{"id":"https://openalex.org/W2156134515","doi":"https://doi.org/10.1109/vts.2011.5783779","title":"SLIDER: A fast and accurate defect simulation framework","display_name":"SLIDER: A fast and accurate defect simulation framework","publication_year":2011,"publication_date":"2011-05-01","ids":{"openalex":"https://openalex.org/W2156134515","doi":"https://doi.org/10.1109/vts.2011.5783779","mag":"2156134515"},"language":"en","primary_location":{"id":"doi:10.1109/vts.2011.5783779","is_oa":false,"landing_page_url":"https://doi.org/10.1109/vts.2011.5783779","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"29th VLSI Test Symposium","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5035594701","display_name":"Wing Chiu Tam","orcid":null},"institutions":[{"id":"https://openalex.org/I74973139","display_name":"Carnegie Mellon University","ror":"https://ror.org/05x2bcf33","country_code":"US","type":"education","lineage":["https://openalex.org/I74973139"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Wing Chiu Tam","raw_affiliation_strings":["ECE Department, Carnegie Mellon University, Pittsburgh, USA"],"affiliations":[{"raw_affiliation_string":"ECE Department, Carnegie Mellon University, Pittsburgh, USA","institution_ids":["https://openalex.org/I74973139"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5111967389","display_name":"R.D. Blanton","orcid":null},"institutions":[{"id":"https://openalex.org/I74973139","display_name":"Carnegie Mellon University","ror":"https://ror.org/05x2bcf33","country_code":"US","type":"education","lineage":["https://openalex.org/I74973139"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"R. D. Blanton","raw_affiliation_strings":["ECE Department, Carnegie Mellon University, Pittsburgh, USA"],"affiliations":[{"raw_affiliation_string":"ECE Department, Carnegie Mellon University, Pittsburgh, USA","institution_ids":["https://openalex.org/I74973139"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5035594701"],"corresponding_institution_ids":["https://openalex.org/I74973139"],"apc_list":null,"apc_paid":null,"fwci":1.763,"has_fulltext":false,"cited_by_count":9,"citation_normalized_percentile":{"value":0.86284242,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":98},"biblio":{"volume":null,"issue":null,"first_page":"172","last_page":"177"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9965999722480774,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7357182502746582},{"id":"https://openalex.org/keywords/netlist","display_name":"Netlist","score":0.6754387617111206},{"id":"https://openalex.org/keywords/scalability","display_name":"Scalability","score":0.6314853429794312},{"id":"https://openalex.org/keywords/fault-injection","display_name":"Fault injection","score":0.5768071413040161},{"id":"https://openalex.org/keywords/mixed-signal-integrated-circuit","display_name":"Mixed-signal integrated circuit","score":0.5556473731994629},{"id":"https://openalex.org/keywords/automatic-test-pattern-generation","display_name":"Automatic test pattern generation","score":0.5525019764900208},{"id":"https://openalex.org/keywords/observability","display_name":"Observability","score":0.5125250816345215},{"id":"https://openalex.org/keywords/automation","display_name":"Automation","score":0.46691372990608215},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.4610885977745056},{"id":"https://openalex.org/keywords/signal","display_name":"SIGNAL (programming language)","score":0.45836955308914185},{"id":"https://openalex.org/keywords/computer-engineering","display_name":"Computer engineering","score":0.4577788710594177},{"id":"https://openalex.org/keywords/electronic-design-automation","display_name":"Electronic design automation","score":0.44206860661506653},{"id":"https://openalex.org/keywords/logic-simulation","display_name":"Logic simulation","score":0.4301602244377136},{"id":"https://openalex.org/keywords/speedup","display_name":"Speedup","score":0.42834410071372986},{"id":"https://openalex.org/keywords/set","display_name":"Set (abstract data type)","score":0.4227873980998993},{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.42233550548553467},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.33017903566360474},{"id":"https://openalex.org/keywords/integrated-circuit","display_name":"Integrated circuit","score":0.28661656379699707},{"id":"https://openalex.org/keywords/logic-gate","display_name":"Logic