{"id":"https://openalex.org/W2091243480","doi":"https://doi.org/10.1109/vts.2013.6548925","title":"A multi-faceted approach to FPGA-based Trojan circuit detection","display_name":"A multi-faceted approach to FPGA-based Trojan circuit detection","publication_year":2013,"publication_date":"2013-04-01","ids":{"openalex":"https://openalex.org/W2091243480","doi":"https://doi.org/10.1109/vts.2013.6548925","mag":"2091243480"},"language":"en","primary_location":{"id":"doi:10.1109/vts.2013.6548925","is_oa":false,"landing_page_url":"https://doi.org/10.1109/vts.2013.6548925","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2013 IEEE 31st VLSI Test Symposium (VTS)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5023400680","display_name":"Michael Patterson","orcid":"https://orcid.org/0000-0001-6317-0697"},"institutions":[{"id":"https://openalex.org/I173911158","display_name":"Iowa State University","ror":"https://ror.org/04rswrd78","country_code":"US","type":"education","lineage":["https://openalex.org/I173911158"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"M. Patterson","raw_affiliation_strings":["Electrical and Computer Engineering, Iowa State University, Ames, IA, USA","Electr. & Comput. Eng., Iowa State Univ., Ames, IA, USA"],"affiliations":[{"raw_affiliation_string":"Electrical and Computer Engineering, Iowa State University, Ames, IA, USA","institution_ids":["https://openalex.org/I173911158"]},{"raw_affiliation_string":"Electr. & Comput. Eng., Iowa State Univ., Ames, IA, USA","institution_ids":["https://openalex.org/I173911158"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5077846569","display_name":"Aaron Mills","orcid":null},"institutions":[{"id":"https://openalex.org/I173911158","display_name":"Iowa State University","ror":"https://ror.org/04rswrd78","country_code":"US","type":"education","lineage":["https://openalex.org/I173911158"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"A. Mills","raw_affiliation_strings":["Electrical and Computer Engineering, Iowa State University, Ames, IA, USA","Electr. & Comput. Eng., Iowa State Univ., Ames, IA, USA"],"affiliations":[{"raw_affiliation_string":"Electrical and Computer Engineering, Iowa State University, Ames, IA, USA","institution_ids":["https://openalex.org/I173911158"]},{"raw_affiliation_string":"Electr. & Comput. Eng., Iowa State Univ., Ames, IA, USA","institution_ids":["https://openalex.org/I173911158"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5055211294","display_name":"Ryan A. Scheel","orcid":null},"institutions":[{"id":"https://openalex.org/I173911158","display_name":"Iowa State University","ror":"https://ror.org/04rswrd78","country_code":"US","type":"education","lineage":["https://openalex.org/I173911158"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"R. Scheel","raw_affiliation_strings":["Electrical and Computer Engineering, Iowa State University, Ames, IA, USA","Electr. & Comput. Eng., Iowa State Univ., Ames, IA, USA"],"affiliations":[{"raw_affiliation_string":"Electrical and Computer Engineering, Iowa State University, Ames, IA, USA","institution_ids":["https://openalex.org/I173911158"]},{"raw_affiliation_string":"Electr. & Comput. Eng., Iowa State Univ., Ames, IA, USA","institution_ids":["https://openalex.org/I173911158"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5083959793","display_name":"Jennifer Tillman","orcid":null},"institutions":[{"id":"https://openalex.org/I173911158","display_name":"Iowa State University","ror":"https://ror.org/04rswrd78","country_code":"US","type":"education","lineage":["https://openalex.org/I173911158"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"J. Tillman","raw_affiliation_strings":["Electrical and Computer Engineering, Iowa State University, Ames, IA, USA","Electr. & Comput. Eng., Iowa State Univ., Ames, IA, USA"],"affiliations":[{"raw_affiliation_string":"Electrical and Computer Engineering, Iowa State University, Ames, IA, USA","institution_ids":["https://openalex.org/I173911158"]},{"raw_affiliation_string":"Electr. & Comput. Eng., Iowa State