{"id":"https://openalex.org/W1969564587","doi":"https://doi.org/10.1109/vts.2014.6818739","title":"Fast evaluation of test vector sets using a simulation-based statistical metric","display_name":"Fast evaluation of test vector sets using a simulation-based statistical metric","publication_year":2014,"publication_date":"2014-04-01","ids":{"openalex":"https://openalex.org/W1969564587","doi":"https://doi.org/10.1109/vts.2014.6818739","mag":"1969564587"},"language":"en","primary_location":{"id":"doi:10.1109/vts.2014.6818739","is_oa":false,"landing_page_url":"https://doi.org/10.1109/vts.2014.6818739","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2014 IEEE 32nd VLSI Test Symposium (VTS)","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5053069866","display_name":"Shahrzad Mirkhani","orcid":null},"institutions":[{"id":"https://openalex.org/I86519309","display_name":"The University of Texas at Austin","ror":"https://ror.org/00hj54h04","country_code":"US","type":"education","lineage":["https://openalex.org/I86519309"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Shahrzad Mirkhani","raw_affiliation_strings":["The University of Texas at Austin","Computer Engineering Research Center 201 E 24th Street, ACES Bldg., Austin, TX 78712 The University of Texas at Austin"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"The University of Texas at Austin","institution_ids":["https://openalex.org/I86519309"]},{"raw_affiliation_string":"Computer Engineering Research Center 201 E 24th Street, ACES Bldg., Austin, TX 78712 The University of Texas at Austin","institution_ids":["https://openalex.org/I86519309"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5068070739","display_name":"Jacob A. Abraham","orcid":"https://orcid.org/0000-0002-5336-5631"},"institutions":[{"id":"https://openalex.org/I86519309","display_name":"The University of Texas at Austin","ror":"https://ror.org/00hj54h04","country_code":"US","type":"education","lineage":["https://openalex.org/I86519309"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Jacob A. Abraham","raw_affiliation_strings":["The University of Texas at Austin","Computer Engineering Research Center 201 E 24th Street, ACES Bldg., Austin, TX 78712 The University of Texas at Austin"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"The University of Texas at Austin","institution_ids":["https://openalex.org/I86519309"]},{"raw_affiliation_string":"Computer Engineering Research Center 201 E 24th Street, ACES Bldg., Austin, TX 78712 The University of Texas at Austin","institution_ids":["https://openalex.org/I86519309"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I86519309"],"apc_list":null,"apc_paid":null,"fwci":null,"has_fulltext":false,"cited_by_count":9,"citation_normalized_percentile":null,"cited_by_percentile_year":null,"biblio":{"volume":"27","issue":null,"first_page":"1","last_page":"6"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9987999796867371,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9969000220298767,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/fault-coverage","display_name":"Fault coverage","score":0.8036710023880005},{"id":"https://openalex.org/keywords/automatic-test-pattern-generation","display_name":"Automatic test pattern generation","score":0.706613302230835},{"id":"https://openalex.org/keywords/metric","display_name":"Metric (unit)","score":0.6522213220596313},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6463741064071655},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.6021511554718018},{"id":"https://openalex.org/keywords/code-coverage","display_name":"Code coverage","score":0.5690057277679443},{"id":"https://openalex.org/keywords/test-vector","display_name":"Test vector","score":0.5665075778961182},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.5244293808937073},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.504106879234314},{"id":"https://openalex.org/keywords/speedup","display_name":"Speedup","score":0.4728907644748688},{"id":"https://openalex.org/keywords/stuck-at-fault","display_name":"Stuck-at fault","score":0.4686669111251831},{"id":"https://openalex.org/keywords/built-in-self-test","display_name":"Built-in self-test","score":0.45519647002220154},{"id":"https://openalex.org/keywords/logic-simulation","display_name":"Logic simulation","score":0.4402203857898712},{"id":"https://openalex.org/keywords/fault-detection-and-isolation","display_name":"Fault detection and isolation","score":0.396040141582489},{"id":"https://openalex.org/keywords/logic-gate","display_name":"Logic gate","score":0.39009299874305725},{"id":"https://openalex.org/keywords/software","display_name":"Software","score":0.37760165333747864},{"id":"https://openalex.org/keywords/parallel-computing","display_name":"Parallel computing","score":0.37356534600257874},{"id":"https://openalex.org/keywords/computer-engineering","display_name":"Computer engineering","score":0.37010088562965393},{"id":"https://openalex.org/keywords/test-set","display_name":"Test set","score":0.188594251871109},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.16489285230636597},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.16261988878250122},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.090720534324646}],"concepts":[{"id":"https://openalex.org/C126953365","wikidata":"https://www.wikidata.org/wiki/Q5438152","display_name":"Fault coverage","level":3,"score":0.8036710023880005},{"id":"https://openalex.org/C17626397","wikidata":"https://www.wikidata.org/wiki/Q837455","display_name":"Automatic test pattern generation","level":3,"score":0.706613302230835},{"id":"https://openalex.org/C176217482","wikidata":"https://www.wikidata.org/wiki/Q860554","display_name":"Metric (unit)","level":2,"score":0.6522213220596313},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6463741064071655},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.6021511554718018},{"id":"https://openalex.org/C53942775","wikidata":"https://www.wikidata.org/wiki/Q1211721","display_name":"Code