{"id":"https://openalex.org/W2040929218","doi":"https://doi.org/10.1109/vts.2012.6231098","title":"SAT-ATPG using preferences for improved detection of complex defect mechanisms","display_name":"SAT-ATPG using preferences for improved detection of complex defect mechanisms","publication_year":2012,"publication_date":"2012-04-01","ids":{"openalex":"https://openalex.org/W2040929218","doi":"https://doi.org/10.1109/vts.2012.6231098","mag":"2040929218"},"language":"en","primary_location":{"id":"doi:10.1109/vts.2012.6231098","is_oa":false,"landing_page_url":"https://doi.org/10.1109/vts.2012.6231098","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2012 IEEE 30th VLSI Test Symposium (VTS)","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5109113395","display_name":"Alexander Czutro","orcid":null},"institutions":[{"id":"https://openalex.org/I161046081","display_name":"University of Freiburg","ror":"https://ror.org/0245cg223","country_code":"DE","type":"education","lineage":["https://openalex.org/I161046081"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Alexander Czutro","raw_affiliation_strings":["Albert Ludwigs University of Freiburg, Freiburg im Breisgau, Germany","Albert-Ludwigs-University Freiburg, Georges-K\u00f6hler-Allee 051, 79110, Germany"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Albert Ludwigs University of Freiburg, Freiburg im Breisgau, Germany","institution_ids":["https://openalex.org/I161046081"]},{"raw_affiliation_string":"Albert-Ludwigs-University Freiburg, Georges-K\u00f6hler-Allee 051, 79110, Germany","institution_ids":["https://openalex.org/I161046081"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5111203264","display_name":"Matthias Sauer","orcid":null},"institutions":[{"id":"https://openalex.org/I161046081","display_name":"University of Freiburg","ror":"https://ror.org/0245cg223","country_code":"DE","type":"education","lineage":["https://openalex.org/I161046081"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Matthias Sauer","raw_affiliation_strings":["Albert Ludwigs University of Freiburg, Freiburg im Breisgau, Germany","Albert-Ludwigs-University Freiburg, Georges-K\u00f6hler-Allee 051, 79110, Germany"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Albert Ludwigs University of Freiburg, Freiburg im Breisgau, Germany","institution_ids":["https://openalex.org/I161046081"]},{"raw_affiliation_string":"Albert-Ludwigs-University Freiburg, Georges-K\u00f6hler-Allee 051, 79110, Germany","institution_ids":["https://openalex.org/I161046081"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5102124603","display_name":"Tobias Schubert","orcid":null},"institutions":[{"id":"https://openalex.org/I161046081","display_name":"University of Freiburg","ror":"https://ror.org/0245cg223","country_code":"DE","type":"education","lineage":["https://openalex.org/I161046081"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Tobias Schubert","raw_affiliation_strings":["Albert Ludwigs University of Freiburg, Freiburg im Breisgau, Germany","Albert-Ludwigs-University Freiburg, Georges-K\u00f6hler-Allee 051, 79110, Germany"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Albert Ludwigs University of Freiburg, Freiburg im Breisgau, Germany","institution_ids":["https://openalex.org/I161046081"]},{"raw_affiliation_string":"Albert-Ludwigs-University Freiburg, Georges-K\u00f6hler-Allee 051, 79110, Germany","institution_ids":["https://openalex.org/I161046081"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5027416202","display_name":"Ilia Polian","orcid":"https://orcid.org/0000-0002-6563-2725"},"institutions":[{"id":"https://openalex.org/I186354981","display_name":"University of Passau","ror":"https://ror.org/05ydjnb78","country_code":"DE","type":"education","lineage":["https://openalex.org/I186354981"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Ilia Polian","raw_affiliation_strings":["University of Passau, Passau, Germany","University of Passau, Innstra\u00dfe 43, 94032, Germany"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"University