{"id":"https://openalex.org/W1981113618","doi":"https://doi.org/10.1109/vts.2013.6548935","title":"Chip-level modeling and analysis of electrical masking of soft errors","display_name":"Chip-level modeling and analysis of electrical masking of soft errors","publication_year":2013,"publication_date":"2013-04-01","ids":{"openalex":"https://openalex.org/W1981113618","doi":"https://doi.org/10.1109/vts.2013.6548935","mag":"1981113618"},"language":"en","primary_location":{"id":"doi:10.1109/vts.2013.6548935","is_oa":false,"landing_page_url":"https://doi.org/10.1109/vts.2013.6548935","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2013 IEEE 31st VLSI Test Symposium (VTS)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"green","oa_url":"https://zenodo.org/record/3435944","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5047542446","display_name":"Saman Kiamehr","orcid":"https://orcid.org/0000-0003-1536-3819"},"institutions":[{"id":"https://openalex.org/I102335020","display_name":"Karlsruhe Institute of Technology","ror":"https://ror.org/04t3en479","country_code":"DE","type":"education","lineage":["https://openalex.org/I102335020","https://openalex.org/I1305996414"]}],"countries":["DE"],"is_corresponding":true,"raw_author_name":"S. Kiamehr","raw_affiliation_strings":["Department of Computer Science, Karlsruhe Institute of Technology, Karlsruhe, Germany"],"affiliations":[{"raw_affiliation_string":"Department of Computer Science, Karlsruhe Institute of Technology, Karlsruhe, Germany","institution_ids":["https://openalex.org/I102335020"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5030714713","display_name":"Mohammad Ali Ebrahimi","orcid":"https://orcid.org/0000-0001-5612-3729"},"institutions":[{"id":"https://openalex.org/I102335020","display_name":"Karlsruhe Institute of Technology","ror":"https://ror.org/04t3en479","country_code":"DE","type":"education","lineage":["https://openalex.org/I102335020","https://openalex.org/I1305996414"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"M. Ebrahimi","raw_affiliation_strings":["Department of Computer Science, Karlsruhe Institute of Technology, Karlsruhe, Germany"],"affiliations":[{"raw_affiliation_string":"Department of Computer Science, Karlsruhe Institute of Technology, Karlsruhe, Germany","institution_ids":["https://openalex.org/I102335020"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5018615087","display_name":"Farshad Firouzi","orcid":"https://orcid.org/0000-0002-8359-4304"},"institutions":[{"id":"https://openalex.org/I102335020","display_name":"Karlsruhe Institute of Technology","ror":"https://ror.org/04t3en479","country_code":"DE","type":"education","lineage":["https://openalex.org/I102335020","https://openalex.org/I1305996414"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"F. Firouzi","raw_affiliation_strings":["Department of Computer Science, Karlsruhe Institute of Technology, Karlsruhe, Germany"],"affiliations":[{"raw_affiliation_string":"Department of Computer Science, Karlsruhe Institute of Technology, Karlsruhe, Germany","institution_ids":["https://openalex.org/I102335020"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5064445713","display_name":"Mehdi B. Tahoori","orcid":"https://orcid.org/0000-0002-8829-5610"},"institutions":[{"id":"https://openalex.org/I102335020","display_name":"Karlsruhe Institute of Technology","ror":"https://ror.org/04t3en479","country_code":"DE","type":"education","lineage":["https://openalex.org/I102335020","https://openalex.org/I1305996414"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"M. B. Tahoori","raw_affiliation_strings":["Department of Computer Science, Karlsruhe Institute of Technology, Karlsruhe, Germany"],"affiliations":[{"raw_affiliation_string":"Department of Computer Science, Karlsruhe Institute of Technology, Karlsruhe, Germany","institution_ids":["https://openalex.org/I102335020"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5047542446"],"corresponding_institution_ids":["https://openalex.org/I102335020"],"apc_list":null,"apc_paid":null,"fwci":2.128,"has_fulltext":false,"cited_by_count":22,"citation_normalized_percentile":{"value":0.87935223,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":97},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"6"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9991999864578247,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/masking","display_name":"Masking (illustration)","score":0.8272002339363098},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.638251543045044},{"id":"https://openalex.org/keywords/very-large-scale-integration","display_name":"Very-large-scale integration","score":0.6253344416618347},{"id":"https://openalex.org/keywords/chip","display_name":"Chip","score":0.6023352742195129},{"id":"https://openalex.org/keywords/soft-error","display_name":"Soft error","score":0.5493729114532471},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.5467873215675354},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.5414341688156128},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.24666324257850647},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.1683049201965332},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.1454487144947052},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.09657737612724304}],"concepts":[{"id":"https://openalex.org/C2777402240","wikidata":"https://www.wikidata.org/wiki/Q6783436","display_name":"Masking (illustration)","level":2,"score":0.8272002339363098},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.638251543045044},{"id":"https://openalex.org/C14580979","wikidata":"https://www.wikidata.org/wiki/Q876049","display_name":"Very-large-scale integration","level":2,"score":0.6253344416618347},{"id":"https://openalex.org/C165005293","wikidata":"https://www.wikidata.org/wiki/Q1074500","display_name":"Chip","level":2,"score":0.6023352742195129},{"id":"https://openalex.org/C154474529","wikidata":"https://www.wikidata.org/wiki/Q1658917","display_name":"Soft