gate","score":0.2715664505958557},{"id":"https://openalex.org/keywords/software","display_name":"Software","score":0.23789769411087036},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.1987234354019165},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.15878623723983765},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.13979586958885193},{"id":"https://openalex.org/keywords/parallel-computing","display_name":"Parallel computing","score":0.11283034086227417}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7357182502746582},{"id":"https://openalex.org/C177650935","wikidata":"https://www.wikidata.org/wiki/Q1760303","display_name":"Netlist","level":2,"score":0.6754387617111206},{"id":"https://openalex.org/C48044578","wikidata":"https://www.wikidata.org/wiki/Q727490","display_name":"Scalability","level":2,"score":0.6314853429794312},{"id":"https://openalex.org/C2775928411","wikidata":"https://www.wikidata.org/wiki/Q2041312","display_name":"Fault injection","level":3,"score":0.5768071413040161},{"id":"https://openalex.org/C62907940","wikidata":"https://www.wikidata.org/wiki/Q1541329","display_name":"Mixed-signal integrated circuit","level":3,"score":0.5556473731994629},{"id":"https://openalex.org/C17626397","wikidata":"https://www.wikidata.org/wiki/Q837455","display_name":"Automatic test pattern generation","level":3,"score":0.5525019764900208},{"id":"https://openalex.org/C36299963","wikidata":"https://www.wikidata.org/wiki/Q1369844","display_name":"Observability","level":2,"score":0.5125250816345215},{"id":"https://openalex.org/C115901376","wikidata":"https://www.wikidata.org/wiki/Q184199","display_name":"Automation","level":2,"score":0.46691372990608215},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.4610885977745056},{"id":"https://openalex.org/C2779843651","wikidata":"https://www.wikidata.org/wiki/Q7390335","display_name":"SIGNAL (programming language)","level":2,"score":0.45836955308914185},{"id":"https://openalex.org/C113775141","wikidata":"https://www.wikidata.org/wiki/Q428691","display_name":"Computer engineering","level":1,"score":0.4577788710594177},{"id":"https://openalex.org/C64260653","wikidata":"https://www.wikidata.org/wiki/Q1194864","display_name":"Electronic design automation","level":2,"score":0.44206860661506653},{"id":"https://openalex.org/C64859876","wikidata":"https://www.wikidata.org/wiki/Q173673","display_name":"Logic simulation","level":3,"score":0.4301602244377136},{"id":"https://openalex.org/C68339613","wikidata":"https://www.wikidata.org/wiki/Q1549489","display_name":"Speedup","level":2,"score":0.42834410071372986},{"id":"https://openalex.org/C177264268","wikidata":"https://www.wikidata.org/wiki/Q1514741","display_name":"Set (abstract data type)","level":2,"score":0.4227873980998993},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.42233550548553467},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.33017903566360474},{"id":"https://openalex.org/C530198007","wikidata":"https://www.wikidata.org/wiki/Q80831","display_name":"Integrated circuit","level":2,"score":0.28661656379699707},{"id":"https://openalex.org/C131017901","wikidata":"https://www.wikidata.org/wiki/Q170451","display_name":"Logic gate","level":2,"score":0.2715664505958557},{"id":"https://openalex.org/C2777904410","wikidata":"https://www.wikidata.org/wiki/Q7397","display_name":"Software","level":2,"score":0.23789769411087036},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.1987234354019165},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.15878623723983765},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.13979586958885193},{"id":"https://openalex.org/C173608175","wikidata":"https://www.wikidata.org/wiki/Q232661","display_name":"Parallel computing","level":1,"score":0.11283034086227417},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C28826006","wikidata":"https://www.wikidata.org/wiki/Q33521","display_name":"Applied mathematics","level":1,"score":0.0},{"id":"https://openalex.org/C78519656","wikidata":"https://www.wikidata.org/wiki/Q101333","display_name":"Mechanical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C77088390","wikidata":"https://www.wikidata.org/wiki/Q8513","display_name":"Database","level":1,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.0},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/vts.2011.5783779","is_oa":false,"landing_page_url":"https://doi.org/10.1109/vts.2011.5783779","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"29th VLSI Test Symposium","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Industry, innovation and