{"id":"https://openalex.org/W1537124481","doi":"https://doi.org/10.1109/vts.2015.7116286","title":"Abstraction-based relation mining for functional test generation","display_name":"Abstraction-based relation mining for functional test generation","publication_year":2015,"publication_date":"2015-04-01","ids":{"openalex":"https://openalex.org/W1537124481","doi":"https://doi.org/10.1109/vts.2015.7116286","mag":"1537124481"},"language":"en","primary_location":{"id":"doi:10.1109/vts.2015.7116286","is_oa":false,"landing_page_url":"https://doi.org/10.1109/vts.2015.7116286","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2015 IEEE 33rd VLSI Test Symposium (VTS)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5008936808","display_name":"Kelson Gent","orcid":null},"institutions":[{"id":"https://openalex.org/I859038795","display_name":"Virginia Tech","ror":"https://ror.org/02smfhw86","country_code":"US","type":"education","lineage":["https://openalex.org/I859038795"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Kelson Gent","raw_affiliation_strings":["Bradley Department of Electrical and Computer Engineering, Virginia Tech, Blacksburg, VA, USA","Bradley Department of Electrical and Computer Engineering, Virginia Tech, Blacksburg, 24061 USA"],"affiliations":[{"raw_affiliation_string":"Bradley Department of Electrical and Computer Engineering, Virginia Tech, Blacksburg, VA, USA","institution_ids":["https://openalex.org/I859038795"]},{"raw_affiliation_string":"Bradley Department of Electrical and Computer Engineering, Virginia Tech, Blacksburg, 24061 USA","institution_ids":["https://openalex.org/I859038795"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5108516165","display_name":"Michael S. Hsiao","orcid":null},"institutions":[{"id":"https://openalex.org/I859038795","display_name":"Virginia Tech","ror":"https://ror.org/02smfhw86","country_code":"US","type":"education","lineage":["https://openalex.org/I859038795"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Michael S. Hsiao","raw_affiliation_strings":["Bradley Department of Electrical and Computer Engineering, Virginia Tech, Blacksburg, VA, USA","Bradley Department of Electrical and Computer Engineering, Virginia Tech, Blacksburg, 24061 USA"],"affiliations":[{"raw_affiliation_string":"Bradley Department of Electrical and Computer Engineering, Virginia Tech, Blacksburg, VA, USA","institution_ids":["https://openalex.org/I859038795"]},{"raw_affiliation_string":"Bradley Department of Electrical and Computer Engineering, Virginia Tech, Blacksburg, 24061 USA","institution_ids":["https://openalex.org/I859038795"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5008936808"],"corresponding_institution_ids":["https://openalex.org/I859038795"],"apc_list":null,"apc_paid":null,"fwci":1.6592,"has_fulltext":false,"cited_by_count":3,"citation_normalized_percentile":{"value":0.83223313,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":96},"biblio":{"volume":"1703","issue":null,"first_page":"1","last_page":"6"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10743","display_name":"Software Testing and Debugging Techniques","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10743","display_name":"Software Testing and Debugging Techniques","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10142","display_name":"Formal Methods in Verification","score":0.9972000122070312,"subfield":{"id":"https://openalex.org/subfields/1703","display_name":"Computational Theory and Mathematics"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7885935306549072},{"id":"https://openalex.org/keywords/abstraction","display_name":"Abstraction","score":0.7009655237197876},{"id":"https://openalex.org/keywords/relation","display_name":"Relation (database)","score":0.5616198778152466},{"id":"https://openalex.org/keywords/automatic-test-pattern-generation","display_name":"Automatic test pattern generation","score":0.5127538442611694},{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.4962034821510315},{"id":"https://openalex.org/keywords/random-testing","display_name":"Random