{"id":"https://openalex.org/W1529971285","doi":"https://doi.org/10.1109/vts.2015.7116249","title":"Ultrafast stimulus error removal algorithm for ADC linearity test","display_name":"Ultrafast stimulus error removal algorithm for ADC linearity test","publication_year":2015,"publication_date":"2015-04-01","ids":{"openalex":"https://openalex.org/W1529971285","doi":"https://doi.org/10.1109/vts.2015.7116249","mag":"1529971285"},"language":"en","primary_location":{"id":"doi:10.1109/vts.2015.7116249","is_oa":false,"landing_page_url":"https://doi.org/10.1109/vts.2015.7116249","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2015 IEEE 33rd VLSI Test Symposium (VTS)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5100357750","display_name":"Tao Chen","orcid":"https://orcid.org/0000-0002-4980-6836"},"institutions":[{"id":"https://openalex.org/I173911158","display_name":"Iowa State University","ror":"https://ror.org/04rswrd78","country_code":"US","type":"education","lineage":["https://openalex.org/I173911158"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Tao Chen","raw_affiliation_strings":["Department of Electrical and Computer Engineering, Iowa State University, Ames, IA, USA","[Department of Electrical & Computer Engineering, Iowa State University, Ames, USA]"],"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, Iowa State University, Ames, IA, USA","institution_ids":["https://openalex.org/I173911158"]},{"raw_affiliation_string":"[Department of Electrical & Computer Engineering, Iowa State University, Ames, USA]","institution_ids":["https://openalex.org/I173911158"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5101873076","display_name":"Degang Chen","orcid":"https://orcid.org/0000-0002-5938-6329"},"institutions":[{"id":"https://openalex.org/I173911158","display_name":"Iowa State University","ror":"https://ror.org/04rswrd78","country_code":"US","type":"education","lineage":["https://openalex.org/I173911158"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Degang Chen","raw_affiliation_strings":["Department of Electrical and Computer Engineering, Iowa State University, Ames, IA, USA","[Department of Electrical & Computer Engineering, Iowa State University, Ames, USA]"],"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, Iowa State University, Ames, IA, USA","institution_ids":["https://openalex.org/I173911158"]},{"raw_affiliation_string":"[Department of Electrical & Computer Engineering, Iowa State University, Ames, USA]","institution_ids":["https://openalex.org/I173911158"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5100357750"],"corresponding_institution_ids":["https://openalex.org/I173911158"],"apc_list":null,"apc_paid":null,"fwci":1.9729,"has_fulltext":false,"cited_by_count":26,"citation_normalized_percentile":{"value":0.87189804,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":98},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"5"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12300","display_name":"Advanced Electrical Measurement Techniques","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12300","display_name":"Advanced Electrical Measurement Techniques","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9991000294685364,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9973000288009644,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/linearity","display_name":"Linearity","score":0.8042987585067749},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.6481899619102478},{"id":"https://openalex.org/keywords/histogram","display_name":"Histogram","score":0.618293046951294},{"id":"https://openalex.org/keywords/integral-nonlinearity","display_name":"Integral nonlinearity","score":0.6111770868301392},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6092424392700195},{"id":"https://openalex.org/keywords/nonlinear-system","display_name":"Nonlinear system","score":0.500680685043335},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.3354845643043518},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.31821781396865845},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.1428672969341278},{"id":"https://openalex.org/keywords/converters","display_name":"Converters","score":0.12245947122573853},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.10890495777130127}],"concepts":[{"id":"https://openalex.org/C77170095","wikidata":"https://www.wikidata.org/wiki/Q1753188","display_name":"Linearity","level":2,"score":0.8042987585067749},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.6481899619102478},{"id":"https://openalex.org/C53533937","wikidata":"https://www.wikidata.org/wiki/Q185020","display_name":"Histogram","level":3,"score":0.618293046951294},{"id":"https://openalex.org/C130829357","wikidata":"https://www.wikidata.org/wiki/Q1665386","display_name":"Integral