{"id":"https://openalex.org/W2011272593","doi":"https://doi.org/10.1109/vts.2014.6818751","title":"Alternative “safe” test of hysteretic power converters","display_name":"Alternative “safe” test of hysteretic power converters","publication_year":2014,"publication_date":"2014-04-01","ids":{"openalex":"https://openalex.org/W2011272593","doi":"https://doi.org/10.1109/vts.2014.6818751","mag":"2011272593"},"language":"en","primary_location":{"id":"doi:10.1109/vts.2014.6818751","is_oa":false,"landing_page_url":"https://doi.org/10.1109/vts.2014.6818751","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2014 IEEE 32nd VLSI Test Symposium (VTS)","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5110205796","display_name":"X. Wang","orcid":"https://orcid.org/0009-0002-3329-356X"},"institutions":[{"id":"https://openalex.org/I130701444","display_name":"Georgia Institute of Technology","ror":"https://ror.org/01zkghx44","country_code":"US","type":"education","lineage":["https://openalex.org/I130701444"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"X. Wang","raw_affiliation_strings":["Georgia Institute of Technology","[Georgia Institute of Technology.]"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Georgia Institute of Technology","institution_ids":["https://openalex.org/I130701444"]},{"raw_affiliation_string":"[Georgia Institute of Technology.]","institution_ids":["https://openalex.org/I130701444"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5036928885","display_name":"K. Blanchard","orcid":null},"institutions":[{"id":"https://openalex.org/I74760111","display_name":"Texas Instruments (United States)","ror":"https://ror.org/03vsmv677","country_code":"US","type":"company","lineage":["https://openalex.org/I74760111"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"K. Blanchard","raw_affiliation_strings":["Texas Instruments"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Texas Instruments","institution_ids":["https://openalex.org/I74760111"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5041553697","display_name":"S. Estella","orcid":null},"institutions":[{"id":"https://openalex.org/I74760111","display_name":"Texas Instruments (United States)","ror":"https://ror.org/03vsmv677","country_code":"US","type":"company","lineage":["https://openalex.org/I74760111"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"S. Estella","raw_affiliation_strings":["Texas Instruments"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Texas Instruments","institution_ids":["https://openalex.org/I74760111"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5069579193","display_name":"Abhijit Chatterjee","orcid":"https://orcid.org/0000-0003-1553-4470"},"institutions":[{"id":"https://openalex.org/I130701444","display_name":"Georgia Institute of Technology","ror":"https://ror.org/01zkghx44","country_code":"US","type":"education","lineage":["https://openalex.org/I130701444"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"A. Chatterjee","raw_affiliation_strings":["Georgia Institute of Technology","[Georgia Institute of Technology.]"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Georgia Institute of Technology","institution_ids":["https://openalex.org/I130701444"]},{"raw_affiliation_string":"[Georgia Institute of Technology.]","institution_ids":["https://openalex.org/I130701444"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":4.1431,"has_fulltext":false,"cited_by_count":8,"citation_normalized_percentile":{"value":0.93695541,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":89,"max":97},"biblio":{"volume":"26","issue":null,"first_page":"1","last_page":"6"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12898","display_name":"Induction Heating and Inverter Technology","score":0.9926999807357788,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12898","display_name":"Induction Heating and Inverter Technology","score":0.9926999807357788,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11222","display_name":"Magnetic Properties and Applications","score":0.991599977016449,"subfield":{"id":"https://openalex.org/subfields/2504","display_name":"Electronic, Optical and Magnetic Materials"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10220","display_name":"Machine Fault Diagnosis Techniques","score":0.9898999929428101,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/converters","display_name":"Converters","score":0.7493649125099182},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.560345470905304},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.4523412585258484},{"id":"https://openalex.org/keywords/test","display_name":"Test (biology)","score":0.44177767634391785},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.32292789220809937},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2799617052078247},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.20528873801231384},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.17222890257835388},{"id":"https://openalex.org/keywords/biology","display_name":"Biology","score":0.10387864708900452}],"concepts":[{"id":"https://openalex.org/C2778422915","wikidata":"https://www.wikidata.org/wiki/Q10302051","display_name":"Converters","level":3,"score":0.7493649125099182},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.560345470905304},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.4523412585258484},{"id":"https://openalex.org/C2777267654","wikidata":"https://www.wikidata.org/wiki/Q3519023","display_name":"Test (biology)","level":2,"score":0.44177767634391785},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.32292789220809937},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2799617052078247},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.20528873801231384},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.17222890257835388},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.10387864708900452},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C151730666","wikidata":"https://www.wikidata.org/wiki/Q7205","display_name":"Paleontology","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/vts.2014.6818751","is_oa":false,"landing_page_url":"https://doi.org/10.1109/vts.2014.6818751","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2014 IEEE 32nd VLSI Test Symposium (VTS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7","score":0.8700000047683716}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":16,"referenced_works":["https://openalex.org/W1639032689","https://openalex.org/W1912876005","https://openalex.org/W2047468602","https://openalex.org/W2050413450","https://openalex.org/W2062985000","https://openalex.org/W2100673614","https://openalex.org/W2102201073","https://openalex.org/W2104535426","https://openalex.org/W2108939487","https://openalex.org/W2123647786","https://openalex.org/W2129690060","https://openalex.org/W2136660238","https://openalex.org/W2153430703","https://openalex.org/W3023540311","https://openalex.org/W4241361977","https://openalex.org/W6675112573"],"related_works":["https://openalex.org/W4391375266","https://openalex.org/W2748952813","https://openalex.org/W631083485","https://openalex.org/W4313452936","https://openalex.org/W2097026685","https://openalex.org/W2480068220","https://openalex.org/W2070883797","https://openalex.org/W4386859288","https://openalex.org/W2102542442","https://openalex.org/W1986220761"],"abstract_inverted_index":{"This":[0,125],"paper":[1],"presents":[2],"a":[3,79,94,100,110,134],"novel":[4],"alternative":[5,75],"\u201csafe\u201d":[6,80],"test":[7,65,76,82,126],"method":[8],"for":[9,136,141],"line":[10,117],"and":[11,67,99,116,139,148],"load":[12,115],"regulation":[13,85,118],"specifications":[14,22,86,119],"of":[15,54,61,83,87,120,133,157],"hysteretic":[16,88],"controlled":[17,89],"switching":[18,41,90],"power":[19,91],"converters.":[20],"These":[21],"have":[23],"not":[24],"been":[25],"tested":[26],"in":[27],"production":[28],"before":[29],"because":[30],"the":[31,62,105,114,131,155,158],"conventional":[32],"measurement":[33],"techniques":[34],"lead":[35],"to":[36,58,153],"huge":[37],"voltage":[38,44],"spikes":[39,45],"during":[40],"transients.":[42],"Those":[43],"are":[46,122,151],"caused":[47],"by":[48,130],"energy":[49],"accumulation":[50],"from":[51],"parasitic":[52],"inductances":[53],"ATE":[55],"interface":[56],"board":[57],"input":[59],"capacitance":[60],"device":[63],"under":[64],"(DUT)":[66],"can":[68],"damage":[69],"DUT's":[70],"internal":[71],"circuitries.":[72],"The":[73],"proposed":[74,159],"approach":[77,127],"offers":[78],"manufacturing":[81],"load/line":[84],"converters":[92],"through":[93],"carefully":[95,111],"altered":[96,106],"feedback":[97,107],"circuit":[98,108],"current-limited":[101],"load.":[102],"Through":[103],"injecting":[104],"with":[109],"crafted":[112],"stimulus,":[113],"DUT":[121,142],"accurately":[123],"predicted.":[124],"is":[128],"facilitated":[129],"use":[132],"DAC":[135],"stimulus":[137],"generation":[138],"ADC":[140],"response":[143],"capturing.":[144],"Both":[145],"simulated":[146],"data":[147],"hardware":[149],"measurements":[150],"used":[152],"demonstrate":[154],"viability":[156],"\u201dsafe\u201dtesting":[160],"method.":[161]},"counts_by_year":[{"year":2021,"cited_by_count":1},{"year":2016,"cited_by_count":1},{"year":2015,"cited_by_count":3},{"year":2014,"cited_by_count":2},{"year":2013,"cited_by_count":1}],"updated_date":"2026-07-29T14:22:42.915294","created_date":"2025-10-10T00:00:00"}