testing","score":0.48481717705726624},{"id":"https://openalex.org/keywords/convergence","display_name":"Convergence (economics)","score":0.48177024722099304},{"id":"https://openalex.org/keywords/theoretical-computer-science","display_name":"Theoretical computer science","score":0.47674453258514404},{"id":"https://openalex.org/keywords/reduction","display_name":"Reduction (mathematics)","score":0.45324909687042236},{"id":"https://openalex.org/keywords/formal-verification","display_name":"Formal verification","score":0.44765955209732056},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.4454725384712219},{"id":"https://openalex.org/keywords/path","display_name":"Path (computing)","score":0.4290677011013031},{"id":"https://openalex.org/keywords/stochastic-process","display_name":"Stochastic process","score":0.41835808753967285},{"id":"https://openalex.org/keywords/computer-engineering","display_name":"Computer engineering","score":0.36780741810798645},{"id":"https://openalex.org/keywords/test-case","display_name":"Test case","score":0.3429814577102661},{"id":"https://openalex.org/keywords/data-mining","display_name":"Data mining","score":0.2769790291786194},{"id":"https://openalex.org/keywords/programming-language","display_name":"Programming language","score":0.25096243619918823},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.24326899647712708},{"id":"https://openalex.org/keywords/machine-learning","display_name":"Machine learning","score":0.18977198004722595},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.13518047332763672}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7885935306549072},{"id":"https://openalex.org/C124304363","wikidata":"https://www.wikidata.org/wiki/Q673661","display_name":"Abstraction","level":2,"score":0.7009655237197876},{"id":"https://openalex.org/C25343380","wikidata":"https://www.wikidata.org/wiki/Q277521","display_name":"Relation (database)","level":2,"score":0.5616198778152466},{"id":"https://openalex.org/C17626397","wikidata":"https://www.wikidata.org/wiki/Q837455","display_name":"Automatic test pattern generation","level":3,"score":0.5127538442611694},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.4962034821510315},{"id":"https://openalex.org/C106159264","wikidata":"https://www.wikidata.org/wiki/Q17146789","display_name":"Random testing","level":4,"score":0.48481717705726624},{"id":"https://openalex.org/C2777303404","wikidata":"https://www.wikidata.org/wiki/Q759757","display_name":"Convergence (economics)","level":2,"score":0.48177024722099304},{"id":"https://openalex.org/C80444323","wikidata":"https://www.wikidata.org/wiki/Q2878974","display_name":"Theoretical computer science","level":1,"score":0.47674453258514404},{"id":"https://openalex.org/C111335779","wikidata":"https://www.wikidata.org/wiki/Q3454686","display_name":"Reduction (mathematics)","level":2,"score":0.45324909687042236},{"id":"https://openalex.org/C111498074","wikidata":"https://www.wikidata.org/wiki/Q173326","display_name":"Formal verification","level":2,"score":0.44765955209732056},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.4454725384712219},{"id":"https://openalex.org/C2777735758","wikidata":"https://www.wikidata.org/wiki/Q817765","display_name":"Path (computing)","level":2,"score":0.4290677011013031},{"id":"https://openalex.org/C8272713","wikidata":"https://www.wikidata.org/wiki/Q176737","display_name":"Stochastic process","level":2,"score":0.41835808753967285},{"id":"https://openalex.org/C113775141","wikidata":"https://www.wikidata.org/wiki/Q428691","display_name":"Computer engineering","level":1,"score":0.36780741810798645},{"id":"https://openalex.org/C128942645","wikidata":"https://www.wikidata.org/wiki/Q1568346","display_name":"Test case","level":3,"score":0.3429814577102661},{"id":"https://openalex.org/C124101348","wikidata":"https://www.wikidata.org/wiki/Q172491","display_name":"Data mining","level":1,"score":0.2769790291786194},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.25096243619918823},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.24326899647712708},{"id":"https://openalex.org/C119857082","wikidata":"https://www.wikidata.org/wiki/Q2539","display_name":"Machine