nonlinearity","level":4,"score":0.6111770868301392},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6092424392700195},{"id":"https://openalex.org/C158622935","wikidata":"https://www.wikidata.org/wiki/Q660848","display_name":"Nonlinear system","level":2,"score":0.500680685043335},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.3354845643043518},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.31821781396865845},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.1428672969341278},{"id":"https://openalex.org/C2778422915","wikidata":"https://www.wikidata.org/wiki/Q10302051","display_name":"Converters","level":3,"score":0.12245947122573853},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.10890495777130127},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.0},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/vts.2015.7116249","is_oa":false,"landing_page_url":"https://doi.org/10.1109/vts.2015.7116249","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2015 IEEE 33rd VLSI Test Symposium (VTS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":18,"referenced_works":["https://openalex.org/W1638355465","https://openalex.org/W1907528811","https://openalex.org/W2006786321","https://openalex.org/W2021095575","https://openalex.org/W2084128131","https://openalex.org/W2098852797","https://openalex.org/W2111032961","https://openalex.org/W2113796007","https://openalex.org/W2113872865","https://openalex.org/W2114504404","https://openalex.org/W2128726980","https://openalex.org/W2129182275","https://openalex.org/W2131477866","https://openalex.org/W2163817444","https://openalex.org/W2187548090","https://openalex.org/W2985106606","https://openalex.org/W6639903313","https://openalex.org/W6677117236"],"related_works":["https://openalex.org/W2159533852","https://openalex.org/W2117768990","https://openalex.org/W2168668096","https://openalex.org/W2319809644","https://openalex.org/W171113498","https://openalex.org/W2120340610","https://openalex.org/W2124661899","https://openalex.org/W2154916972","https://openalex.org/W2595218477","https://openalex.org/W2015667454"],"abstract_inverted_index":{"Linearity":[0],"test":[1,39,44,81,119,139,143,204],"of":[2,58,88,131,163,171],"an":[3],"analog-to-digital":[4],"converter":[5],"(ADC)":[6],"can":[7],"be":[8,34,76,84],"very":[9],"challenging":[10],"because":[11],"it":[12],"requires":[13],"a":[14,112,191],"signal":[15],"generator":[16],"substantially":[17],"more":[18],"linear":[19],"than":[20],"the":[21,29,37,42,49,70,80,92,126,149,202],"ADC":[22,66,108],"under":[23],"test.":[24],"For":[25],"high":[26,64],"performance":[27],"ADCs,":[28,164],"overall":[30],"manufacturing":[31],"cost":[32],"could":[33],"dominated":[35],"by":[36,86,157],"long":[38],"time":[40,82,140],"and":[41,54,79,110,145,168,180],"high-precision":[43],"instruments.":[45],"This":[46],"paper":[47],"introduces":[48],"ultrafast":[50,127],"stimulus":[51,71,113],"error":[52,114,205],"removal":[53,115],"segmented":[55,128],"model":[56,129],"identification":[57,130],"linearity":[59,67,73,132],"errors":[60,133],"(USER-SMILE)":[61],"method":[62],"for":[63,190],"resolution":[65,166],"test,":[68],"allowing":[69],"signal's":[72],"requirement":[74],"to":[75,83,91,117,136,148],"significantly":[77],"relaxed":[78],"reduced":[85],"orders":[87],"magnitude":[89],"compared":[90],"state-of-art":[93],"histogram":[94,150],"method.":[95,151],"The":[96,121,152],"USER-SMILE":[97,122,153],"algorithm":[98,123,154],"uses":[99,111,125],"two":[100,196],"nonlinear":[101,175,177,199],"but":[102],"functionally":[103],"related":[104],"input":[105,172,183],"signals":[106,173],"as":[107],"excitations":[109],"technique":[116],"recover":[118],"accuracy.":[120],"also":[124],"(uSMILE)":[134],"approach":[135],"dramatically":[137],"reduce":[138],"while":[141],"achieving":[142],"accuracy":[144],"coverage":[146],"superior":[147],"is":[155,206],"validated":[156],"extensive":[158],"simulation":[159,186],"with":[160,195],"different":[161,165,169],"types":[162,170],"levels,":[167],"including":[174],"ramps,":[176],"sine":[178],"waves":[179],"even":[181],"random":[182],"signals.":[184],"Statistical":[185],"results":[187],"show":[188],"that":[189],"16-bit":[192],"SAR":[193],"ADC,":[194],"1":[197],"hit/code":[198],"ramp":[200],"signals,":[201],"INL":[203],"within":[207],"+/-":[208],"0.4LSB.":[209]},"counts_by_year":[{"year":2025,"cited_by_count":2},{"year":2024,"cited_by_count":3},{"year":2023,"cited_by_count":2},{"year":2021,"cited_by_count":1},{"year":2020,"cited_by_count":3},{"year":2019,"cited_by_count":5},{"year":2018,"cited_by_count":5},{"year":2017,"cited_by_count":3},{"year":2016,"cited_by_count":1},{"year":2015,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}