{"id":"https://openalex.org/W2395241998","doi":"https://doi.org/10.1109/vts.2016.7477268","title":"Predicting Vt mean and variance from parallel Id measurement with model-fitting technique","display_name":"Predicting Vt mean and variance from parallel Id measurement with model-fitting technique","publication_year":2016,"publication_date":"2016-04-01","ids":{"openalex":"https://openalex.org/W2395241998","doi":"https://doi.org/10.1109/vts.2016.7477268","mag":"2395241998"},"language":"en","primary_location":{"id":"doi:10.1109/vts.2016.7477268","is_oa":false,"landing_page_url":"https://doi.org/10.1109/vts.2016.7477268","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2016 IEEE 34th VLSI Test Symposium (VTS)","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5109384994","display_name":"Chih-Ying Tsai","orcid":null},"institutions":[{"id":"https://openalex.org/I148366613","display_name":"National Yang Ming Chiao Tung University","ror":"https://ror.org/00se2k293","country_code":"TW","type":"education","lineage":["https://openalex.org/I148366613"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Chih-Ying Tsai","raw_affiliation_strings":["Dept. of Electronics Engineering & Institute of Electronics, National Chiao Tung University, Hsinchu, Taiwan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Dept. of Electronics Engineering & Institute of Electronics, National Chiao Tung University, Hsinchu, Taiwan","institution_ids":["https://openalex.org/I148366613"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5055627620","display_name":"Kao-Chi Lee","orcid":null},"institutions":[{"id":"https://openalex.org/I148366613","display_name":"National Yang Ming Chiao Tung University","ror":"https://ror.org/00se2k293","country_code":"TW","type":"education","lineage":["https://openalex.org/I148366613"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Kao-Chi Lee","raw_affiliation_strings":["Dept. of Electronics Engineering & Institute of Electronics, National Chiao Tung University, Hsinchu, Taiwan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Dept. of Electronics Engineering & Institute of Electronics, National Chiao Tung University, Hsinchu, Taiwan","institution_ids":["https://openalex.org/I148366613"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5003285200","display_name":"Chien-Hsueh Lin","orcid":null},"institutions":[{"id":"https://openalex.org/I148366613","display_name":"National Yang Ming Chiao Tung University","ror":"https://ror.org/00se2k293","country_code":"TW","type":"education","lineage":["https://openalex.org/I148366613"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Chien-Hsueh Lin","raw_affiliation_strings":["Dept. of Electronics Engineering & Institute of Electronics, National Chiao Tung University, Hsinchu, Taiwan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Dept. of Electronics Engineering & Institute of Electronics, National Chiao Tung University, Hsinchu, Taiwan","institution_ids":["https://openalex.org/I148366613"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5065480094","display_name":"Sung-Chu Yu","orcid":null},"institutions":[{"id":"https://openalex.org/I4210161555","display_name":"United Microelectronics (Taiwan)","ror":"https://ror.org/0580qje17","country_code":"TW","type":"company","lineage":["https://openalex.org/I4210161555"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Sung-Chu Yu","raw_affiliation_strings":["United Microelectronics Corporation, Taiwan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"United Microelectronics Corporation, Taiwan","institution_ids":["https://openalex.org/I4210161555"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5078455237","display_name":"Wen-Rong Liau","orcid":null},"institutions":[{"id":"https://openalex.org/I4210161555","display_name":"United Microelectronics (Taiwan)","ror":"https://ror.org/0580qje17","country_code":"TW","type":"company","lineage":["https://openalex.org/I4210161555"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Wen-Rong Liau","raw_affiliation_strings":["United Microelectronics Corporation, Taiwan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"United Microelectronics Corporation, Taiwan","institution_ids":["https://openalex.org/I4210161555"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5008575768","display_name":"Alex Chun-Liang Hou","orcid":null},"institutions":[{"id":"https://openalex.org/I4210161555","display_name":"United Microelectronics (Taiwan)","ror":"https://ror.org/0580qje17","country_code":"TW","type":"company","lineage":["https://openalex.org/I4210161555"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Alex Chun-Liang Hou","raw_affiliation_strings":["United Microelectronics Corporation, Taiwan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"United Microelectronics Corporation, Taiwan","institution_ids":["https://openalex.org/I4210161555"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5084399586","display_name":"Ying-Yen Chen","orcid":null},"institutions":[{"id":"https://openalex.org/I901624438","display_name":"Realtek (Taiwan)","ror":"https://ror.org/05x1ffr83","country_code":"TW","type":"company","lineage":["https://openalex.org/I901624438"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Ying-Yen Chen","raw_affiliation_strings":["Realtek Semiconductor Corporation, Taiwan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Realtek Semiconductor Corporation, Taiwan","institution_ids":["https://openalex.org/I901624438"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5102225158","display_name":"Chun\u2010Yi Kuo","orcid":null},"institutions":[{"id":"https://openalex.org/I901624438","display_name":"Realtek (Taiwan)","ror":"https://ror.org/05x1ffr83","country_code":"TW","type":"company","lineage":["https://openalex.org/I901624438"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Chun-Yi Kuo","raw_affiliation_strings":["Realtek Semiconductor Corporation, Taiwan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Realtek Semiconductor Corporation, Taiwan","institution_ids":["https://openalex.org/I901624438"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5086374528","display_name":"Jih-Nung Lee","orcid":"https://orcid.org/0000-0003-4805-4350"},"institutions":[{"id":"https://openalex.org/I901624438","display_name":"Realtek (Taiwan)","ror":"https://ror.org/05x1ffr83","country_code":"TW","type":"company","lineage":["https://openalex.org/I901624438"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Jih-Nung Lee","raw_affiliation_strings":["Realtek Semiconductor Corporation, Taiwan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Realtek Semiconductor Corporation, Taiwan","institution_ids":["https://openalex.org/I901624438"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5045156360","display_name":"Mango C.