{"id":"https://openalex.org/W1483388539","doi":"https://doi.org/10.1109/vts.2015.7116273","title":"At-Product-Test Dedicated Adaptive supply-resonance suppression","display_name":"At-Product-Test Dedicated Adaptive supply-resonance suppression","publication_year":2015,"publication_date":"2015-04-01","ids":{"openalex":"https://openalex.org/W1483388539","doi":"https://doi.org/10.1109/vts.2015.7116273","mag":"1483388539"},"language":"en","primary_location":{"id":"doi:10.1109/vts.2015.7116273","is_oa":false,"landing_page_url":"https://doi.org/10.1109/vts.2015.7116273","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2015 IEEE 33rd VLSI Test Symposium (VTS)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5025443037","display_name":"Kohki Taniguchi","orcid":null},"institutions":[{"id":"https://openalex.org/I65837984","display_name":"Kobe University","ror":"https://ror.org/03tgsfw79","country_code":"JP","type":"education","lineage":["https://openalex.org/I65837984"]}],"countries":["JP"],"is_corresponding":true,"raw_author_name":"Kohki Taniguchi","raw_affiliation_strings":["Graduate School of System Informatics, Kobe University, Japan","Graduate School of System Informatics, Kobe University, JAPAN"],"affiliations":[{"raw_affiliation_string":"Graduate School of System Informatics, Kobe University, Japan","institution_ids":["https://openalex.org/I65837984"]},{"raw_affiliation_string":"Graduate School of System Informatics, Kobe University, JAPAN","institution_ids":["https://openalex.org/I65837984"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5032938283","display_name":"Noriyuki Miura","orcid":"https://orcid.org/0000-0002-0072-6114"},"institutions":[{"id":"https://openalex.org/I65837984","display_name":"Kobe University","ror":"https://ror.org/03tgsfw79","country_code":"JP","type":"education","lineage":["https://openalex.org/I65837984"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Noriyuki Miura","raw_affiliation_strings":["Graduate School of System Informatics, Kobe University, Japan","Graduate School of System Informatics, Kobe University, JAPAN"],"affiliations":[{"raw_affiliation_string":"Graduate School of System Informatics, Kobe University, Japan","institution_ids":["https://openalex.org/I65837984"]},{"raw_affiliation_string":"Graduate School of System Informatics, Kobe University, JAPAN","institution_ids":["https://openalex.org/I65837984"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5022941859","display_name":"Taisuke Hayashi","orcid":null},"institutions":[{"id":"https://openalex.org/I65837984","display_name":"Kobe University","ror":"https://ror.org/03tgsfw79","country_code":"JP","type":"education","lineage":["https://openalex.org/I65837984"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Taisuke Hayashi","raw_affiliation_strings":["Graduate School of System Informatics, Kobe University, Japan","Graduate School of System Informatics, Kobe University, JAPAN"],"affiliations":[{"raw_affiliation_string":"Graduate School of System Informatics, Kobe University, Japan","institution_ids":["https://openalex.org/I65837984"]},{"raw_affiliation_string":"Graduate School of System Informatics, Kobe University, JAPAN","institution_ids":["https://openalex.org/I65837984"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5070370721","display_name":"Makoto Nagata","orcid":"https://orcid.org/0000-0002-0625-9107"},"institutions":[{"id":"https://openalex.org/I65837984","display_name":"Kobe University","ror":"https://ror.org/03tgsfw79","country_code":"JP","type":"education","lineage":["https://openalex.org/I65837984"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Makoto Nagata","raw_affiliation_strings":["Graduate School of System Informatics, Kobe University, Japan","Graduate School of System Informatics, Kobe University, JAPAN"],"affiliations":[{"raw_affiliation_string":"Graduate School of System Informatics, Kobe University, Japan","institution_ids":["https://openalex.org/I65837984"]},{"raw_affiliation_string":"Graduate School of System Informatics, Kobe University, JAPAN","institution_ids":["https://openalex.org/I65837984"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5025443037"],"corresponding_institution_ids":["https://openalex.org/I65837984"],"apc_list":null,"apc_paid":null,"fwci":0.1973,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.55290188,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":94},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"6"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11444","display_name":"Electromagnetic Compatibility and Noise Suppression","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11444","display_name":"Electromagnetic Compatibility and Noise Suppression","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11417","display_name":"Advancements in PLL and VCO Technologies","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10187","display_name":"Radio