{"id":"https://openalex.org/W1964936529","doi":"https://doi.org/10.1109/vts.2013.6548934","title":"Low-cost multi-channel testing of periodic signals using monobit receivers and incoherent subsampling","display_name":"Low-cost multi-channel testing of periodic signals using monobit receivers and incoherent subsampling","publication_year":2013,"publication_date":"2013-04-01","ids":{"openalex":"https://openalex.org/W1964936529","doi":"https://doi.org/10.1109/vts.2013.6548934","mag":"1964936529"},"language":"en","primary_location":{"id":"doi:10.1109/vts.2013.6548934","is_oa":false,"landing_page_url":"https://doi.org/10.1109/vts.2013.6548934","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2013 IEEE 31st VLSI Test Symposium (VTS)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5008840067","display_name":"Thomas W. Moon","orcid":"https://orcid.org/0000-0001-8256-1183"},"institutions":[{"id":"https://openalex.org/I130701444","display_name":"Georgia Institute of Technology","ror":"https://ror.org/01zkghx44","country_code":"US","type":"education","lineage":["https://openalex.org/I130701444"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Thomas Moon","raw_affiliation_strings":["School of ECE, Georgia Tech, USA","[Sch. of ECE, Georgia Tech, Atlanta, GA, USA]"],"affiliations":[{"raw_affiliation_string":"School of ECE, Georgia Tech, USA","institution_ids":["https://openalex.org/I130701444"]},{"raw_affiliation_string":"[Sch. of ECE, Georgia Tech, Atlanta, GA, USA]","institution_ids":["https://openalex.org/I130701444"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5017180010","display_name":"Hyun Choi","orcid":"https://orcid.org/0000-0002-6963-3004"},"institutions":[{"id":"https://openalex.org/I4210101778","display_name":"Samsung (United States)","ror":"https://ror.org/01bfbvm65","country_code":"US","type":"company","lineage":["https://openalex.org/I2250650973","https://openalex.org/I4210101778"]},{"id":"https://openalex.org/I2250650973","display_name":"Samsung (South Korea)","ror":"https://ror.org/04w3jy968","country_code":"KR","type":"company","lineage":["https://openalex.org/I2250650973"]}],"countries":["KR","US"],"is_corresponding":false,"raw_author_name":"Hyun Woo Choi","raw_affiliation_strings":["Samsung Electronics, South Korea","Samsung Electron., San Jose, CA, USA"],"affiliations":[{"raw_affiliation_string":"Samsung Electronics, South Korea","institution_ids":["https://openalex.org/I2250650973"]},{"raw_affiliation_string":"Samsung Electron., San Jose, CA, USA","institution_ids":["https://openalex.org/I4210101778"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5069579193","display_name":"Abhijit Chatterjee","orcid":"https://orcid.org/0000-0003-1553-4470"},"institutions":[{"id":"https://openalex.org/I130701444","display_name":"Georgia Institute of Technology","ror":"https://ror.org/01zkghx44","country_code":"US","type":"education","lineage":["https://openalex.org/I130701444"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"A. Chatterjee","raw_affiliation_strings":["School of ECE, Georgia Tech, USA","[Sch. of ECE, Georgia Tech, Atlanta, GA, USA]"],"affiliations":[{"raw_affiliation_string":"School of ECE, Georgia Tech, USA","institution_ids":["https://openalex.org/I130701444"]},{"raw_affiliation_string":"[Sch. of ECE, Georgia Tech, Atlanta, GA, USA]","institution_ids":["https://openalex.org/I130701444"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5008840067"],"corresponding_institution_ids":["https://openalex.org/I130701444"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":{"value":0.04397577,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":94},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"6"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11417","display_name":"Advancements in PLL and VCO Technologies","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11417","display_name":"Advancements in PLL and VCO Technologies","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12300","display_name":"Advanced Electrical Measurement Techniques","score":0.9976000189781189,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":0.996399998664856,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/waveform","display_name":"Waveform","score":0.7757773399353027},{"id":"https://openalex.org/keywords/comparator","display_name":"Comparator","score":0.6897473931312561},{"id":"https://openalex.org/keywords/sine-wave","display_name":"Sine wave","score":0.652733564376831},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6445297002792358},{"id":"https://openalex.org/keywords/field-programmable-gate-array","display_name":"Field-programmable gate array","score":0.6016141176223755},{"id":"https://openalex.org/keywords/bandwidth","display_name":"Bandwidth (computing)","score":0.6009339094161987},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.5914018154144287},{"id":"https://openalex.org/keywords/channel","display_name":"Channel (broadcasting)","score":0.5727753043174744},{"id":"https://openalex.org/keywords/signal","display_name":"SIGNAL (programming language)","score":0.5202587842941284},{"id":"https://openalex.org/keywords/amplitude","display_name":"Amplitude","score":0.4681071937084198},{"id":"https://openalex.org/keywords/sine","display_name":"Sine","score":0.46120232343673706},{"id":"https://openalex.org/keywords/sampling","display_name":"Sampling (signal