error","level":2,"score":0.5493729114532471},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.5467873215675354},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.5414341688156128},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.24666324257850647},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.1683049201965332},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.1454487144947052},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.09657737612724304},{"id":"https://openalex.org/C153349607","wikidata":"https://www.wikidata.org/wiki/Q36649","display_name":"Visual arts","level":1,"score":0.0},{"id":"https://openalex.org/C142362112","wikidata":"https://www.wikidata.org/wiki/Q735","display_name":"Art","level":0,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/vts.2013.6548935","is_oa":false,"landing_page_url":"https://doi.org/10.1109/vts.2013.6548935","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2013 IEEE 31st VLSI Test Symposium (VTS)","raw_type":"proceedings-article"},{"id":"pmh:oai:zenodo.org:3435944","is_oa":true,"landing_page_url":"https://zenodo.org/record/3435944","pdf_url":null,"source":{"id":"https://openalex.org/S4306400562","display_name":"Zenodo (CERN European Organization for Nuclear Research)","issn_l":null,"issn":null,"is_oa":true,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I67311998","host_organization_name":"European Organization for Nuclear Research","host_organization_lineage":["https://openalex.org/I67311998"],"host_organization_lineage_names":[],"type":"repository"},"license":"other-oa","license_id":"https://openalex.org/licenses/other-oa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"","raw_type":"info:eu-repo/semantics/conferencePaper"}],"best_oa_location":{"id":"pmh:oai:zenodo.org:3435944","is_oa":true,"landing_page_url":"https://zenodo.org/record/3435944","pdf_url":null,"source":{"id":"https://openalex.org/S4306400562","display_name":"Zenodo (CERN European Organization for Nuclear Research)","issn_l":null,"issn":null,"is_oa":true,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I67311998","host_organization_name":"European Organization for Nuclear Research","host_organization_lineage":["https://openalex.org/I67311998"],"host_organization_lineage_names":[],"type":"repository"},"license":"other-oa","license_id":"https://openalex.org/licenses/other-oa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"","raw_type":"info:eu-repo/semantics/conferencePaper"},"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","score":0.6700000166893005,"display_name":"Affordable and clean energy"}],"awards":[],"funders":[{"id":"https://openalex.org/F4320320879","display_name":"Deutsche Forschungsgemeinschaft","ror":"https://ror.org/018mejw64"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":24,"referenced_works":["https://openalex.org/W2010966375","https://openalex.org/W2020872704","https://openalex.org/W2049025281","https://openalex.org/W2058002953","https://openalex.org/W2062980181","https://openalex.org/W2097385122","https://openalex.org/W2098426274","https://openalex.org/W2098864349","https://openalex.org/W2100219166","https://openalex.org/W2114580895","https://openalex.org/W2117115814","https://openalex.org/W2121512328","https://openalex.org/W2135277685","https://openalex.org/W2146802428","https://openalex.org/W2148644350","https://openalex.org/W2149041233","https://openalex.org/W2154509298","https://openalex.org/W2158595203","https://openalex.org/W2160055399","https://openalex.org/W2169213530","https://openalex.org/W3149694916","https://openalex.org/W6655719840","https://openalex.org/W6664625427","https://openalex.org/W6677251561"],"related_works":["https://openalex.org/W2041615232","https://openalex.org/W4283025278","https://openalex.org/W61292821","https://openalex.org/W2082432309","https://openalex.org/W817174743","https://openalex.org/W2050492524","https://openalex.org/W2998315020","https://openalex.org/W2104790384","https://openalex.org/W2167002145","https://openalex.org/W2098218272"],"abstract_inverted_index":{"With":[0],"continuous":[1],"downscaling":[2],"of":[3,24,34,66,108],"VLSI":[4,35],"technologies,":[5],"logic":[6],"cells":[7],"are":[8],"becoming":[9],"more":[10],"susceptible":[11],"to":[12,85,104],"radiation-induced":[13],"soft":[14,91],"error.":[15],"To":[16],"accurately":[17,29,62],"model":[18],"this":[19,52,109],"at":[20,37],"chip-level,":[21],"the":[22,44,48,64,70,89,106],"impact":[23,65],"electrical":[25,49,58,80],"masking":[26,59,81],"should":[27],"be":[28],"considered.":[30],"Moreover,":[31],"increasing":[32],"complexity":[33],"chips":[36],"nanoscale":[38],"results":[39],"in":[40,79,88],"voltage":[41,67,77],"fluctuation":[42,68,78],"across":[43,69],"chip":[45],"which":[46,61],"impacts":[47],"masking.":[50],"In":[51],"paper,":[53],"we":[54],"present":[55,96],"a":[56,97],"chip-level":[57],"analysis":[60,73],"considers":[63],"chip.":[71],"Our":[72],"shows":[74],"that":[75],"neglecting":[76],"can":[82],"lead":[83],"up":[84],"152%":[86],"inaccuracy":[87],"overall":[90],"error":[92],"rate.":[93],"We":[94],"also":[95],"technique":[98],"based":[99],"on":[100],"backward":[101],"pulse":[102],"propagation":[103],"reduce":[105],"runtime":[107],"analysis.":[110]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2024,"cited_by_count":2},{"year":2023,"cited_by_count":2},{"year":2022,"cited_by_count":1},{"year":2021,"cited_by_count":3},{"year":2020,"cited_by_count":1},{"year":2019,"cited_by_count":1},{"year":2018,"cited_by_count":2},{"year":2016,"cited_by_count":3},{"year":2015,"cited_by_count":3},{"year":2014,"cited_by_count":1},{"year":2013,"cited_by_count":2}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2016-06-24T00:00:00"}