infrastructure","id":"https://metadata.un.org/sdg/9","score":0.6399999856948853}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":37,"referenced_works":["https://openalex.org/W566385658","https://openalex.org/W1555407400","https://openalex.org/W1592689466","https://openalex.org/W1735018384","https://openalex.org/W1821415291","https://openalex.org/W1830318039","https://openalex.org/W1831960804","https://openalex.org/W1864256460","https://openalex.org/W1951780703","https://openalex.org/W1969896938","https://openalex.org/W1975803260","https://openalex.org/W1994432930","https://openalex.org/W2071864943","https://openalex.org/W2107568030","https://openalex.org/W2107609659","https://openalex.org/W2117253172","https://openalex.org/W2121093655","https://openalex.org/W2122132511","https://openalex.org/W2123095027","https://openalex.org/W2126693329","https://openalex.org/W2138223068","https://openalex.org/W2138735239","https://openalex.org/W2142606518","https://openalex.org/W2144328631","https://openalex.org/W2152406824","https://openalex.org/W2152489029","https://openalex.org/W2153457918","https://openalex.org/W2156294156","https://openalex.org/W2159277142","https://openalex.org/W2161229078","https://openalex.org/W2163558178","https://openalex.org/W4246165039","https://openalex.org/W4250556527","https://openalex.org/W4253418633","https://openalex.org/W6668572202","https://openalex.org/W6678797189","https://openalex.org/W6682357834"],"related_works":["https://openalex.org/W1506159315","https://openalex.org/W2297417762","https://openalex.org/W1530804449","https://openalex.org/W2098869417","https://openalex.org/W1985951220","https://openalex.org/W2106223679","https://openalex.org/W2106548485","https://openalex.org/W2503215586","https://openalex.org/W4312335373","https://openalex.org/W4298123071"],"abstract_inverted_index":{"As":[0,14],"integrated":[1],"circuit":[2,118],"(IC)":[3],"manufacturing":[4],"entered":[5],"the":[6,51,89,105,117,174],"nano-scale":[7],"era,":[8],"defect":[9,36,64,100,133,161,191,202],"observability":[10],"has":[11,84],"greatly":[12],"diminished.":[13],"a":[15,57,152],"result,":[16],"test-fail":[17],"data":[18,169],"diagnosis":[19,158],"and":[20,62,71,113,121,127,141,166],"mining":[21],"are":[22],"playing":[23],"an":[24],"indispensable":[25],"role":[26],"in":[27,151],"providing":[28],"feedback":[29],"for":[30,78,124],"yield":[31],"learning.":[32],"Accurate":[33],"simulation":[34,49,74],"of":[35,69,116,154,187],"behavior":[37],"is":[38,177],"vital":[39],"to":[40,59,179],"this":[41,86],"process":[42],"but,":[43],"unfortunately,":[44],"cannot":[45],"be":[46,149,194],"achieved":[47],"with":[48],"at":[50,104],"logic-level":[52],"alone.":[53],"This":[54],"work":[55,83],"proposes":[56],"framework":[58,146,176],"enable":[60],"fast":[61],"accurate":[63,201],"simulation,":[65,126,140],"by":[66,199],"making":[67],"use":[68],"existing":[70],"well-developed":[72],"mixed-signal":[73,125,139,145],"technology":[75],"(traditionally":[76],"used":[77],"design":[79,135],"verification).":[80],"While":[81],"previous":[82],"considered":[85],"topic":[87],"before,":[88],"innovation":[90],"here":[91],"centers":[92],"on":[93],"two":[94],"aspects:":[95],"(i)":[96],"accuracy":[97],"resulting":[98,110],"from":[99,111],"injection":[101],"taking":[102],"place":[103],"layout":[106],"level,":[107],"(ii)":[108],"speedup":[109],"careful":[112],"automatic":[114],"partitioning":[115],"into":[119],"digital":[120],"analog":[122],"domains":[123],"(iii)":[128],"complete":[129],"automation":[130],"that":[131,156,173],"involves":[132],"injection,":[134],"partitioning,":[136],"netlist":[137],"extraction,":[138],"test-data":[142],"extraction.":[143],"The":[144],"developed":[147],"can":[148,193],"applied":[150],"variety":[153],"settings":[155],"include":[157],"resolution":[159],"improvement,":[160],"localization,":[162],"fault":[163],"model":[164],"evaluation,":[165],"virtual":[167],"failure":[168],"creation.":[170],"Experiments":[171],"demonstrate":[172],"proposed":[175],"scalable":[178],"handle":[180],"large":[181],"designs":[182],"efficiently.":[183],"A":[184],"second":[185],"set":[186],"experiments":[188],"demonstrates":[189],"how":[190],"localization":[192],"dramatically":[195],"improved":[196],"(>;":[197],"53%)":[198],"more":[200],"simulation.":[203]},"counts_by_year":[{"year":2017,"cited_by_count":1},{"year":2015,"cited_by_count":1},{"year":2014,"cited_by_count":2},{"year":2012,"cited_by_count":4}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}