{"id":"https://openalex.org/W2089431461","doi":"https://doi.org/10.1109/vts.2012.6231106","title":"Net diagnosis using stuck-at and transition fault models","display_name":"Net diagnosis using stuck-at and transition fault models","publication_year":2012,"publication_date":"2012-04-01","ids":{"openalex":"https://openalex.org/W2089431461","doi":"https://doi.org/10.1109/vts.2012.6231106","mag":"2089431461"},"language":"en","primary_location":{"id":"doi:10.1109/vts.2012.6231106","is_oa":false,"landing_page_url":"https://doi.org/10.1109/vts.2012.6231106","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2012 IEEE 30th VLSI Test Symposium (VTS)","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":null,"display_name":"Lixing Zhao","orcid":null},"institutions":[{"id":"https://openalex.org/I4210146936","display_name":"Huawei Technologies (United States)","ror":"https://ror.org/03jyqk712","country_code":"US","type":"company","lineage":["https://openalex.org/I2250955327","https://openalex.org/I4210146936"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Lixing Zhao","raw_affiliation_strings":["FutureWei Tecnologies, Inc., Santa Clara, CA, USA","FutureWei Tecnologies, Inc., 2330 Central Expressway, Santa Clara, CA 95054 USA, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"FutureWei Tecnologies, Inc., Santa Clara, CA, USA","institution_ids":["https://openalex.org/I4210146936"]},{"raw_affiliation_string":"FutureWei Tecnologies, Inc., 2330 Central Expressway, Santa Clara, CA 95054 USA, USA","institution_ids":["https://openalex.org/I4210146936"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5084081268","display_name":"Vishwani D. Agrawal","orcid":"https://orcid.org/0000-0002-7121-5979"},"institutions":[{"id":"https://openalex.org/I82497590","display_name":"Auburn University","ror":"https://ror.org/02v80fc35","country_code":"US","type":"education","lineage":["https://openalex.org/I82497590"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Vishwani D. Agrawal","raw_affiliation_strings":["ECE Department, Aubum University, Auburn, AL, USA","Auburn University, ECE Department, 200 Broun Hall, AL 36849 USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"ECE Department, Aubum University, Auburn, AL, USA","institution_ids":["https://openalex.org/I82497590"]},{"raw_affiliation_string":"Auburn University, ECE Department, 200 Broun Hall, AL 36849 USA","institution_ids":["https://openalex.org/I82497590"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":null,"has_fulltext":false,"cited_by_count":10,"citation_normalized_percentile":null,"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"221","last_page":"226"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.996999979019165,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/ranking","display_name":"Ranking (information retrieval)","score":0.8218597173690796},{"id":"https://openalex.org/keywords/fault-detection-and-isolation","display_name":"Fault detection and isolation","score":0.5997305512428284},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.5808392763137817},{"id":"https://openalex.org/keywords/rank","display_name":"Rank (graph theory)","score":0.5571089386940002},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5464519262313843},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.5250329971313477},{"id":"https://openalex.org/keywords/fault-coverage","display_name":"Fault coverage","score":0.45260846614837646},{"id":"https://openalex.org/keywords/signal","display_name":"SIGNAL (programming language)","score":0.4284384250640869},{"id":"https://openalex.org/keywords/data-mining","display_name":"Data mining","score":0.33392268419265747},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.2786620855331421},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.27230361104011536},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.25147587060928345},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.24107861518859863}],"concepts":[{"id":"https://openalex.org/C189430467","wikidata":"https://www.wikidata.org/wiki/Q7293293","display_name":"Ranking (information retrieval)","level":2,"score":0.8218597173690796},{"id":"https://openalex.org/C152745839","wikidata":"https://www.wikidata.org/wiki/Q5438153","display_name":"Fault detection and isolation","level":3,"score":0.5997305512428284},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.5808392763137817},{"id":"https://openalex.org/C164226766","wikidata":"https://www.wikidata.org/wiki/Q7293202","display_name":"Rank (graph theory)","level":2,"score":0.5571089386940002},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5464519262313843},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.5250329971313477},{"id":"https://openalex.org/C126953365","wikidata":"https://www.wikidata.org/wiki/Q5438152","display_name":"Fault coverage","level":3,"score":0.45260846614837646},{"id":"https://openalex.org/C2779843651","wikidata":"https://www.wikidata.org/wiki/Q7390335","display_name":"SIGNAL (programming language)","level":2,"score":0.4284384250640869},{"id":"https://openalex.org/C124101348","wikidata":"https://www.wikidata.org/wiki/Q172491","display_name":"Data