{"id":"https://openalex.org/W2024366987","doi":"https://doi.org/10.1109/vts.2012.6231083","title":"An oscillation-based test structure for timing information extraction","display_name":"An oscillation-based test structure for timing information extraction","publication_year":2012,"publication_date":"2012-04-01","ids":{"openalex":"https://openalex.org/W2024366987","doi":"https://doi.org/10.1109/vts.2012.6231083","mag":"2024366987"},"language":"en","primary_location":{"id":"doi:10.1109/vts.2012.6231083","is_oa":false,"landing_page_url":"https://doi.org/10.1109/vts.2012.6231083","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2012 IEEE 30th VLSI Test Symposium (VTS)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5021724906","display_name":"Eun Jung Jang","orcid":"https://orcid.org/0000-0002-9104-5129"},"institutions":[{"id":"https://openalex.org/I86519309","display_name":"The University of Texas at Austin","ror":"https://ror.org/00hj54h04","country_code":"US","type":"education","lineage":["https://openalex.org/I86519309"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Eun Jung Jang","raw_affiliation_strings":["Computer Engineering Research Center, University of Texas, Austin, USA","Computer Engineering Research Center, The University of Texas Austin, USA"],"affiliations":[{"raw_affiliation_string":"Computer Engineering Research Center, University of Texas, Austin, USA","institution_ids":["https://openalex.org/I86519309"]},{"raw_affiliation_string":"Computer Engineering Research Center, The University of Texas Austin, USA","institution_ids":["https://openalex.org/I86519309"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5026865205","display_name":"Anne Gattiker","orcid":null},"institutions":[{"id":"https://openalex.org/I4210156936","display_name":"IBM Research - Austin","ror":"https://ror.org/05gjbbg60","country_code":"US","type":"facility","lineage":["https://openalex.org/I1341412227","https://openalex.org/I4210114115","https://openalex.org/I4210156936"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Anne Gattiker","raw_affiliation_strings":["Austin Research Laboratory, IBM, Austin, TX, USA","Austin Research Lab, IBM, TX 78758, USA"],"affiliations":[{"raw_affiliation_string":"Austin Research Laboratory, IBM, Austin, TX, USA","institution_ids":["https://openalex.org/I4210156936"]},{"raw_affiliation_string":"Austin Research Lab, IBM, TX 78758, USA","institution_ids":["https://openalex.org/I4210156936"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5046886936","display_name":"Sani Nassif","orcid":"https://orcid.org/0000-0002-5096-4794"},"institutions":[{"id":"https://openalex.org/I4210156936","display_name":"IBM Research - Austin","ror":"https://ror.org/05gjbbg60","country_code":"US","type":"facility","lineage":["https://openalex.org/I1341412227","https://openalex.org/I4210114115","https://openalex.org/I4210156936"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Sani Nassif","raw_affiliation_strings":["Austin Research Laboratory, IBM, Austin, TX, USA","Austin Research Lab, IBM, TX 78758, USA"],"affiliations":[{"raw_affiliation_string":"Austin Research Laboratory, IBM, Austin, TX, USA","institution_ids":["https://openalex.org/I4210156936"]},{"raw_affiliation_string":"Austin Research Lab, IBM, TX 78758, USA","institution_ids":["https://openalex.org/I4210156936"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5068070739","display_name":"Jacob A. Abraham","orcid":"https://orcid.org/0000-0002-5336-5631"},"institutions":[{"id":"https://openalex.org/I86519309","display_name":"The University of Texas at Austin","ror":"https://ror.org/00hj54h04","country_code":"US","type":"education","lineage":["https://openalex.org/I86519309"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Jacob A. Abraham","raw_affiliation_strings":["Computer Engineering Research Center, University of Texas, Austin, USA","Computer Engineering Research Center, The University of Texas Austin, USA"],"affiliations":[{"raw_affiliation_string":"Computer Engineering Research Center, University of