{"id":"https://openalex.org/W1978748630","doi":"https://doi.org/10.1109/vts.2013.6548914","title":"Innovative practices session 6C: Latest practices in test compression","display_name":"Innovative practices session 6C: Latest practices in test compression","publication_year":2013,"publication_date":"2013-04-01","ids":{"openalex":"https://openalex.org/W1978748630","doi":"https://doi.org/10.1109/vts.2013.6548914","mag":"1978748630"},"language":"en","primary_location":{"id":"doi:10.1109/vts.2013.6548914","is_oa":false,"landing_page_url":"https://doi.org/10.1109/vts.2013.6548914","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2013 IEEE 31st VLSI Test Symposium (VTS)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5070673314","display_name":"J.E. Colburn","orcid":"https://orcid.org/0009-0007-2166-6281"},"institutions":[{"id":"https://openalex.org/I4210127875","display_name":"Nvidia (United States)","ror":"https://ror.org/03jdj4y14","country_code":"US","type":"company","lineage":["https://openalex.org/I4210127875"]},{"id":"https://openalex.org/I1304085615","display_name":"Nvidia (United Kingdom)","ror":"https://ror.org/02kr42612","country_code":"GB","type":"company","lineage":["https://openalex.org/I1304085615","https://openalex.org/I4210127875"]}],"countries":["GB","US"],"is_corresponding":true,"raw_author_name":"J. Colburn","raw_affiliation_strings":["NVIDIA Corporation, USA","NVIDIA.CORPORATION"],"affiliations":[{"raw_affiliation_string":"NVIDIA Corporation, USA","institution_ids":["https://openalex.org/I4210127875"]},{"raw_affiliation_string":"NVIDIA.CORPORATION","institution_ids":["https://openalex.org/I1304085615"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5024304785","display_name":"Kun Young Chung","orcid":null},"institutions":[{"id":"https://openalex.org/I2250650973","display_name":"Samsung (South Korea)","ror":"https://ror.org/04w3jy968","country_code":"KR","type":"company","lineage":["https://openalex.org/I2250650973"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"K.-Y. Chung","raw_affiliation_strings":["Samsung Electronics Company, South Korea","Samsung Electronics Co"],"affiliations":[{"raw_affiliation_string":"Samsung Electronics Company, South Korea","institution_ids":["https://openalex.org/I2250650973"]},{"raw_affiliation_string":"Samsung Electronics Co","institution_ids":["https://openalex.org/I2250650973"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5087237429","display_name":"H. Konuk","orcid":null},"institutions":[{"id":"https://openalex.org/I4210127325","display_name":"Broadcom (United States)","ror":"https://ror.org/035gt5s03","country_code":"US","type":"company","lineage":["https://openalex.org/I4210127325"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"H. Konuk","raw_affiliation_strings":["Broadcom Corporation, USA","BROADCOM CORP"],"affiliations":[{"raw_affiliation_string":"Broadcom Corporation, USA","institution_ids":["https://openalex.org/I4210127325"]},{"raw_affiliation_string":"BROADCOM CORP","institution_ids":[]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5074064792","display_name":"Yanhao Dong","orcid":"https://orcid.org/0000-0003-1224-1015"},"institutions":[{"id":"https://openalex.org/I4210137977","display_name":"Advanced Micro Devices (United States)","ror":"https://ror.org/04kd6c783","country_code":"US","type":"company","lineage":["https://openalex.org/I4210137977"]},{"id":"https://openalex.org/I1311921367","display_name":"Advanced Micro Devices (Canada)","ror":"https://ror.org/02yh0k313","country_code":"CA","type":"company","lineage":["https://openalex.org/I1311921367","https://openalex.org/I4210137977"]}],"countries":["CA","US"],"is_corresponding":false,"raw_author_name":"Y. Dong","raw_affiliation_strings":["Advanced Micro Devices, Inc., USA","[Advanced Micro Devices Inc.]"],"affiliations":[{"raw_affiliation_string":"Advanced Micro Devices, Inc., USA","institution_ids":["https://openalex.org/I4210137977"]},{"raw_affiliation_string":"[Advanced Micro Devices Inc.]","institution_ids":["https://openalex.org/I1311921367"]}]}],"institutions":[],"countries_distinct_count":4,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5070673314"],"corresponding_institution_ids":["https://openalex.org/I4210127875","https://openalex.org/I1304085615"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.05700271,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"1"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9394000172615051,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9394000172615051,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/session","display_name":"Session (web analytics)","score":0.7648216485977173},{"id":"https://openalex.org/keywords/test","display_name":"Test (biology)","score":0.5818305611610413},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5204727649688721},{"id":"https://openalex.org/keywords/world-wide-web","display_name":"World Wide Web","score":0.11894741654396057},{"id":"https://openalex.org/keywords/geology","display_name":"Geology","score":0.08642655611038208}],"concepts":[{"id":"https://openalex.org/C2779182362","wikidata":"https://www.wikidata.org/wiki/Q17126187","display_name":"Session (web