{"id":"https://openalex.org/W2082524676","doi":"https://doi.org/10.1109/vts.2013.6548942","title":"Special session 11B: Hot topic on-chip clocking \u2014 Industrial trends","display_name":"Special session 11B: Hot topic on-chip clocking \u2014 Industrial trends","publication_year":2013,"publication_date":"2013-04-01","ids":{"openalex":"https://openalex.org/W2082524676","doi":"https://doi.org/10.1109/vts.2013.6548942","mag":"2082524676"},"language":"en","primary_location":{"id":"doi:10.1109/vts.2013.6548942","is_oa":false,"landing_page_url":"https://doi.org/10.1109/vts.2013.6548942","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2013 IEEE 31st VLSI Test Symposium (VTS)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5041100073","display_name":"Anshuman Chandra","orcid":"https://orcid.org/0000-0002-2686-3918"},"institutions":[{"id":"https://openalex.org/I1335490905","display_name":"Synopsys (Switzerland)","ror":"https://ror.org/03mb54f81","country_code":"CH","type":"company","lineage":["https://openalex.org/I1335490905","https://openalex.org/I4210088951"]}],"countries":["CH"],"is_corresponding":true,"raw_author_name":"Anshuman Chandra","raw_affiliation_strings":["Synopsys","SYNOPSYS"],"affiliations":[{"raw_affiliation_string":"Synopsys","institution_ids":["https://openalex.org/I1335490905"]},{"raw_affiliation_string":"SYNOPSYS","institution_ids":["https://openalex.org/I1335490905"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":["https://openalex.org/A5041100073"],"corresponding_institution_ids":["https://openalex.org/I1335490905"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.14052317,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"1"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9932000041007996,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9932000041007996,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10904","display_name":"Embedded Systems Design Techniques","score":0.9390000104904175,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/chip","display_name":"Chip","score":0.7040923833847046},{"id":"https://openalex.org/keywords/session","display_name":"Session (web analytics)","score":0.6649887561798096},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6278210878372192},{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.5615900754928589},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.5030903220176697},{"id":"https://openalex.org/keywords/test","display_name":"Test (biology)","score":0.5021686553955078},{"id":"https://openalex.org/keywords/quality","display_name":"Quality (philosophy)","score":0.4856192171573639},{"id":"https://openalex.org/keywords/design-for-testing","display_name":"Design for testing","score":0.4727821350097656},{"id":"https://openalex.org/keywords/system-on-a-chip","display_name":"System on a chip","score":0.4507772624492645},{"id":"https://openalex.org/keywords/controller","display_name":"Controller (irrigation)","score":0.42838799953460693},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.37243854999542236},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.24054193496704102},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.13511443138122559}],"concepts":[{"id":"https://openalex.org/C165005293","wikidata":"https://www.wikidata.org/wiki/Q1074500","display_name":"Chip","level":2,"score":0.7040923833847046},{"id":"https://openalex.org/C2779182362","wikidata":"https://www.wikidata.org/wiki/Q17126187","display_name":"Session (web analytics)","level":2,"score":0.6649887561798096},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6278210878372192},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.5615900754928589},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.5030903220176697},{"id":"https://openalex.org/C2777267654","wikidata":"https://www.wikidata.org/wiki/Q3519023","display_name":"Test (biology)","level":2,"score":0.5021686553955078},{"id":"https://openalex.org/C2779530757","wikidata":"https://www.wikidata.org/wiki/Q1207505","display_name":"Quality (philosophy)","level":2,"score":0.4856192171573639},{"id":"https://openalex.org/C190874656","wikidata":"https://www.wikidata.org/wiki/Q5264347","display_name":"Design