Texas, Austin, USA","institution_ids":["https://openalex.org/I86519309"]},{"raw_affiliation_string":"Computer Engineering Research Center, The University of Texas Austin, USA","institution_ids":["https://openalex.org/I86519309"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5021724906"],"corresponding_institution_ids":["https://openalex.org/I86519309"],"apc_list":null,"apc_paid":null,"fwci":0.8702,"has_fulltext":false,"cited_by_count":7,"citation_normalized_percentile":{"value":0.72849916,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":96},"biblio":{"volume":null,"issue":null,"first_page":"74","last_page":"79"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/ring-oscillator","display_name":"Ring oscillator","score":0.6902121305465698},{"id":"https://openalex.org/keywords/correctness","display_name":"Correctness","score":0.6605864763259888},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6540808081626892},{"id":"https://openalex.org/keywords/static-timing-analysis","display_name":"Static timing analysis","score":0.5488380789756775},{"id":"https://openalex.org/keywords/application-specific-integrated-circuit","display_name":"Application-specific integrated circuit","score":0.4995558261871338},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.495312362909317},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.44085052609443665},{"id":"https://openalex.org/keywords/oscillation","display_name":"Oscillation (cell signaling)","score":0.4197880029678345},{"id":"https://openalex.org/keywords/computer-engineering","display_name":"Computer engineering","score":0.3985205292701721},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.3597724437713623},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.23618489503860474},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.19888538122177124},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.1797884702682495}],"concepts":[{"id":"https://openalex.org/C104111718","wikidata":"https://www.wikidata.org/wiki/Q2153973","display_name":"Ring oscillator","level":3,"score":0.6902121305465698},{"id":"https://openalex.org/C55439883","wikidata":"https://www.wikidata.org/wiki/Q360812","display_name":"Correctness","level":2,"score":0.6605864763259888},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6540808081626892},{"id":"https://openalex.org/C93682380","wikidata":"https://www.wikidata.org/wiki/Q2025226","display_name":"Static timing analysis","level":2,"score":0.5488380789756775},{"id":"https://openalex.org/C77390884","wikidata":"https://www.wikidata.org/wiki/Q217302","display_name":"Application-specific integrated circuit","level":2,"score":0.4995558261871338},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.495312362909317},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.44085052609443665},{"id":"https://openalex.org/C2778439541","wikidata":"https://www.wikidata.org/wiki/Q7106412","display_name":"Oscillation (cell signaling)","level":2,"score":0.4197880029678345},{"id":"https://openalex.org/C113775141","wikidata":"https://www.wikidata.org/wiki/Q428691","display_name":"Computer engineering","level":1,"score":0.3985205292701721},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.3597724437713623},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.23618489503860474},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.19888538122177124},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.1797884702682495},{"id":"https://openalex.org/C54355233","wikidata":"https://www.wikidata.org/wiki/Q7162","display_name":"Genetics","level":1,"score":0.0},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/vts.2012.6231083","is_oa":false,"landing_page_url":"https://doi.org/10.1109/vts.2012.6231083","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2012 IEEE 30th VLSI Test Symposium (VTS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":22,"referenced_works":["https://openalex.org/W1583788531","https://openalex.org/W2035588661","https://openalex.org/W2057004185","https://openalex.org/W2082949768","https://openalex.org/W2106315190","https://openalex.org/W2120719803","https://openalex.org/W2129267471","https://openalex.org/W2139879272","https://openalex.org/W2142290027","https://openalex.org/W2155636448","https://openalex.org/W2157111192","https://openalex.org/W2161156282","https://openalex.org/W2168812909","https://openalex.org/W2170285316","https://openalex.org/W2171769301","https://openalex.org/W2581692531","https://openalex.org/W3140640533","https://openalex.org/W3150032013","https://openalex.org/W4237642306","https://openalex.org/W4247815215","https://openalex.org/W4249020130","https://openalex.org/W6659479963"],"related_works":["https://openalex.org/W1667647204","https://openalex.org/W2404647514","https://openalex.org/W4247536566","https://openalex.org/W2018477250","https://openalex.org/W3009508265","https://openalex.org/W2144812464","https://openalex.org/W4246774934","https://openalex.org/W2143442623","https://openalex.org/W4388667102","https://openalex.org/W2080035745"],"abstract_inverted_index":{"Technology":[0],"scaling":[1],"introduces":[2],"many":[3],"sources":[4],"of":[5,19,32,38,43,49,53,67,74,79,82,100,111,121,138,144,157],"variability":[6],"and":[7,14,62,94,198,263],"uncertainty":[8],"that":[9,131],"are":[10],"difficult":[11],"to":[12,28,64,125,182,189,220],"model":[13,61],"predict":[15,29],"[3].":[16],"The":[17,41,77,119,142],"result":[18,48],"these":[20],"uncertainties":[21],"is":[22,46,85,91,124,151,169,186,200,212],"a":[23,36,50,127,159,215,224],"degradation":[24],"in":[25,108,115,167,257],"our":[26],"ability":[27],"the":[30,47,57,80,106,109,136,155,173,191,210,231,250],"performance":[31,45,69],"fabricated":[33],"chips,":[34],"i.e.,":[35],"lack":[37],"model-to-hardware":[39],"matching.":[40],"prediction":[42],"circuit":[44],"complex":[51,96],"hierarchy":[52],"models":[54,66,84,262],"starting":[55],"at":[56,214],"basic":[58],"MOSFET":[59],"device":[60],"rising":[63,98],"full-chip":[65],"important":[68,87,255],"metrics":[70],"like":[71],"power,":[72],"frequency":[73],"operation,":[75],"etc.":[76],"assessment":[78],"quality":[81],"such":[83],"an":[86,254],"activity,":[88],"but":[89],"it":[90,185,199,219],"becoming":[92],"harder":[93],"more":[95,202],"with":[97,105],"levels":[99],"variability,":[101],"as":[102,104],"well":[103],"increase":[107],"number":[110],"systematic":[112,232],"effects":[113,235],"observed":[114,264],"modern":[116],"CMOS":[117],"processes.":[118],"purpose":[120],"this":[122],"paper":[123],"introduce":[126],"special-purpose":[128],"test":[129,178],"structure":[130,179,211,251],"specifically":[132],"focuses":[133],"on":[134,154,172],"ensuring":[135],"accuracy":[137],"gate":[139,174],"timing":[140,175,261],"models.":[141,176],"certification":[143],"digital":[145],"design":[146],"correctness":[147],"(the":[148],"so-called":[149],"signoff)":[150],"based":[152,170],"largely":[153],"results":[156,193,248],"performing":[158],"Static":[160],"Timing":[161],"Analysis":[162],"(STA)":[163],"[15],":[164],"[18],":[165],"which,":[166],"turn,":[168],"entirely":[171],"Our":[177],"compares":[180],"favorably":[181],"alternative":[183],"approaches;":[184],"far":[187],"easier":[188],"obtain":[190],"desired":[192],"than":[194,204],"direct":[195],"delay":[196],"measurement,":[197],"much":[201],"general":[203],"simple":[205],"ring":[206,244],"oscillator":[207],"structures.":[208,246],"Further,":[209],"specified":[213],"high":[216],"level,":[217],"allowing":[218],"be":[221,239],"synthesized":[222],"using":[223],"standard":[225],"ASIC":[226],"place-and-route":[227],"flow,":[228],"thus":[229],"capturing":[230],"local":[233],"layout":[234],"which":[236],"can":[237,252],"sometimes":[238],"lost":[240],"by":[241],"simpler":[242],"(e.g.,":[243],"oscillator)":[245],"Experimental":[247],"show":[249],"play":[253],"role":[256],"identifying":[258],"mismatches":[259],"between":[260],"hardware.":[265]},"counts_by_year":[{"year":2018,"cited_by_count":1},{"year":2017,"cited_by_count":1},{"year":2016,"cited_by_count":2},{"year":2014,"cited_by_count":2},{"year":2013,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}