{"id":"https://openalex.org/W1518408009","doi":"https://doi.org/10.1109/vts.2015.7116277","title":"Memory repair for high defect densities","display_name":"Memory repair for high defect densities","publication_year":2015,"publication_date":"2015-04-01","ids":{"openalex":"https://openalex.org/W1518408009","doi":"https://doi.org/10.1109/vts.2015.7116277","mag":"1518408009"},"language":"en","primary_location":{"id":"doi:10.1109/vts.2015.7116277","is_oa":false,"landing_page_url":"https://doi.org/10.1109/vts.2015.7116277","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2015 IEEE 33rd VLSI Test Symposium (VTS)","raw_type":"proceedings-article"},"type":"preprint","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5062704166","display_name":"M. Nicolaidis","orcid":null},"institutions":[{"id":"https://openalex.org/I106785703","display_name":"Institut polytechnique de Grenoble","ror":"https://ror.org/05sbt2524","country_code":"FR","type":"education","lineage":["https://openalex.org/I106785703","https://openalex.org/I899635006"]},{"id":"https://openalex.org/I177483745","display_name":"Universit\u00e9 Joseph Fourier","ror":"https://ror.org/02aj0kh94","country_code":"FR","type":"education","lineage":["https://openalex.org/I177483745"]},{"id":"https://openalex.org/I1294671590","display_name":"Centre National de la Recherche Scientifique","ror":"https://ror.org/02feahw73","country_code":"FR","type":"funder","lineage":["https://openalex.org/I1294671590"]},{"id":"https://openalex.org/I4210149677","display_name":"Universitario Francisco de As\u00eds","ror":"https://ror.org/04qtcz169","country_code":"UY","type":"education","lineage":["https://openalex.org/I4210149677"]}],"countries":["FR","UY"],"is_corresponding":true,"raw_author_name":"Michael Nicolaidis","raw_affiliation_strings":["TIMA, UJF","TIMA (CNRS, Grenoble INP, UJF), France"],"affiliations":[{"raw_affiliation_string":"TIMA, UJF","institution_ids":["https://openalex.org/I4210149677"]},{"raw_affiliation_string":"TIMA (CNRS, Grenoble INP, UJF), France","institution_ids":["https://openalex.org/I177483745","https://openalex.org/I1294671590","https://openalex.org/I106785703"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5003384880","display_name":"Panagiota Papavramidou","orcid":null},"institutions":[{"id":"https://openalex.org/I4210149677","display_name":"Universitario Francisco de As\u00eds","ror":"https://ror.org/04qtcz169","country_code":"UY","type":"education","lineage":["https://openalex.org/I4210149677"]},{"id":"https://openalex.org/I106785703","display_name":"Institut polytechnique de Grenoble","ror":"https://ror.org/05sbt2524","country_code":"FR","type":"education","lineage":["https://openalex.org/I106785703","https://openalex.org/I899635006"]},{"id":"https://openalex.org/I1294671590","display_name":"Centre National de la Recherche Scientifique","ror":"https://ror.org/02feahw73","country_code":"FR","type":"funder","lineage":["https://openalex.org/I1294671590"]},{"id":"https://openalex.org/I177483745","display_name":"Universit\u00e9 Joseph Fourier","ror":"https://ror.org/02aj0kh94","country_code":"FR","type":"education","lineage":["https://openalex.org/I177483745"]}],"countries":["FR","UY"],"is_corresponding":false,"raw_author_name":"Panagiota Papavramidou","raw_affiliation_strings":["TIMA, UJF","TIMA (CNRS, Grenoble INP, UJF), France"],"affiliations":[{"raw_affiliation_string":"TIMA, UJF","institution_ids":["https://openalex.org/I4210149677"]},{"raw_affiliation_string":"TIMA (CNRS, Grenoble INP, UJF), France","institution_ids":["https://openalex.org/I177483745","https://openalex.org/I1294671590","https://openalex.org/I106785703"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5062704166"],"corresponding_institution_ids":["https://openalex.org/I106785703","https://openalex.org/I177483745","https://openalex.org/I1294671590","https://openalex.org/I4210149677"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.02026759,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"4"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12808","display_name":"Ferroelectric and Negative Capacitance Devices","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.6505333781242371},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.6289446353912354},{"id":"https://openalex.org/keywords/scaling","display_name":"Scaling","score":0.614646315574646},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5390095114707947},{"id":"https://openalex.org/keywords/random-access-memory","display_name":"Random access memory","score":0.4364904463291168},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.3980519771575928},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.36448240280151367},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.34572458267211914},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.3420330882072449},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.23551887273788452},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.15456393361091614},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.11274862289428711}],"concepts":[{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.6505333781242371},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.6289446353912354},{"id":"https://openalex.org/C99844830","wikidata":"https://www.wikidata.org/wiki/Q102441924","display_name":"Scaling","level":2,"score":0.614646315574646},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5390095114707947},{"id":"https://openalex.org/C2994168587","wikidata":"https://www.wikidata.org/wiki/Q5295","display_name":"Random access memory","level":2,"score":0.4364904463291168},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.3980519771575928},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.36448240280151367},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.34572458267211914},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.3420330882072449},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.23551887273788452},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.15456393361091614},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.11274862289428711},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.0},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/vts.2015.7116277","is_oa":false,"landing_page_url":"https://doi.org/10.1109/vts.2015.7116277","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2015 IEEE 33rd VLSI Test Symposium (VTS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.47999998927116394,"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":6,"referenced_works":["https://openalex.org/W646173351","https://openalex.org/W1667843264","https://openalex.org/W1967547903","https://openalex.org/W1973194889","https://openalex.org/W2018755671","https://openalex.org/W2171372273"],"related_works":["https://openalex.org/W2033512842","https://openalex.org/W4322734194","https://openalex.org/W1607054433","https://openalex.org/W3005535424","https://openalex.org/W4233600955","https://openalex.org/W2913665393","https://openalex.org/W2994319598","https://openalex.org/W2369695847","https://openalex.org/W2110842462","https://openalex.org/W4233757488"],"abstract_inverted_index":{"We":[0],"illustrate":[1],"that":[2],"memory":[3,39],"repair":[4,40],"for":[5,41],"high":[6,42],"defect":[7,43],"densities":[8],"allows":[9],"improving":[10,18],"yield,":[11],"extending":[12],"circuit":[13],"life,":[14],"reducing":[15],"power,":[16],"and":[17,20],"reliability,":[19],"can":[21],"be":[22],"used":[23],"to":[24],"push":[25],"aggressively":[26],"the":[27],"limits":[28],"of":[29],"technology":[30],"scaling.":[31],"Then":[32],"we":[33],"present":[34],"several":[35],"developments":[36],"enabling":[37],"low-cost":[38],"densities,":[44],"which":[45],"alllow":[46],"realising":[47],"this":[48],"promise.":[49]},"counts_by_year":[],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}