{"id":"https://openalex.org/W2055260121","doi":"https://doi.org/10.1109/vts.2012.6231093","title":"Dual-frequency incoherent subsampling driven test response acquisition of spectrally sparse wideband signals with enhanced time resolution","display_name":"Dual-frequency incoherent subsampling driven test response acquisition of spectrally sparse wideband signals with enhanced time resolution","publication_year":2012,"publication_date":"2012-04-01","ids":{"openalex":"https://openalex.org/W2055260121","doi":"https://doi.org/10.1109/vts.2012.6231093","mag":"2055260121"},"language":"en","primary_location":{"id":"doi:10.1109/vts.2012.6231093","is_oa":false,"landing_page_url":"https://doi.org/10.1109/vts.2012.6231093","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2012 IEEE 30th VLSI Test Symposium (VTS)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5024799302","display_name":"Nicholas Tzou","orcid":null},"institutions":[{"id":"https://openalex.org/I130701444","display_name":"Georgia Institute of Technology","ror":"https://ror.org/01zkghx44","country_code":"US","type":"education","lineage":["https://openalex.org/I130701444"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Nicholas Tzou","raw_affiliation_strings":["School of ECE, Georgia Tech, USA"],"affiliations":[{"raw_affiliation_string":"School of ECE, Georgia Tech, USA","institution_ids":["https://openalex.org/I130701444"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5008840067","display_name":"Thomas W. Moon","orcid":"https://orcid.org/0000-0001-8256-1183"},"institutions":[{"id":"https://openalex.org/I130701444","display_name":"Georgia Institute of Technology","ror":"https://ror.org/01zkghx44","country_code":"US","type":"education","lineage":["https://openalex.org/I130701444"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Thomas Moon","raw_affiliation_strings":["School of ECE, Georgia Tech, USA"],"affiliations":[{"raw_affiliation_string":"School of ECE, Georgia Tech, USA","institution_ids":["https://openalex.org/I130701444"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5048916001","display_name":"Wang Xian","orcid":"https://orcid.org/0000-0002-2313-5309"},"institutions":[{"id":"https://openalex.org/I130701444","display_name":"Georgia Institute of Technology","ror":"https://ror.org/01zkghx44","country_code":"US","type":"education","lineage":["https://openalex.org/I130701444"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Xian Wang","raw_affiliation_strings":["School of ECE, Georgia Tech, USA"],"affiliations":[{"raw_affiliation_string":"School of ECE, Georgia Tech, USA","institution_ids":["https://openalex.org/I130701444"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5017180010","display_name":"Hyun Choi","orcid":"https://orcid.org/0000-0002-6963-3004"},"institutions":[{"id":"https://openalex.org/I2250650973","display_name":"Samsung (South Korea)","ror":"https://ror.org/04w3jy968","country_code":"KR","type":"company","lineage":["https://openalex.org/I2250650973"]},{"id":"https://openalex.org/I130701444","display_name":"Georgia Institute of Technology","ror":"https://ror.org/01zkghx44","country_code":"US","type":"education","lineage":["https://openalex.org/I130701444"]}],"countries":["KR","US"],"is_corresponding":false,"raw_author_name":"Hyun Choi","raw_affiliation_strings":["Samsung Electronics Limited, South Korea","School of ECE, Georgia Tech, USA"],"affiliations":[{"raw_affiliation_string":"Samsung Electronics Limited, South Korea","institution_ids":["https://openalex.org/I2250650973"]},{"raw_affiliation_string":"School of ECE, Georgia Tech, USA","institution_ids":["https://openalex.org/I130701444"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5069579193","display_name":"Abhijit Chatterjee","orcid":"https://orcid.org/0000-0003-1553-4470"},"institutions":[{"id":"https://openalex.org/I130701444","display_name":"Georgia Institute of Technology","ror":"https://ror.org/01zkghx44","country_code":"US","type":"education","lineage":["https://openalex.org/I130701444"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Abhijit Chatterjee","raw_affiliation_strings":["School of ECE, Georgia Tech, USA"],"affiliations":[{"raw_affiliation_string":"School of ECE, Georgia