{"id":"https://openalex.org/W2046550956","doi":"https://doi.org/10.1109/vts.2012.6231067","title":"Derating based hardware optimizations in soft error tolerant designs","display_name":"Derating based hardware optimizations in soft error tolerant designs","publication_year":2012,"publication_date":"2012-04-01","ids":{"openalex":"https://openalex.org/W2046550956","doi":"https://doi.org/10.1109/vts.2012.6231067","mag":"2046550956"},"language":"en","primary_location":{"id":"doi:10.1109/vts.2012.6231067","is_oa":false,"landing_page_url":"https://doi.org/10.1109/vts.2012.6231067","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2012 IEEE 30th VLSI Test Symposium (VTS)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5112005511","display_name":"V Prasanth","orcid":null},"institutions":[{"id":"https://openalex.org/I59270414","display_name":"Indian Institute of Science Bangalore","ror":"https://ror.org/04dese585","country_code":"IN","type":"education","lineage":["https://openalex.org/I59270414"]}],"countries":["IN"],"is_corresponding":true,"raw_author_name":"V Prasanth","raw_affiliation_strings":["Indian Institute of Science, Bangalore, Karnataka, IN","Computer Design and Test Lab., Indian Institute of Science, Bangalore, India"],"affiliations":[{"raw_affiliation_string":"Indian Institute of Science, Bangalore, Karnataka, IN","institution_ids":["https://openalex.org/I59270414"]},{"raw_affiliation_string":"Computer Design and Test Lab., Indian Institute of Science, Bangalore, India","institution_ids":["https://openalex.org/I59270414"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5073587430","display_name":"Virendra Singh","orcid":"https://orcid.org/0000-0002-7035-7844"},"institutions":[{"id":"https://openalex.org/I59270414","display_name":"Indian Institute of Science Bangalore","ror":"https://ror.org/04dese585","country_code":"IN","type":"education","lineage":["https://openalex.org/I59270414"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"Virendra Singh","raw_affiliation_strings":["Computer Design and Test Lab, Indian institute of Science, Bangalore, India","Computer Design and Test Lab., Indian Institute of Science, Bangalore, India"],"affiliations":[{"raw_affiliation_string":"Computer Design and Test Lab, Indian institute of Science, Bangalore, India","institution_ids":["https://openalex.org/I59270414"]},{"raw_affiliation_string":"Computer Design and Test Lab., Indian Institute of Science, Bangalore, India","institution_ids":["https://openalex.org/I59270414"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5028519358","display_name":"Rubin Parekhji","orcid":"https://orcid.org/0009-0000-6625-2786"},"institutions":[{"id":"https://openalex.org/I4210109535","display_name":"Texas Instruments (India)","ror":"https://ror.org/01t305n31","country_code":"IN","type":"company","lineage":["https://openalex.org/I4210109535","https://openalex.org/I74760111"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"Rubin Parekhji","raw_affiliation_strings":["Texas Instruments (India) Pvt. Ltd., Bangalore, India","Texas Instruments (India) Pvt Ltd, Bangalore, India"],"affiliations":[{"raw_affiliation_string":"Texas Instruments (India) Pvt. Ltd., Bangalore, India","institution_ids":["https://openalex.org/I4210109535"]},{"raw_affiliation_string":"Texas Instruments (India) Pvt Ltd, Bangalore, India","institution_ids":["https://openalex.org/I4210109535"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5112005511"],"corresponding_institution_ids":["https://openalex.org/I59270414"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":{"value":0.10948923,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":94},"biblio":{"volume":null,"issue":null,"first_page":"282","last_page":"287"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10780","display_name":"Reliability and Maintenance Optimization","score":0.9962999820709229,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12423","display_name":"Software Reliability and Analysis Research","score":0.9836000204086304,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/derating","display_name":"Derating","score":0.9881749153137207},{"id":"https://openalex.org/keywords/soft-error","display_name":"Soft error","score":0.7394562363624573},{"id":"https://openalex.org/keywords/redundancy","display_name":"Redundancy (engineering)","score":0.7321426272392273},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.7225492000579834},{"id":"https://openalex.org/keywords/firmware","display_name":"Firmware","score":0.6980290412902832},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6864123344421387},{"id":"https://openalex.org/keywords/overhead","display_name":"Overhead (engineering)","score":0.6286641359329224},{"id":"https://openalex.org/keywords/robustness","display_name":"Robustness (evolution)","score":0.6283185482025146},{"id":"https://openalex.org/keywords/error-detection-and-correction","display_name":"Error detection and correction","score":0.5652497410774231},{"id":"https://openalex.org/keywords/dependability","display_name":"Dependability","score":0.45674505829811096},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.447096049785614},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.44575077295303345},{"id":"https://openalex.org/keywords/benchmark","display_name":"Benchmark (surveying)","score":0.4258931875228882},{"id":"https://openalex.org/keywords/computer-engineering","display_name":"Computer engineering","score":0.345897376537323},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.3235545754432678},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.19389128684997559},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.16166606545448303},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.11514115333557129},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.09274914860725403}],"concepts":[{"id":"https://openalex.org/C70500001","wikidata":"https://www.wikidata.org/wiki/Q1199915","display_name":"Derating","level":3,"score":0.9881749153137207},{"id":"https://openalex.org/C154474529","wikidata":"https://www.wikidata.org/wiki/Q1658917","display_name":"Soft error","level":2,"score":0.7394562363624573},{"id":"https://openalex.org/C152124472","wikidata":"https://www.wikidata.org/wiki/Q1204361","display_name":"Redundancy (engineering)","level":2,"score":0.7321426272392273},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.7225492000579834},{"id":"https://openalex.org/C67212190","wikidata":"https://www.wikidata.org/wiki/Q104851","display_name":"Firmware","level":2,"score":0.6980290412902832},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6864123344421387},{"id":"https://openalex.org/C2779960059","wikidata":"https://www.wikidata.org/wiki/Q7113681","display_name":"Overhead (engineering)","level":2,"score":0.6286641359329224},{"id":"https://openalex.org/C63479239","wikidata":"https://www.wikidata.org/wiki/Q7353546","display_name":"Robustness (evolution)","level":3,"score":0.6283185482025146},{"id":"https://openalex.org/C103088060","wikidata":"https://www.wikidata.org/wiki/Q1062839","display_name":"Error detection and correction","level":2,"score":0.5652497410774231},{"id":"https://openalex.org/C77019957","wikidata":"https://www.wikidata.org/wiki/Q2689057","display_name":"Dependability","level":2,"score":0.45674505829811096},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.447096049785614},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.44575077295303345},{"id":"https://openalex.org/C185798385","wikidata":"https://www.wikidata.org/wiki/Q1161707","display_name":"Benchmark (surveying)","level":2,"score":0.4258931875228882},{"id":"https://openalex.org/C113775141","wikidata":"https://www.wikidata.org/wiki/Q428691","display_name":"Computer engineering","level":1,"score":0.345897376537323},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.3235545754432678},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.19389128684997559},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.16166606545448303},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.11514115333557129},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.09274914860725403},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C55493867","wikidata":"https://www.wikidata.org/wiki/Q7094","display_name":"Biochemistry","level":1,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.0},{"id":"https://openalex.org/C104317684","wikidata":"https://www.wikidata.org/wiki/Q7187","display_name":"Gene","level":2,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C13280743","wikidata":"https://www.wikidata.org/wiki/Q131089","display_name":"Geodesy","level":1,"score":0.0},{"id":"https://openalex.org/C205649164","wikidata":"https://www.wikidata.org/wiki/Q1071","display_name":"Geography","level":0,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/vts.2012.6231067","is_oa":false,"landing_page_url":"https://doi.org/10.1109/vts.2012.6231067","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2012 