learning","level":1,"score":0.18977198004722595},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.13518047332763672},{"id":"https://openalex.org/C162324750","wikidata":"https://www.wikidata.org/wiki/Q8134","display_name":"Economics","level":0,"score":0.0},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.0},{"id":"https://openalex.org/C138885662","wikidata":"https://www.wikidata.org/wiki/Q5891","display_name":"Philosophy","level":0,"score":0.0},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.0},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.0},{"id":"https://openalex.org/C50522688","wikidata":"https://www.wikidata.org/wiki/Q189833","display_name":"Economic growth","level":1,"score":0.0},{"id":"https://openalex.org/C152877465","wikidata":"https://www.wikidata.org/wiki/Q208042","display_name":"Regression analysis","level":2,"score":0.0},{"id":"https://openalex.org/C111472728","wikidata":"https://www.wikidata.org/wiki/Q9471","display_name":"Epistemology","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/vts.2015.7116286","is_oa":false,"landing_page_url":"https://doi.org/10.1109/vts.2015.7116286","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2015 IEEE 33rd VLSI Test Symposium (VTS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":15,"referenced_works":["https://openalex.org/W127224647","https://openalex.org/W1559507652","https://openalex.org/W1986193117","https://openalex.org/W1992792191","https://openalex.org/W2005532768","https://openalex.org/W2102691476","https://openalex.org/W2111979321","https://openalex.org/W2127637733","https://openalex.org/W2150566739","https://openalex.org/W2150764159","https://openalex.org/W2155298431","https://openalex.org/W2292465457","https://openalex.org/W4243707100","https://openalex.org/W6676590341","https://openalex.org/W6683036265"],"related_works":["https://openalex.org/W2147116815","https://openalex.org/W2183567146","https://openalex.org/W1978533075","https://openalex.org/W2096843010","https://openalex.org/W2527390967","https://openalex.org/W2102816555","https://openalex.org/W3155744979","https://openalex.org/W2405583496","https://openalex.org/W2547155723","https://openalex.org/W4295918990"],"abstract_inverted_index":{"Functional":[0],"test":[1,135],"generation":[2,103],"and":[3,59,88,121],"design":[4],"validation":[5],"frequently":[6],"use":[7],"stochastic":[8],"methods":[9],"for":[10,14,115],"vector":[11],"generation.":[12],"However,":[13],"circuits":[15],"with":[16,90,131],"narrow":[17],"paths":[18],"or":[19],"random-resistant":[20],"corner":[21],"cases,":[22],"purely":[23],"random":[24],"techniques":[25,33],"can":[26,34],"fail":[27],"to":[28,54,81,100,128,138],"produce":[29],"adequate":[30],"results.":[31],"Deterministic":[32],"aid":[35],"this":[36,112],"process;":[37],"however,":[38],"they":[39],"add":[40],"significant":[41],"computational":[42],"complexity.":[43],"This":[44],"paper":[45],"presents":[46],"a":[47,73,123,132],"Register":[48],"Transfer":[49],"Level":[50],"(RTL)":[51],"abstraction":[52],"technique":[53],"derive":[55],"relationships":[56,96],"between":[57],"inputs":[58],"path":[60],"activations.":[61,94],"The":[62],"abstractions":[63],"are":[64,97],"built":[65],"off":[66],"of":[67,75,126,134],"various":[68],"program":[69],"slices.":[70],"Using":[71],"such":[72],"variety":[74],"abstracted":[76],"RTL":[77],"models,":[78],"we":[79],"attempt":[80],"find":[82],"patterns":[83],"in":[84,104],"the":[85,105],"reduced":[86],"state":[87],"input":[89],"their":[91],"resulting":[92],"branch":[93],"These":[95],"then":[98],"applied":[99],"guide":[101],"stimuli":[102],"concrete":[106],"model.":[107],"Experimental":[108],"results":[109],"show":[110],"that":[111],"method":[113],"allows":[114],"fast":[116],"convergence":[117],"on":[118],"hard-to-reach":[119],"states":[120],"achieves":[122],"performance":[124],"increase":[125],"up":[127],"9\u00d7":[129],"together":[130],"reduction":[133],"lengths":[136],"compared":[137],"previous":[139],"hybrid":[140],"search":[141],"techniques.":[142]},"counts_by_year":[{"year":2017,"cited_by_count":2},{"year":2016,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}