{"id":"https://openalex.org/W1563087557","doi":"https://doi.org/10.1109/vts.2015.7116297","title":"Test vector omission with minimal sets of simulated faults","display_name":"Test vector omission with minimal sets of simulated faults","publication_year":2015,"publication_date":"2015-04-01","ids":{"openalex":"https://openalex.org/W1563087557","doi":"https://doi.org/10.1109/vts.2015.7116297","mag":"1563087557"},"language":"en","primary_location":{"id":"doi:10.1109/vts.2015.7116297","is_oa":false,"landing_page_url":"https://doi.org/10.1109/vts.2015.7116297","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2015 IEEE 33rd VLSI Test Symposium (VTS)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5032651920","display_name":"Irith Pomeranz","orcid":"https://orcid.org/0000-0002-5491-7282"},"institutions":[{"id":"https://openalex.org/I219193219","display_name":"Purdue University West Lafayette","ror":"https://ror.org/02dqehb95","country_code":"US","type":"education","lineage":["https://openalex.org/I219193219"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Irith Pomeranz","raw_affiliation_strings":["School of Electrical and Computer Engineering, Purdue University West Lafayette, IN, U.S.A","School of Electrical and Computer Engineering, Purdue University,  West Lafayette, IN 47907, U.S.A"],"affiliations":[{"raw_affiliation_string":"School of Electrical and Computer Engineering, Purdue University West Lafayette, IN, U.S.A","institution_ids":["https://openalex.org/I219193219"]},{"raw_affiliation_string":"School of Electrical and Computer Engineering, Purdue University,  West Lafayette, IN 47907, U.S.A","institution_ids":[]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":["https://openalex.org/A5032651920"],"corresponding_institution_ids":["https://openalex.org/I219193219"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.02838605,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"6"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9957000017166138,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10743","display_name":"Software Testing and Debugging Techniques","score":0.9937999844551086,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/test-vector","display_name":"Test vector","score":0.6989763975143433},{"id":"https://openalex.org/keywords/test-set","display_name":"Test set","score":0.6249290108680725},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.6194937229156494},{"id":"https://openalex.org/keywords/subsequence","display_name":"Subsequence","score":0.6035672426223755},{"id":"https://openalex.org/keywords/fault-coverage","display_name":"Fault coverage","score":0.5869890451431274},{"id":"https://openalex.org/keywords/automatic-test-pattern-generation","display_name":"Automatic test pattern generation","score":0.5763137936592102},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5717726945877075},{"id":"https://openalex.org/keywords/longest-common-subsequence-problem","display_name":"Longest common subsequence problem","score":0.5654864311218262},{"id":"https://openalex.org/keywords/sequence","display_name":"Sequence (biology)","score":0.5592597126960754},{"id":"https://openalex.org/keywords/set","display_name":"Set (abstract data type)","score":0.5337235927581787},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.5090305805206299},{"id":"https://openalex.org/keywords/test","display_name":"Test (biology)","score":0.44545841217041016},{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.4446742832660675},{"id":"https://openalex.org/keywords/reduction","display_name":"Reduction (mathematics)","score":0.42444297671318054},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.3000873923301697},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.16918417811393738},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.16278645396232605}],"concepts":[{"id":"https://openalex.org/C100767440","wikidata":"https://www.wikidata.org/wiki/Q7705816","display_name":"Test vector","level":3,"score":0.6989763975143433},{"id":"https://openalex.org/C169903167","wikidata":"https://www.wikidata.org/wiki/Q3985153","display_name":"Test set","level":2,"score":0.6249290108680725},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.6194937229156494},{"id":"https://openalex.org/C137877099","wikidata":"https://www.wikidata.org/wiki/Q1332977","display_name":"Subsequence","level":3,"score":0.6035672426223755},{"id":"https://openalex.org/C126953365","wikidata":"https://www.wikidata.org/wiki/Q5438152","display_name":"Fault coverage","level":3,"score":0.5869890451431274},{"id":"https://openalex.org/C17626397","wikidata":"https://www.wikidata.org/wiki/Q837455","display_name":"Automatic test pattern generation","level":3,"score":0.5763137936592102},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5717726945877075},{"id":"https://openalex.org/C120098539","wikidata":"https://www.wikidata.org/wiki/Q141001","display_name":"Longest common subsequence problem","level":2,"score":0.5654864311218262},{"id":"https://openalex.org/C2778112365","wikidata":"https://www.wikidata.org/wiki/Q3511065","display_name":"Sequence (biology)","level":2,"score":0.5592597126960754},{"id":"https://openalex.org/C177264268","wikidata":"https://www.wikidata.org/wiki/Q1514741","display_name":"Set (abstract data type)","level":2,"score":0.5337235927581787},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.5090305805206299},{"id":"https://openalex.org/C2777267654","wikidata":"https://www.wikidata.org/wiki/Q3519023","display_name":"Test (biology)","level":2,"score":0.44545841217041016},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.4446742832660675},{"id":"https://openalex.org/C111335779","wikidata":"https://www.wikidata.org/wiki/Q3454686","display_name":"Reduction (mathematics)","level":2,"score":0.42444297671318054},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.3000873923301697},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.16918417811393738},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.16278645396232605},{"id":"https://openalex.org/C151730666","wikidata":"https://www.wikidata.org/wiki/Q7205","display_name":"Paleontology","level":1,"score":0.0},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0},{"id":"https://openalex.org/C34388435","wikidata":"https://www.wikidata.org/wiki/Q2267362","display_name":"Bounded function","level":2,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C134306372","wikidata":"https://www.wikidata.org/wiki/Q7754","display_name":"Mathematical analysis","level":1,"score":0.0},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.0},{"id":"https://openalex.org/C54355233","wikidata":"https://www.wikidata.org/wiki/Q7162","display_name":"Genetics","level":1,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/vts.2015.7116297","is_oa":false,"landing_page_url":"https://doi.org/10.1109/vts.2015.7116297","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2015 IEEE 33rd VLSI Test Symposium (VTS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[{"id":"https://openalex.org/F4320306076","display_name":"National Science Foundation","ror":"https://ror.org/021nxhr62"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":24,"referenced_works":["https://openalex.org/W1796553235","https://openalex.org/W1913684980","https://openalex.org/W1972479656","https://openalex.org/W2002339134","https://openalex.org/W2103428426","https://openalex.org/W2108839403","https://openalex.org/W2114433681","https://openalex.org/W2123101243","https://openalex.org/W2126676773","https://openalex.org/W2134848334","https://openalex.org/W2137843962","https://openalex.org/W2140817218","https://openalex.org/W2154175844","https://openalex.org/W2161706161","https://openalex.org/W2162203306","https://openalex.org/W2169702711","https://openalex.org/W4230759791","https://openalex.org/W4242575540","https://openalex.org/W4243200393","https://openalex.org/W4247532507","https://openalex.org/W4254057321","https://openalex.org/W6676084624","https://openalex.org/W6683906137","https://openalex.org/W6684176839"],"related_works":["https://openalex.org/W2098752843","https://openalex.org/W2151556234","https://openalex.org/W2154529098","https://openalex.org/W2092357065","https://openalex.org/W2136680550","https://openalex.org/W2147400189","https://openalex.org/W2154314512","https://openalex.org/W2019719714","https://openalex.org/W2129591317","https://openalex.org/W2154934646"],"abstract_inverted_index":{"Test":[0],"vector":[1,23,32,98,157],"omission":[2,24,94,158],"is":[3,46,68],"a":[4,19,77,82,96,119,131,142],"static":[5],"test":[6,11,16,22,31,74,97,111,156],"compaction":[7],"procedure":[8,25],"for":[9,29,38,71,92,155],"functional":[10],"sequences":[12],"that":[13,35,44,87],"removes":[14],"unnecessary":[15],"vectors":[17,75],"from":[18],"sequence.":[20,78],"The":[21,114],"requires":[26],"fault":[27,122,135],"simulation":[28,123,136],"every":[30],"(or":[33],"subsequence)":[34],"it":[36,45],"considers":[37],"omission.":[39],"It":[40],"was":[41],"noted":[42],"earlier":[43],"possible":[47],"to":[48,89,103],"reduce":[49],"the":[50,57,61,72,93,126,128,152,161],"set":[51,84],"of":[52,76,85,95,163],"simulated":[53,91],"faults":[54,62,86],"based":[55],"on":[56],"clock":[58,105,108],"cycles":[59,109],"where":[60,110],"are":[63,116],"detected.":[64],"However,":[65],"this":[66],"reduction":[67],"effective":[69],"only":[70],"later":[73],"This":[79],"paper":[80,129],"defines":[81],"minimal":[83],"need":[88],"be":[90],"by":[99,118],"considering,":[100],"in":[101,151],"addition":[102],"detection":[104],"cycles,":[106],"also":[107],"subsequences":[112],"start.":[113],"former":[115],"computed":[117],"conventional":[120],"sequential":[121,132],"process.":[124],"For":[125],"latter,":[127],"introduces":[130],"reverse":[133],"order":[134],"process,":[137],"and":[138],"an":[139],"approximation":[140],"with":[141],"reduced":[143],"computational":[144],"complexity.":[145],"Experimental":[146],"results":[147],"show":[148],"significant":[149],"reductions":[150],"run":[153],"time":[154],"without":[159],"affecting":[160],"level":[162],"compaction.":[164]},"counts_by_year":[],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}