for testing","level":3,"score":0.4727821350097656},{"id":"https://openalex.org/C118021083","wikidata":"https://www.wikidata.org/wiki/Q610398","display_name":"System on a chip","level":2,"score":0.4507772624492645},{"id":"https://openalex.org/C203479927","wikidata":"https://www.wikidata.org/wiki/Q5165939","display_name":"Controller (irrigation)","level":2,"score":0.42838799953460693},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.37243854999542236},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.24054193496704102},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.13511443138122559},{"id":"https://openalex.org/C136764020","wikidata":"https://www.wikidata.org/wiki/Q466","display_name":"World Wide Web","level":1,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C6557445","wikidata":"https://www.wikidata.org/wiki/Q173113","display_name":"Agronomy","level":1,"score":0.0},{"id":"https://openalex.org/C151730666","wikidata":"https://www.wikidata.org/wiki/Q7205","display_name":"Paleontology","level":1,"score":0.0},{"id":"https://openalex.org/C111472728","wikidata":"https://www.wikidata.org/wiki/Q9471","display_name":"Epistemology","level":1,"score":0.0},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0},{"id":"https://openalex.org/C51234621","wikidata":"https://www.wikidata.org/wiki/Q2149495","display_name":"Testability","level":2,"score":0.0},{"id":"https://openalex.org/C138885662","wikidata":"https://www.wikidata.org/wiki/Q5891","display_name":"Philosophy","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/vts.2013.6548942","is_oa":false,"landing_page_url":"https://doi.org/10.1109/vts.2013.6548942","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2013 IEEE 31st VLSI Test Symposium (VTS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/9","score":0.6499999761581421,"display_name":"Industry, innovation and infrastructure"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":0,"referenced_works":[],"related_works":["https://openalex.org/W1978339999","https://openalex.org/W2360400548","https://openalex.org/W2115579119","https://openalex.org/W2017236304","https://openalex.org/W2384601745","https://openalex.org/W2537171119","https://openalex.org/W2367495590","https://openalex.org/W2048370503","https://openalex.org/W2362119228","https://openalex.org/W2172250424"],"abstract_inverted_index":{"A":[0],"typical":[1],"design":[2,35],"today":[3],"is":[4,144],"implemented":[5,64],"with":[6,89,115],"DFT":[7,102],"where":[8],"the":[9,25,28,31,45,56,61,66,70,75,116,128,132,142],"capture":[10],"clocks":[11],"are":[12],"supplied":[13],"on":[14,65,93],"chip.":[15,67],"The":[16],"on-chip":[17],"controller":[18],"(OCC)":[19],"plays":[20],"a":[21,158],"critical":[22,91],"role":[23],"in":[24,49,69],"application":[26],"and":[27,60,140],"quality":[29,159],"of":[30,42,52,58,118,131],"tests.":[32],"Almost":[33],"every":[34,94],"house":[36,50],"has":[37],"developed":[38],"an":[39],"innovative":[40,152],"way":[41],"delivering":[43],"either":[44],"structural":[46],"tests":[47,54,155],"or":[48],"mix":[51],"structural-functional":[53],"through":[55],"use":[57,151],"OCC":[59,137,153],"design-for-test":[62],"(DFT)":[63],"Complexities":[68],"implementation":[71],"come":[72],"due":[73],"to":[74,85,112,126,135,150,156],"various":[76],"test":[77,106,162],"strategies":[78],"employed":[79],"with:":[80],"\u2022":[81,96,107],"Process":[82],"variation":[83],"leading":[84],"issues":[86],"like":[87],"dealing":[88],"non-unique":[90],"paths":[92],"chip":[95],"Test":[97],"data":[98],"compression":[99],"becoming":[100],"primary":[101],"solution":[103],"for":[104],"manufacturing":[105,161],"Low":[108],"cost":[109],"testers":[110],"unable":[111],"keep":[113],"up":[114],"requirements":[117],"clocking":[119],"schemes":[120],"In":[121],"this":[122],"session,":[123],"we":[124],"want":[125],"explore":[127],"current":[129],"offerings":[130],"EDA":[133],"tools":[134],"implement":[136],"based":[138,154],"solutions":[139,149],"how":[141],"industry":[143],"going":[145],"beyond":[146],"those":[147],"standard":[148],"provide":[157],"at-speed":[160],"solution.":[163]},"counts_by_year":[],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}