of Passau, Passau, Germany","institution_ids":["https://openalex.org/I186354981"]},{"raw_affiliation_string":"University of Passau, Innstra\u00dfe 43, 94032, Germany","institution_ids":["https://openalex.org/I186354981"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5038861833","display_name":"Bernd Becker","orcid":"https://orcid.org/0000-0003-4031-3258"},"institutions":[{"id":"https://openalex.org/I161046081","display_name":"University of Freiburg","ror":"https://ror.org/0245cg223","country_code":"DE","type":"education","lineage":["https://openalex.org/I161046081"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Bernd Becker","raw_affiliation_strings":["Albert Ludwigs University of Freiburg, Freiburg im Breisgau, Germany","Albert-Ludwigs-University Freiburg, Georges-K\u00f6hler-Allee 051, 79110, Germany"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Albert Ludwigs University of Freiburg, Freiburg im Breisgau, Germany","institution_ids":["https://openalex.org/I161046081"]},{"raw_affiliation_string":"Albert-Ludwigs-University Freiburg, Georges-K\u00f6hler-Allee 051, 79110, Germany","institution_ids":["https://openalex.org/I161046081"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":null,"has_fulltext":false,"cited_by_count":13,"citation_normalized_percentile":null,"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"170","last_page":"175"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9988999962806702,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9843999743461609,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/automatic-test-pattern-generation","display_name":"Automatic test pattern generation","score":0.6700900793075562},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6483415365219116},{"id":"https://openalex.org/keywords/suite","display_name":"Suite","score":0.4665966033935547},{"id":"https://openalex.org/keywords/cluster-analysis","display_name":"Cluster analysis","score":0.45952850580215454},{"id":"https://openalex.org/keywords/set","display_name":"Set (abstract data type)","score":0.44985827803611755},{"id":"https://openalex.org/keywords/fault-coverage","display_name":"Fault coverage","score":0.43815308809280396},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.33699384331703186},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.19849303364753723},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.1930389106273651},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.0970396101474762}],"concepts":[{"id":"https://openalex.org/C17626397","wikidata":"https://www.wikidata.org/wiki/Q837455","display_name":"Automatic test pattern generation","level":3,"score":0.6700900793075562},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6483415365219116},{"id":"https://openalex.org/C79581498","wikidata":"https://www.wikidata.org/wiki/Q1367530","display_name":"Suite","level":2,"score":0.4665966033935547},{"id":"https://openalex.org/C73555534","wikidata":"https://www.wikidata.org/wiki/Q622825","display_name":"Cluster analysis","level":2,"score":0.45952850580215454},{"id":"https://openalex.org/C177264268","wikidata":"https://www.wikidata.org/wiki/Q1514741","display_name":"Set (abstract data type)","level":2,"score":0.44985827803611755},{"id":"https://openalex.org/C126953365","wikidata":"https://www.wikidata.org/wiki/Q5438152","display_name":"Fault coverage","level":3,"score":0.43815308809280396},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.33699384331703186},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.19849303364753723},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.1930389106273651},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.0970396101474762},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C95457728","wikidata":"https://www.wikidata.org/wiki/Q309","display_name":"History","level":0,"score":0.0},{"id":"https://openalex.org/C166957645","wikidata":"https://www.wikidata.org/wiki/Q23498","display_name":"Archaeology","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/vts.2012.6231098","is_oa":false,"landing_page_url":"https://doi.org/10.1109/vts.2012.6231098","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2012 