{"id":"https://openalex.org/W2040576605","doi":"https://doi.org/10.1109/vts.2013.6548882","title":"Finding best voltage and frequency to shorten power-constrained test time","display_name":"Finding best voltage and frequency to shorten power-constrained test time","publication_year":2013,"publication_date":"2013-04-01","ids":{"openalex":"https://openalex.org/W2040576605","doi":"https://doi.org/10.1109/vts.2013.6548882","mag":"2040576605"},"language":"en","primary_location":{"id":"doi:10.1109/vts.2013.6548882","is_oa":false,"landing_page_url":"https://doi.org/10.1109/vts.2013.6548882","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2013 IEEE 31st VLSI Test Symposium (VTS)","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5080722961","display_name":"Praveen Venkataramani","orcid":null},"institutions":[{"id":"https://openalex.org/I82497590","display_name":"Auburn University","ror":"https://ror.org/02v80fc35","country_code":"US","type":"education","lineage":["https://openalex.org/I82497590"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"P. Venkataramani","raw_affiliation_strings":["Department of Electrical and Computer Engineering, Auburn University, Auburn, AL, USA","Dept. of Electr. & Comput. Eng, Auburn Univ., Auburn, AL, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, Auburn University, Auburn, AL, USA","institution_ids":["https://openalex.org/I82497590"]},{"raw_affiliation_string":"Dept. of Electr. & Comput. Eng, Auburn Univ., Auburn, AL, USA","institution_ids":["https://openalex.org/I82497590"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5074124067","display_name":"Suraj Sindia","orcid":null},"institutions":[{"id":"https://openalex.org/I82497590","display_name":"Auburn University","ror":"https://ror.org/02v80fc35","country_code":"US","type":"education","lineage":["https://openalex.org/I82497590"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"S. Sindia","raw_affiliation_strings":["Department of Electrical and Computer Engineering, Auburn University, Auburn, AL, USA","Dept. of Electr. & Comput. Eng, Auburn Univ., Auburn, AL, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, Auburn University, Auburn, AL, USA","institution_ids":["https://openalex.org/I82497590"]},{"raw_affiliation_string":"Dept. of Electr. & Comput. Eng, Auburn Univ., Auburn, AL, USA","institution_ids":["https://openalex.org/I82497590"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5084081268","display_name":"Vishwani D. Agrawal","orcid":"https://orcid.org/0000-0002-7121-5979"},"institutions":[{"id":"https://openalex.org/I82497590","display_name":"Auburn University","ror":"https://ror.org/02v80fc35","country_code":"US","type":"education","lineage":["https://openalex.org/I82497590"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"V. D. Agrawal","raw_affiliation_strings":["Department of Electrical and Computer Engineering, Auburn University, Auburn, AL, USA","Dept. of Electr. & Comput. Eng, Auburn Univ., Auburn, AL, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, Auburn University, Auburn, AL, USA","institution_ids":["https://openalex.org/I82497590"]},{"raw_affiliation_string":"Dept. of Electr. & Comput. Eng, Auburn Univ., Auburn, AL, USA","institution_ids":["https://openalex.org/I82497590"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I82497590"],"apc_list":null,"apc_paid":null,"fwci":null,"has_fulltext":false,"cited_by_count":11,"citation_normalized_percentile":null,"cited_by_percentile_year":null,"biblio":{"volume":"25","issue":null,"first_page":"1","last_page":"6"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/set","display_name":"Set (abstract data type)","score":0.43688854575157166},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.386813223361969},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.3805311918258667},{"id":"https://openalex.org/keywords/programming-language","display_name":"Programming language","score":0.07874542474746704}],"concepts":[{"id":"https://openalex.org/C177264268","wikidata":"https://www.wikidata.org/wiki/Q1514741","display_name":"Set (abstract data type)","level":2,"score":0.43688854575157166},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.386813223361969},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.3805311918258667},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.07874542474746704}],"mesh":[],"locations_count":3,"locations":[{"id":"doi:10.1109/vts.2013.6548882","is_oa":false,"landing_page_url":"https://doi.org/10.1109/vts.2013.6548882","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2013 