{"id":"https://openalex.org/W1600529349","doi":"https://doi.org/10.1109/vts.2015.7116264","title":"Panel: When will the cost of dependability end innovation in computer design?","display_name":"Panel: When will the cost of dependability end innovation in computer design?","publication_year":2015,"publication_date":"2015-04-01","ids":{"openalex":"https://openalex.org/W1600529349","doi":"https://doi.org/10.1109/vts.2015.7116264","mag":"1600529349"},"language":"en","primary_location":{"id":"doi:10.1109/vts.2015.7116264","is_oa":false,"landing_page_url":"https://doi.org/10.1109/vts.2015.7116264","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2015 IEEE 33rd VLSI Test Symposium (VTS)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5030335506","display_name":"Valeria Bertacco","orcid":"https://orcid.org/0000-0002-0319-3368"},"institutions":[{"id":"https://openalex.org/I27837315","display_name":"University of Michigan\u2013Ann Arbor","ror":"https://ror.org/00jmfr291","country_code":"US","type":"education","lineage":["https://openalex.org/I27837315"]},{"id":"https://openalex.org/I1330855593","display_name":"Vel Tech Rangarajan Dr. Sagunthala R&D Institute of Science and Technology","ror":"https://ror.org/05bc5bx80","country_code":"IN","type":"education","lineage":["https://openalex.org/I1330855593"]}],"countries":["IN","US"],"is_corresponding":true,"raw_author_name":"Valeria Bertacco","raw_affiliation_strings":["Department of CSE, VTU VEL TECH UNIVERSITY Avadi, Chennai","University of Michigan , USA"],"affiliations":[{"raw_affiliation_string":"Department of CSE, VTU VEL TECH UNIVERSITY Avadi, Chennai","institution_ids":["https://openalex.org/I1330855593"]},{"raw_affiliation_string":"University of Michigan , USA","institution_ids":["https://openalex.org/I27837315"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":1,"corresponding_author_ids":["https://openalex.org/A5030335506"],"corresponding_institution_ids":["https://openalex.org/I1330855593","https://openalex.org/I27837315"],"apc_list":null,"apc_paid":null,"fwci":0.1973,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.56367664,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":94},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"1"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.7282999753952026,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.7282999753952026,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.6984999775886536,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/dependability","display_name":"Dependability","score":0.9696621894836426},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.8274332284927368},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.7321854829788208},{"id":"https://openalex.org/keywords/silicon","display_name":"Silicon","score":0.6087337732315063},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5486895442008972},{"id":"https://openalex.org/keywords/point","display_name":"Point (geometry)","score":0.46474048495292664},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2087303102016449},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.14834117889404297},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.10618528723716736}],"concepts":[{"id":"https://openalex.org/C77019957","wikidata":"https://www.wikidata.org/wiki/Q2689057","display_name":"Dependability","level":2,"score":0.9696621894836426},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.8274332284927368},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.7321854829788208},{"id":"https://openalex.org/C544956773","wikidata":"https://www.wikidata.org/wiki/Q670","display_name":"Silicon","level":2,"score":0.6087337732315063},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5486895442008972},{"id":"https://openalex.org/C28719098","wikidata":"https://www.wikidata.org/wiki/Q44946","display_name":"Point (geometry)","level":2,"score":0.46474048495292664},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2087303102016449},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.14834117889404297},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.10618528723716736},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C191897082","wikidata":"https://www.wikidata.org/wiki/Q11467","display_name":"Metallurgy","level":1,"score":0.0},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.0},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/vts.2015.7116264","is_oa":false,"landing_page_url":"https://doi.org/10.1109/vts.2015.7116264","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2015 IEEE 33rd VLSI Test Symposium (VTS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Industry, innovation and infrastructure","id":"https://metadata.un.org/sdg/9","score":0.6600000262260437}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":0,"referenced_works":[],"related_works":["https://openalex.org/W2097009805","https://openalex.org/W2080951167","https://openalex.org/W2374901194","https://openalex.org/W2033512842","https://openalex.org/W2994319598","https://openalex.org/W4322734194","https://openalex.org/W3005535424","https://openalex.org/W4233600955","https://openalex.org/W2913665393","https://openalex.org/W2369695847"],"abstract_inverted_index":{"As":[0],"silicon":[1,21,51,96],"feature":[2],"sizes":[3],"approach":[4],"atomic":[5],"scales,":[6],"device":[7],"reliability":[8,48,77],"is":[9,16,53],"waning":[10],"and":[11],"the":[12,18,33,42,45,68],"cost":[13,34,46,69],"of":[14,35,47,70],"dependability":[15],"on":[17],"rise.":[19],"Post":[20],"devices,":[22],"such":[23],"as":[24],"CNTs":[25],"or":[26],"TFETs,":[27],"promise":[28],"better":[29],"performance":[30],"but":[31],"at":[32],"even":[36],"worse":[37],"reliability.":[38],"Will":[39],"we":[40,62,73,83,86],"reach":[41],"point":[43],"where":[44],"for":[49],"future":[50],"substrates":[52],"too":[54],"expensive":[55],"to":[56,66],"justify":[57],"their":[58],"existence?":[59],"Or":[60],"will":[61],"discover":[63,75],"new":[64],"ways":[65],"contain":[67],"dependability?":[71],"If":[72,90],"do":[74,82],"low-cost":[76],"mechanisms,":[78],"how":[79,92],"much":[80,93],"time":[81],"have":[84,97],"before":[85],"must":[87],"deploy":[88],"them?":[89],"not,":[91],"life":[94],"does":[95],"left?":[98]},"counts_by_year":[{"year":2018,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}