IEEE 30th VLSI Test Symposium (VTS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[{"id":"https://openalex.org/F4320320879","display_name":"Deutsche Forschungsgemeinschaft","ror":"https://ror.org/018mejw64"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":26,"referenced_works":["https://openalex.org/W1561842830","https://openalex.org/W1961788500","https://openalex.org/W1970933103","https://openalex.org/W1981134393","https://openalex.org/W1987383048","https://openalex.org/W1990971075","https://openalex.org/W2009778415","https://openalex.org/W2070302634","https://openalex.org/W2096146619","https://openalex.org/W2097410912","https://openalex.org/W2098169468","https://openalex.org/W2102355929","https://openalex.org/W2103967987","https://openalex.org/W2108103162","https://openalex.org/W2108914014","https://openalex.org/W2110395803","https://openalex.org/W2127346720","https://openalex.org/W2135613306","https://openalex.org/W2140289669","https://openalex.org/W2142852319","https://openalex.org/W2144225402","https://openalex.org/W2156640787","https://openalex.org/W2157356693","https://openalex.org/W2159564843","https://openalex.org/W2164152101","https://openalex.org/W2169468177"],"related_works":["https://openalex.org/W2091833418","https://openalex.org/W2913077774","https://openalex.org/W4256030018","https://openalex.org/W2145089576","https://openalex.org/W2021253405","https://openalex.org/W1986228509","https://openalex.org/W2147400189","https://openalex.org/W1600468096","https://openalex.org/W2340957901","https://openalex.org/W1991935474"],"abstract_inverted_index":{"Failures":[0],"caused":[1],"by":[2,132,162],"phenomena":[3],"such":[4,21],"as":[5,111,116,122],"crosstalk":[6],"or":[7],"power-supply":[8],"noise":[9],"are":[10,128],"gaining":[11],"in":[12,14,79,154],"importance":[13],"advanced":[15],"nanoscale":[16],"technologies.":[17],"The":[18,107],"detection":[19],"of":[20,28,39,68,104,113,157],"complex":[22],"defects":[23],"benefits":[24],"from":[25],"the":[26,40,50,82,146],"satisfaction":[27],"certain":[29],"constraints,":[30],"for":[31,81,95],"instance":[32],"justifying":[33],"specific":[34],"transitions":[35],"on":[36,72],"neighbouring":[37],"lines":[38],"defect":[41],"location.":[42],"We":[43],"present":[44],"a":[45,66,102,119,137,155],"SAT-based":[46],"ATPG-tool":[47],"that":[48,91],"supports":[49],"enhanced":[51],"conditional":[52],"multiple-stuck-at":[53],"fault":[54,62,83],"model":[55,58],"(ECMS@).":[56],"This":[57],"can":[59,98],"specify":[60],"multiple":[61],"locations":[63],"along":[64],"with":[65,124],"set":[67,103],"hard":[69,75],"conditions":[70,76,115],"imposed":[71],"arbitrary":[73],"lines;":[74],"must":[77],"hold":[78],"order":[80],"effect":[84],"to":[85,144,149,164],"become":[86],"active.":[87],"Additionally,":[88],"optimisation":[89],"constraints":[90],"may":[92],"be":[93,99],"required":[94,148],"best":[96],"coverage":[97],"specified":[100],"via":[101],"soft":[105],"conditions.":[106],"introduced":[108],"tool":[109],"justifies":[110],"many":[112],"these":[114],"possible,":[117],"using":[118],"mechanism":[120],"known":[121],"SAT":[123],"preferences.":[125],"Several":[126],"applications":[127],"discussed":[129],"and":[130],"evaluated":[131],"extensive":[133],"experimental":[134],"data.":[135],"Furthermore,":[136],"novel":[138],"fault-clustering":[139],"technique":[140],"is":[141],"introduced,":[142],"thanks":[143],"which":[145],"time":[147],"classify":[150],"all":[151],"stuck-at":[152],"faults":[153],"suite":[156],"industrial":[158],"benchmarks":[159],"was":[160],"reduced":[161],"up":[163],"65%.":[165]},"counts_by_year":[{"year":2019,"cited_by_count":1},{"year":2016,"cited_by_count":1},{"year":2015,"cited_by_count":1},{"year":2014,"cited_by_count":4},{"year":2013,"cited_by_count":2},{"year":2012,"cited_by_count":4}],"updated_date":"2026-07-14T23:27:15.235271","created_date":"2025-10-10T00:00:00"}