IEEE 31st VLSI Test Symposium (VTS)","raw_type":"proceedings-article"},{"id":"pmh:oai:CiteSeerX.psu:10.1.1.295.1473","is_oa":false,"landing_page_url":"http://citeseerx.ist.psu.edu/viewdoc/summary?doi=10.1.1.295.1473","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"http://www.eng.auburn.edu/~vagrawal/TALKS/VTS13/01A-4.pdf","raw_type":"text"},{"id":"pmh:oai:CiteSeerX.psu:10.1.1.300.3576","is_oa":false,"landing_page_url":"http://citeseerx.ist.psu.edu/viewdoc/summary?doi=10.1.1.300.3576","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"http://www.eng.auburn.edu/~vagrawal/TALKS/VTS13/VTS13.pdf","raw_type":"text"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[{"id":"https://openalex.org/F4320306076","display_name":"National Science Foundation","ror":"https://ror.org/021nxhr62"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":19,"referenced_works":["https://openalex.org/W43040088","https://openalex.org/W1595368737","https://openalex.org/W1963987929","https://openalex.org/W2085955574","https://openalex.org/W2090376908","https://openalex.org/W2107996516","https://openalex.org/W2112497021","https://openalex.org/W2116424179","https://openalex.org/W2126152478","https://openalex.org/W2126872604","https://openalex.org/W2133079932","https://openalex.org/W2134067926","https://openalex.org/W2135615172","https://openalex.org/W2154258156","https://openalex.org/W2168572717","https://openalex.org/W2788886401","https://openalex.org/W6601734473","https://openalex.org/W6671980997","https://openalex.org/W6678897769"],"related_works":["https://openalex.org/W4391375266","https://openalex.org/W2748952813","https://openalex.org/W2051487156","https://openalex.org/W2073681303","https://openalex.org/W2390279801","https://openalex.org/W2358668433","https://openalex.org/W4396701345","https://openalex.org/W2376932109","https://openalex.org/W2001405890","https://openalex.org/W4396696052"],"abstract_inverted_index":{"In":[0],"a":[1,33],"digital":[2],"test,":[3],"supply":[4],"voltage":[5],"(V":[6],"<sub":[7,14,21,37,42,57,62,67,72,96,109,115,126],"xmlns:mml=\"http://www.w3.org/1998/Math/MathML\"":[8,15,22,38,43,58,63,68,73,97,110,116,127],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">DD</sub>":[9,59],"),":[10,17],"clock":[11],"frequency":[12],"(f":[13],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">test</sub>":[16,69,117],"peak":[18,100],"power":[19,101],"(P":[20],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">MAX</sub>":[23,39],")":[24],"and":[25,65,113],"test":[26,103,135,147,158],"time":[27,159],"(TT)":[28],"are":[29],"related":[30],"parameters.":[31],"For":[32],"given":[34],"limit":[35],"P":[36,41,108],"=":[40,60,70],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">MAX":[44,111],"func</sub>":[45,112],",":[46],"normally":[47],"set":[48],"by":[49,145],"functional":[50],"specification,":[51],"we":[52],"find":[53],"the":[54,84,99,121,157],"optimum":[55],"V":[56,61,95,125],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">DDopt</sub>":[64,98,128],"f":[66,71,114],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">opt</sub>":[74],"to":[75],"minimize":[76],"TT.":[77],"A":[78],"solution":[79],"is":[80,91,118],"derived":[81],"analytically":[82],"from":[83,141],"technology-dependent":[85],"characterization":[86],"of":[87,160],"semiconductor":[88],"devices.":[89],"It":[90],"shown":[92],"that":[93,120],"at":[94,124],"any":[102],"cycle":[104],"consumes":[105],"just":[106],"equals":[107],"fastest":[119],"critical":[122],"path":[123],"will":[129],"allow.":[130],"The":[131],"paper":[132],"demonstrates":[133],"how":[134],"parameters":[136],"can":[137,155],"be":[138],"obtained":[139],"numerically":[140],"MATLAB,":[142],"or":[143],"experimentally":[144],"bench":[146],"equipment":[148],"like":[149],"National":[150],"Instruments'":[151],"ELVIS.":[152],"This":[153],"optimization":[154],"cut":[156],"ISCAS'89":[161],"benchmarks":[162],"in":[163],"180nm":[164],"CMOS":[165],"into":[166],"half.":[167]},"counts_by_year":[{"year":2022,"cited_by_count":1},{"year":2017,"cited_by_count":1},{"year":2015,"cited_by_count":2},{"year":2014,"cited_by_count":4},{"year":2013,"cited_by_count":3}],"updated_date":"2026-07-14T23:27:15.235271","created_date":"2025-10-10T00:00:00"}