Univ., Ames, IA, USA","institution_ids":["https://openalex.org/I173911158"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5048764897","display_name":"E. Dye","orcid":null},"institutions":[{"id":"https://openalex.org/I173911158","display_name":"Iowa State University","ror":"https://ror.org/04rswrd78","country_code":"US","type":"education","lineage":["https://openalex.org/I173911158"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"E. Dye","raw_affiliation_strings":["Electrical and Computer Engineering, Iowa State University, Ames, IA, USA","Electr. & Comput. Eng., Iowa State Univ., Ames, IA, USA"],"affiliations":[{"raw_affiliation_string":"Electrical and Computer Engineering, Iowa State University, Ames, IA, USA","institution_ids":["https://openalex.org/I173911158"]},{"raw_affiliation_string":"Electr. & Comput. Eng., Iowa State Univ., Ames, IA, USA","institution_ids":["https://openalex.org/I173911158"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5081541206","display_name":"Joseph Zambreno","orcid":"https://orcid.org/0000-0002-0566-5744"},"institutions":[{"id":"https://openalex.org/I173911158","display_name":"Iowa State University","ror":"https://ror.org/04rswrd78","country_code":"US","type":"education","lineage":["https://openalex.org/I173911158"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"J. Zambreno","raw_affiliation_strings":["Electrical and Computer Engineering, Iowa State University, Ames, IA, USA","Electr. & Comput. Eng., Iowa State Univ., Ames, IA, USA"],"affiliations":[{"raw_affiliation_string":"Electrical and Computer Engineering, Iowa State University, Ames, IA, USA","institution_ids":["https://openalex.org/I173911158"]},{"raw_affiliation_string":"Electr. & Comput. Eng., Iowa State Univ., Ames, IA, USA","institution_ids":["https://openalex.org/I173911158"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":6,"corresponding_author_ids":["https://openalex.org/A5023400680"],"corresponding_institution_ids":["https://openalex.org/I173911158"],"apc_list":null,"apc_paid":null,"fwci":0.3152,"has_fulltext":false,"cited_by_count":5,"citation_normalized_percentile":{"value":0.62208731,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":96},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"4"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12122","display_name":"Physical Unclonable Functions (PUFs) and Hardware Security","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12122","display_name":"Physical Unclonable Functions (PUFs) and Hardware Security","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9957000017166138,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11601","display_name":"Neuroscience and Neural Engineering","score":0.9710999727249146,"subfield":{"id":"https://openalex.org/subfields/2804","display_name":"Cellular and Molecular Neuroscience"},"field":{"id":"https://openalex.org/fields/28","display_name":"Neuroscience"},"domain":{"id":"https://openalex.org/domains/1","display_name":"Life Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/trojan","display_name":"Trojan","score":0.8856018781661987},{"id":"https://openalex.org/keywords/field-programmable-gate-array","display_name":"Field-programmable gate array","score":0.8247781991958618},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6549322009086609},{"id":"https://openalex.org/keywords/context","display_name":"Context (archaeology)","score":0.6548095941543579},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.6327514052391052},{"id":"https://openalex.org/keywords/hardware-trojan","display_name":"Hardware Trojan","score":0.5657022595405579},{"id":"https://openalex.org/keywords/variety","display_name":"Variety (cybernetics)","score":0.49597200751304626},{"id":"https://openalex.org/keywords/set","display_name":"Set (abstract data type)","score":0.426114022731781},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.3340790271759033},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.24742478132247925},{"id":"https://openalex.org/keywords/computer-security","display_name":"Computer security","score":0.24365422129631042},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.10907822847366333},{"id":"https://openalex.org/keywords/programming-language","display_name":"Programming