowe","orcid":null},"institutions":[{"id":"https://openalex.org/I4210101778","display_name":"Samsung (United States)","ror":"https://ror.org/01bfbvm65","country_code":"US","type":"company","lineage":["https://openalex.org/I2250650973","https://openalex.org/I4210101778"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Mike Lowe","raw_affiliation_strings":["Samsung, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Samsung, USA","institution_ids":["https://openalex.org/I4210101778"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5088193029","display_name":"Mark LaVine","orcid":null},"institutions":[{"id":"https://openalex.org/I4210156213","display_name":"American Rock Mechanics Association","ror":"https://ror.org/05vfrxy92","country_code":"US","type":"nonprofit","lineage":["https://openalex.org/I4210156213"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Mark LaVine","raw_affiliation_strings":["ARM, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"ARM, USA","institution_ids":["https://openalex.org/I4210156213"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5052367385","display_name":"Skip Lindsey","orcid":null},"institutions":[{"id":"https://openalex.org/I1343180700","display_name":"Intel (United States)","ror":"https://ror.org/01ek73717","country_code":"US","type":"company","lineage":["https://openalex.org/I1343180700"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Skip Lindsey","raw_affiliation_strings":["Intel, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Intel, USA","institution_ids":["https://openalex.org/I1343180700"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5059709921","display_name":"Sharad Kumar","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Sharad Kumar","raw_affiliation_strings":["NXP, India"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"NXP, India","institution_ids":[]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":7,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.04376706,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"1"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9916999936103821,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9916999936103821,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9902999997138977,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9225999712944031,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/standardization","display_name":"Standardization","score":0.9468252658843994},{"id":"https://openalex.org/keywords/debugging","display_name":"Debugging","score":0.9184941053390503},{"id":"https://openalex.org/keywords/automation","display_name":"Automation","score":0.6446658372879028},{"id":"https://openalex.org/keywords/session","display_name":"Session (web analytics)","score":0.6307957172393799},{"id":"https://openalex.org/keywords/software-engineering","display_name":"Software engineering","score":0.6242297887802124},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5768132209777832},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.5030557513237},{"id":"https://openalex.org/keywords/electronic-design-automation","display_name":"Electronic design automation","score":0.49623018503189087},{"id":"https://openalex.org/keywords/panel-discussion","display_name":"Panel discussion","score":0.4894596338272095},{"id":"https://openalex.org/keywords/semiconductor-industry","display_name":"Semiconductor industry","score":0.4881969094276428},{"id":"https://openalex.org/keywords/software","display_name":"Software","score":0.47070953249931335},{"id":"https://openalex.org/keywords/interoperability","display_name":"Interoperability","score":0.436227023601532},{"id":"https://openalex.org/keywords/software-bug","display_name":"Software bug","score":0.41367632150650024},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.3521426320075989},{"id":"https://openalex.org/keywords/systems-engineering","display_name":"Systems engineering","score":0.3457649052143097},{"id":"https://openalex.org/keywords/operating-system","display_name":"Operating system","score":0.25231802463531494},{"id":"https://openalex.org/keywords/manufacturing-engineering","display_name":"Manufacturing engineering","score":0.19989442825317383},{"id":"https://openalex.org/keywords/business","display_name":"Business","score":0.14921316504478455},{"id":"https://openalex.org/keywords/world-wide-web","display_name":"World Wide