processing)","score":0.4262140989303589},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.3923627734184265},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.3272528648376465},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.2965022623538971},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.1717541515827179},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.17132467031478882},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.16117385029792786},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.1263975203037262},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.11516988277435303},{"id":"https://openalex.org/keywords/detector","display_name":"Detector","score":0.10743984580039978}],"concepts":[{"id":"https://openalex.org/C197424946","wikidata":"https://www.wikidata.org/wiki/Q1165717","display_name":"Waveform","level":3,"score":0.7757773399353027},{"id":"https://openalex.org/C155745195","wikidata":"https://www.wikidata.org/wiki/Q1164179","display_name":"Comparator","level":3,"score":0.6897473931312561},{"id":"https://openalex.org/C66907618","wikidata":"https://www.wikidata.org/wiki/Q207527","display_name":"Sine wave","level":3,"score":0.652733564376831},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6445297002792358},{"id":"https://openalex.org/C42935608","wikidata":"https://www.wikidata.org/wiki/Q190411","display_name":"Field-programmable gate array","level":2,"score":0.6016141176223755},{"id":"https://openalex.org/C2776257435","wikidata":"https://www.wikidata.org/wiki/Q1576430","display_name":"Bandwidth (computing)","level":2,"score":0.6009339094161987},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.5914018154144287},{"id":"https://openalex.org/C127162648","wikidata":"https://www.wikidata.org/wiki/Q16858953","display_name":"Channel (broadcasting)","level":2,"score":0.5727753043174744},{"id":"https://openalex.org/C2779843651","wikidata":"https://www.wikidata.org/wiki/Q7390335","display_name":"SIGNAL (programming language)","level":2,"score":0.5202587842941284},{"id":"https://openalex.org/C180205008","wikidata":"https://www.wikidata.org/wiki/Q159190","display_name":"Amplitude","level":2,"score":0.4681071937084198},{"id":"https://openalex.org/C186661526","wikidata":"https://www.wikidata.org/wiki/Q13647261","display_name":"Sine","level":2,"score":0.46120232343673706},{"id":"https://openalex.org/C140779682","wikidata":"https://www.wikidata.org/wiki/Q210868","display_name":"Sampling (signal processing)","level":3,"score":0.4262140989303589},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.3923627734184265},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.3272528648376465},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.2965022623538971},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.1717541515827179},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.17132467031478882},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.16117385029792786},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.1263975203037262},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.11516988277435303},{"id":"https://openalex.org/C94915269","wikidata":"https://www.wikidata.org/wiki/Q1834857","display_name":"Detector","level":2,"score":0.10743984580039978},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/vts.2013.6548934","is_oa":false,"landing_page_url":"https://doi.org/10.1109/vts.2013.6548934","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2013 IEEE 31st VLSI Test Symposium (VTS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.4300000071525574,"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7"}],"awards":[],"funders":[{"id":"https://openalex.org/F4320332195","display_name":"Samsung","ror":"https://ror.org/04w3jy968"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":6,"referenced_works":["https://openalex.org/W1964784719","https://openalex.org/W2022972690","https://openalex.org/W2144405265","https://openalex.org/W2164103183","https://openalex.org/W2166116685","https://openalex.org/W2170040849"],"related_works":["https://openalex.org/W2886467464","https://openalex.org/W2351812187","https://openalex.org/W2906950246","https://openalex.org/W2149977966","https://openalex.org/W2379854577","https://openalex.org/W2362063739","https://openalex.org/W2351293857","https://openalex.org/W2424761688","https://openalex.org/W2487672730","https://openalex.org/W2409813437"],"abstract_inverted_index":{"This":[0],"paper":[1],"proposes":[2],"a":[3,10,21,66,80,84],"new":[4],"method":[5,19],"to":[6,29,43],"reconstruct":[7],"signal":[8,49],"by":[9,72],"monobit":[11,27],"receiver":[12,28],"based":[13],"on":[14],"incoherent":[15],"subsampling.":[16],"The":[17,75],"proposed":[18],"uses":[20],"time-variant":[22],"threshold":[23,38],"voltage":[24,39],"for":[25],"the":[26,37,47,51,55],"increase":[30],"its":[31],"amplitude":[32],"resolution.":[33],"By":[34],"our":[35,73],"methodology,":[36],"does":[40],"not":[41],"have":[42],"be":[44],"synchronized":[45],"with":[46,59],"input":[48],"nor":[50],"sampling":[52],"clock":[53],"of":[54],"system.":[56],"Hardware":[57],"measurement":[58,77],"FPGA":[60],"and":[61,83],"high-bandwidth":[62],"clocked-comparators":[63],"shows":[64],"that":[65],"low-cost":[67],"multi-channel":[68],"test":[69],"is":[70],"achievable":[71],"method.":[74],"hardware":[76],"results":[78],"show":[79],"square":[81],"waveform":[82,87],"sine":[85],"wave":[86],"reconstruction.":[88]},"counts_by_year":[{"year":2019,"cited_by_count":1},{"year":2018,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}