Tech, USA","institution_ids":["https://openalex.org/I130701444"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5024799302"],"corresponding_institution_ids":["https://openalex.org/I130701444"],"apc_list":null,"apc_paid":null,"fwci":0.3429,"has_fulltext":false,"cited_by_count":3,"citation_normalized_percentile":{"value":0.61940743,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":96},"biblio":{"volume":"73","issue":null,"first_page":"140","last_page":"145"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10500","display_name":"Sparse and Compressive Sensing Techniques","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2206","display_name":"Computational Mechanics"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10500","display_name":"Sparse and Compressive Sensing Techniques","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2206","display_name":"Computational Mechanics"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11447","display_name":"Blind Source Separation Techniques","score":0.9983000159263611,"subfield":{"id":"https://openalex.org/subfields/1711","display_name":"Signal Processing"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/compressed-sensing","display_name":"Compressed sensing","score":0.7093579769134521},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6758019924163818},{"id":"https://openalex.org/keywords/wideband","display_name":"Wideband","score":0.6618046164512634},{"id":"https://openalex.org/keywords/sampling","display_name":"Sampling (signal processing)","score":0.6479452848434448},{"id":"https://openalex.org/keywords/signal-reconstruction","display_name":"Signal reconstruction","score":0.6363111734390259},{"id":"https://openalex.org/keywords/coherent-sampling","display_name":"Coherent sampling","score":0.5716853141784668},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.5109128355979919},{"id":"https://openalex.org/keywords/waveform","display_name":"Waveform","score":0.488178551197052},{"id":"https://openalex.org/keywords/time\u2013frequency-analysis","display_name":"Time\u2013frequency analysis","score":0.4644456207752228},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.43286556005477905},{"id":"https://openalex.org/keywords/signal","display_name":"SIGNAL (programming language)","score":0.4124421179294586},{"id":"https://openalex.org/keywords/signal-processing","display_name":"Signal processing","score":0.3697916865348816},{"id":"https://openalex.org/keywords/digital-signal-processing","display_name":"Digital signal processing","score":0.2886956036090851},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.17154625058174133},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.1524263322353363},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.14099866151809692},{"id":"https://openalex.org/keywords/computer-vision","display_name":"Computer vision","score":0.1142512857913971},{"id":"https://openalex.org/keywords/filter","display_name":"Filter (signal processing)","score":0.10063651204109192}],"concepts":[{"id":"https://openalex.org/C124851039","wikidata":"https://www.wikidata.org/wiki/Q2665459","display_name":"Compressed sensing","level":2,"score":0.7093579769134521},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6758019924163818},{"id":"https://openalex.org/C2780202535","wikidata":"https://www.wikidata.org/wiki/Q4524457","display_name":"Wideband","level":2,"score":0.6618046164512634},{"id":"https://openalex.org/C140779682","wikidata":"https://www.wikidata.org/wiki/Q210868","display_name":"Sampling (signal processing)","level":3,"score":0.6479452848434448},{"id":"https://openalex.org/C70958404","wikidata":"https://www.wikidata.org/wiki/Q7512728","display_name":"Signal reconstruction","level":4,"score":0.6363111734390259},{"id":"https://openalex.org/C31942786","wikidata":"https://www.wikidata.org/wiki/Q679800","display_name":"Coherent sampling","level":4,"score":0.5716853141784668},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.5109128355979919},{"id":"https://openalex.org/C197424946","wikidata":"https://www.wikidata.org/wiki/Q1165717","display_name":"Waveform","level":3,"score":0.488178551197052},{"id":"https://openalex.org/C142433447","wikidata":"https://www.wikidata.org/wiki/Q7806653","display_name":"Time\u2013frequency analysis","level":3,"score":0.4644456207752228},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.43286556005477905},{"id":"https://openalex.org/C2779843651","wikidata":"https://www.wikidata.org/wiki/Q7390335","display_name":"SIGNAL (programming language)","level":2,"score":0.4124421179294586},{"id":"https://openalex.org/C104267543","wikidata":"https://www.wikidata.org/wiki/Q208163","display_name":"Signal