Web","score":0.11329510807991028}],"concepts":[{"id":"https://openalex.org/C188087704","wikidata":"https://www.wikidata.org/wiki/Q369577","display_name":"Standardization","level":2,"score":0.9468252658843994},{"id":"https://openalex.org/C168065819","wikidata":"https://www.wikidata.org/wiki/Q845566","display_name":"Debugging","level":2,"score":0.9184941053390503},{"id":"https://openalex.org/C115901376","wikidata":"https://www.wikidata.org/wiki/Q184199","display_name":"Automation","level":2,"score":0.6446658372879028},{"id":"https://openalex.org/C2779182362","wikidata":"https://www.wikidata.org/wiki/Q17126187","display_name":"Session (web analytics)","level":2,"score":0.6307957172393799},{"id":"https://openalex.org/C115903868","wikidata":"https://www.wikidata.org/wiki/Q80993","display_name":"Software engineering","level":1,"score":0.6242297887802124},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5768132209777832},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.5030557513237},{"id":"https://openalex.org/C64260653","wikidata":"https://www.wikidata.org/wiki/Q1194864","display_name":"Electronic design automation","level":2,"score":0.49623018503189087},{"id":"https://openalex.org/C2781433648","wikidata":"https://www.wikidata.org/wiki/Q2100278","display_name":"Panel discussion","level":2,"score":0.4894596338272095},{"id":"https://openalex.org/C2987888538","wikidata":"https://www.wikidata.org/wiki/Q2986369","display_name":"Semiconductor industry","level":2,"score":0.4881969094276428},{"id":"https://openalex.org/C2777904410","wikidata":"https://www.wikidata.org/wiki/Q7397","display_name":"Software","level":2,"score":0.47070953249931335},{"id":"https://openalex.org/C20136886","wikidata":"https://www.wikidata.org/wiki/Q749647","display_name":"Interoperability","level":2,"score":0.436227023601532},{"id":"https://openalex.org/C1009929","wikidata":"https://www.wikidata.org/wiki/Q179550","display_name":"Software bug","level":3,"score":0.41367632150650024},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.3521426320075989},{"id":"https://openalex.org/C201995342","wikidata":"https://www.wikidata.org/wiki/Q682496","display_name":"Systems engineering","level":1,"score":0.3457649052143097},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.25231802463531494},{"id":"https://openalex.org/C117671659","wikidata":"https://www.wikidata.org/wiki/Q11049265","display_name":"Manufacturing engineering","level":1,"score":0.19989442825317383},{"id":"https://openalex.org/C144133560","wikidata":"https://www.wikidata.org/wiki/Q4830453","display_name":"Business","level":0,"score":0.14921316504478455},{"id":"https://openalex.org/C136764020","wikidata":"https://www.wikidata.org/wiki/Q466","display_name":"World Wide Web","level":1,"score":0.11329510807991028},{"id":"https://openalex.org/C78519656","wikidata":"https://www.wikidata.org/wiki/Q101333","display_name":"Mechanical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C112698675","wikidata":"https://www.wikidata.org/wiki/Q37038","display_name":"Advertising","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/vts.2016.7477311","is_oa":false,"landing_page_url":"https://doi.org/10.1109/vts.2016.7477311","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2016 IEEE 34th VLSI Test Symposium (VTS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/9","score":0.6399999856948853,"display_name":"Industry, innovation and infrastructure"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":0,"referenced_works":[],"related_works":["https://openalex.org/W2740264376","https://openalex.org/W4206999239","https://openalex.org/W2900719967","https://openalex.org/W2161928627","https://openalex.org/W4388482952","https://openalex.org/W2786113878","https://openalex.org/W2787155073","https://openalex.org/W2727867943","https://openalex.org/W4322631505","https://openalex.org/W3015562293"],"abstract_inverted_index":{"Although":[0],"there":[1,6],"are":[2,7,35,66],"standards":[3],"for":[4,9,11,77],"DFT,":[5],"none":[8],"Design":[10],"Debug":[12],"and":[13,27,50,61,75],"Validation":[14],"(DFD/DFV)":[15],"of":[16],"silicon":[17],"in":[18],"systems.":[19],"Many":[20],"semiconductor":[21],"companies":[22],"have":[23],"standardized":[24],"DFD/DFV":[25],"architectures":[26],"features":[28],"within":[29],"their":[30],"own":[31],"products,":[32],"however":[33],"these":[34,45],"proprietary":[36],"solutions.":[37],"The":[38],"panel":[39],"will":[40,51],"explore":[41],"whether":[42,53],"or":[43],"not":[44],"solutions":[46],"share":[47],"common":[48],"requirements":[49],"debate":[52],"the":[54],"industry":[55],"would":[56],"benefit":[57],"from":[58],"any":[59],"standardization,":[60],"what":[62],"to":[63,72],"standardize.":[64],"Examples":[65],"standard":[67],"debug":[68,74],"infrastructure":[69],"IP,":[70],"bridges":[71],"software":[73],"support":[76],"EDA":[78],"automation.":[79]},"counts_by_year":[],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}