{"id":"https://openalex.org/W2045313419","doi":"https://doi.org/10.1109/vts.2013.6548915","title":"Enhanced algorithm of combining trace and scan signals in post-silicon validation","display_name":"Enhanced algorithm of combining trace and scan signals in post-silicon validation","publication_year":2013,"publication_date":"2013-04-01","ids":{"openalex":"https://openalex.org/W2045313419","doi":"https://doi.org/10.1109/vts.2013.6548915","mag":"2045313419"},"language":"en","primary_location":{"id":"doi:10.1109/vts.2013.6548915","is_oa":false,"landing_page_url":"https://doi.org/10.1109/vts.2013.6548915","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2013 IEEE 31st VLSI Test Symposium (VTS)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5044434679","display_name":"Kihyuk Han","orcid":null},"institutions":[],"countries":[],"is_corresponding":true,"raw_author_name":"Kihyuk Han","raw_affiliation_strings":["GPU Design Department, Samsung Austin Rearch & Development Center, Austin, TX, USA","GPU Design Dept., Samsung Austin R&D Center (SARC), Austin, TX, USA"],"affiliations":[{"raw_affiliation_string":"GPU Design Department, Samsung Austin Rearch & Development Center, Austin, TX, USA","institution_ids":[]},{"raw_affiliation_string":"GPU Design Dept., Samsung Austin R&D Center (SARC), Austin, TX, USA","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5026627679","display_name":"Joon-Sung Yang","orcid":"https://orcid.org/0000-0002-1502-5353"},"institutions":[{"id":"https://openalex.org/I848706","display_name":"Sungkyunkwan University","ror":"https://ror.org/04q78tk20","country_code":"KR","type":"education","lineage":["https://openalex.org/I848706"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Joon-Sung Yang","raw_affiliation_strings":["Sungkyunkwan University, Suwon, South Korea"],"affiliations":[{"raw_affiliation_string":"Sungkyunkwan University, Suwon, South Korea","institution_ids":["https://openalex.org/I848706"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5068070739","display_name":"Jacob A. Abraham","orcid":"https://orcid.org/0000-0002-5336-5631"},"institutions":[{"id":"https://openalex.org/I86519309","display_name":"The University of Texas at Austin","ror":"https://ror.org/00hj54h04","country_code":"US","type":"education","lineage":["https://openalex.org/I86519309"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"J. A. Abraham","raw_affiliation_strings":["Computer Engineering Research Center, University of Texas, Austin, Austin, TX, USA","Comput. Eng. Res. Center, Univ. of Texas at Austin, Austin, TX, USA"],"affiliations":[{"raw_affiliation_string":"Computer Engineering Research Center, University of Texas, Austin, Austin, TX, USA","institution_ids":["https://openalex.org/I86519309"]},{"raw_affiliation_string":"Comput. Eng. Res. Center, Univ. of Texas at Austin, Austin, TX, USA","institution_ids":["https://openalex.org/I86519309"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5044434679"],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.3152,"has_fulltext":false,"cited_by_count":3,"citation_normalized_percentile":{"value":0.60298188,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":96},"biblio":{"volume":"28","issue":null,"first_page":"1","last_page":"6"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9990000128746033,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/observability","display_name":"Observability","score":0.973639190196991},{"id":"https://openalex.org/keywords/trace","display_name":"TRACE (psycholinguistics)","score":0.8365224599838257},{"id":"https://openalex.org/keywords/benchmark","display_name":"Benchmark (surveying)","score":0.7895515561103821},{"id":"https://openalex.org/keywords/debugging","display_name":"Debugging","score":0.7716173529624939},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6857413053512573},{"id":"https://openalex.org/keywords/silicon","display_name":"Silicon","score":0.6758834719657898},{"id":"https://openalex.org/keywords/dependency","display_name":"Dependency (UML)","score":0.629338264465332},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.5215458869934082},{"id":"https://openalex.org/keywords/integrated-circuit","display_name":"Integrated circuit","score":0.44719645380973816},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.4330226480960846},{"id":"https://openalex.org/keywords/software-bug","display_name":"Software bug","score":0.4199422597885132},{"id":"https://openalex.org/keywords/computer-engineering","display_name":"Computer engineering","score":0.37023675441741943},{"id":"https://openalex.org/keywords/software","display_name":"Software","score":0.24699139595031738},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.15458640456199646},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.11953574419021606},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.1140022873878479},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.11299589276313782},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.1106446385383606}],"concepts":[{"id":"https://openalex.org/C36299963","wikidata":"https://www.wikidata.org/wiki/Q1369844","display_name":"Observability","level":2,"score":0.973639190196991},{"id":"https://openalex.org/C75291252","wikidata":"https://www.wikidata.org/wiki/Q1315756","display_name":"TRACE (psycholinguistics)","level":2,"score":0.8365224599838257},{"id":"https://openalex.org/C185798385","wikidata":"https://www.wikidata.org/wiki/Q1161707","display_name":"Benchmark (surveying)","level":2,"score":0.7895515561103821},{"id":"https://openalex.org/C168065819","wikidata":"https://www.wikidata.org/wiki/Q845566","display_name":"Debugging","level":2,"score":0.7716173529624939},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6857413053512573},{"id":"https://openalex.org/C544956773","wikidata":"https://www.wikidata.org/wiki/Q670","display_name":"Silicon","level":2,"score":0.6758834719657898},{"id":"https://openalex.org/C19768560","wikidata":"https://www.wikidata.org/wiki/Q320727","display_name":"Dependency (UML)","level":2,"score":0.629338264465332},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.5215458869934082},{"id":"https://openalex.org/C530198007","wikidata":"https://www.wikidata.org/wiki/Q80831","display_name":"Integrated circuit","level":2,"score":0.44719645380973816},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.4330226480960846},{"id":"https://openalex.org/C1009929","wikidata":"https://www.wikidata.org/wiki/Q179550","display_name":"Software bug","level":3,"score":0.4199422597885132},{"id":"https://openalex.org/C113775141","wikidata":"https://www.wikidata.org/wiki/Q428691","display_name":"Computer engineering","level":1,"score":0.37023675441741943},{"id":"https://openalex.org/C2777904410","wikidata":"https://www.wikidata.org/wiki/Q7397","display_name":"Software","level":2,"score":0.24699139595031738},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.15458640456199646},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.11953574419021606},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.1140022873878479},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.11299589276313782},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.1106446385383606},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C13280743","wikidata":"https://www.wikidata.org/wiki/Q131089","display_name":"Geodesy","level":1,"score":0.0},{"id":"https://openalex.org/C138885662","wikidata":"https://www.wikidata.org/wiki/Q5891","display_name":"Philosophy","level":0,"score":0.0},{"id":"https://openalex.org/C28826006","wikidata":"https://www.wikidata.org/wiki/Q33521","display_name":"Applied mathematics","level":1,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C41895202","wikidata":"https://www.wikidata.org/wiki/Q8162","display_name":"Linguistics","level":1,"score":0.0},{"id":"https://openalex.org/C205649164","wikidata":"https://www.wikidata.org/wiki/Q1071","display_name":"Geography","level":0,"score":0.0},{"id":"https://openalex.org/C191897082","wikidata":"https://www.wikidata.org/wiki/Q11467","display_name":"Metallurgy","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/vts.2013.6548915","is_oa":false,"landing_page_url":"https://doi.org/10.1109/vts.2013.6548915","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2013 IEEE 31st VLSI Test Symposium (VTS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Industry, innovation and infrastructure","id":"https://metadata.un.org/sdg/9","score":0.49000000953674316}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":18,"referenced_works":["https://openalex.org/W604137612","https://openalex.org/W1917409762","https://openalex.org/W1965210897","https://openalex.org/W2001097795","https://openalex.org/W2066387260","https://openalex.org/W2088256110","https://openalex.org/W2098854373","https://openalex.org/W2106648230","https://openalex.org/W2108567808","https://openalex.org/W2121433810","https://openalex.org/W2127120420","https://openalex.org/W2141207024","https://openalex.org/W2141261568","https://openalex.org/W2159004509","https://openalex.org/W2168040632","https://openalex.org/W2170454670","https://openalex.org/W4243896332","https://openalex.org/W4251189334"],"related_works":["https://openalex.org/W2740264376","https://openalex.org/W4206999239","https://openalex.org/W2161928627","https://openalex.org/W4388482952","https://openalex.org/W2786113878","https://openalex.org/W2727867943","https://openalex.org/W3015562293","https://openalex.org/W4400860681","https://openalex.org/W1978161581","https://openalex.org/W2787155073"],"abstract_inverted_index":{"As":[0],"the":[1,13,36,44,71,89,99,112,124],"complexity":[2],"of":[3,39,92,101,119],"integrated":[4],"circuit":[5,103],"design":[6,20],"increases":[7],"and":[8,63,85,94],"production":[9],"schedules":[10],"become":[11],"shorter,":[12],"dependency":[14],"on":[15,107],"post-silicon":[16,33,50],"validation":[17,34],"for":[18,49,88],"capturing":[19],"errors":[21],"that":[22,56,111],"escape":[23],"from":[24],"pre-silicon":[25],"verification":[26],"also":[27],"increases.":[28],"A":[29],"major":[30],"challenge":[31],"in":[32],"is":[35],"limited":[37,45],"observability":[38,57,100],"internal":[40,102],"states":[41,121],"caused":[42],"by":[43],"storage":[46],"capacity":[47],"available":[48],"validation.":[51],"Recent":[52],"research":[53],"has":[54],"shown":[55],"can":[58],"be":[59],"enhanced":[60,84],"if":[61],"trace":[62,76,93],"scan":[64,95],"signals":[65,77,96],"are":[66,78],"combined":[67],"together,":[68],"compared":[69,122],"with":[70],"debugging":[72],"scenario":[73],"where":[74],"only":[75],"monitored.":[79],"This":[80],"paper":[81],"proposes":[82],"an":[83],"systematic":[86],"algorithm":[87],"efficient":[90],"combination":[91],"to":[97,123],"maximize":[98],"states.":[104],"Experimental":[105],"results":[106],"benchmark":[108],"circuits":[109],"show":[110],"proposed":[113],"technique":[114],"provides":[115],"a":[116],"higher":[117],"number":[118],"restored":[120],"existing":[125],"techniques.":[126]},"counts_by_year":[{"year":2018,"cited_by_count":2},{"year":2015,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}