processing","level":3,"score":0.3697916865348816},{"id":"https://openalex.org/C84462506","wikidata":"https://www.wikidata.org/wiki/Q173142","display_name":"Digital signal processing","level":2,"score":0.2886956036090851},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.17154625058174133},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.1524263322353363},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.14099866151809692},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.1142512857913971},{"id":"https://openalex.org/C106131492","wikidata":"https://www.wikidata.org/wiki/Q3072260","display_name":"Filter (signal processing)","level":2,"score":0.10063651204109192},{"id":"https://openalex.org/C554190296","wikidata":"https://www.wikidata.org/wiki/Q47528","display_name":"Radar","level":2,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/vts.2012.6231093","is_oa":false,"landing_page_url":"https://doi.org/10.1109/vts.2012.6231093","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2012 IEEE 30th VLSI Test Symposium (VTS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[{"id":"https://openalex.org/F4320332195","display_name":"Samsung","ror":"https://ror.org/04w3jy968"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":18,"referenced_works":["https://openalex.org/W1985324531","https://openalex.org/W1993534261","https://openalex.org/W2014153177","https://openalex.org/W2050826786","https://openalex.org/W2101675075","https://openalex.org/W2103164394","https://openalex.org/W2103885650","https://openalex.org/W2106661578","https://openalex.org/W2110140246","https://openalex.org/W2119667497","https://openalex.org/W2122548617","https://openalex.org/W2123629701","https://openalex.org/W2133285942","https://openalex.org/W2137673544","https://openalex.org/W2168156431","https://openalex.org/W2950398214","https://openalex.org/W3144686578","https://openalex.org/W3145458642"],"related_works":["https://openalex.org/W2378166785","https://openalex.org/W1483997978","https://openalex.org/W2611619770","https://openalex.org/W2541626582","https://openalex.org/W2156466545","https://openalex.org/W3104324607","https://openalex.org/W4206981968","https://openalex.org/W1987102304","https://openalex.org/W4200358983","https://openalex.org/W2379468505"],"abstract_inverted_index":{"In":[0,120],"this":[1],"paper,":[2],"we":[3],"propose":[4],"a":[5,65],"new":[6],"test":[7],"response":[8],"acquisition":[9],"technique":[10,24,108],"for":[11],"high-speed":[12],"devices-based":[13],"on":[14],"dual-frequency":[15],"incoherent":[16],"sub-sampling":[17],"and":[18,36,59,132,148],"sparse":[19,29,156],"signal":[20,104,149],"reconstruction.":[21],"The":[22,51],"proposed":[23,78,107],"enables":[25,152],"reconstruction":[26,150],"of":[27,112,124,139,145,154],"spectrally":[28,155],"wideband":[30,157],"signals":[31,35,158],"such":[32],"as":[33,46],"multi-tone":[34],"short":[37],"pseudo-random":[38],"bit":[39],"sequences":[40],"(PRBS)":[41],"with":[42,64,159],"enhanced":[43,160],"time/frequency":[44,161],"resolution":[45],"opposed":[47],"to":[48,71,83],"current":[49],"methods.":[50],"sampling":[52,61,74,94,118,146],"hardware":[53,79,147],"utilizes":[54],"dual":[55],"analog-to-digital":[56],"converters":[57],"(ADCs)":[58],"dedicated":[60],"frequency":[62,67],"synthesizers":[63],"common":[66],"reference.":[68],"As":[69],"compared":[70],"other":[72],"compressive":[73],"architectures":[75],"[1],":[76],"the":[77,106,122],"architecture":[80],"is":[81],"easy":[82],"implement":[84],"at":[85],"low":[86],"cost":[87],"since":[88],"it":[89],"does":[90],"not":[91],"require":[92],"accurate":[93],"clock":[95],"phase":[96],"adjustment":[97],"or":[98],"random":[99],"timing":[100],"generation.":[101],"For":[102],"digital":[103],"reconstruction,":[105],"requires":[109],"less":[110],"number":[111],"waveform":[113],"samples":[114],"than":[115],"conventional":[116],"equivalent-time":[117],"techniques.":[119],"addition,":[121],"use":[123],"an":[125],"resolution-enhanced":[126],"discrete":[127],"Fourier":[128],"transform":[129],"(DFT)":[130],"frame":[131],"basis":[133],"pursuit":[134],"algorithms":[135,151],"minimizes":[136],"spectral":[137],"leakage":[138],"incoherently":[140],"sub-sampled":[141],"signals.":[142],"This":[143],"co-design":[144],"testing":[153],"resolution.":[162]},"counts_by_year":[{"year":2024,"cited_by_count":2},{"year":2015,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}