{"id":"https://openalex.org/W2083382522","doi":"https://doi.org/10.1109/vts.2013.6548912","title":"A programmable BIST design for PLL static phase offset estimation and clock duty cycle detection","display_name":"A programmable BIST design for PLL static phase offset estimation and clock duty cycle detection","publication_year":2013,"publication_date":"2013-04-01","ids":{"openalex":"https://openalex.org/W2083382522","doi":"https://doi.org/10.1109/vts.2013.6548912","mag":"2083382522"},"language":"en","primary_location":{"id":"doi:10.1109/vts.2013.6548912","is_oa":false,"landing_page_url":"https://doi.org/10.1109/vts.2013.6548912","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2013 IEEE 31st VLSI Test Symposium (VTS)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5057478744","display_name":"Sen-Wen Hsiao","orcid":null},"institutions":[{"id":"https://openalex.org/I130701444","display_name":"Georgia Institute of Technology","ror":"https://ror.org/01zkghx44","country_code":"US","type":"education","lineage":["https://openalex.org/I130701444"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Sen-Wen Hsiao","raw_affiliation_strings":["School of Electrical and Computer Engineering, Georgia Institute of Technology, Atlanta, GA, USA","Sch. of Electr. & Comput. Eng., Georgia Inst. of Technol. Atlanta, Atlanta, GA, USA"],"affiliations":[{"raw_affiliation_string":"School of Electrical and Computer Engineering, Georgia Institute of Technology, Atlanta, GA, USA","institution_ids":["https://openalex.org/I130701444"]},{"raw_affiliation_string":"Sch. of Electr. & Comput. Eng., Georgia Inst. of Technol. Atlanta, Atlanta, GA, USA","institution_ids":["https://openalex.org/I130701444"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5024799302","display_name":"Nicholas Tzou","orcid":null},"institutions":[{"id":"https://openalex.org/I130701444","display_name":"Georgia Institute of Technology","ror":"https://ror.org/01zkghx44","country_code":"US","type":"education","lineage":["https://openalex.org/I130701444"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Nicholas Tzou","raw_affiliation_strings":["School of Electrical and Computer Engineering, Georgia Institute of Technology, Atlanta, GA, USA","Sch. of Electr. & Comput. Eng., Georgia Inst. of Technol. Atlanta, Atlanta, GA, USA"],"affiliations":[{"raw_affiliation_string":"School of Electrical and Computer Engineering, Georgia Institute of Technology, Atlanta, GA, USA","institution_ids":["https://openalex.org/I130701444"]},{"raw_affiliation_string":"Sch. of Electr. & Comput. Eng., Georgia Inst. of Technol. Atlanta, Atlanta, GA, USA","institution_ids":["https://openalex.org/I130701444"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5103180343","display_name":"A. Chatterjee","orcid":"https://orcid.org/0000-0002-2856-0160"},"institutions":[{"id":"https://openalex.org/I130701444","display_name":"Georgia Institute of Technology","ror":"https://ror.org/01zkghx44","country_code":"US","type":"education","lineage":["https://openalex.org/I130701444"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"A. Chatterjee","raw_affiliation_strings":["School of Electrical and Computer Engineering, Georgia Institute of Technology, Atlanta, GA, USA","Sch. of Electr. & Comput. Eng., Georgia Inst. of Technol. Atlanta, Atlanta, GA, USA"],"affiliations":[{"raw_affiliation_string":"School of Electrical and Computer Engineering, Georgia Institute of Technology, Atlanta, GA, USA","institution_ids":["https://openalex.org/I130701444"]},{"raw_affiliation_string":"Sch. of Electr. & Comput. Eng., Georgia Inst. of Technol. Atlanta, Atlanta, GA, USA","institution_ids":["https://openalex.org/I130701444"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5057478744"],"corresponding_institution_ids":["https://openalex.org/I130701444"],"apc_list":null,"apc_paid":null,"fwci":0.9458,"has_fulltext":false,"cited_by_count":8,"citation_normalized_percentile":{"value":0.79035597,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":96},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"6"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11417","display_name":"Advancements in PLL and VCO Technologies","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11417","display_name":"Advancements in PLL and VCO Technologies","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10187","display_name":"Radio Frequency Integrated Circuit Design","score":0.9980000257492065,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11444","display_name":"Electromagnetic Compatibility and Noise Suppression","score":0.9947999715805054,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/phase-locked-loop","display_name":"Phase-locked loop","score":0.8299477100372314},{"id":"https://openalex.org/keywords/jitter","display_name":"Jitter","score":0.7154688239097595},{"id":"https://openalex.org/keywords/offset","display_name":"Offset (computer science)","score":0.6255546808242798},{"id":"https://openalex.org/keywords/comparator","display_name":"Comparator","score":0.5835000276565552},{"id":"https://openalex.org/keywords/duty-cycle","display_name":"Duty cycle","score":0.5596064329147339},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.5523543953895569},{"id":"https://openalex.org/keywords/integrator","display_name":"Integrator","score":0.5334942936897278},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.46230804920196533},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.4516356587409973},{"id":"https://openalex.org/keywords/phase-detector","display_name":"Phase detector","score":0.44486409425735474},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.38348573446273804},{"id":"https://openalex.org/keywords/control-theory","display_name":"Control