IEEE 30th VLSI Test Symposium (VTS)","raw_type":"proceedings-article"},{"id":"pmh:oai:eprints.iisc.ac.in:45334","is_oa":false,"landing_page_url":null,"pdf_url":null,"source":{"id":"https://openalex.org/S4377196309","display_name":"NOT FOUND REPOSITORY (Indian Institute of Science Bangalore)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I59270414","host_organization_name":"Indian Institute of Science Bangalore","host_organization_lineage":["https://openalex.org/I59270414"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"acceptedVersion","is_accepted":true,"is_published":false,"raw_source_name":"","raw_type":"Conference Proceedings"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":28,"referenced_works":["https://openalex.org/W160422864","https://openalex.org/W1504298609","https://openalex.org/W1981194937","https://openalex.org/W1986601058","https://openalex.org/W1999076355","https://openalex.org/W1999799697","https://openalex.org/W2023856022","https://openalex.org/W2050431855","https://openalex.org/W2052153312","https://openalex.org/W2053104259","https://openalex.org/W2054593687","https://openalex.org/W2092581164","https://openalex.org/W2097579272","https://openalex.org/W2099569658","https://openalex.org/W2116244405","https://openalex.org/W2128248970","https://openalex.org/W2141068710","https://openalex.org/W2141072664","https://openalex.org/W2142358791","https://openalex.org/W2143557070","https://openalex.org/W2154207847","https://openalex.org/W2161033118","https://openalex.org/W2161978115","https://openalex.org/W2738426844","https://openalex.org/W3149410719","https://openalex.org/W6630127424","https://openalex.org/W6663907715","https://openalex.org/W6741394288"],"related_works":["https://openalex.org/W2031058597","https://openalex.org/W2055509677","https://openalex.org/W3144921385","https://openalex.org/W2130940980","https://openalex.org/W2110991008","https://openalex.org/W2000201823","https://openalex.org/W2042832476","https://openalex.org/W2149051075","https://openalex.org/W2061536619","https://openalex.org/W2394408226"],"abstract_inverted_index":{"Ensuring":[0],"reliable":[1],"operation":[2],"over":[3],"an":[4,71],"extended":[5],"period":[6],"of":[7,11,23,89,105,126,148,159],"time":[8],"is":[9,61,154],"one":[10],"the":[12,24,36,114,124,140,163,174],"biggest":[13],"challenges":[14],"facing":[15],"present":[16],"day":[17],"electronic":[18],"systems.":[19],"The":[20],"increased":[21],"vulnerability":[22],"components":[25],"to":[26,50,58,62,138,143],"atmospheric":[27],"particle":[28],"strikes":[29],"poses":[30],"a":[31,65,145,157],"big":[32],"threat":[33],"in":[34,110,173],"attaining":[35],"reliability":[37,53],"required":[38],"for":[39],"various":[40,90,127],"mission":[41],"critical":[42],"applications.":[43],"Various":[44],"soft":[45,66,149],"error":[46,67,76,150],"mitigation":[47,68],"methodologies":[48],"exist":[49],"address":[51],"this":[52,59,120],"challenge.":[54],"A":[55],"general":[56],"solution":[57],"problem":[60],"arrive":[63],"at":[64],"methodology":[69],"with":[70],"acceptable":[72],"implementation":[73,80],"overhead":[74,81,142,176],"and":[75,98,130,180],"tolerance":[77],"level.":[78],"This":[79,152],"can":[82,134],"then":[83],"be":[84,135],"reduced":[85],"by":[86],"taking":[87],"advantage":[88],"derating":[91,97,128,182],"effects":[92],"like":[93],"logical":[94],"derating,":[95,101],"electrical":[96],"timing":[99],"window":[100],"and/or":[102],"making":[103],"use":[104],"application":[106],"redundancy,":[107],"e.g.":[108],"redundancy":[109],"firmware/software":[111],"executing":[112],"on":[113,156],"so":[115],"designed":[116],"robust":[117],"hardware.":[118],"In":[119],"paper,":[121],"we":[122],"analyze":[123],"impact":[125],"factors":[129],"show":[131,169],"how":[132],"they":[133],"profitably":[136],"employed":[137],"reduce":[139],"hardware":[141,175],"implement":[144],"given":[146],"level":[147],"robustness.":[151],"analysis":[153],"performed":[155],"set":[158],"benchmark":[160],"circuits":[161],"using":[162],"delayed":[164],"capture":[165],"methodology.":[166],"Experimental":[167],"results":[168],"upto":[170],"23%":[171],"reduction":[172],"when":[177],"considering":[178],"individual":[179],"combined":[181],"factors.":[183]},"counts_by_year":[{"year":2018,"cited_by_count":1},{"year":2017,"cited_by_count":1}],"updated_date":"2026-04-04T16:13:02.066488","created_date":"2025-10-10T00:00:00"}