language","score":0.08084282279014587}],"concepts":[{"id":"https://openalex.org/C174333608","wikidata":"https://www.wikidata.org/wiki/Q19635","display_name":"Trojan","level":2,"score":0.8856018781661987},{"id":"https://openalex.org/C42935608","wikidata":"https://www.wikidata.org/wiki/Q190411","display_name":"Field-programmable gate array","level":2,"score":0.8247781991958618},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6549322009086609},{"id":"https://openalex.org/C2779343474","wikidata":"https://www.wikidata.org/wiki/Q3109175","display_name":"Context (archaeology)","level":2,"score":0.6548095941543579},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.6327514052391052},{"id":"https://openalex.org/C2780873074","wikidata":"https://www.wikidata.org/wiki/Q5656397","display_name":"Hardware Trojan","level":3,"score":0.5657022595405579},{"id":"https://openalex.org/C136197465","wikidata":"https://www.wikidata.org/wiki/Q1729295","display_name":"Variety (cybernetics)","level":2,"score":0.49597200751304626},{"id":"https://openalex.org/C177264268","wikidata":"https://www.wikidata.org/wiki/Q1514741","display_name":"Set (abstract data type)","level":2,"score":0.426114022731781},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.3340790271759033},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.24742478132247925},{"id":"https://openalex.org/C38652104","wikidata":"https://www.wikidata.org/wiki/Q3510521","display_name":"Computer security","level":1,"score":0.24365422129631042},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.10907822847366333},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.08084282279014587},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0},{"id":"https://openalex.org/C151730666","wikidata":"https://www.wikidata.org/wiki/Q7205","display_name":"Paleontology","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/vts.2013.6548925","is_oa":false,"landing_page_url":"https://doi.org/10.1109/vts.2013.6548925","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2013 IEEE 31st VLSI Test Symposium (VTS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":15,"referenced_works":["https://openalex.org/W1510893231","https://openalex.org/W1541663547","https://openalex.org/W2005006301","https://openalex.org/W2012032225","https://openalex.org/W2021705882","https://openalex.org/W2099105559","https://openalex.org/W2109894721","https://openalex.org/W2120912790","https://openalex.org/W2121667970","https://openalex.org/W2130066128","https://openalex.org/W2134631869","https://openalex.org/W2146093477","https://openalex.org/W2146369740","https://openalex.org/W3123269857","https://openalex.org/W6632480037"],"related_works":["https://openalex.org/W4385434494","https://openalex.org/W3159333627","https://openalex.org/W3004467197","https://openalex.org/W2091750459","https://openalex.org/W4328053173","https://openalex.org/W1500594134","https://openalex.org/W3084939900","https://openalex.org/W2382172865","https://openalex.org/W1526642037","https://openalex.org/W4321062229"],"abstract_inverted_index":{"Three":[0],"general":[1],"approaches":[2],"to":[3,36],"detecting":[4],"Trojans":[5,45],"embedded":[6],"in":[7,12],"FPGA":[8],"circuits":[9],"were":[10,34],"explored":[11],"the":[13,16,30,63],"context":[14],"of":[15,29,40,46,65,68],"2012":[17],"CSAW":[18],"Embedded":[19],"Systems":[20],"Challenge:":[21],"functional":[22],"testing,":[23],"power":[24],"analysis,":[25],"and":[26],"direct":[27],"analysis":[28],"bitfile.":[31],"These":[32],"tests":[33],"used":[35],"classify":[37],"a":[38,53,57,66],"set":[39],"32":[41],"bitfiles":[42],"which":[43,61],"include":[44],"an":[47],"unknown":[48],"nature.":[49],"The":[50],"project":[51],"is":[52],"step":[54],"towards":[55],"developing":[56],"framework":[58],"for":[59],"Trojan-detection":[60],"leverages":[62],"strengths":[64],"variety":[67],"testing":[69],"techniques.":[70]},"counts_by_year":[{"year":2023,"cited_by_count":1},{"year":2019,"cited_by_count":2},{"year":2018,"cited_by_count":1},{"year":2014,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}