theory (sociology)","score":0.3491887152194977},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.3146345019340515},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.19421985745429993}],"concepts":[{"id":"https://openalex.org/C12707504","wikidata":"https://www.wikidata.org/wiki/Q52637","display_name":"Phase-locked loop","level":3,"score":0.8299477100372314},{"id":"https://openalex.org/C134652429","wikidata":"https://www.wikidata.org/wiki/Q1052698","display_name":"Jitter","level":2,"score":0.7154688239097595},{"id":"https://openalex.org/C175291020","wikidata":"https://www.wikidata.org/wiki/Q1156822","display_name":"Offset (computer science)","level":2,"score":0.6255546808242798},{"id":"https://openalex.org/C155745195","wikidata":"https://www.wikidata.org/wiki/Q1164179","display_name":"Comparator","level":3,"score":0.5835000276565552},{"id":"https://openalex.org/C199822604","wikidata":"https://www.wikidata.org/wiki/Q557120","display_name":"Duty cycle","level":3,"score":0.5596064329147339},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.5523543953895569},{"id":"https://openalex.org/C79518650","wikidata":"https://www.wikidata.org/wiki/Q2081431","display_name":"Integrator","level":3,"score":0.5334942936897278},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.46230804920196533},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4516356587409973},{"id":"https://openalex.org/C110086884","wikidata":"https://www.wikidata.org/wiki/Q2085341","display_name":"Phase detector","level":3,"score":0.44486409425735474},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.38348573446273804},{"id":"https://openalex.org/C47446073","wikidata":"https://www.wikidata.org/wiki/Q5165890","display_name":"Control theory (sociology)","level":3,"score":0.3491887152194977},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.3146345019340515},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.19421985745429993},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C2775924081","wikidata":"https://www.wikidata.org/wiki/Q55608371","display_name":"Control (management)","level":2,"score":0.0},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/vts.2013.6548912","is_oa":false,"landing_page_url":"https://doi.org/10.1109/vts.2013.6548912","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2013 IEEE 31st VLSI Test Symposium (VTS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy","score":0.8100000023841858}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":17,"referenced_works":["https://openalex.org/W1492059061","https://openalex.org/W1580654973","https://openalex.org/W1658809881","https://openalex.org/W1677884181","https://openalex.org/W2044055781","https://openalex.org/W2061322893","https://openalex.org/W2072192908","https://openalex.org/W2075632902","https://openalex.org/W2099126831","https://openalex.org/W2106535821","https://openalex.org/W2135281359","https://openalex.org/W2150684740","https://openalex.org/W2158180061","https://openalex.org/W2159758079","https://openalex.org/W2160667575","https://openalex.org/W4205520818","https://openalex.org/W4238947463"],"related_works":["https://openalex.org/W4386620376","https://openalex.org/W2295601265","https://openalex.org/W2148370333","https://openalex.org/W2936029881","https://openalex.org/W2096085680","https://openalex.org/W1978946573","https://openalex.org/W2908219865","https://openalex.org/W1153251241","https://openalex.org/W1576501709","https://openalex.org/W1990401855"],"abstract_inverted_index":{"Reference":[0],"spur":[1],"is":[2,147,156],"a":[3,21,42,72,103],"nonlinear":[4],"effect":[5],"and":[6,36,70,114,144,153,165],"important":[7],"specification":[8],"in":[9,89,102],"PLL":[10,49,105,142],"for":[11,48,63,77,93,119,159],"long":[12],"term":[13],"jitter.":[14],"Periodic":[15],"events":[16],"of":[17,60,80],"reference":[18,143],"clock":[19],"create":[20],"static":[22,50],"phase":[23,29,51,139],"offset":[24,30,52,140],"between":[25,141],"signals.":[26],"The":[27,55,97,122,138],"finite":[28],"comes":[31],"from":[32],"charge":[33],"pump":[34],"mismatch":[35,81],"layout":[37],"asymmetry.":[38],"This":[39],"paper":[40],"presents":[41],"built-in":[43],"self-test":[44],"(BIST)":[45],"circuit":[46,57],"applied":[47,158],"(SPO)":[53],"estimation.":[54],"proposed":[56],"takes":[58],"advantage":[59],"an":[61,78],"integrator":[62],"time-to-voltage":[64],"conversion":[65],"(TVC).":[66],"Along":[67],"with":[68,106],"comparators":[69],"counters,":[71],"BIST":[73],"can":[74,99,132],"be":[75,100,133],"constructed":[76],"estimation":[79],"ratio":[82],"down":[83],"to":[84],"1%":[85],"over":[86,135],"process":[87,136],"corners":[88],"simulation":[90],"(10":[91],"psec":[92],"lnsec":[94],"pulse":[95],"width).":[96],"calibration":[98],"operated":[101],"closed-loop":[104],"lock":[107],"signal.":[108],"Additional":[109],"circuits":[110],"including":[111],"delay":[112],"lines":[113],"non-inverting":[115],"amplifiers":[116],"are":[117,167],"designed":[118],"fast":[120],"calibration.":[121],"result":[123],"shows":[124],"at":[125],"least":[126],"27":[127],"times":[128],"faster":[129],"detection":[130],"speed":[131],"achieved":[134],"corners.":[137],"feedback":[145],"signal":[146],"essentially":[148],"the":[149,154],"duty":[150,160],"cycle":[151,161],"difference,":[152],"test":[155],"also":[157],"distortion.":[162],"Related":[163],"analysis":[164],"measurement":[166],"included.":[168]},"counts_by_year":[{"year":2020,"cited_by_count":1},{"year":2019,"cited_by_count":1},{"year":2018,"cited_by_count":1},{"year":2016,"cited_by_count":2},{"year":2014,"cited_by_count":1},{"year":2013,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}