{"id":"https://openalex.org/W2105439963","doi":"https://doi.org/10.1109/vts.2011.5783754","title":"Levelized low cost delay test compaction considering IR-drop induced power supply noise","display_name":"Levelized low cost delay test compaction considering IR-drop induced power supply noise","publication_year":2011,"publication_date":"2011-05-01","ids":{"openalex":"https://openalex.org/W2105439963","doi":"https://doi.org/10.1109/vts.2011.5783754","mag":"2105439963"},"language":"en","primary_location":{"id":"doi:10.1109/vts.2011.5783754","is_oa":false,"landing_page_url":"https://doi.org/10.1109/vts.2011.5783754","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"29th VLSI Test Symposium","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5011899492","display_name":"Zhongwei Jiang","orcid":"https://orcid.org/0000-0003-3772-4814"},"institutions":[{"id":"https://openalex.org/I91045830","display_name":"Texas A&M University","ror":"https://ror.org/01f5ytq51","country_code":"US","type":"education","lineage":["https://openalex.org/I91045830"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Zhongwei Jiang","raw_affiliation_strings":["Department of Computer Science and Engineering, Texas A and M University, College Station, TX, USA","Department of Computer Science and Engineering, Texas A&M University, College Station, 77843-3112, USA"],"affiliations":[{"raw_affiliation_string":"Department of Computer Science and Engineering, Texas A and M University, College Station, TX, USA","institution_ids":["https://openalex.org/I91045830"]},{"raw_affiliation_string":"Department of Computer Science and Engineering, Texas A&M University, College Station, 77843-3112, USA","institution_ids":["https://openalex.org/I91045830"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100401045","display_name":"Zheng Wang","orcid":"https://orcid.org/0000-0001-6157-0662"},"institutions":[{"id":"https://openalex.org/I91045830","display_name":"Texas A&M University","ror":"https://ror.org/01f5ytq51","country_code":"US","type":"education","lineage":["https://openalex.org/I91045830"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Zheng Wang","raw_affiliation_strings":["Department of Computer Science and Engineering, Texas A and M University, College Station, TX, USA","Department of Computer Science and Engineering, Texas A&M University, College Station, 77843-3112, USA"],"affiliations":[{"raw_affiliation_string":"Department of Computer Science and Engineering, Texas A and M University, College Station, TX, USA","institution_ids":["https://openalex.org/I91045830"]},{"raw_affiliation_string":"Department of Computer Science and Engineering, Texas A&M University, College Station, 77843-3112, USA","institution_ids":["https://openalex.org/I91045830"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100378601","display_name":"Jing Wang","orcid":"https://orcid.org/0000-0002-8491-4146"},"institutions":[{"id":"https://openalex.org/I4210137977","display_name":"Advanced Micro Devices (United States)","ror":"https://ror.org/04kd6c783","country_code":"US","type":"company","lineage":["https://openalex.org/I4210137977"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Jing Wang","raw_affiliation_strings":["Advanced Micro Devices, Inc., Austin, TX, USA","Adv. Micro Devices, Austin, TX, USA"],"affiliations":[{"raw_affiliation_string":"Advanced Micro Devices, Inc., Austin, TX, USA","institution_ids":["https://openalex.org/I4210137977"]},{"raw_affiliation_string":"Adv. Micro Devices, Austin, TX, USA","institution_ids":["https://openalex.org/I4210137977"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5027337337","display_name":"D.M.H. Walker","orcid":"https://orcid.org/0000-0002-4839-3830"},"institutions":[{"id":"https://openalex.org/I91045830","display_name":"Texas A&M University","ror":"https://ror.org/01f5ytq51","country_code":"US","type":"education","lineage":["https://openalex.org/I91045830"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"D. M. H. Walker","raw_affiliation_strings":["Department of Computer Science and Engineering, Texas A and M University, College Station, TX, USA","Department of Computer Science and Engineering, Texas A&M University, College Station, 77843-3112, USA"],"affiliations":[{"raw_affiliation_string":"Department of Computer Science and Engineering, Texas A and M University, College Station, TX, USA","institution_ids":["https://openalex.org/I91045830"]},{"raw_affiliation_string":"Department of Computer