analytics)","level":2,"score":0.7648216485977173},{"id":"https://openalex.org/C2777267654","wikidata":"https://www.wikidata.org/wiki/Q3519023","display_name":"Test (biology)","level":2,"score":0.5818305611610413},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5204727649688721},{"id":"https://openalex.org/C136764020","wikidata":"https://www.wikidata.org/wiki/Q466","display_name":"World Wide Web","level":1,"score":0.11894741654396057},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.08642655611038208},{"id":"https://openalex.org/C151730666","wikidata":"https://www.wikidata.org/wiki/Q7205","display_name":"Paleontology","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/vts.2013.6548914","is_oa":false,"landing_page_url":"https://doi.org/10.1109/vts.2013.6548914","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2013 IEEE 31st VLSI Test Symposium (VTS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":0,"referenced_works":[],"related_works":["https://openalex.org/W4391375266","https://openalex.org/W2748952813","https://openalex.org/W4230197055","https://openalex.org/W4296749040","https://openalex.org/W621808327","https://openalex.org/W644007644","https://openalex.org/W2497198634","https://openalex.org/W3012257603","https://openalex.org/W1586784764","https://openalex.org/W4292264782"],"abstract_inverted_index":{"Test":[0],"compression":[1,42,257,268,343],"has":[2,177],"become":[3],"a":[4,67,118,172,341],"requirement":[5],"for":[6,82,90,122,270,299,328],"many":[7,230],"designs":[8,125,184],"to":[9,77,141,166,197,233,316,339,367],"meet":[10],"the":[11,31,37,49,75,133,241,311,330,346],"required":[12],"test":[13,18,23,41,64,71,143,147,153,174,200,212,223,235,308,331],"quality":[14,65,148],"levels":[15],"in":[16,70,131,139,181,219,240,345],"reasonable":[17],"times":[19],"and":[20,33,58,96,135,214,237,310,362],"with":[21,93,203,255,353,370],"acceptable":[22],"cost.":[24],"This":[25,158],"session":[26],"will":[27,47,228,290,296,324,348],"cover":[28,325],"some":[29,280,360],"of":[30,40,55,61,170,243,247,264,282,288,313],"tradeoffs":[32,281,363],"options":[34],"available":[35],"from":[36,74,275,303],"broad":[38],"spectrum":[39],"solutions.":[43],"The":[44,225,321],"first":[45],"talk":[46,227],"address":[48],"difficulty":[50],"when":[51],"testing":[52,91],"large":[53],"numbers":[54],"logic":[56,258,269,302],"blocks":[57],"processor":[59,183],"cores":[60],"maintaining":[62],"high":[63],"without":[66,145,210],"requisite":[68],"increase":[69],"cost":[72,144],"stemming":[73],"need":[76,366],"allocate":[78],"substantially":[79],"more":[80,87],"pins":[81,89,108,201],"digital":[83],"test.":[84],"Simply":[85],"adding":[86],"chip-level":[88],"conflicts":[92],"packaging":[94],"constraints":[95,361],"can":[97],"potentially":[98],"undermine":[99],"other":[100,294],"cost-saving":[101],"techniques":[102,232],"that":[103,126,176,364],"rely":[104],"on":[105,334],"utilizing":[106],"fewer":[107],"such":[109],"as":[110,167,185,187],"multi-site":[111],"testing.":[112],"What":[113],"is":[114,117],"needed":[115],"instead":[116,263,287],"DFT":[119,163,231],"strategy":[120,130],"optimized":[121,162],"complex":[123,188],"SOC":[124,189],"use":[127],"multicore":[128,182],"processors-a":[129],"which":[132],"architecture":[134],"automation":[136],"elements":[137],"work":[138,338],"tandem":[140],"lower":[142],"compromising":[146,211],"or":[149,205],"significantly":[150,202],"increasing":[151],"automatic":[152],"pattern":[154],"generation":[155],"(ATPG)":[156],"runtime.":[157],"presentation":[159,323],"highlights":[160],"an":[161],"architecture,":[164],"referred":[165],"\"shared":[168],"I/O\"":[169],"DFTMAX,":[171],"synthesis-based":[173],"solution":[175],"been":[178],"used":[179],"successfully":[180],"well":[186],"designs.":[190],"Using":[191],"this":[192],"approach,":[193],"they":[194],"were":[195],"able":[196],"reduce":[198,234,317],"scan":[199,222,253,267,273],"similar":[204],"even":[206],"less":[207],"ATPG":[208,318],"patterns,":[209],"coverage,":[213],"achieve":[215,340],"over":[216],"2X":[217],"reduction":[218],"wafer":[220],"level":[221],"time.":[224],"second":[226],"present":[229],"time":[236],"improve":[238],"coverage":[239],"context":[242],"core":[244],"wrapping.":[245],"Some":[246,293,337],"these":[248],"methods":[249,295],"include":[250],"using":[251,283],"external":[252,272],"chains":[254,274],"separate":[256],"inside":[259],"each":[260],"place-and-route":[261],"block":[262],"having":[265],"'chip-top'":[266],"all":[271],"different":[276,335],"place-and-route.":[277],"In":[278],"addition,":[279],"dynamic":[284],"launch-on-shift/launch-on-capture":[285],"(LOS/LOC)":[286],"static":[289],"be":[291,297,350,368],"covered.":[292],"covered":[298],"preventing":[300],"decompressor":[301],"feeding":[304],"X'es":[305],"during":[306],"launch-on-shift":[307],"patterns":[309],"benefits":[312],"control":[314],"test-points":[315],"vector":[319],"counts.":[320],"final":[322],"various":[326],"methodologies":[327],"reducing":[329],"data":[332],"volume":[333],"chips.":[336],"higher":[342],"ratio":[344],"future":[347],"also":[349,365],"discussed.":[351],"As":[352],"any":[354],"good":[355],"engineering":[356],"solution,":[357],"there":[358],"are":[359],"considered":[369],"those":[371],"choices.":[372]},"counts_by_year":[],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}