coverage","level":3,"score":0.5690057277679443},{"id":"https://openalex.org/C100767440","wikidata":"https://www.wikidata.org/wiki/Q7705816","display_name":"Test vector","level":3,"score":0.5665075778961182},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.5244293808937073},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.504106879234314},{"id":"https://openalex.org/C68339613","wikidata":"https://www.wikidata.org/wiki/Q1549489","display_name":"Speedup","level":2,"score":0.4728907644748688},{"id":"https://openalex.org/C13625343","wikidata":"https://www.wikidata.org/wiki/Q7627418","display_name":"Stuck-at fault","level":4,"score":0.4686669111251831},{"id":"https://openalex.org/C2780980493","wikidata":"https://www.wikidata.org/wiki/Q181142","display_name":"Built-in self-test","level":2,"score":0.45519647002220154},{"id":"https://openalex.org/C64859876","wikidata":"https://www.wikidata.org/wiki/Q173673","display_name":"Logic simulation","level":3,"score":0.4402203857898712},{"id":"https://openalex.org/C152745839","wikidata":"https://www.wikidata.org/wiki/Q5438153","display_name":"Fault detection and isolation","level":3,"score":0.396040141582489},{"id":"https://openalex.org/C131017901","wikidata":"https://www.wikidata.org/wiki/Q170451","display_name":"Logic gate","level":2,"score":0.39009299874305725},{"id":"https://openalex.org/C2777904410","wikidata":"https://www.wikidata.org/wiki/Q7397","display_name":"Software","level":2,"score":0.37760165333747864},{"id":"https://openalex.org/C173608175","wikidata":"https://www.wikidata.org/wiki/Q232661","display_name":"Parallel computing","level":1,"score":0.37356534600257874},{"id":"https://openalex.org/C113775141","wikidata":"https://www.wikidata.org/wiki/Q428691","display_name":"Computer engineering","level":1,"score":0.37010088562965393},{"id":"https://openalex.org/C169903167","wikidata":"https://www.wikidata.org/wiki/Q3985153","display_name":"Test set","level":2,"score":0.188594251871109},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.16489285230636597},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.16261988878250122},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.090720534324646},{"id":"https://openalex.org/C21547014","wikidata":"https://www.wikidata.org/wiki/Q1423657","display_name":"Operations management","level":1,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C172707124","wikidata":"https://www.wikidata.org/wiki/Q423488","display_name":"Actuator","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/vts.2014.6818739","is_oa":false,"landing_page_url":"https://doi.org/10.1109/vts.2014.6818739","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2014 IEEE 32nd VLSI Test Symposium (VTS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":21,"referenced_works":["https://openalex.org/W1503570386","https://openalex.org/W1607506395","https://openalex.org/W1891950198","https://openalex.org/W1998316224","https://openalex.org/W1998351640","https://openalex.org/W2036384654","https://openalex.org/W2098786960","https://openalex.org/W2104428548","https://openalex.org/W2110900369","https://openalex.org/W2123227472","https://openalex.org/W2125465318","https://openalex.org/W2132789645","https://openalex.org/W2133222590","https://openalex.org/W2142736763","https://openalex.org/W2147437163","https://openalex.org/W2153450600","https://openalex.org/W2313165267","https://openalex.org/W4233949684","https://openalex.org/W4244274599","https://openalex.org/W4250678187","https://openalex.org/W4298839163"],"related_works":["https://openalex.org/W2013189010","https://openalex.org/W2366927937","https://openalex.org/W2149690470","https://openalex.org/W2356961922","https://openalex.org/W1533384744","https://openalex.org/W2122073851","https://openalex.org/W1540713932","https://openalex.org/W1993653991","https://openalex.org/W2149684986","https://openalex.org/W2154529098"],"abstract_inverted_index":{"Evaluating":[0],"the":[1,33,60,63,82,85,91,94,111,128,134],"coverage":[2,34,49,65,96,131,136],"of":[3,35,74,81,84,105,125],"tests":[4],"for":[5,13,30,147],"large":[6,148],"circuits":[7],"is":[8,44,68],"computationally":[9],"very":[10],"intensive,":[11],"particularly":[12],"logic":[14],"BIST,":[15],"software-based":[16],"self":[17],"test":[18,21,86,106],"and":[19,76,113,116],"on-line":[20],"schemes.":[22],"This":[23,67],"has":[24],"led":[25],"to":[26,90],"research":[27],"into":[28],"techniques":[29],"rapidly":[31],"evaluating":[32],"proposed":[36],"test.":[37],"We":[38],"introduce":[39],"a":[40,79,101,117],"new":[41],"metric":[42],"which":[43],"highly":[45],"correlated":[46],"with":[47,70,100,133,141],"fault":[48,64,95,130,135,139],"measured":[50],"by":[51],"gate-level":[52],"simulators.":[53],"Based":[54],"on":[55,110],"this":[56],"metric,":[57],"we":[58],"estimate":[59],"time":[61],"when":[62,88],"saturates.":[66],"done":[69],"only":[71],"one":[72],"pass":[73],"simulation":[75],"it":[77],"provides":[78],"measure":[80],"effectiveness":[83],"sequence":[87],"applied":[89],"circuit-under-test;":[92],"additionally,":[93],"can":[97],"be":[98],"estimated":[99,129],"relatively":[102],"small":[103],"number":[104],"vectors.":[107],"Experimental":[108],"results":[109],"ISCAS'85":[112],"ISCAS'89":[114],"benchmarks,":[115],"RISC":[118],"processor":[119],"(OR1200),":[120],"show":[121],"an":[122,142],"average":[123,143],"error":[124],"2.85%":[126],"in":[127],"compared":[132],"from":[137],"full":[138],"simulation,":[140],"speedup":[144],"over":[145],"8\u00d7":[146],"circuits.":[149]},"counts_by_year":[{"year":2024,"cited_by_count":1},{"year":2022,"cited_by_count":1},{"year":2019,"cited_by_count":1},{"year":2018,"cited_by_count":3},{"year":2016,"cited_by_count":1},{"year":2015,"cited_by_count":1},{"year":2014,"cited_by_count":1}],"updated_date":"2026-07-14T23:27:15.235271","created_date":"2025-10-10T00:00:00"}