Science and Engineering, Texas A&M University, College Station, 77843-3112, USA","institution_ids":["https://openalex.org/I91045830"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5011899492"],"corresponding_institution_ids":["https://openalex.org/I91045830"],"apc_list":null,"apc_paid":null,"fwci":1.0075,"has_fulltext":false,"cited_by_count":7,"citation_normalized_percentile":{"value":0.78104419,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":96},"biblio":{"volume":null,"issue":null,"first_page":"52","last_page":"57"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9988999962806702,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/noise","display_name":"Noise (video)","score":0.5988795757293701},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.50493985414505},{"id":"https://openalex.org/keywords/drop","display_name":"Drop (telecommunication)","score":0.46817082166671753},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.4283030033111572},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.14104923605918884}],"concepts":[{"id":"https://openalex.org/C99498987","wikidata":"https://www.wikidata.org/wiki/Q2210247","display_name":"Noise (video)","level":3,"score":0.5988795757293701},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.50493985414505},{"id":"https://openalex.org/C2781345722","wikidata":"https://www.wikidata.org/wiki/Q5308388","display_name":"Drop (telecommunication)","level":2,"score":0.46817082166671753},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.4283030033111572},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.14104923605918884},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/vts.2011.5783754","is_oa":false,"landing_page_url":"https://doi.org/10.1109/vts.2011.5783754","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"29th VLSI Test Symposium","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7","score":0.7900000214576721}],"awards":[],"funders":[{"id":"https://openalex.org/F4320306076","display_name":"National Science Foundation","ror":"https://ror.org/021nxhr62"},{"id":"https://openalex.org/F4320306087","display_name":"Semiconductor Research Corporation","ror":"https://ror.org/047z4n946"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":25,"referenced_works":["https://openalex.org/W2101030753","https://openalex.org/W2101278273","https://openalex.org/W2106006800","https://openalex.org/W2109791184","https://openalex.org/W2117791241","https://openalex.org/W2124089733","https://openalex.org/W2124629253","https://openalex.org/W2142868932","https://openalex.org/W2148008037","https://openalex.org/W2152724929","https://openalex.org/W2153171864","https://openalex.org/W2153912424","https://openalex.org/W2155202144","https://openalex.org/W2157080063","https://openalex.org/W2162547872","https://openalex.org/W2168670003","https://openalex.org/W4233794767","https://openalex.org/W4236133696","https://openalex.org/W4237840841","https://openalex.org/W4238696474","https://openalex.org/W4242987207","https://openalex.org/W6675809723","https://openalex.org/W6682469502","https://openalex.org/W6683155022","https://openalex.org/W6683598130"],"related_works":["https://openalex.org/W2748952813","https://openalex.org/W2390279801","https://openalex.org/W2358668433","https://openalex.org/W2376932109","https://openalex.org/W2001405890","https://openalex.org/W2382290278","https://openalex.org/W2478288626","https://openalex.org/W4391913857","https://openalex.org/W2350741829","https://openalex.org/W2530322880"],"abstract_inverted_index":{"Power":[0],"supply":[1],"noise":[2,10],"is":[3],"very":[4],"important":[5],"in":[6,59],"delay":[7,14,41,48],"testing.":[8],"Excessive":[9],"can":[11,27],"cause":[12],"circuit":[13,47],"increases":[15],"that":[16,23,45],"lead":[17,28],"to":[18,29],"test":[19,30,42,50],"overkill.":[20],"Test":[21],"patterns":[22],"are":[24,62],"too":[25],"quiet":[26],"escapes.":[31],"In":[32],"this":[33],"work,":[34],"we":[35],"introduce":[36],"a":[37,52],"realistic":[38],"low":[39],"cost":[40],"compaction":[43],"flow":[44],"guardbands":[46],"during":[49],"using":[51],"sequence":[53],"of":[54],"estimation":[55],"metrics.":[56],"Significant":[57],"reductions":[58],"CPU":[60],"time":[61],"demonstrated":[63],"over":[64],"prior":[65],"work.":[66]},"counts_by_year":[{"year":2017,"cited_by_count":1},{"year":2015,"cited_by_count":2},{"year":2014,"cited_by_count":2},{"year":2013,"cited_by_count":2}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}