Frequency Integrated Circuit Design","score":0.9977999925613403,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.6312354207038879},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.5904946327209473},{"id":"https://openalex.org/keywords/band-stop-filter","display_name":"Band-stop filter","score":0.5544666647911072},{"id":"https://openalex.org/keywords/noise","display_name":"Noise (video)","score":0.5336445569992065},{"id":"https://openalex.org/keywords/chip","display_name":"Chip","score":0.5288872718811035},{"id":"https://openalex.org/keywords/product","display_name":"Product (mathematics)","score":0.511873185634613},{"id":"https://openalex.org/keywords/spectrum-analyzer","display_name":"Spectrum analyzer","score":0.47979289293289185},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.42075973749160767},{"id":"https://openalex.org/keywords/filter","display_name":"Filter (signal processing)","score":0.4174695312976837},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.33486104011535645},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.3032572865486145},{"id":"https://openalex.org/keywords/low-pass-filter","display_name":"Low-pass filter","score":0.21742936968803406}],"concepts":[{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.6312354207038879},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.5904946327209473},{"id":"https://openalex.org/C112806600","wikidata":"https://www.wikidata.org/wiki/Q386022","display_name":"Band-stop filter","level":4,"score":0.5544666647911072},{"id":"https://openalex.org/C99498987","wikidata":"https://www.wikidata.org/wiki/Q2210247","display_name":"Noise (video)","level":3,"score":0.5336445569992065},{"id":"https://openalex.org/C165005293","wikidata":"https://www.wikidata.org/wiki/Q1074500","display_name":"Chip","level":2,"score":0.5288872718811035},{"id":"https://openalex.org/C90673727","wikidata":"https://www.wikidata.org/wiki/Q901718","display_name":"Product (mathematics)","level":2,"score":0.511873185634613},{"id":"https://openalex.org/C158007255","wikidata":"https://www.wikidata.org/wiki/Q1055222","display_name":"Spectrum analyzer","level":2,"score":0.47979289293289185},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.42075973749160767},{"id":"https://openalex.org/C106131492","wikidata":"https://www.wikidata.org/wiki/Q3072260","display_name":"Filter (signal processing)","level":2,"score":0.4174695312976837},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.33486104011535645},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.3032572865486145},{"id":"https://openalex.org/C44682112","wikidata":"https://www.wikidata.org/wiki/Q918242","display_name":"Low-pass filter","level":3,"score":0.21742936968803406},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.0},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.0},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.0},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/vts.2015.7116273","is_oa":false,"landing_page_url":"https://doi.org/10.1109/vts.2015.7116273","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2015 IEEE 33rd VLSI Test Symposium (VTS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Affordable and clean energy","score":0.44999998807907104,"id":"https://metadata.un.org/sdg/7"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":12,"referenced_works":["https://openalex.org/W1593525474","https://openalex.org/W1969650916","https://openalex.org/W1972522449","https://openalex.org/W1990358709","https://openalex.org/W2029497909","https://openalex.org/W2124090262","https://openalex.org/W2133397979","https://openalex.org/W2141448832","https://openalex.org/W2741550146","https://openalex.org/W4251609330","https://openalex.org/W6635291617","https://openalex.org/W6642736963"],"related_works":["https://openalex.org/W2391061712","https://openalex.org/W2094171095","https://openalex.org/W4231462422","https://openalex.org/W3014521742","https://openalex.org/W2018394392","https://openalex.org/W2360439310","https://openalex.org/W1979303977","https://openalex.org/W2546380746","https://openalex.org/W2372452257","https://openalex.org/W2506093188"],"abstract_inverted_index":{"This":[0],"paper":[1],"presents":[2],"an":[3,22],"adaptive":[4],"supply-resonance":[5],"(SR)":[6],"suppression":[7],"scheme":[8],"at":[9],"a":[10,43],"product":[11,17],"testing":[12],"stage.":[13],"Dedicated":[14],"to":[15],"each":[16],"in":[18,46],"different":[19],"assembly":[20],"forms,":[21],"on-chip":[23],"power-delivery-network":[24],"analyzer":[25],"identifies":[26],"SR":[27,34],"frequency":[28],"and":[29],"autotunes":[30],"notch":[31],"filter":[32],"for":[33],"noise":[35],"suppression.":[36],"The":[37],"feasibility":[38],"has":[39],"been":[40],"silicon-proven":[41],"by":[42],"prototype":[44],"demonstration":[45],"0.18\u03bcm":[47],"CMOS":[48],"successfully.":[49]},"counts_by_year":[{"year":2017,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}