-T. Chao","orcid":"https://orcid.org/0000-0002-7299-9015"},"institutions":[{"id":"https://openalex.org/I148366613","display_name":"National Yang Ming Chiao Tung University","ror":"https://ror.org/00se2k293","country_code":"TW","type":"education","lineage":["https://openalex.org/I148366613"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Mango C.-T. Chao","raw_affiliation_strings":["Dept. of Electronics Engineering & Institute of Electronics, National Chiao Tung University, Hsinchu, Taiwan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Dept. of Electronics Engineering & Institute of Electronics, National Chiao Tung University, Hsinchu, Taiwan","institution_ids":["https://openalex.org/I148366613"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":1.6145,"has_fulltext":false,"cited_by_count":5,"citation_normalized_percentile":{"value":0.79427232,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":96},"biblio":{"volume":"22","issue":null,"first_page":"1","last_page":"6"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9993000030517578,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9993000030517578,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9991000294685364,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11338","display_name":"Advancements in Photolithography Techniques","score":0.9947999715805054,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/variance","display_name":"Variance (accounting)","score":0.7021759748458862},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5309497714042664},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.44356581568717957},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.428340345621109}],"concepts":[{"id":"https://openalex.org/C196083921","wikidata":"https://www.wikidata.org/wiki/Q7915758","display_name":"Variance (accounting)","level":2,"score":0.7021759748458862},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5309497714042664},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.44356581568717957},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.428340345621109},{"id":"https://openalex.org/C121955636","wikidata":"https://www.wikidata.org/wiki/Q4116214","display_name":"Accounting","level":1,"score":0.0},{"id":"https://openalex.org/C144133560","wikidata":"https://www.wikidata.org/wiki/Q4830453","display_name":"Business","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/vts.2016.7477268","is_oa":false,"landing_page_url":"https://doi.org/10.1109/vts.2016.7477268","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2016 IEEE 34th VLSI Test Symposium (VTS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Life in Land","id":"https://metadata.un.org/sdg/15","score":0.7200000286102295}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":27,"referenced_works":["https://openalex.org/W1594031697","https://openalex.org/W1746819321","https://openalex.org/W1965072200","https://openalex.org/W1987366127","https://openalex.org/W1997407109","https://openalex.org/W2036547494","https://openalex.org/W2045803758","https://openalex.org/W2057541401","https://openalex.org/W2087429211","https://openalex.org/W2096652287","https://openalex.org/W2101926813","https://openalex.org/W2102067969","https://openalex.org/W2104010258","https://openalex.org/W2105961649","https://openalex.org/W2118335598","https://openalex.org/W2119776516","https://openalex.org/W2119821739","https://openalex.org/W2144452471","https://openalex.org/W2153635508","https://openalex.org/W2320628389","https://openalex.org/W2911964244","https://openalex.org/W3095590901","https://openalex.org/W3156302520","https://openalex.org/W4211049957","https://openalex.org/W4239510810","https://openalex.org/W6649931594","https://openalex.org/W6676015143"],"related_works":["https://openalex.org/W4391375266","https://openalex.org/W2748952813","https://openalex.org/W2051487156","https://openalex.org/W2073681303","https://openalex.org/W2390279801","https://openalex.org/W2358668433","https://openalex.org/W4396701345","https://openalex.org/W2376932109","https://openalex.org/W2001405890","https://openalex.org/W4396696052"],"abstract_inverted_index":{"To":[0],"measure":[1],"the":[2,25,40,56,64,76,86,123],"variation":[3],"of":[4,29,34,60,79,100,122,126],"device":[5],"Vtrequires":[6],"long":[7],"test":[8,12,108],"for":[9,97],"conventional":[10,106],"WAT":[11,107],"structures.":[13],"This":[14],"paper":[15],"presents":[16],"a":[17,31,51,80,92],"framework":[18,38,89,115],"that":[19,53,85],"can":[20,54,90,116],"efficiently":[21],"and":[22,27,58,102],"effectively":[23],"obtain":[24],"mean":[26,57],"variance":[28,59],"Vtfor":[30],"large":[32],"number":[33],"DUTs.":[35,70],"The":[36,71],"proposed":[37,87,114],"applies":[39],"model-based":[41],"random":[42],"forest":[43],"as":[44],"its":[45],"core":[46],"model-fitting":[47,88],"technique":[48],"to":[49,105],"learn":[50],"model":[52],"predict":[55],"Vtbased":[61],"on":[62,75],"only":[63],"combined":[65],"Idmeasured":[66],"from":[67],"parallel":[68],"connected":[69],"experimental":[72],"results":[73],"based":[74],"SPICE":[77],"simulation":[78],"UMC":[81],"28nm":[82],"technology":[83],"demonstrate":[84],"achieve":[91,117],"more":[93],"than":[94],"99%":[95],"R-squared":[96],"predicting":[98],"both":[99],"Vtmean":[101],"variance.":[103],"Compared":[104],"structures":[109],"using":[110],"binary":[111],"search,":[112],"our":[113],"42.9X":[118],"speedup":[119],"in":[120],"turn":[121],"required":[124],"iterations":[125],"Idmeasurement":[127],"per":[128],"DUT.":[129]},"counts_by_year":[{"year":2021,"cited_by_count":1},{"year":2019,"cited_by_count":1},{"year":2018,"cited_by_count":2},{"year":2017,"cited_by_count":1}],"updated_date":"2026-07-29T14:22:42.915294","created_date":"2025-10-10T00:00:00"}