mining","level":1,"score":0.33392268419265747},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.2786620855331421},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.27230361104011536},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.25147587060928345},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.24107861518859863},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C114614502","wikidata":"https://www.wikidata.org/wiki/Q76592","display_name":"Combinatorics","level":1,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C172707124","wikidata":"https://www.wikidata.org/wiki/Q423488","display_name":"Actuator","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/vts.2012.6231106","is_oa":false,"landing_page_url":"https://doi.org/10.1109/vts.2012.6231106","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2012 IEEE 30th VLSI Test Symposium (VTS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":51,"referenced_works":["https://openalex.org/W12648890","https://openalex.org/W92532996","https://openalex.org/W164528542","https://openalex.org/W589537540","https://openalex.org/W1511688816","https://openalex.org/W1580093784","https://openalex.org/W1595368737","https://openalex.org/W1600468096","https://openalex.org/W1864256460","https://openalex.org/W1951780703","https://openalex.org/W2009138312","https://openalex.org/W2021463588","https://openalex.org/W2042343454","https://openalex.org/W2092357065","https://openalex.org/W2102173895","https://openalex.org/W2103509853","https://openalex.org/W2103935412","https://openalex.org/W2108420455","https://openalex.org/W2108914014","https://openalex.org/W2111599933","https://openalex.org/W2113518275","https://openalex.org/W2114564787","https://openalex.org/W2115005577","https://openalex.org/W2116906958","https://openalex.org/W2117253172","https://openalex.org/W2118910735","https://openalex.org/W2119205109","https://openalex.org/W2119779484","https://openalex.org/W2122516313","https://openalex.org/W2124025609","https://openalex.org/W2130108594","https://openalex.org/W2139971665","https://openalex.org/W2144570337","https://openalex.org/W2145235807","https://openalex.org/W2147576441","https://openalex.org/W2149949200","https://openalex.org/W2150674066","https://openalex.org/W2154462766","https://openalex.org/W2167634051","https://openalex.org/W2168349862","https://openalex.org/W2171012943","https://openalex.org/W2281835504","https://openalex.org/W2331993796","https://openalex.org/W2541135903","https://openalex.org/W2594402854","https://openalex.org/W3137092842","https://openalex.org/W3141419712","https://openalex.org/W4234217119","https://openalex.org/W6634610426","https://openalex.org/W6676465215","https://openalex.org/W6680952733"],"related_works":["https://openalex.org/W2188500270","https://openalex.org/W2303858293","https://openalex.org/W2915512527","https://openalex.org/W51364034","https://openalex.org/W2793336762","https://openalex.org/W2091548507","https://openalex.org/W2368816706","https://openalex.org/W3159414774","https://openalex.org/W3160516639","https://openalex.org/W2383699822"],"abstract_inverted_index":{"Given":[0],"the":[1,21,31,44,107,126],"test":[2,45],"output":[3,23],"from":[4],"a":[5,39,89],"defective":[6],"digital":[7],"circuit,":[8],"we":[9,26],"identify":[10],"one":[11],"or":[12,141,148],"more":[13,80],"faulty":[14,180],"signal":[15],"nets":[16,150],"that":[17],"may":[18],"have":[19],"caused":[20],"observed":[22],"results.":[24],"Although":[25],"make":[27],"no":[28],"assumption":[29],"about":[30],"actual":[32],"defect,":[33],"our":[34,167],"diagnosis":[35,168],"is":[36,111,122],"based":[37,124],"upon":[38],"dictionary":[40],"pre-generated":[41],"by":[42,113,137,158],"simulating":[43],"vectors":[46],"for":[47,118],"their":[48],"detection":[49],"of":[50,128],"collapsed":[51],"single":[52,147,160,177],"stuck-at":[53,140,161],"and":[54,67,75,88,96,162,173,178],"transition":[55,142,163],"faults":[56,131,144,164],"at":[57],"each":[58],"primary":[59],"output.":[60],"First,":[61],"novel":[62],"three-stage":[63],"candidate":[64,68,77,109,120],"filtering":[65],"system":[66,70],"ranking":[69,82,90],"are":[71,100],"proposed":[72],"to":[73,85],"reduce":[74],"rank":[76,117],"faults.":[78,115],"A":[79,116],"balanced":[81],"method":[83],"compared":[84],"previous":[86],"works":[87],"strategy":[91],"which":[92],"combined":[93],"both":[94],"overall":[95],"per-test":[97],"performance":[98],"together":[99],"used":[101],"in":[102,151,175],"these":[103],"two":[104],"systems.":[105],"Then,":[106],"ranked":[108],"list":[110],"expanded":[112],"uncollapsing":[114],"every":[119],"net":[121],"calculated":[123],"on":[125,132,145],"number":[127],"top-ranked":[129],"suspected":[130],"it.":[133],"Experiments":[134],"were":[135,165],"conducted":[136],"injecting":[138],"multiple":[139],"delay":[143],"either":[146],"double":[149,179],"certain":[152],"ISCAS85":[153],"circuit.":[154],"When":[155],"tests":[156],"generated":[157],"targeting":[159],"used,":[166],"algorithm":[169],"shows":[170],"good":[171],"diagnosability":[172],"resolution":[174],"identifying":[176],"nets.":[181]},"counts_by_year":[{"year":2025,"cited_by_count":2},{"year":2023,"cited_by_count":1},{"year":2020,"cited_by_count":1},{"year":2015,"cited_by_count":1},{"year":2014,"cited_by_count":1},{"year":2013,"cited_by_count":2},{"year":2012,"cited_by_count":2}],"updated_date":"2026-07-14T23:27:15.235271","created_date":"2025-10-10T00:00:00"}